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CN101217134A - Substrate structure of ball grid array package and ball mounting method thereof - Google Patents

Substrate structure of ball grid array package and ball mounting method thereof Download PDF

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Publication number
CN101217134A
CN101217134A CN 200710001410 CN200710001410A CN101217134A CN 101217134 A CN101217134 A CN 101217134A CN 200710001410 CN200710001410 CN 200710001410 CN 200710001410 A CN200710001410 A CN 200710001410A CN 101217134 A CN101217134 A CN 101217134A
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ball
substrate
wiring
grid array
solder ball
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陈建宏
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Powertech Technology Inc
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Powertech Technology Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

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Abstract

The invention relates to a substrate structure applied to ball grid array packaging and a ball mounting method thereof; a ball grid array package substrate structure, comprising: a substrate; a wiring provided inside the substrate; and a plurality of solder ball pads arranged on one surface of the substrate and electrically connected with the wiring, wherein the solder ball pads are composed of a layer of tin and a layer of organic solderability protection pad. A ball planting method for ball grid array package includes: providing a ball grid array package substrate, wherein the solder ball pad is composed of a layer of tin and an organic solderability protection pad; coating a soldering flux on the surface of the solder ball pad; arranging a plurality of solder balls on the soldering flux; and reflowing to electrically connect the solder balls and the wires. Therefore, the invention can solve the problems of copper oxidation, solder ball migration, solder ball cracking and the like in the prior art, so the ball grid array packaging substrate and the ball mounting method thereof have the advantages of high quality, low cost and the like.

Description

球栅阵列封装的基板结构及其植球方法 Substrate Structure of Ball Grid Array Package and Its Ball Planting Method

技术领域 technical field

本发明涉及一种基板结构及其植球方法,特别是关于一种应用于球栅阵列封装的基板结构及其植球方法。The invention relates to a substrate structure and a ball planting method thereof, in particular to a substrate structure applied to ball grid array packaging and a ball planting method thereof.

背景技术 Background technique

近年来,随着终端消费性电子产品朝向“轻、薄、短、小”及多功能化发展的趋势,集成电路(Integrated Circuit,IC)的芯片(chip)构装技术亦朝向高密度化、小型化、高脚数化的方向前进,为了实现小型化与窄脚距的封装、以及改善散热等问题,目前球栅阵列封装结构(BallGrid Array,BGA)、覆晶(Flip Chip)、芯片尺寸封装(Chip Scale Package,CSP)等先进构装技术已成为主流,其中的球栅阵列封装相较于打线封装,具有信号传输延迟小、应用频率高、散热能力强及封装体积小等优点,所以广泛应用于各种不同型式的封装结构,包括:窗型球栅阵列封装结构、细间距球栅阵列(Fine pitch BGA,FBGA)封装结构、超细间距球栅阵列(Very Fine pitch BGA,VFBGA)封装结构、微型球栅阵列(micro BGA,μBGA)封装结构及叠置式多芯片球栅阵列(Stacked-typeMulti-Chip Package BGA,St-MCP BGA)封装结构等。In recent years, with the development trend of terminal consumer electronic products towards "light, thin, short, small" and multi-functionality, the chip (chip) packaging technology of integrated circuits (Integrated Circuit, IC) is also moving towards high density, The direction of miniaturization and high pin count is advancing. In order to achieve miniaturization and narrow pitch packaging and improve heat dissipation, the current ball grid array packaging structure (BallGrid Array, BGA), flip chip (Flip Chip), chip size Advanced packaging technologies such as Chip Scale Package (CSP) have become the mainstream. Compared with wire bonding packaging, ball grid array packaging has the advantages of small signal transmission delay, high application frequency, strong heat dissipation capability and small packaging volume. Therefore, it is widely used in various types of packaging structures, including: window ball grid array packaging structure, fine pitch BGA (FBGA) packaging structure, ultra-fine pitch ball grid array (Very Fine pitch BGA, VFBGA) ) packaging structure, micro BGA (micro BGA, μBGA) packaging structure and stacked-type Multi-Chip Package BGA (Stacked-type Multi-Chip Package BGA, St-MCP BGA) packaging structure, etc.

因此,高密度芯片构装需要高密度、高品质与低成本的芯片封装基板(substrate)予以配合。Therefore, high-density chip assembly requires a high-density, high-quality, and low-cost chip packaging substrate to cooperate.

图1是一现有球栅阵列封装基板的剖面示意图,一基板2具有一第一表面6与一第二表面10,且基板2内部具有一布线(trace)4,其材质为铜(Cu),其中,第一表面6具有暴露出部分布线4的多个第一凹槽;多个焊球垫(solder ball pad)8设于第一凹槽并暴露出第一表面6,其中,焊球垫8与布线4电性连接,任一焊球垫8为一有机可焊性保护垫(Organic Solderability Preservative,OSP),其用以电性连接多个焊球(solder ball)(图中未示),焊球作为输入/输出(Input/Output,I/O)端,使基板2得以电性连接一外界装置(图中未示),例如以表面黏着技术(Surface Mount Technology,SMT)来完成球栅阵列封装结构与一印刷电路板(Printed Circuit Board,PCB)(图中未示)的构装及电性连接。FIG. 1 is a schematic cross-sectional view of a conventional ball grid array package substrate. A substrate 2 has a first surface 6 and a second surface 10, and a wiring (trace) 4 is provided inside the substrate 2, and its material is copper (Cu). , wherein the first surface 6 has a plurality of first grooves exposing part of the wiring 4; a plurality of solder ball pads (solder ball pads) 8 are arranged in the first grooves and expose the first surface 6, wherein the solder balls The pad 8 is electrically connected to the wiring 4, and any solder ball pad 8 is an organic solderability protection pad (Organic Solderability Preservative, OSP), which is used to electrically connect multiple solder balls (solder ball) (not shown in the figure) ), the solder balls are used as input/output (Input/Output, I/O) terminals, so that the substrate 2 can be electrically connected to an external device (not shown in the figure), for example, it is completed by surface mount technology (Surface Mount Technology, SMT) The assembly and electrical connection between the BGA packaging structure and a Printed Circuit Board (PCB) (not shown in the figure).

接续上述说明,第二表面10具有暴露出部分布线4的多个第二凹槽,多个焊垫12设于第二凹槽并暴露出第二表面10,其中,焊垫12与布线4电性连接,任一焊垫12由一层镍(Ni)14及一层金(Au)16所组成,其中,镍14设于布线4表面,而金16设于镍14上;焊垫12用以电性连接多个焊线(bonding wire)(图中未示),焊线的功用是电性连接载设于封装结构中的一芯片(图中未示)与布线4,使芯片得以电性连接基板2,并因而得以电性连接一外界装置(图中未示),例如一印刷电路板(图中未示)。Continuing the above description, the second surface 10 has a plurality of second grooves exposing part of the wiring 4, and a plurality of welding pads 12 are arranged in the second grooves and expose the second surface 10, wherein the welding pads 12 are electrically connected to the wiring 4 Any pad 12 is composed of a layer of nickel (Ni) 14 and a layer of gold (Au) 16, wherein the nickel 14 is located on the surface of the wiring 4, and the gold 16 is located on the nickel 14; the pad 12 is used To electrically connect a plurality of bonding wires (not shown in the figure), the function of the bonding wire is to electrically connect a chip (not shown in the figure) mounted in the package structure with the wiring 4, so that the chip can be electrically It is electrically connected to the substrate 2, and thus can be electrically connected to an external device (not shown in the figure), such as a printed circuit board (not shown in the figure).

图2A至图2B是一现有球栅阵列封装的植球(ball mount)方法的步骤示意图,其步骤包含:提供一球栅阵列封装基板2,基板2具有一第一表面6,且第一表面6具有多个凹槽,基板2内部具有布线4,且凹槽暴露出部分布线4,多个焊球垫8设于凹槽并暴露出第一表面6,其中,焊球垫8与布线4电性连接,且焊球垫8为一有机可焊性保护垫;涂布一助焊剂(flux)18于焊球垫8表面;布植(mount)多个焊球20于助焊剂(flux)18上;以及回焊(reflow),使多个焊球20与布线4电性连接。2A to 2B are schematic diagrams of the steps of a conventional ball grid array package ball mount method, the steps include: providing a ball grid array package substrate 2, the substrate 2 has a first surface 6, and the first The surface 6 has a plurality of grooves, the inside of the substrate 2 has wiring 4, and the grooves expose part of the wiring 4, and a plurality of solder ball pads 8 are arranged in the grooves and expose the first surface 6, wherein the solder ball pads 8 and the wiring 4. Electrical connection, and the solder ball pad 8 is an organic solderability protection pad; coating a flux (flux) 18 on the surface of the solder ball pad 8; planting (mount) a plurality of solder balls 20 on the flux (flux) 18 ; and reflow (reflow), so that a plurality of solder balls 20 are electrically connected to the wiring 4 .

然而,此种采用有机可焊性保护垫作为焊球垫的球栅阵列封装基板具有数项缺点,包括焊球垫下面的铜会发生铜氧化(Cu oxidation)现象以及发生焊球迁移(ball shifting)现象。However, the ball grid array package substrate using organic solderability protection pads as solder ball pads has several disadvantages, including Cu oxidation and ball shifting of copper under the solder ball pads. )Phenomenon.

图3是另一现有球栅阵列封装基板的剖面示意图,基板22具有第一表面26与第二表面34,且基板22内部具有一布线(trace)24,其材质为铜(Cu),其中,第一表面26具有暴露出部分布线24的多个第一凹槽;多个焊球垫28设于第一凹槽并暴露出第一表面26,其中,焊球垫28与布线24电性连接,任一焊球垫28由一层镍30及一层金32所组成,其中,镍30设于布线24表面,而金32设于镍30上,镍30/金32通常是由电镀(plating)或无电解镍含浸金(Electroless Nickel ImmersionGold,ENIG)等方法所制作;焊球垫28用以电性连接多个焊球(solderball)(图中未示),焊球作为输入/输出(Input/Output,I/O)端,使基板22得以电性连接一外界装置(图中未示)。3 is a schematic cross-sectional view of another conventional ball grid array package substrate. The substrate 22 has a first surface 26 and a second surface 34, and a wiring (trace) 24 is provided inside the substrate 22, and its material is copper (Cu), wherein , the first surface 26 has a plurality of first grooves exposing part of the wiring 24; a plurality of solder ball pads 28 are located in the first grooves and expose the first surface 26, wherein the solder ball pads 28 are electrically connected to the wiring 24 connection, any solder ball pad 28 is composed of a layer of nickel 30 and a layer of gold 32, wherein the nickel 30 is arranged on the surface of the wiring 24, and the gold 32 is arranged on the nickel 30, and the nickel 30/gold 32 is usually formed by electroplating ( plating) or electroless nickel immersion gold (Electroless Nickel ImmersionGold, ENIG) and other methods; the solder ball pad 28 is used to electrically connect a plurality of solder balls (solderball) (not shown in the figure), and the solder balls are used as input/output ( Input/Output (I/O) terminal enables the substrate 22 to be electrically connected to an external device (not shown in the figure).

接续上述说明,第二表面34具有暴露出部分布线24的多个第二凹槽,多个焊垫36设于第二凹槽并暴露出第二表面34,其中,焊垫36与布线24电性连接,任一焊垫36由一层镍38及一层金40所组成,其中,镍38设于布线24表面,而金40设于镍38上;焊垫36用以电性连接多个焊线(bonding wire)(图中未示),焊线的功用是电性连接载设于封装结构中的一芯片(图中未示)与布线24,使芯片得以电性连接基板22,并因而得以电性连接一外界装置(图中未示),例如一印刷电路板(图中未示)。Continuing the above description, the second surface 34 has a plurality of second grooves exposing part of the wiring 24, and a plurality of welding pads 36 are arranged in the second grooves and expose the second surface 34, wherein the welding pads 36 are electrically connected to the wiring 24. Any solder pad 36 is composed of a layer of nickel 38 and a layer of gold 40, wherein the nickel 38 is arranged on the surface of the wiring 24, and the gold 40 is arranged on the nickel 38; the solder pad 36 is used to electrically connect multiple Bonding wire (not shown in the figure), the function of the bonding wire is to electrically connect a chip (not shown in the figure) mounted in the package structure with the wiring 24, so that the chip can be electrically connected to the substrate 22, and Therefore, an external device (not shown in the figure), such as a printed circuit board (not shown in the figure), can be electrically connected.

然而,此种采用一层镍及一层金作为焊球垫的球栅阵列封装基板的缺点是材料成本高,而且金属间化合物(Inter-Metallic Compound,IMC)上的焊球容易发生破裂(crack)现象。However, the disadvantage of this ball grid array package substrate using a layer of nickel and a layer of gold as solder ball pads is that the material cost is high, and the solder balls on the intermetallic compound (Inter-Metallic Compound, IMC) are prone to cracking (crack). )Phenomenon.

发明内容 Contents of the invention

为解决现有技术以有机可焊性保护垫作为焊球垫所产生的铜氧化与焊球迁移等问题,本发明目的之一是提出一种采用锡/有机可焊性保护垫作为焊球垫的基板结构及其植球方法。In order to solve the problems such as copper oxidation and solder ball migration produced by using organic solderability protection pads as solder ball pads in the prior art, one of the purposes of the present invention is to propose a method that uses tin/organic solderability protection pads as solder ball pads. substrate structure and its ball planting method.

为解决现有技术的金/镍焊球垫所产生的焊球破裂等问题,本发明目的之一是提出一种采用锡/有机可焊性保护垫作为焊球垫的基板结构及其植球方法。In order to solve problems such as solder ball ruptures produced by gold/nickel solder ball pads in the prior art, one of the objectives of the present invention is to propose a substrate structure and its ball planting using tin/organic solderability protection pads as solder ball pads method.

为了达到上述目的,本发明提供一种球栅阵列封装基板结构,包括:一基板,其具有一表面,且表面具有多个凹槽;一布线,其设于基板内部,其中,凹槽暴露出部分布线;及多个焊球垫,其设于凹槽并暴露出表面,其中,焊球垫与布线电性连接,任一焊球垫包括:一层锡,其设于布线表面;及一层有机可焊性保护垫,其设于锡上。In order to achieve the above object, the present invention provides a ball grid array package substrate structure, comprising: a substrate having a surface with a plurality of grooves; a wiring, which is arranged inside the substrate, wherein the grooves are exposed Part of the wiring; and a plurality of solder ball pads, which are arranged in the groove and exposed on the surface, wherein the solder ball pads are electrically connected to the wiring, and any solder ball pad includes: a layer of tin, which is arranged on the surface of the wiring; and a A layer of organic solderability protection pad is provided on the tin.

为了达到上述目的,本发明还提供一种球栅阵列封装的植球方法,包括:提供一球栅阵列封装基板,其中,基板具有一表面,且表面具有多个凹槽,基板内部具有一布线,多个焊球垫设于凹槽并暴露出表面,其中,焊球垫与布线电性连接,且任一焊球垫由一层锡及一层有机可焊性保护垫组成,其中,锡设于布线表面,且有机可焊性保护垫设于锡上;涂布一助焊剂于焊球垫表面;布植多个焊球于助焊剂上;及回焊,使焊球与布线电性连接。In order to achieve the above object, the present invention also provides a ball-planting method for a ball grid array package, including: providing a ball grid array package substrate, wherein the substrate has a surface with a plurality of grooves, and the inside of the substrate has a wiring , a plurality of solder ball pads are arranged in the groove and expose the surface, wherein the solder ball pads are electrically connected to the wiring, and any solder ball pad is composed of a layer of tin and a layer of organic solderability protection pad, wherein the tin Provided on the surface of the wiring, and the organic solderability protection pad is provided on the tin; coating a flux on the surface of the solder ball pad; planting a plurality of solder balls on the flux; and reflowing, so that the solder ball and the wiring are electrically connected .

因此,本发明的采用锡/有机可焊性保护垫作为焊球垫的球栅阵列封装基板及其植球方法具有高品质与低成本等优点。Therefore, the ball grid array packaging substrate using the tin/organic solderability protection pad as the solder ball pad and the ball planting method of the present invention have the advantages of high quality and low cost.

下面通过具体实施例配合所附的图式详加说明,当更容易了解本发明的目的、技术内容、特点及其所达成的功效。In the following, detailed descriptions will be given through specific embodiments in conjunction with the accompanying drawings, so that it will be easier to understand the purpose, technical content, features and effects of the present invention.

附图说明 Description of drawings

图1是一现有球栅阵列封装基板的剖面示意图;1 is a schematic cross-sectional view of a conventional ball grid array package substrate;

图2A至图2C是一现有球栅阵列封装的植球方法的步骤示意图;2A to 2C are schematic diagrams of the steps of a ball planting method for a conventional ball grid array package;

图3是一现有球栅阵列封装基板的剖面示意图;3 is a schematic cross-sectional view of a conventional ball grid array package substrate;

图4是本发明一实施例的球栅阵列封装基板的剖面示意图;4 is a schematic cross-sectional view of a ball grid array package substrate according to an embodiment of the present invention;

图5A至图5C是本发明一实施例的球栅阵列封装的植球方法步骤示意图。FIG. 5A to FIG. 5C are schematic diagrams of steps of a ball planting method for a ball grid array package according to an embodiment of the present invention.

图中符号说明Explanation of symbols in the figure

2、22、42    基板2, 22, 42 Substrate

4、24、44         布线4, 24, 44 Wiring

6、26、46         第一表面6, 26, 46 The first surface

8、28、48         焊球垫8, 28, 48 solder ball pads

10、34、54        第二表面10, 34, 54 Second surface

12、36、56        焊垫12, 36, 56 solder pads

14、30、38、58    镍14, 30, 38, 58 nickel

16、32、40、60    金16, 32, 40, 60 Gold

18、48、62        助焊剂18, 48, 62 flux

20、64            焊球20, 64 solder balls

50                锡50 tin

52                有机可焊性保护垫52 Organic Solderability Protection Pad

具体实施方式 Detailed ways

本发明的具体实施方式详细说明如下,所述较佳实施例仅做一说明而非用以限定本发明。The specific implementation of the present invention is as follows in detail, and the preferred embodiments are only for illustration and not intended to limit the present invention.

图4是本发明一实施例的球栅阵列封装基板的剖面示意图,一基板42具有一第一表面46与一第二表面54,且基板42内部具有一布线(trace)44,其中,第一表面46具有暴露出部分布线44的多个第一凹槽;多个焊球垫48设于第一凹槽并暴露出第一表面46,其中,焊球垫48与布线44电性连接,任一焊球垫48由一层锡(Sn)50及一层有机可焊性保护垫52所组成,其中,锡50设于布线44表面,而有机可焊性保护垫52设于锡50上;焊球垫48用以电性连接多个焊球(solder ball)(图中未示),焊球作为输入/输出(Input/Output,I/O)端,使基板42得以电性连接一外界装置(图中未示)。4 is a schematic cross-sectional view of a ball grid array package substrate according to an embodiment of the present invention. A substrate 42 has a first surface 46 and a second surface 54, and there is a wiring (trace) 44 inside the substrate 42, wherein the first The surface 46 has a plurality of first grooves exposing part of the wiring 44; a plurality of solder ball pads 48 are disposed in the first grooves and expose the first surface 46, wherein the solder ball pads 48 are electrically connected to the wiring 44, any A solder ball pad 48 is composed of a layer of tin (Sn) 50 and a layer of organic solderability protection pad 52, wherein the tin 50 is arranged on the surface of the wiring 44, and the organic solderability protection pad 52 is arranged on the tin 50; The solder ball pad 48 is used to electrically connect a plurality of solder balls (solder ball) (not shown in the figure), and the solder ball is used as an input/output (Input/Output, I/O) terminal, so that the substrate 42 can be electrically connected to an external environment. device (not shown in the figure).

在一实施例中,基板42可为FR4(Fire retardant grade of G10)基板、FR5(Fire retardant grade of G11)基板或BT(thin core)基板,且其材质可为有机玻璃纤维、环氧树脂或上述的组合;布线44的材质可为铜(Cu);且锡50的厚度可等于或小于30微米(μm),且有机可焊性保护垫52的厚度可等于或小于20微米。In one embodiment, the substrate 42 can be FR4 (Fire retardant grade of G10) substrate, FR5 (Fire retardant grade of G11) substrate or BT (thin core) substrate, and its material can be organic glass fiber, epoxy resin or The combination of the above; the material of the wire 44 can be copper (Cu); the thickness of the tin 50 can be equal to or less than 30 microns (μm), and the thickness of the organic solderability protection pad 52 can be equal to or less than 20 microns.

接续上述说明,第二表面34具有暴露出部分布线44的多个第二凹槽,在一实施例中,多个焊垫56设于第二凹槽并暴露出第二表面34,其中,焊垫56与布线44电性连接,任一焊垫56由一层镍58及一层金60所组成,其中,镍58设于布线44表面,而金60设于镍58上;焊垫56用以电性连接多个焊线(bonding wire)(图中未示),焊线的功用是电性连接载设于封装结构中的一芯片(图中未示)与布线44,使芯片得以电性连接基板42,并因而得以电性连接一外界装置(图中未示),例如一印刷电路板(图中未示)。Continuing the above description, the second surface 34 has a plurality of second grooves exposing part of the wiring 44. In one embodiment, a plurality of solder pads 56 are disposed in the second grooves and expose the second surface 34, wherein the solder pads 56 Pad 56 is electrically connected with wiring 44, and any pad 56 is made up of one layer of nickel 58 and one layer of gold 60, wherein, nickel 58 is arranged on the surface of wiring 44, and gold 60 is arranged on nickel 58; To electrically connect a plurality of bonding wires (not shown in the figure), the function of the bonding wire is to electrically connect a chip (not shown in the figure) mounted in the package structure with the wiring 44, so that the chip can be electrically It is electrically connected to the substrate 42, and thus electrically connected to an external device (not shown in the figure), such as a printed circuit board (not shown in the figure).

因此,本发明的球栅阵列封装基板的特征之一是采用锡/有机可焊性保护垫作为焊球垫,因此可避免现有技术以有机可焊性保护垫作为焊球垫的铜氧化现象与焊球迁移现象,也可解决现有技术的金/镍焊球垫的焊球破裂问题,而且成本比金/镍焊球垫低廉。Therefore, one of the characteristics of the ball grid array package substrate of the present invention is to use tin/organic solderability protection pads as solder ball pads, so it can avoid the copper oxidation phenomenon in the prior art that uses organic solderability protection pads as solder ball pads The solder ball migration phenomenon can also solve the solder ball cracking problem of the gold/nickel solder ball pad in the prior art, and the cost is lower than that of the gold/nickel solder ball pad.

图5A至图5B是本发明一实施例的球栅阵列封装的植球方法步骤示意图,其步骤包括:提供一球栅阵列封装基板42,基板42具有第一表面46,且第一表面46具有多个凹槽,基板42内部具有布线44,且凹槽暴露出部分布线44,多个焊球垫48设于凹槽内并暴露出第一表面46,其中,焊球垫48与布线44电性连接,且焊球垫48由一层锡50及一层有机可焊性保护垫52所组成,其中,锡50设于布线44表面,有机可焊性保护垫52设于锡50上;涂布一助焊剂62于焊球垫48表面;布植多个焊球64于助焊剂48上;以及回焊(reflow),使焊球64与布线44电性连接。5A to FIG. 5B are schematic diagrams of the steps of the ball planting method of the ball grid array package according to an embodiment of the present invention, and the steps include: providing a ball grid array package substrate 42, the substrate 42 has a first surface 46, and the first surface 46 has A plurality of grooves, the substrate 42 has wiring 44 inside, and the groove exposes part of the wiring 44, and a plurality of solder ball pads 48 are arranged in the groove and expose the first surface 46, wherein the solder ball pad 48 is electrically connected to the wiring 44 connection, and the solder ball pad 48 is composed of a layer of tin 50 and a layer of organic solderability protection pad 52, wherein the tin 50 is arranged on the surface of the wiring 44, and the organic solderability protection pad 52 is arranged on the tin 50; distributing a solder flux 62 on the surface of the solder ball pad 48 ; planting a plurality of solder balls 64 on the solder flux 48 ; and reflowing to electrically connect the solder balls 64 to the wiring 44 .

在一实施例中,焊球64的材质可包含锡。In one embodiment, the material of the solder ball 64 may include tin.

综上所述,本发明的采用锡/有机可焊性保护垫作为焊球垫的球栅阵列封装基板及其植球方法具有高品质与低成本等优点。In summary, the ball grid array packaging substrate using tin/organic solderability protection pads as solder ball pads and the ball planting method of the present invention have the advantages of high quality and low cost.

以上所述的实施例仅为说明本发明的技术思想及特点,其目的在使本领域技术人员能够了解本发明的内容并据以实施,当不能以之限定本发明的保护范围,即大凡依本发明所揭示的精神所作的均等变化或修饰,仍应涵盖在本发明的专利范围内。The above-described embodiments are only to illustrate the technical ideas and characteristics of the present invention, and its purpose is to enable those skilled in the art to understand the content of the present invention and implement it accordingly. When it cannot limit the protection scope of the present invention, that is, generally The equivalent changes or modifications made by the spirit disclosed in the present invention should still be covered within the patent scope of the present invention.

Claims (15)

1. structure of base plate for packaging ball grid array comprises:
One substrate, it has a first surface, and wherein, this first surface has a plurality of first grooves;
One wiring, it is located at this substrate inside, and wherein, those first grooves expose this wiring of part; And
A plurality of solder ball pads, it is located at those first grooves and exposes this first surface, and wherein, those solder ball pads and this wiring electrically connect, and it is characterized in that arbitrary this solder ball pad comprises:
One deck tin, it is located at this wiring surface; And
One deck Organic Solderability neonychium, it is located on this layer tin.
2. structure of base plate for packaging ball grid array as claimed in claim 1, wherein, this substrate is FR4 substrate, FR5 substrate or BT substrate.
3. structure of base plate for packaging ball grid array as claimed in claim 1, wherein, the material of this substrate is polymethyl methacrylate fiber, epoxy resin or above-mentioned combination.
4. structure of base plate for packaging ball grid array as claimed in claim 1, wherein, the material of this wiring is a copper.
5. structure of base plate for packaging ball grid array as claimed in claim 1, wherein, the thickness of this layer tin is for being equal to or less than 30 microns.
6. structure of base plate for packaging ball grid array as claimed in claim 1, wherein, the thickness of this layer Organic Solderability neonychium is for being equal to or less than 20 microns.
7. structure of base plate for packaging ball grid array as claimed in claim 1, wherein, this substrate has a second surface, and this second surface has a plurality of second grooves, and wherein, those second grooves expose this wiring of part.
8. structure of base plate for packaging ball grid array as claimed in claim 7 comprises a plurality of weld pads, and it is located at those second grooves and exposes this second surface, and wherein, those weld pads and this wiring electrically connect, and arbitrary this weld pad comprises:
One deck nickel, it is located at this wiring surface; And
One deck gold, it is located on this layer nickel.
9. the ball-establishing method of a BGA Package comprises:
One base plate for packaging ball grid array is provided, and wherein, this substrate has a surface, and this surface has a plurality of grooves, this substrate inside has a wiring, and those grooves expose the part this wiring, a plurality of solder ball pads are located at those grooves and are exposed this surface, it is characterized in that, those solder ball pads and this wiring electrically connects, and arbitrary this solder ball pad is made up of one deck tin and one deck Organic Solderability neonychium, wherein, this layer tin is located at this wiring surface, and this Organic Solderability neonychium is located on this layer tin;
Be coated with a scaling powder in this solder ball pad surface;
Cloth is planted a plurality of soldered balls on this scaling powder; And
Reflow electrically connects those soldered balls and this wiring.
10. the ball-establishing method of BGA Package as claimed in claim 9, wherein, this substrate is FR4 substrate, FR5 substrate or BT substrate.
11. the ball-establishing method of BGA Package as claimed in claim 9, wherein, the material of this substrate is polymethyl methacrylate fiber, epoxy resin or above-mentioned combination.
12. the ball-establishing method of BGA Package as claimed in claim 9, wherein, the material of this wiring is a copper.
13. the ball-establishing method of BGA Package as claimed in claim 9, wherein, the thickness of this layer tin is for being equal to or less than 30 microns.
14. the ball-establishing method of BGA Package as claimed in claim 9, wherein, the thickness of this layer Organic Solderability neonychium is for being equal to or less than 20 microns.
15. the ball-establishing method of BGA Package as claimed in claim 9, wherein, the material of those soldered balls comprises tin.
CN 200710001410 2007-01-05 2007-01-05 Substrate structure of ball grid array package and ball mounting method thereof Pending CN101217134A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103188885A (en) * 2011-12-28 2013-07-03 三星电机株式会社 Method for manufacturing of circuit board
CN105990299A (en) * 2015-02-06 2016-10-05 展讯通信(上海)有限公司 BGA (Ball Grid Array) packaging structure and preparation method thereof
WO2020061978A1 (en) * 2018-09-28 2020-04-02 Intel Corporation Groove design to facilitate flow of material between two substrates
CN115332117A (en) * 2022-08-12 2022-11-11 苏州通富超威半导体有限公司 Ball grid array packaging method and device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103188885A (en) * 2011-12-28 2013-07-03 三星电机株式会社 Method for manufacturing of circuit board
CN105990299A (en) * 2015-02-06 2016-10-05 展讯通信(上海)有限公司 BGA (Ball Grid Array) packaging structure and preparation method thereof
WO2020061978A1 (en) * 2018-09-28 2020-04-02 Intel Corporation Groove design to facilitate flow of material between two substrates
CN115332117A (en) * 2022-08-12 2022-11-11 苏州通富超威半导体有限公司 Ball grid array packaging method and device
CN115332117B (en) * 2022-08-12 2024-09-24 苏州通富超威半导体有限公司 Ball grid array packaging method and device

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