CN101351008B - Method for debugging a test platform and system for testing handhold set thereof - Google Patents
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Abstract
The invention relates to a debugging method for a testing platform and a handheld device testing system thereof. The invention is used to debug the instruction set of the flow process of a testing tube in the testing platform. The debugging method of the testing platform comprises: founding an instruction set in the first computer database of the testing platform; setting the same instruction set in the testing tube flow process of the first computer or a second computer; comparing the two instruction sets to get a comparison result and to judge the correctness of the instruction set. The handheld device testing system includes a plurality of test lines, the first computer and a plurality of second computers which respectively control each test line and are controlled by the first computer. The first computer compares the instruction set in the first computer database with the instruction set in the tube process or in the second computer programs to form a comparison result. If the comparison results are same, the flow process exists in the second computers to be tested later. The invention can avoid mistake possibilities generated by the manual set of the instruction set, which reduces testing time and satisfies the requirement of multifunctional test.
Description
Technical field
The present invention relates to a kind of method that is applicable to the debug of test platform, particularly relate to a kind of hand-held device test platform that is applicable to, can avoid in the computer instruction set possibility that makes a mistake, more can alleviate the burden of instruction set in the testing setup control test platform computer, and can reduce the whole test process required time, also can satisfy debug method and the system for testing handhold thereof of mobile phone test to multiple functional test requirement.
Background technology
At present, fast development along with integrated circuit technique and wide frequency technology, the mobile phone industry is from being the 2G/2.5G of representative with global system for mobile communications (GSM), code division multiple access (CDMA), person-to-person communication service (PCS) and general packet radio service (GPRS), to shifting, and be subjected to the powerful driving of many mobile wideband applied business such as Mobile business, global location service, mobile electron paying, portable medical based on the 3G Wi-Fi wide frequency technology, that merge voice, data and video image.Yet, at the mobile phone market that technology becomes increasingly complex, profit is more and more thinner, test must could guarantee fast, flexibly and effectively that production line reaches the output of keeping profit, the tester that has advanced software and hardware and different test patterns by employing, can realize measuring quickly and accurately to various mobile phones, thereby can guarantee the quality that the 3G product is required.
Along with chip for cell phone (wafer) degree of integration is more and more higher, mobile phone (is being a module along module just, below all being called module) more and more littler, the increasing direction of function develops, the test event of mobile phone is also more and more, for example in the test of 3G mobile, need comprise functional test, agreement compatibility test, usability testing, Interoperability Testing ... or the like at least 10 main tests, this does not comprise the sub-test event in each main test event as yet.In brief, want the quality of guaranteeing that mobile phone products is required, simply by/it is not enough that failure is measured, unless want to emit the risk that loses the client.Any mistake that may influence element must carefully detect in mobile phone manufacturer in manufacture process.
In addition, for making the dealer of mobile phone, have diversified product and layout to go out a complete product line be considerable.Test between the mobile phone of different model, or identical test event arranged, or different test events arranged, in view of the above, how to integrate and dispose a cover test macro in order to satisfy the test request of mobile phone test, should to think better of, go to satisfy management and control the mobile phone testing equipment to multiple function, how to select testing tool software and java standard library, with the needs that adapt to future development or the like problem.
At present, existing automatic flow control-management system at single mobile phone products test, (program is a formula will to test the keyholed back plate process program the software engineer, this paper all is called program) exploitation finish after, the Test Engineer need be mounted to test keyholed back plate process program in the control computer (computer is a computer, and this paper all is called computer) of each bar detection line.Then, the Test Engineer must set each parameter of test keyholed back plate process program in each control computer, guaranteeing that tested mobile phone can be admitted to the test that difference in functionality is carried out in each testing station in regular turn according to certain flow process, or can skip the testing station that some need not be tested.Thus, the automatic flow control-management system can make the efficient of test significantly promote, and then can shorten the testing time and improve the tester table configuration flexibility.
Yet, when the Test Engineer tests the parameter of keyholed back plate process program in setting each control computer, if set wrong but do not know, when mobile phone entered the testing station and need carry out the test of A item, test keyholed back plate process program to server but went to grasp the test data of B item and mistake occurs.In this case, the lighter's whole piece p-wire is shut down, and weight person then p-wire does not shut down and proceeds, but wrong test parameter can't effectively filter out defective products, to reach the purpose of test.Moreover the Test Engineer needs to set one by one the parameter in the control computer, and is so not only time-consuming, and more can increase the possibility of setting mistake.
This shows that the debug method of above-mentioned existing test platform and system for testing handhold thereof on the structure and use of method, system, obviously still have inconvenience and defective, and demand urgently further being improved.For solving the problem of above-mentioned existence, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but do not see always that for a long time suitable design finished by development, and the debug method of general test platform and system for testing handhold thereof do not have appropriate method and system to address the above problem, and this obviously is the problem that the anxious desire of relevant dealer solves.Therefore how to found a kind of debug method and system for testing handhold thereof of new test platform, real one of the current important research and development problem that belongs to, also becoming the current industry utmost point needs improved target.
Because the defective that the debug method of above-mentioned existing test platform and system for testing handhold thereof exist, the inventor is based on being engaged in this type of product design manufacturing abundant for many years practical experience and professional knowledge, and the utilization of cooperation scientific principle, actively studied innovation, in the hope of founding a kind of debug method and system for testing handhold thereof of new test platform, can improve the debug method and the system for testing handhold thereof of general existing test platform, make it have more practicality.Through constantly research, design, and after studying repeatedly and improving, create the present invention who has practical value finally.
Summary of the invention
The objective of the invention is to, overcome the defective of the debug method existence of existing test platform, and a kind of debug method of the new test platform that is applicable to test platform is provided, the possibility that technical problem to be solved makes a mistake when being the instruction set that makes in its control computer that can effectively avoid manually setting test platform, make it can alleviate the burden that the Test Engineer sets the instruction set in the computer of controlling test platform, and then can reduce the required time of whole test process, be very suitable for practicality.
A further object of the present invention is, the system for testing handhold of the debug method of the above-mentioned test platform of a kind of the present invention of being applicable to is provided, technical problem to be solved is to make its system for testing handhold that provides send message notice, factory's information system (Factory Information System, FIS) download required data information in the server, test the keyholed back plate a plurality of testing stations of process program management and control and can satisfy the test request of mobile phone test, thereby be suitable for practicality more multiple function.
The object of the invention to solve the technical problems realizes by the following technical solutions.A kind of debug method of guaranteeing the test platform of test platform correctness according to the present invention's proposition, this test platform comprises one first computer and plural platform second computer, and this method may further comprise the steps: provide a test keyholed back plate process program on this first computer; Download in this test keyholed back plate process program respectively this second computer to a plurality of detection lines; One instruction of setting up this test keyholed back plate process program combines in the data bank of this first computer; And when this instruction combine in set in this test keyholed back plate process program of this second computer finish after, this instruction set in the test keyholed back plate process program of this instruction set in this data bank of comparing and this second computer is to produce a comparison result; Wherein, when this comparison result when being identical, with this instruction set in the data bank of this first computer is downloaded to this test keyholed back plate process program in other those second computer.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
The debug method of aforesaid test platform, when wherein said comparison result was inequality, this test platform can send message notice.
The debug method of aforesaid test platform, wherein said instruction set comprise the required data information of download in this first computer.
The debug method of aforesaid test platform, a plurality of testing stations of wherein said test keyholed back plate process program management and control.
The debug method of aforesaid test platform, wherein said instruction set comprises data information required when respectively this testing station is tested.
The object of the invention to solve the technical problems also realizes by the following technical solutions.According to a kind of system for testing handhold that the present invention proposes, it comprises at least: a plurality of p-wires; One first computer; And plural platform second computer, each this second computer is controlled each those p-wire respectively and is subjected to this first computer control; Wherein this instruction set that will build on the test keyholed back plate process program in the data bank of this first computer is compared with this instruction set that setting in this test keyholed back plate process program of those second computers is finished, and produces a comparison result; When comparison result when being identical, this test keyholed back plate process program of this instruction set of having set will be present in those second computers to carry out follow-up testing procedure.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid system for testing handhold, when wherein said comparison result was inequality, this system for testing handhold can send message notice.
Aforesaid system for testing handhold, wherein said instruction set comprise the required data information of download in this first computer.
Aforesaid system for testing handhold, a plurality of testing stations of wherein said test keyholed back plate process program management and control.
Aforesaid system for testing handhold, wherein said instruction set comprises data information required when respectively this testing station is tested.
The present invention compared with prior art has tangible advantage and beneficial effect.By above technical scheme as can be known, major technique of the present invention thes contents are as follows:
For achieving the above object, the invention provides a kind of debug method of test platform of test platform program parameter, this method comprises the following step: at first, to be stated from the server on the test keyholed back plate process program, and in the data bank of server, set up test keyholed back plate process program required instruction set in this test.Then, download test keyholed back plate process program to the control computer of a plurality of detection lines, at last, required instruction set in this test is imported in each control computer one by one, and will control instruction set in the computer and the instruction set in the server is compared, when both are identical, then begin to test; When both are inequality, inspect in the control computer again and the instruction set in the server data bank.The disclosed method of the present invention, the correctness of the instruction set that can guarantee to control in the computer and set up.
In addition, for achieving the above object, the present invention provides a kind of debug method of test platform of test platform program parameter in addition, this method comprises the following step: at first, to be stated from the server on the test keyholed back plate process program, and in the data bank of server, set up test keyholed back plate process program required instruction set in this test.Then, required instruction set in this test is input into test keyholed back plate process program in the server once more, and instruction set in the comparison data bank and the interior instruction set of test keyholed back plate process program, when both are identical, download test keyholed back plate process program and to the control computer of a plurality of detection lines, then begin to test; When both are inequality, inspect in the test keyholed back plate process program again and the instruction set in the server data bank.The disclosed method of the present invention, not only can guarantee to control the correctness of controlling the instruction set of testing process in the computer according to this, again because the control computer is downloaded test keyholed back plate process program by server, this time test required parameter to comprise, set up the needed time of instruction set so can significantly reduce at the control computer.
By technique scheme, the debug method of test platform of the present invention and system for testing handhold thereof have following advantage and beneficial effect at least:
1, the debug method of guaranteeing the test platform of test platform correctness of the present invention, overcome the defective of the debug method existence of existing test platform, a kind of debug method of the test platform that is applicable to test platform newly is provided, the possibility that makes a mistake in the time of can effectively avoiding manually setting the instruction set in the control computer of test platform, more can alleviate the burden that the Test Engineer sets the instruction set in the computer of controlling test platform, and then can reduce the required time of whole test process, be very suitable for practicality.
2, system for testing handhold of the present invention, by sending message notice, factory's information system (Factory Information System, FIS) download required data information in the server, the a plurality of testing stations of test keyholed back plate process program management and control, and can satisfy the test request of mobile phone test to multiple function, be very suitable for practicality.
In sum, the invention relates to a kind of debug method and system for testing handhold thereof of test platform, in order to instruction set debug to the test keyholed back plate process program in the test platform.This method is to set up an instruction set in the data bank of first computer of test platform, and then the test keyholed back plate process program in first computer or second computer is set same instruction set.Compare two groups of instruction set that are positioned at diverse location to obtain a comparison result, use the correctness of the instruction set that judgement sets up, and can reduce the required time of whole test process.System for testing handhold of the present invention can satisfy the test request of mobile phone test to multiple function.The present invention has above-mentioned plurality of advantages and practical value, no matter it all has bigger improvement on the structure of method, system or function, obvious improvement is arranged technically, and produced handy and practical effect, and the debug method of more existing test platform and system for testing handhold thereof have the outstanding effect of enhancement, thereby being suitable for practicality more, really is a new and innovative, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of specification, and for above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, below especially exemplified by preferred embodiment, and conjunction with figs., be described in detail as follows.
Description of drawings
Fig. 1 is the structural representation of the system for testing handhold of the debug method that is applicable to test platform provided by the invention of the present invention.
Fig. 2 is the flow chart according to debug method first preferred embodiment of test platform of the present invention.
Fig. 3 is the flow chart according to debug method second preferred embodiment of test platform of the present invention.
Step 100: the exploitation of test keyholed back plate process program is finished
Step 102: will test the keyholed back plate process program and be uploaded to the FIS server
Step 104: the parameter group of institute's correspondence is built in the FIS server
Step 106: will test the keyholed back plate process program and be downloaded in the control computer from the FIS server
Step 108: the parameter group of institute's correspondence is built in the control computer
Whether step 110: it is identical to compare two parameter group?
Step 112: carry out test jobs
Step 114: the message of sending " mistake "
Step 200: the exploitation of test keyholed back plate process program is finished
Step 202: the parameter group of institute's correspondence is built in the FIS server
Step 204: the parameter group with institute's correspondence builds in the FIS server again
Whether step 208: it is identical to compare two parameter group?
Step 210: will test keyholed back plate process program and parameter group and be downloaded in the control computer from the FIS server
Step 212: carry out test jobs
Step 214: the message of sending " mistake "
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, debug method and its embodiment of system for testing handhold, method, step, structure, feature and the effect thereof of the test platform that foundation the present invention is proposed, describe in detail as after.
In order to make technical scheme of the present invention and technical characterictic more clear, below will disclose various embodiment of the present invention, the execution mode of various features for example, and described particular element with only arrange to simplifying this explanation, be not in order to limit the present invention.In addition, the present invention can reuse reference number and literal in various embodiments, and the purpose of repetition is to simplify and clearly demonstrate, and is not in order to specify the relation between various embodiment and/or the described structure.
Seeing also shown in Figure 1ly, is the structural representation of the system for testing handhold of the debug method that is applicable to test platform provided by the invention of the present invention.The system for testing handhold 10 of preferred embodiment of the present invention comprises first computer (being computer) 20 and a plurality of second computer 30.Each second computer 30 is connected with first computer 20 and controls a hand-held device p-wire.First computer 20 can be a server (Server), in the present embodiment, particularly can be factory's information (being data message) system (Factory Information System, FIS) server.Second computer 30 is the control computer.
Seeing also shown in Figure 2ly, is the flow chart according to debug method first preferred embodiment of test platform of the present invention.The debug method of the test platform of the present invention's first preferred embodiment may further comprise the steps:
At first, carry out step 100, the software engineer goes out to test the keyholed back plate process program according to the Planning and Development of each testing station in the whole piece standard testing line;
Then, carry out step 102, will test the keyholed back plate process program by software engineer or Test Engineer and be uploaded to first computer 20.
Because the exploitation of test keyholed back plate process program is not at single product, so, the testing process that tested different hand-held device is carried out in the standard testing line on the p-wire is not necessarily not identical with the station, for example, the hand-held device of no Bluetooth function can be skipped the testing station of bluetooth module (module).In test keyholed back plate process program, set up different instruction set at the test meeting of different hand-held devices.The content of instruction set comprises the testing station of the tested needed test of hand-held device and skips the testing station of the test of needs.
Then, carry out step 104, the Test Engineer is according to this tested hand-held device, a mobile phone for example, plan the program of whole test, and will build in data (the being data) storehouse of factory's information system (FIS) server in pairing instruction set input factory's information system (FIS) server and with it.In addition, instruction set more comprises data information required when tested hand-held device is tested in each testing station or should download required data information or the like in factory's information system (FIS) server.
Then, carry out step 106, the Test Engineer will test the keyholed back plate process program and be downloaded in pairing second computer 30 of each p-wire from factory's information system (FIS) server, this second computer 30 can be personal computer, and the purpose of second computer 30 is the control computers as a p-wire.
Then, proceed step 108, the Test Engineer selects a control computer more required instruction set to be re-set among the test keyholed back plate process program of control computer;
Then, carry out step 110, in step 110, the instruction set in the instruction set in the comparison server data bank and the test keyholed back plate process program of control computer, whether compare two parameter group identical.
In theory, instruction set data in the server data bank need be identical with the instruction set data in the control computer, certainly, if both are identical, then enter step 112, instruction set in the server data bank is downloaded among the test keyholed back plate process program of other second computers, enters step 114 again, carry out test jobs;
If there is any difference between the two, carry out step 116, system can send the message of " mistake " and notify the Test Engineer, this moment, the Test Engineer must inspect in data (data) storehouse and the instruction set in the control computer again, after being revised to locate errors, then can proceed to detect operation.
In the present embodiment, the above-mentioned step 104 and the order of step 106 can be exchanged.
Seeing also shown in Figure 3ly, is the flow chart according to debug method second preferred embodiment of test platform of the present invention.The debug method of the test platform of the present invention's second preferred embodiment, two embodiment are the same in the connection of hardware in principle, and as shown in Figure 3, it may further comprise the steps:
At first, carry out step 200, the software engineer goes out according to the Planning and Development of each testing station in the whole piece standard testing line and finishes test keyholed back plate process program.
Then, carry out step 202, will test the keyholed back plate process program by software engineer or Test Engineer and be uploaded in one first computer, be about to test the keyholed back plate process program and be uploaded in the information system FIS of the factory server.
Because the exploitation of test keyholed back plate process program is not at single product, so, the testing process that tested different hand-held device is carried out in the standard testing line on the p-wire is not necessarily not identical with the station, and for example, the hand-held device of no Bluetooth function can be skipped the testing station of bluetooth module.In test keyholed back plate process program, set up different instruction set at the test meeting of different hand-held devices.The content of instruction set comprises the testing station of the tested needed test of hand-held device and skips the testing station of the test of needs.
Then, carry out step 204, the Test Engineer is according to this tested hand-held device, for example a mobile phone, plan the program of whole test, and will build in the data bank of factory's information system (FIS) server in pairing instruction set input factory's information system (FIS) server and with it.Because tested hand-held device need not carry out the test of all testing stations in the whole piece standard testing line, so the content of instruction set comprises the testing station of the tested needed test of hand-held device and skips the testing station of the test of needs.In addition, instruction set more comprises data information required when tested hand-held device is tested in each testing station or should download required data information or the like in factory's information system (FIS) server.
Then, carry out step 206, the Test Engineer is set in test keyholed back plate process program in factory's information system (FIS) server with required instruction set.The instruction set that instruction set that step 204 is set up and step 206 set can be stored in the diverse location of factory's information system (FIS) server.
Then, carry out step 208, two instruction set of successively setting up in the comparison server, whether promptly compare two parameter group identical.
In theory, in step 204 and step 206 the instruction set set up respectively should be identical, certainly, if both are identical, then enter step 210, the test keyholed back plate process program that configures instruction set is downloaded in each control computer, and carry out test jobs in step 212; If there is any difference between the two, then carry out step 214, system can send the message of " mistake " and notify the Test Engineer, this moment, the Test Engineer must inspect in data bank and the instruction set in the test keyholed back plate process program in the control computer again, after being revised to locate errors, then can proceed to detect operation.
In the present embodiment, step 210 will test the keyholed back plate process program from factory's information system (FIS) server be downloaded to control computer action after step 202, all can carry out at any time.
Because the diversification of hand-held device function and complicated, test that also phase shape is more complicated, the test parameter in test process is also more, and the possibility that the Test Engineer makes a mistake when the control computer of p-wire is set up instruction set is also higher.In view of the above, the present invention is used in the same computer or carries out in the various computing machine instruction set of being set up being compared after the above instruction set of twice or twice sets up again.The content of instruction set is not only to be simple numerical, because the complexity of instruction set, the Test Engineer is between the instruction set of front and back foundation, and the chance that can occur identical mistake at same place is very little.In view of the above, the Test Engineer need not set up instruction set on the control computer of each bar p-wire, and must emit fallible danger.The Test Engineer only needs the debug method by the disclosed test platform of the present invention, after confirming that instruction set is errorless, the test keyholed back plate process program that configures instruction set is downloaded in the data bank of factory's information system (FIS) server in each control computer.Thus, not only can significantly reduce fallible probability when setting up instruction set, more can significantly reduce the Test Engineer and in the control computer, set up the needed time of instruction set, be very suitable for practicality.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the technology contents that can utilize above-mentioned announcement is made a little change or is modified to the equivalent embodiment of equivalent variations, in every case be not break away from the technical solution of the present invention content, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (10)
1. debug method of guaranteeing the test platform of test platform correctness, this test platform comprises one first computer and plural platform second computer, it is characterized in that this method may further comprise the steps:
Provide a test keyholed back plate process program on this first computer;
Download in this test keyholed back plate process program respectively this second computer to a plurality of detection lines;
One instruction of setting up this test keyholed back plate process program combines in the data bank of this first computer; And
When this instruction combine in set in this test keyholed back plate process program of at least one second computer finish after, this instruction set in the test keyholed back plate process program of this instruction set in this data bank of comparing and this at least one second computer is to produce a comparison result;
Wherein, when this comparison result when being identical, with this instruction set in the data bank of this first computer is downloaded to except that this this test keyholed back plate process program in other second computers at least one second computer.
2. the debug method of test platform according to claim 1, when it is characterized in that wherein said comparison result is inequality, this test platform can send message notice.
3. the debug method of test platform according to claim 1 is characterized in that wherein said instruction set comprises the required data information of download in this first computer.
4. the debug method of test platform according to claim 1 is characterized in that a plurality of testing stations of wherein said test keyholed back plate process program management and control.
5. the debug method of test platform according to claim 4 is characterized in that wherein said instruction set comprises data information required when respectively this testing station is tested.
6. system for testing handhold is characterized in that it comprises at least:
A plurality of p-wires;
One first computer; And
Plural number platform second computer, each this second computer is controlled each those p-wire respectively and is subjected to this first computer control;
One instruction set that wherein will build on the test keyholed back plate process program in the data bank of this first computer is compared with this instruction set that setting in this test keyholed back plate process program of those second computers is finished, and produces a comparison result; When comparison result when being identical, this test keyholed back plate process program of this instruction set of having set will be present in those second computers to carry out follow-up testing procedure.
7. system for testing handhold according to claim 6, when it is characterized in that wherein said comparison result is inequality, this system for testing handhold can send message notice.
8. system for testing handhold according to claim 6 is characterized in that wherein said instruction set comprises the required data information of download in this first computer.
9. system for testing handhold according to claim 6 is characterized in that a plurality of testing stations of wherein said test keyholed back plate process program management and control.
10. system for testing handhold according to claim 9 is characterized in that wherein said instruction set comprises data information required when respectively this testing station is tested.
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| CN2007100441042A CN101351008B (en) | 2007-07-20 | 2007-07-20 | Method for debugging a test platform and system for testing handhold set thereof |
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| CN2007100441042A CN101351008B (en) | 2007-07-20 | 2007-07-20 | Method for debugging a test platform and system for testing handhold set thereof |
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| CN101351008B true CN101351008B (en) | 2011-12-28 |
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| CN1932776A (en) * | 2006-09-29 | 2007-03-21 | 上海科泰世纪科技有限公司 | Automatic operating method for interface test in embedded operating system |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1179253A (en) * | 1995-01-30 | 1998-04-15 | 艾利森电话股份有限公司 | Load software into field test equipment |
| CN1325067A (en) * | 2000-05-19 | 2001-12-05 | 英业达股份有限公司 | Method for automatically testing personal computer memory card international association cards |
| CN1932776A (en) * | 2006-09-29 | 2007-03-21 | 上海科泰世纪科技有限公司 | Automatic operating method for interface test in embedded operating system |
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