CN101452415B - Auxiliary device and method for testing embedded system - Google Patents
Auxiliary device and method for testing embedded system Download PDFInfo
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- CN101452415B CN101452415B CN2007102028054A CN200710202805A CN101452415B CN 101452415 B CN101452415 B CN 101452415B CN 2007102028054 A CN2007102028054 A CN 2007102028054A CN 200710202805 A CN200710202805 A CN 200710202805A CN 101452415 B CN101452415 B CN 101452415B
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Abstract
The present invention relates to an auxiliary device for testing an embedded system. The auxiliary device comprises a writing device, a general input and output chip, a signal conversion device and a serial bus interface which are sequentially connected, and the general input and output chip is also connected with a display device, wherein the writing device is used for writing testing parameters into the general input and output chip; the general input and output chip is used for storing the testing parameters; the serial bus interface is used for connecting the auxiliary device and an embedded system tester table; the signal conversion device is used for converting reading signals and testing results sent by the embedded system tester table into formats on the general input and output chip according to different types of the serial bus interface; the general input and output chip is also used for storing the testing results; and the display device is used for displaying the testing parameters and the testing results on the general input and output chip instantly. In addition, the present invention also provides a method for assisting testing the embedded system by utilizing the auxiliary device.
Description
Technical field
The present invention relates to a kind of servicing unit and method of embedded system test.
Background technology
Improving and the assurance product quality, is the important content in the business activity.In order to improve and to guarantee product quality, enterprise must implement test to obtain the quality information of product and manufacture process thereof to product, according to these information the manufacture process of product is implemented control---revise and the compensation activity, make waster and reprocessed products rate drop to minimum level, finally guarantee the stability and the output consistency of product thereof of product quality forming process.
As everyone knows, when embedded system is tested, obtain test result, and the common personal computer (Personal Computer) that passes through that displays it links to each other with the embedded system test board, between personal computer and embedded system test board, carry out communication, the result who is tested is shown on personal computer, promptly serve as man-computer interface by personal computer.The cost of personal computer is also too high relatively because personal computer is not only bought detection time long (only start personal computer and just need certain hour) and being used to, and the space requirement that sets up board is also bigger, and so not only time-consuming but also expensive, testing cost increases.
Summary of the invention
In view of above content, be necessary to provide a kind of servicing unit of embedded system test, it can change into test result corresponding form on the general output input chip, and will on display device, show through the test result of format conversion with different indications, the user can draw the result of test, convenience simple in structure by the indications that shows.
In view of above content, also be necessary to provide a kind of method of utilizing the auxiliary embedded system test of above-mentioned servicing unit, it can change into test result corresponding form on the general output input chip, and will on display device, show through the test result of format conversion with different indications, the user can draw the result of test by the indications that shows, and method is simple and convenient.
A kind of servicing unit of embedded system test, this servicing unit links to each other with the embedded system test board, this embedded system continent test-run a machine platform is used to test the function of various embedded systems, described servicing unit comprises writing station, general I/O chip, chromacoder and the serial bus interface that connects successively, described general I/O chip also is connected with display device, wherein: the said write device is used for test parameter is write general I/O chip, and described test parameter is made up of indications; Described general I/O chip is used to preserve above-mentioned test parameter; Described serial bus interface is used for auxiliary connecting device and embedded system test board; Described chromacoder is used for becoming form on the general I/O chip according to the dissimilar conversion of signals that read that the embedded system test board is sent of serial bus interface, and read above-mentioned test parameter so that embedded system is tested, and convert test result on the general I/O chip form according to the signal that reads after the format conversion; Described general I/O chip also is used to preserve test result; Described display device is used for the indications of the test parameter correspondence on the general I/O chip of instant playback and shows above-mentioned test result by different indications.
A kind of method of utilizing the auxiliary embedded system test of the described servicing unit of claim, this method comprises the steps: that writing station writes test parameter in the general I/O chip, described test parameter is made up of indications; The embedded system test board sends the signal that reads that reads test parameter on the general I/O chip; Type according to the serial bus interface that is connected with the embedded system test board judges whether that needs carry out conversion of signals; When not needing to carry out conversion of signals, described embedded system test board reads the test parameter on the general I/O chip, begins test, and the test result with the embedded system test board writes general I/O chip by serial bus interface then; When needs carry out conversion of signals, chromacoder becomes form on the general I/O chip to read the test parameter on the general I/O chip the described conversion of signals that reads, the embedded system test board begins test, chromacoder converts the test result of embedded system test board on the general I/O chip form then, and it is write on the general I/O chip; Display device is come out test parameter on the general I/O chip and test result by different indications instant playbacks.
Compared to prior art, the servicing unit of described embedded system test and method, utilize the writing station, the GPIO chip that connect successively on the servicing unit, chromacoder and serial bus interface obtain the test result of embedded system test board, test result is changed into status information corresponding on the GPIO chip, and the status information of correspondence shown, the user can draw the result of test by the status information that shows, convenience simple in structure, it is little to take up room, and has saved cost greatly.
Description of drawings
Fig. 1 is the hardware structure figure of the servicing unit preferred embodiment of embedded system test of the present invention.
Fig. 2 is the process flow diagram that the present invention utilizes the method method preferred embodiment of the auxiliary embedded system test of above-mentioned servicing unit.
Embodiment
As shown in Figure 1, be the system architecture diagram of the servicing unit preferred embodiment of embedded system test of the present invention.This system mainly comprises servicing unit 1 and embedded system test board 7.Include display device 2, writing station 3, general input and output (GPIO:General Purpose Input Output) chip 4, chromacoder 5 and serial bus interface 6 in the described servicing unit 1.In servicing unit 1, institute's write the two or more syllables of a word together are gone into device 3, GPIO chip 4, chromacoder 5 and serial bus interface 6 and are connected successively.Described servicing unit 1 is connected to embedded system test board 7 by serial bus interface 6.Described GPIO chip 4 connects display device 2.
Described serial bus interface 6 is used for transmitting signal between servicing unit 1 and embedded system test board 7, serial bus interface 6 comprises following several on the described servicing unit 1: USB (universal serial bus) (USB:Universal Serial Bus), internal integrate circuit bus (I2C:Inter-Integrated Circuit), System Management Bus interface (SMBus:SystemManagement Bus) and universal asynchronous acceptance send serial line interface (UART:UniversalAsynchronous Receiver Transmitter), because above-mentioned every kind of serial bus interface 6 all has certain scope of application, therefore above various serial bus interface 6 is installed on servicing unit 1 to satisfy various test needs.
Described chromacoder 5 is used for when embedded system test board 7 reads test parameter on the GPIO chip 4, judge whether that according to serial bus interface 6 dissimilar needs become form on the GPIO chip reading the test parameter on the GPIO chip 4 conversion of signals that reads that the embedded system test board sends, and when embedded system test board 7 test finish after, test result converted to the form on the GPIO chip.Particularly, if servicing unit 1 is to be connected by USB interface or UART interface with embedded system test board 7, then need to carry out above-mentioned conversion of signals by chromacoder 5, if servicing unit 1 is to be connected by I2C interface or SMBUS interface with embedded system test board 7, then do not need to carry out conversion of signals by chromacoder 5.
Said write device 3 is used for test parameter is write GPIO chip 4.Described test parameter comprises the detailed programs of test, the original state of test.Described writing station 3 can be a single-chip microcomputer, can also be the data processing equipment of other any appropriate, and in this preferred embodiment, what writing station 3 used is single-chip microcomputer.
Described GPIO chip 4 is used to preserve above-mentioned test parameter and test result, described test parameter and test result leave an EEPROM (Electrically ErasableProgrammable Read Only Memory in, electrically erasable programmable ROM) in, described test parameter and test result are generally some concrete indications, and indications is indicated the result of test.Particularly, for example, " F0 " representative test beginning, embedded system test board 7 reads this information and enters test mode, after finishing test, test result is write GPIO chip 4 by serial bus interface 6 and chromacoder 5, if test is passed through, the test result that then writes GPIO chip 4 is passed through to indicate test for " FF ", if test crash, the test result information that then writes GPIO chip 4 is that " FE " is to indicate test crash.
Described embedded system test board 7 is used to test the function of various embedded systems (as: mainboard), and can read test parameter on the GPIO chip 4, and test according to the test parameter that reads, after finishing test, test result is write GPIO chip 4.Pass through as if test, the test result that then writes GPIO chip 4 is passed through to indicate test for " FF ", if test crash, the test result that then writes GPIO chip 4 is that " FE " is to indicate test crash.
Described display device 2 links to each other with GPIO chip 4, be used for test parameter and test result on the instant playback GPIO chip 4, for example, when test has just begun, what show is that some symbols (as: F0) begin to indicate test, shows during end of test (EOT) that other symbol is to indicate whether test is passed through.In the present embodiment, described display device 2 is a LCD plate, in other embodiments, also can be the display device of other any appropriate.
As shown in Figure 2, be the process flow diagram of the householder method preferred embodiment of embedded system test of the present invention.
Step S10, at first, writing station 3 writes test parameter in the GPIO chip 4.Described test parameter comprises the detailed programs of test, the original state of test.Described test parameter is generally some concrete indications, for example, indications " 1 " expression test memory, " F0 " expression test beginning, when embedded system test board 7 read above-mentioned test parameter from GPIO chip 4, then embedded system test board 7 began test memories.Described writing station 3 can be a single-chip microcomputer, can also be the data processing equipment of other any appropriate, and in this preferred embodiment, what writing station 3 used is single-chip microcomputer.
Step S11, embedded system test board 7 send the signal that reads that reads test parameter on the GPIO chip 4.
Step S12, chromacoder 5 judges whether that according to the type of the serial bus interface 6 that is connected with embedded system board 7 needs carry out reading signal conversion with described.Particularly, if servicing unit 1 is to be connected by USB interface or UART interface with embedded system test board 7, then need the described signal that reads to be carried out conversion of signals by chromacoder 5, if servicing unit 1 is to be connected by I2C interface or SMBUS interface with embedded system test board 7, then do not need the described signal that reads to be carried out conversion of signals by chromacoder 5.
Step S13, when not needing to carry out conversion of signals, the described signal that reads reads test parameter on the GPIO chip 4, and embedded system test board 7 begins test.
Step S14 writes GPIO chip 4 with the test result of embedded system test board 7 by serial bus interface 6.
Step S15, display device 2 is come out the test result instant playback on the GPIO chip 4.Particularly, the information that display device 2 shows all is the indications corresponding with test result information, and for example, if test is passed through, then displaying symbol " FF " if test is not passed through, then shows " FE ".
In step S12, when needs carried out conversion of signals, in step S16, chromacoder 5 became form on the GPIO chip 4 reading the test parameter on the GPIO chip 4 the described conversion of signals that reads, and embedded system test board 7 begins test.
Step S17, the test result of embedded system test board converts form on the GPIO chip 4 to by chromacoder 5, and it is write on the GPIO chip 4, forwards step S15 afterwards to.
The servicing unit of embedded system test of the present invention and method utilize the writing station device, GPIO chip, chromacoder and the serial bus interface that connect successively on the servicing unit to obtain the test result of embedded system test board, test result is changed into form corresponding on the GPIO chip, and will on display device, show with different indications through the test result after the format conversion, the user can draw test result by the indications that shows.
It should be noted last that, above embodiment is only unrestricted in order to technical scheme of the present invention to be described, although the present invention is had been described in detail with reference to above preferred embodiment, those of ordinary skill in the art is to be understood that, can make amendment or be equal to replacement technical scheme of the present invention, and not break away from the spirit and scope of technical solution of the present invention.
Claims (6)
1. the servicing unit of an embedded system test, this servicing unit links to each other with the embedded system test board, this embedded system test board is used to test the function of various embedded systems, it is characterized in that, described servicing unit comprises writing station, general I/O chip, chromacoder and the serial bus interface that connects successively, described general I/O chip also is connected with display device, wherein:
The said write device is used for test parameter is write general I/O chip, and described test parameter is made up of indications;
Described general I/O chip is used to preserve above-mentioned test parameter;
Described serial bus interface is used for auxiliary connecting device and embedded system test board;
Described chromacoder is used for becoming form on the general I/O chip according to the dissimilar conversion of signals that read that the embedded system test board is sent of serial bus interface, and read above-mentioned test parameter so that embedded system is tested, and convert test result on the general I/O chip form according to the signal that reads after the format conversion;
Described general I/O chip also is used to preserve test result; And
Described display device is used for the indications of the test parameter correspondence on the general I/O chip of instant playback and shows above-mentioned test result by different indications.
2. the servicing unit of embedded system test as claimed in claim 1 is characterized in that, described serial bus interface is that USB (universal serial bus), internal integrate circuit bus, System Management Bus interface or universal asynchronous acceptance send serial line interface.
3. the servicing unit of embedded system test as claimed in claim 1 is characterized in that, described test parameter comprises the detailed programs of test.
4. a method of utilizing the auxiliary embedded system test of the described servicing unit of claim 1 is characterized in that this method comprises the steps:
Writing station writes test parameter in the general I/O chip, and described test parameter is made up of indications;
The embedded system test board sends the signal that reads that reads test parameter on the general I/O chip;
Type according to the serial bus interface that is connected with the embedded system test board judges whether that needs carry out conversion of signals;
When not needing to carry out conversion of signals, described embedded system test board reads the test parameter on the general I/O chip, begins test, and the test result with the embedded system test board writes general I/O chip by serial bus interface then;
When needs carry out conversion of signals, chromacoder becomes form on the general I/O chip to read the test parameter on the general I/O chip the described conversion of signals that reads, the embedded system test board begins test, chromacoder converts the test result of embedded system test board on the general I/O chip form then, and it is write on the general I/O chip; And
Display device is come out test parameter on the general I/O chip and test result by different indications instant playbacks.
5. embedded system test method as claimed in claim 4 is characterized in that, described serial bus interface is that USB (universal serial bus), internal integrate circuit bus, System Management Bus interface or universal asynchronous acceptance send serial line interface.
6. the method for embedded system test as claimed in claim 4 is characterized in that, described test parameter comprises the detailed programs of test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007102028054A CN101452415B (en) | 2007-11-30 | 2007-11-30 | Auxiliary device and method for testing embedded system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007102028054A CN101452415B (en) | 2007-11-30 | 2007-11-30 | Auxiliary device and method for testing embedded system |
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| Publication Number | Publication Date |
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| CN101452415A CN101452415A (en) | 2009-06-10 |
| CN101452415B true CN101452415B (en) | 2011-05-04 |
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| CN2007102028054A Expired - Fee Related CN101452415B (en) | 2007-11-30 | 2007-11-30 | Auxiliary device and method for testing embedded system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102508750A (en) * | 2011-10-27 | 2012-06-20 | 青岛海信信芯科技有限公司 | Device and method for detecting internal modules of SOC (system-on-chip) |
| CN103542865B (en) * | 2013-08-23 | 2016-09-07 | 航天科工惯性技术有限公司 | Investigating method and device |
| CN109446131A (en) * | 2018-11-08 | 2019-03-08 | 郑州云海信息技术有限公司 | Information transferring method and system |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1359492A (en) * | 1999-01-21 | 2002-07-17 | 毕事快公司 | System and method for testing and validating devices having an embedded operating system |
| EP1522864A2 (en) * | 2003-10-08 | 2005-04-13 | Samsung Electronics Co., Ltd. | Apparatus measuring system-on-a chip efficiency and method thereof |
| CN1203359C (en) * | 2002-11-12 | 2005-05-25 | 统宝光电股份有限公司 | flat panel display |
| CN1740984A (en) * | 2004-08-25 | 2006-03-01 | 鸿富锦精密工业（深圳）有限公司 | The serial high-order hard disk structure interface device for testing functions of motherboard |
| CN101030160A (en) * | 2006-03-02 | 2007-09-05 | 鸿富锦精密工业（深圳）有限公司 | Tester and method for testing unified series interface command |
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- 2007-11-30 CN CN2007102028054A patent/CN101452415B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1359492A (en) * | 1999-01-21 | 2002-07-17 | 毕事快公司 | System and method for testing and validating devices having an embedded operating system |
| CN1203359C (en) * | 2002-11-12 | 2005-05-25 | 统宝光电股份有限公司 | flat panel display |
| EP1522864A2 (en) * | 2003-10-08 | 2005-04-13 | Samsung Electronics Co., Ltd. | Apparatus measuring system-on-a chip efficiency and method thereof |
| CN1740984A (en) * | 2004-08-25 | 2006-03-01 | 鸿富锦精密工业（深圳）有限公司 | The serial high-order hard disk structure interface device for testing functions of motherboard |
| CN101030160A (en) * | 2006-03-02 | 2007-09-05 | 鸿富锦精密工业（深圳）有限公司 | Tester and method for testing unified series interface command |
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| CN101452415A (en) | 2009-06-10 |
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