CN101217134A - Substrate structure of ball grid array package and ball mounting method thereof - Google Patents
Substrate structure of ball grid array package and ball mounting method thereof Download PDFInfo
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- CN101217134A CN101217134A CN 200710001410 CN200710001410A CN101217134A CN 101217134 A CN101217134 A CN 101217134A CN 200710001410 CN200710001410 CN 200710001410 CN 200710001410 A CN200710001410 A CN 200710001410A CN 101217134 A CN101217134 A CN 101217134A
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- 239000000758 substrate Substances 0.000 title claims abstract description 68
- 238000000034 method Methods 0.000 title claims abstract description 25
- 229910000679 solder Inorganic materials 0.000 claims abstract description 84
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 29
- 238000004806 packaging method and process Methods 0.000 claims abstract description 27
- 239000010949 copper Substances 0.000 claims abstract description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 9
- 229910052802 copper Inorganic materials 0.000 claims abstract description 9
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 39
- 229910052759 nickel Inorganic materials 0.000 claims description 19
- 239000010931 gold Substances 0.000 claims description 17
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 16
- 229910052737 gold Inorganic materials 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 11
- 239000003822 epoxy resin Substances 0.000 claims description 3
- 229920000647 polyepoxide Polymers 0.000 claims description 3
- 239000000835 fiber Substances 0.000 claims 2
- 229920003229 poly(methyl methacrylate) Polymers 0.000 claims 2
- 239000004926 polymethyl methacrylate Substances 0.000 claims 2
- 239000000843 powder Substances 0.000 claims 2
- 239000004744 fabric Substances 0.000 claims 1
- 230000004907 flux Effects 0.000 abstract description 11
- 230000003647 oxidation Effects 0.000 abstract description 4
- 238000007254 oxidation reaction Methods 0.000 abstract description 4
- 239000011248 coating agent Substances 0.000 abstract description 3
- 238000000576 coating method Methods 0.000 abstract description 3
- 238000005336 cracking Methods 0.000 abstract description 3
- 230000005012 migration Effects 0.000 abstract description 3
- 238000013508 migration Methods 0.000 abstract description 3
- 238000005476 soldering Methods 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 4
- 238000003466 welding Methods 0.000 description 4
- PXHVJJICTQNCMI-BJUDXGSMSA-N nickel-58 Chemical compound [58Ni] PXHVJJICTQNCMI-BJUDXGSMSA-N 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 239000003063 flame retardant Substances 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 229910000765 intermetallic Inorganic materials 0.000 description 2
- 238000012536 packaging technology Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 239000003755 preservative agent Substances 0.000 description 1
- 230000002335 preservative effect Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
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- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
Description
技术领域 technical field
本发明涉及一种基板结构及其植球方法,特别是关于一种应用于球栅阵列封装的基板结构及其植球方法。The invention relates to a substrate structure and a ball planting method thereof, in particular to a substrate structure applied to ball grid array packaging and a ball planting method thereof.
背景技术 Background technique
近年来,随着终端消费性电子产品朝向“轻、薄、短、小”及多功能化发展的趋势,集成电路(Integrated Circuit,IC)的芯片(chip)构装技术亦朝向高密度化、小型化、高脚数化的方向前进,为了实现小型化与窄脚距的封装、以及改善散热等问题,目前球栅阵列封装结构(BallGrid Array,BGA)、覆晶(Flip Chip)、芯片尺寸封装(Chip Scale Package,CSP)等先进构装技术已成为主流,其中的球栅阵列封装相较于打线封装,具有信号传输延迟小、应用频率高、散热能力强及封装体积小等优点,所以广泛应用于各种不同型式的封装结构,包括:窗型球栅阵列封装结构、细间距球栅阵列(Fine pitch BGA,FBGA)封装结构、超细间距球栅阵列(Very Fine pitch BGA,VFBGA)封装结构、微型球栅阵列(micro BGA,μBGA)封装结构及叠置式多芯片球栅阵列(Stacked-typeMulti-Chip Package BGA,St-MCP BGA)封装结构等。In recent years, with the development trend of terminal consumer electronic products towards "light, thin, short, small" and multi-functionality, the chip (chip) packaging technology of integrated circuits (Integrated Circuit, IC) is also moving towards high density, The direction of miniaturization and high pin count is advancing. In order to achieve miniaturization and narrow pitch packaging and improve heat dissipation, the current ball grid array packaging structure (BallGrid Array, BGA), flip chip (Flip Chip), chip size Advanced packaging technologies such as Chip Scale Package (CSP) have become the mainstream. Compared with wire bonding packaging, ball grid array packaging has the advantages of small signal transmission delay, high application frequency, strong heat dissipation capability and small packaging volume. Therefore, it is widely used in various types of packaging structures, including: window ball grid array packaging structure, fine pitch BGA (FBGA) packaging structure, ultra-fine pitch ball grid array (Very Fine pitch BGA, VFBGA) ) packaging structure, micro BGA (micro BGA, μBGA) packaging structure and stacked-type Multi-Chip Package BGA (Stacked-type Multi-Chip Package BGA, St-MCP BGA) packaging structure, etc.
因此,高密度芯片构装需要高密度、高品质与低成本的芯片封装基板(substrate)予以配合。Therefore, high-density chip assembly requires a high-density, high-quality, and low-cost chip packaging substrate to cooperate.
图1是一现有球栅阵列封装基板的剖面示意图,一基板2具有一第一表面6与一第二表面10,且基板2内部具有一布线(trace)4,其材质为铜(Cu),其中,第一表面6具有暴露出部分布线4的多个第一凹槽;多个焊球垫(solder ball pad)8设于第一凹槽并暴露出第一表面6,其中,焊球垫8与布线4电性连接,任一焊球垫8为一有机可焊性保护垫(Organic Solderability Preservative,OSP),其用以电性连接多个焊球(solder ball)(图中未示),焊球作为输入/输出(Input/Output,I/O)端,使基板2得以电性连接一外界装置(图中未示),例如以表面黏着技术(Surface Mount Technology,SMT)来完成球栅阵列封装结构与一印刷电路板(Printed Circuit Board,PCB)(图中未示)的构装及电性连接。FIG. 1 is a schematic cross-sectional view of a conventional ball grid array package substrate. A
接续上述说明,第二表面10具有暴露出部分布线4的多个第二凹槽,多个焊垫12设于第二凹槽并暴露出第二表面10,其中,焊垫12与布线4电性连接,任一焊垫12由一层镍(Ni)14及一层金(Au)16所组成,其中,镍14设于布线4表面,而金16设于镍14上;焊垫12用以电性连接多个焊线(bonding wire)(图中未示),焊线的功用是电性连接载设于封装结构中的一芯片(图中未示)与布线4,使芯片得以电性连接基板2,并因而得以电性连接一外界装置(图中未示),例如一印刷电路板(图中未示)。Continuing the above description, the
图2A至图2B是一现有球栅阵列封装的植球(ball mount)方法的步骤示意图,其步骤包含:提供一球栅阵列封装基板2,基板2具有一第一表面6,且第一表面6具有多个凹槽,基板2内部具有布线4,且凹槽暴露出部分布线4,多个焊球垫8设于凹槽并暴露出第一表面6,其中,焊球垫8与布线4电性连接,且焊球垫8为一有机可焊性保护垫;涂布一助焊剂(flux)18于焊球垫8表面;布植(mount)多个焊球20于助焊剂(flux)18上;以及回焊(reflow),使多个焊球20与布线4电性连接。2A to 2B are schematic diagrams of the steps of a conventional ball grid array package ball mount method, the steps include: providing a ball grid
然而,此种采用有机可焊性保护垫作为焊球垫的球栅阵列封装基板具有数项缺点,包括焊球垫下面的铜会发生铜氧化(Cu oxidation)现象以及发生焊球迁移(ball shifting)现象。However, the ball grid array package substrate using organic solderability protection pads as solder ball pads has several disadvantages, including Cu oxidation and ball shifting of copper under the solder ball pads. )Phenomenon.
图3是另一现有球栅阵列封装基板的剖面示意图,基板22具有第一表面26与第二表面34,且基板22内部具有一布线(trace)24,其材质为铜(Cu),其中,第一表面26具有暴露出部分布线24的多个第一凹槽;多个焊球垫28设于第一凹槽并暴露出第一表面26,其中,焊球垫28与布线24电性连接,任一焊球垫28由一层镍30及一层金32所组成,其中,镍30设于布线24表面,而金32设于镍30上,镍30/金32通常是由电镀(plating)或无电解镍含浸金(Electroless Nickel ImmersionGold,ENIG)等方法所制作;焊球垫28用以电性连接多个焊球(solderball)(图中未示),焊球作为输入/输出(Input/Output,I/O)端,使基板22得以电性连接一外界装置(图中未示)。3 is a schematic cross-sectional view of another conventional ball grid array package substrate. The
接续上述说明,第二表面34具有暴露出部分布线24的多个第二凹槽,多个焊垫36设于第二凹槽并暴露出第二表面34,其中,焊垫36与布线24电性连接,任一焊垫36由一层镍38及一层金40所组成,其中,镍38设于布线24表面,而金40设于镍38上;焊垫36用以电性连接多个焊线(bonding wire)(图中未示),焊线的功用是电性连接载设于封装结构中的一芯片(图中未示)与布线24,使芯片得以电性连接基板22,并因而得以电性连接一外界装置(图中未示),例如一印刷电路板(图中未示)。Continuing the above description, the
然而,此种采用一层镍及一层金作为焊球垫的球栅阵列封装基板的缺点是材料成本高,而且金属间化合物(Inter-Metallic Compound,IMC)上的焊球容易发生破裂(crack)现象。However, the disadvantage of this ball grid array package substrate using a layer of nickel and a layer of gold as solder ball pads is that the material cost is high, and the solder balls on the intermetallic compound (Inter-Metallic Compound, IMC) are prone to cracking (crack). )Phenomenon.
发明内容 Contents of the invention
为解决现有技术以有机可焊性保护垫作为焊球垫所产生的铜氧化与焊球迁移等问题,本发明目的之一是提出一种采用锡/有机可焊性保护垫作为焊球垫的基板结构及其植球方法。In order to solve the problems such as copper oxidation and solder ball migration produced by using organic solderability protection pads as solder ball pads in the prior art, one of the purposes of the present invention is to propose a method that uses tin/organic solderability protection pads as solder ball pads. substrate structure and its ball planting method.
为解决现有技术的金/镍焊球垫所产生的焊球破裂等问题,本发明目的之一是提出一种采用锡/有机可焊性保护垫作为焊球垫的基板结构及其植球方法。In order to solve problems such as solder ball ruptures produced by gold/nickel solder ball pads in the prior art, one of the objectives of the present invention is to propose a substrate structure and its ball planting using tin/organic solderability protection pads as solder ball pads method.
为了达到上述目的,本发明提供一种球栅阵列封装基板结构,包括:一基板,其具有一表面,且表面具有多个凹槽;一布线,其设于基板内部,其中,凹槽暴露出部分布线;及多个焊球垫,其设于凹槽并暴露出表面,其中,焊球垫与布线电性连接,任一焊球垫包括:一层锡,其设于布线表面;及一层有机可焊性保护垫,其设于锡上。In order to achieve the above object, the present invention provides a ball grid array package substrate structure, comprising: a substrate having a surface with a plurality of grooves; a wiring, which is arranged inside the substrate, wherein the grooves are exposed Part of the wiring; and a plurality of solder ball pads, which are arranged in the groove and exposed on the surface, wherein the solder ball pads are electrically connected to the wiring, and any solder ball pad includes: a layer of tin, which is arranged on the surface of the wiring; and a A layer of organic solderability protection pad is provided on the tin.
为了达到上述目的,本发明还提供一种球栅阵列封装的植球方法,包括:提供一球栅阵列封装基板,其中,基板具有一表面,且表面具有多个凹槽,基板内部具有一布线,多个焊球垫设于凹槽并暴露出表面,其中,焊球垫与布线电性连接,且任一焊球垫由一层锡及一层有机可焊性保护垫组成,其中,锡设于布线表面,且有机可焊性保护垫设于锡上;涂布一助焊剂于焊球垫表面;布植多个焊球于助焊剂上;及回焊,使焊球与布线电性连接。In order to achieve the above object, the present invention also provides a ball-planting method for a ball grid array package, including: providing a ball grid array package substrate, wherein the substrate has a surface with a plurality of grooves, and the inside of the substrate has a wiring , a plurality of solder ball pads are arranged in the groove and expose the surface, wherein the solder ball pads are electrically connected to the wiring, and any solder ball pad is composed of a layer of tin and a layer of organic solderability protection pad, wherein the tin Provided on the surface of the wiring, and the organic solderability protection pad is provided on the tin; coating a flux on the surface of the solder ball pad; planting a plurality of solder balls on the flux; and reflowing, so that the solder ball and the wiring are electrically connected .
因此,本发明的采用锡/有机可焊性保护垫作为焊球垫的球栅阵列封装基板及其植球方法具有高品质与低成本等优点。Therefore, the ball grid array packaging substrate using the tin/organic solderability protection pad as the solder ball pad and the ball planting method of the present invention have the advantages of high quality and low cost.
下面通过具体实施例配合所附的图式详加说明,当更容易了解本发明的目的、技术内容、特点及其所达成的功效。In the following, detailed descriptions will be given through specific embodiments in conjunction with the accompanying drawings, so that it will be easier to understand the purpose, technical content, features and effects of the present invention.
附图说明 Description of drawings
图1是一现有球栅阵列封装基板的剖面示意图;1 is a schematic cross-sectional view of a conventional ball grid array package substrate;
图2A至图2C是一现有球栅阵列封装的植球方法的步骤示意图;2A to 2C are schematic diagrams of the steps of a ball planting method for a conventional ball grid array package;
图3是一现有球栅阵列封装基板的剖面示意图;3 is a schematic cross-sectional view of a conventional ball grid array package substrate;
图4是本发明一实施例的球栅阵列封装基板的剖面示意图;4 is a schematic cross-sectional view of a ball grid array package substrate according to an embodiment of the present invention;
图5A至图5C是本发明一实施例的球栅阵列封装的植球方法步骤示意图。FIG. 5A to FIG. 5C are schematic diagrams of steps of a ball planting method for a ball grid array package according to an embodiment of the present invention.
图中符号说明Explanation of symbols in the figure
2、22、42 基板2, 22, 42 Substrate
4、24、44 布线4, 24, 44 Wiring
6、26、46 第一表面6, 26, 46 The first surface
8、28、48 焊球垫8, 28, 48 solder ball pads
10、34、54 第二表面10, 34, 54 Second surface
12、36、56 焊垫12, 36, 56 solder pads
14、30、38、58 镍14, 30, 38, 58 nickel
16、32、40、60 金16, 32, 40, 60 Gold
18、48、62 助焊剂18, 48, 62 flux
20、64 焊球20, 64 solder balls
50 锡50 tin
52 有机可焊性保护垫52 Organic Solderability Protection Pad
具体实施方式 Detailed ways
本发明的具体实施方式详细说明如下,所述较佳实施例仅做一说明而非用以限定本发明。The specific implementation of the present invention is as follows in detail, and the preferred embodiments are only for illustration and not intended to limit the present invention.
图4是本发明一实施例的球栅阵列封装基板的剖面示意图,一基板42具有一第一表面46与一第二表面54,且基板42内部具有一布线(trace)44,其中,第一表面46具有暴露出部分布线44的多个第一凹槽;多个焊球垫48设于第一凹槽并暴露出第一表面46,其中,焊球垫48与布线44电性连接,任一焊球垫48由一层锡(Sn)50及一层有机可焊性保护垫52所组成,其中,锡50设于布线44表面,而有机可焊性保护垫52设于锡50上;焊球垫48用以电性连接多个焊球(solder ball)(图中未示),焊球作为输入/输出(Input/Output,I/O)端,使基板42得以电性连接一外界装置(图中未示)。4 is a schematic cross-sectional view of a ball grid array package substrate according to an embodiment of the present invention. A
在一实施例中,基板42可为FR4(Fire retardant grade of G10)基板、FR5(Fire retardant grade of G11)基板或BT(thin core)基板,且其材质可为有机玻璃纤维、环氧树脂或上述的组合;布线44的材质可为铜(Cu);且锡50的厚度可等于或小于30微米(μm),且有机可焊性保护垫52的厚度可等于或小于20微米。In one embodiment, the
接续上述说明,第二表面34具有暴露出部分布线44的多个第二凹槽,在一实施例中,多个焊垫56设于第二凹槽并暴露出第二表面34,其中,焊垫56与布线44电性连接,任一焊垫56由一层镍58及一层金60所组成,其中,镍58设于布线44表面,而金60设于镍58上;焊垫56用以电性连接多个焊线(bonding wire)(图中未示),焊线的功用是电性连接载设于封装结构中的一芯片(图中未示)与布线44,使芯片得以电性连接基板42,并因而得以电性连接一外界装置(图中未示),例如一印刷电路板(图中未示)。Continuing the above description, the
因此,本发明的球栅阵列封装基板的特征之一是采用锡/有机可焊性保护垫作为焊球垫,因此可避免现有技术以有机可焊性保护垫作为焊球垫的铜氧化现象与焊球迁移现象,也可解决现有技术的金/镍焊球垫的焊球破裂问题,而且成本比金/镍焊球垫低廉。Therefore, one of the characteristics of the ball grid array package substrate of the present invention is to use tin/organic solderability protection pads as solder ball pads, so it can avoid the copper oxidation phenomenon in the prior art that uses organic solderability protection pads as solder ball pads The solder ball migration phenomenon can also solve the solder ball cracking problem of the gold/nickel solder ball pad in the prior art, and the cost is lower than that of the gold/nickel solder ball pad.
图5A至图5B是本发明一实施例的球栅阵列封装的植球方法步骤示意图,其步骤包括:提供一球栅阵列封装基板42,基板42具有第一表面46,且第一表面46具有多个凹槽,基板42内部具有布线44,且凹槽暴露出部分布线44,多个焊球垫48设于凹槽内并暴露出第一表面46,其中,焊球垫48与布线44电性连接,且焊球垫48由一层锡50及一层有机可焊性保护垫52所组成,其中,锡50设于布线44表面,有机可焊性保护垫52设于锡50上;涂布一助焊剂62于焊球垫48表面;布植多个焊球64于助焊剂48上;以及回焊(reflow),使焊球64与布线44电性连接。5A to FIG. 5B are schematic diagrams of the steps of the ball planting method of the ball grid array package according to an embodiment of the present invention, and the steps include: providing a ball grid
在一实施例中,焊球64的材质可包含锡。In one embodiment, the material of the
综上所述,本发明的采用锡/有机可焊性保护垫作为焊球垫的球栅阵列封装基板及其植球方法具有高品质与低成本等优点。In summary, the ball grid array packaging substrate using tin/organic solderability protection pads as solder ball pads and the ball planting method of the present invention have the advantages of high quality and low cost.
以上所述的实施例仅为说明本发明的技术思想及特点,其目的在使本领域技术人员能够了解本发明的内容并据以实施,当不能以之限定本发明的保护范围,即大凡依本发明所揭示的精神所作的均等变化或修饰,仍应涵盖在本发明的专利范围内。The above-described embodiments are only to illustrate the technical ideas and characteristics of the present invention, and its purpose is to enable those skilled in the art to understand the content of the present invention and implement it accordingly. When it cannot limit the protection scope of the present invention, that is, generally The equivalent changes or modifications made by the spirit disclosed in the present invention should still be covered within the patent scope of the present invention.
Claims (15)
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CN 200710001410 CN101217134A (en) | 2007-01-05 | 2007-01-05 | Substrate structure of ball grid array package and ball mounting method thereof |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103188885A (en) * | 2011-12-28 | 2013-07-03 | 三星电机株式会社 | Method for manufacturing of circuit board |
CN105990299A (en) * | 2015-02-06 | 2016-10-05 | 展讯通信(上海)有限公司 | BGA (Ball Grid Array) packaging structure and preparation method thereof |
WO2020061978A1 (en) * | 2018-09-28 | 2020-04-02 | Intel Corporation | Groove design to facilitate flow of material between two substrates |
CN115332117A (en) * | 2022-08-12 | 2022-11-11 | 苏州通富超威半导体有限公司 | Ball grid array packaging method and device |
-
2007
- 2007-01-05 CN CN 200710001410 patent/CN101217134A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103188885A (en) * | 2011-12-28 | 2013-07-03 | 三星电机株式会社 | Method for manufacturing of circuit board |
CN105990299A (en) * | 2015-02-06 | 2016-10-05 | 展讯通信(上海)有限公司 | BGA (Ball Grid Array) packaging structure and preparation method thereof |
WO2020061978A1 (en) * | 2018-09-28 | 2020-04-02 | Intel Corporation | Groove design to facilitate flow of material between two substrates |
CN115332117A (en) * | 2022-08-12 | 2022-11-11 | 苏州通富超威半导体有限公司 | Ball grid array packaging method and device |
CN115332117B (en) * | 2022-08-12 | 2024-09-24 | 苏州通富超威半导体有限公司 | Ball grid array packaging method and device |
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