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CN101134303A - Polishing pad and method for manufacturing the same - Google Patents

Polishing pad and method for manufacturing the same Download PDF

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Publication number
CN101134303A
CN101134303A CNA2006101263546A CN200610126354A CN101134303A CN 101134303 A CN101134303 A CN 101134303A CN A2006101263546 A CNA2006101263546 A CN A2006101263546A CN 200610126354 A CN200610126354 A CN 200610126354A CN 101134303 A CN101134303 A CN 101134303A
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polishing pad
window
manufacture method
pad body
polishing
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邱丞伟
庄千莹
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Powerchip Semiconductor Corp
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Powerchip Semiconductor Corp
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Abstract

The invention provides a polishing pad and a manufacturing method thereof.A window is embedded in a polishing pad body, and a chemical bond is arranged between the window and the polishing pad body. The manufacturing method comprises the steps of placing an uncured colloid in a polishing pad mould, injecting a polishing pad material into the mould, curing the uncured colloid to form a window when the polishing pad material is formed, and forming a chemical bond between the polishing pad material and the window to obtain the polishing pad with the waterproof window.

Description

抛光垫及其制造方法 Polishing pad and method of manufacturing the same

技术领域 technical field

本发明涉及一种抛光垫,特别涉及一种具有防水窗口的抛光垫。The invention relates to a polishing pad, in particular to a polishing pad with a waterproof window.

背景技术 Background technique

近年来化学机械平坦化(chemical mechanical planarization,简称CMP)已经被大量运用在半导体过程上,其于存在研浆并施加压力的同时,通过晶圆与抛光垫间的相对运动而使晶圆表面平坦化。请参阅图1,其为CMP设备的示意图,CMP的设备通常称为研磨机,在研磨机中晶圆10被安置于晶圆支撑座12下方,并且在与晶圆支撑座对向设置的平台14上安置抛光垫16,而研浆18则由研浆喷洒器20喷洒在抛光垫上,并介于晶圆及抛光垫之间。In recent years, chemical mechanical planarization (chemical mechanical planarization, referred to as CMP) has been widely used in semiconductor processes. It flattens the surface of the wafer through the relative motion between the wafer and the polishing pad while the slurry is present and pressure is applied. change. Please refer to Fig. 1, it is the schematic diagram of CMP equipment, and the equipment of CMP is called grinder usually, and wafer 10 is placed under wafer support seat 12 in grinder, and the platform that is arranged opposite to wafer support seat A polishing pad 16 is placed on 14, and a slurry 18 is sprayed on the polishing pad by a slurry sprayer 20, and is interposed between the wafer and the polishing pad.

抛光垫上通常具有窗口,其目的为提供终点测试(endpoint detection)用,在研磨过程中,利用雷射光线穿透窗口到达晶圆研磨表面以探测晶圆表面状态,并由此得知是否已将材料研磨到正确的厚度。There is usually a window on the polishing pad, and its purpose is to provide endpoint detection. During the grinding process, the laser light is used to penetrate the window to reach the wafer grinding surface to detect the state of the wafer surface, and thus to know whether the Material is ground to the correct thickness.

请参阅图2,其为传统的抛光垫制造过程的示意图,在现有技术中,将一个已经固化完成的高分子材料窗口100放置于抛光垫的制作模具102中,接着将抛光垫的材料104注入模具102中,使抛光垫的材料在模具中成型,形成抛光垫本体106,即完成具有窗口的抛光垫110。Please refer to Fig. 2, which is a schematic diagram of a traditional polishing pad manufacturing process. In the prior art, a solidified polymer material window 100 is placed in a polishing pad manufacturing mold 102, and then the polishing pad material 104 The material of the polishing pad is molded in the mold by injecting it into the mold 102 to form the polishing pad body 106 , that is, the polishing pad 110 with the window is completed.

本案发明人发现在传统的抛光垫110中,其窗口100与抛光垫本体106之间只存在物理作用将两者结合,因此窗口与抛光垫本体间的防水效果不佳。在研磨过程中,研浆会由窗口与抛光垫本体间的间隙渗透至抛光垫下方,使得抛光垫与平台间的贴合胶带材质受到影响,产生小气泡,造成抛光垫与平台间的密合度不佳,并使得抛光垫表面凹凸不平。如此,将会造成晶圆的CMP研磨效果不佳,无法达到应有的平坦化效果,进而造成晶圆上的组件制造优良率或可靠度降低。The inventors of the present case found that in the traditional polishing pad 110, there is only physical interaction between the window 100 and the polishing pad body 106 to combine the two, so the waterproof effect between the window and the polishing pad body is not good. During the grinding process, the slurry will penetrate from the gap between the window and the polishing pad body to the bottom of the polishing pad, which will affect the bonding tape material between the polishing pad and the platform, and produce small air bubbles, resulting in the tightness between the polishing pad and the platform Poor and makes the surface of the polishing pad uneven. In this way, the CMP polishing effect of the wafer will be poor, and the desired planarization effect will not be achieved, which will further reduce the manufacturing yield or reliability of the components on the wafer.

因此,业界亟需改良抛光垫窗口的防水效果,以避免研浆渗透至抛光垫与平台之间,造成晶圆研磨效果不佳。Therefore, the industry urgently needs to improve the waterproof effect of the polishing pad window, so as to prevent the slurry from penetrating between the polishing pad and the platform, resulting in poor wafer polishing effect.

发明内容 Contents of the invention

本发明提供一种抛光垫,包括一窗口镶嵌于抛光垫本体中,其中该窗口与抛光垫本体之间具有化学键。The invention provides a polishing pad, which includes a window embedded in the polishing pad body, wherein there is a chemical bond between the window and the polishing pad body.

本发明更提供一种抛光垫的制造方法,将一未固化的胶质放置于抛光垫的模具中,然后将抛光垫的材料注入于模具中,将抛光垫的材料成型形成抛光垫主体,并使未固化的胶质固化形成窗口,其中窗口与抛光垫本体之间形成化学键,接着将模具移除以得到具有窗口的抛光垫。The present invention further provides a method for manufacturing a polishing pad. An uncured colloid is placed in a mold of the polishing pad, then the material of the polishing pad is injected into the mold, and the material of the polishing pad is formed into a polishing pad body, and The uncured gum is cured to form a window, wherein a chemical bond is formed between the window and the body of the polishing pad, and then the mold is removed to obtain the polishing pad with the window.

为了让本发明的上述和其它目的、特征、和优点能更明显易懂,下文特举出优选实施例,并配合附图,作详细说明如下:In order to make the above-mentioned and other purposes, features, and advantages of the present invention more clearly understood, the preferred embodiments are specifically listed below, and in conjunction with the accompanying drawings, the detailed description is as follows:

附图说明 Description of drawings

图1为已有的化学机械平坦化的研磨设备示意图。FIG. 1 is a schematic diagram of an existing polishing equipment for chemical mechanical planarization.

图2为已有的抛光垫制造流程的示意图。Fig. 2 is a schematic diagram of the existing polishing pad manufacturing process.

图3A为本发明优选实施例的抛光垫的平面图。Figure 3A is a plan view of a polishing pad according to a preferred embodiment of the present invention.

图3B为图3A中虚线区域的平面放大图。FIG. 3B is an enlarged plan view of the dashed area in FIG. 3A .

图4为本发明优选实施例的抛光垫制造流程的示意图。FIG. 4 is a schematic diagram of a polishing pad manufacturing process in a preferred embodiment of the present invention.

图5为本发明优选实施例的真空测试用抛光垫样品的剖面图。Fig. 5 is a cross-sectional view of a polishing pad sample for vacuum testing according to a preferred embodiment of the present invention.

主要组件符号说明Explanation of main component symbols

10~晶圆;12~晶圆支撑座;14~平台;16~抛光垫;18~研浆;20~研浆喷洒器;100~已固化的窗口;102、32~抛光垫的模具;104、38~抛光垫的材料;110~传统的抛光垫;28~未固化的胶质;30~窗口;106、40~抛光垫本体;50~本发明的抛光垫;301~窗口与局部的抛光垫本体的区域;A、B~化学键;C~切削面的切割线;D~贴合面的切割线;E~最初的抛光垫厚度;F~真空测试用的抛光垫样品厚度;G~切割厚度。10~wafer; 12~wafer support seat; 14~platform; 16~polishing pad; 18~slurry; 20~slurry sprayer; 100~cured window; 102, 32~mold of polishing pad; 104 , 38~polishing pad material; 110~traditional polishing pad; 28~uncured colloid; 30~window; 106, 40~polishing pad body; 50~polishing pad of the present invention; 301~window and partial polishing Area of the pad body; A, B~chemical bond; C~cutting line of cutting surface; D~cutting line of mating surface; E~initial polishing pad thickness; F~thickness of polishing pad sample for vacuum test; G~cutting thickness.

实施方式Implementation

本发明提供一种改良的抛光垫,其具有一防水窗口镶嵌于抛光垫本体中,其中窗口与抛光垫本体之间具有化学键,因此,窗口与抛光垫本体的结合非常紧密,可防止研浆从窗口与抛光垫本体之间渗透到抛光垫底下。The present invention provides an improved polishing pad, which has a waterproof window embedded in the polishing pad body, wherein there is a chemical bond between the window and the polishing pad body, so the window and the polishing pad body are very tightly combined, which can prevent the slurry from The gap between the window and the polishing pad body penetrates under the polishing pad.

请参阅图3A,其为本发明的抛光垫的平面图,其中30为窗口,40为抛光垫本体,图3A中虚线301包围的区域的放大图如图3B所示,图中箭头A及B表示窗口30与抛光垫本体40之间形成的化学键。Please refer to Fig. 3A, which is a plan view of the polishing pad of the present invention, wherein 30 is a window, and 40 is a polishing pad body, and the enlarged view of the area surrounded by dotted line 301 in Fig. 3A is shown in Fig. 3B, and arrows A and B represent A chemical bond is formed between window 30 and polishing pad body 40 .

本发明的抛光垫的制造流程,请参阅图4,首先将未固化的胶质28放置于抛光垫的模具32中,然后将抛光垫的材料38注入模具中,使抛光垫的材料发泡成型,形成抛光垫本体40,并使未固化的胶质28固化形成窗口30,此时窗口30与抛光垫本体40之间形成化学键,将模具移除,并将窗口30与抛光垫本体40的上下表面切割至所需尺寸,即可得到具有窗口的抛光垫50,所得到的抛光垫其窗口的上、下表面与抛光垫本体的上、下表面为共平面。The manufacturing flow of polishing pad of the present invention, referring to Fig. 4, at first uncured colloid 28 is placed in the mold 32 of polishing pad, then the material 38 of polishing pad is injected in the mould, makes the material foaming of polishing pad , form the polishing pad body 40, and make the uncured colloid 28 solidify to form the window 30, at this moment, form a chemical bond between the window 30 and the polishing pad body 40, the mold is removed, and the upper and lower sides of the window 30 and the polishing pad body 40 The polishing pad 50 with the window can be obtained by cutting the surface to the desired size, and the upper and lower surfaces of the window of the obtained polishing pad are coplanar with the upper and lower surfaces of the polishing pad body.

本发明的抛光垫本体可为高分子材料,例如常用的聚氨酯(polyurethane,简称PU)。窗口可为透明的高分子材料,例如聚碳酸酯(polycarbonate,简称PC)、聚氨酯(polyurethane,简称PU)或聚丙烯酸甲酯(polymethyl acrylate,简称PMA)等。未固化的胶质则与上述窗口的高分子材料相同,但其尚未完成固化反应。在本发明的实施例中,窗口与抛光垫本体之间的化学键可为氢键,以PU为抛光垫的材料,并且窗口的材料也是PU为例,请参阅以下的化学式1,在窗口与抛光垫本体之间会产生氢键:The polishing pad body of the present invention can be a polymer material, such as commonly used polyurethane (PU for short). The window can be a transparent polymer material, such as polycarbonate (PC for short), polyurethane (PU for short), or polymethyl acrylate (PMA for short). The uncured colloid is the same as the above-mentioned polymer material of the window, but it has not yet completed the curing reaction. In an embodiment of the present invention, the chemical bond between the window and the polishing pad body can be a hydrogen bond, PU is the material of the polishing pad, and the material of the window is also PU as an example, please refer to the following chemical formula 1, in the window and polishing Hydrogen bonding occurs between the pad bodies:

Figure A20061012635400061
Figure A20061012635400061

化学式1chemical formula 1

此外,以PU为抛光垫的材料,窗口材料选用PC为例,请参阅以下的化学式2,在窗口与抛光垫本体之间也会产生氢键:In addition, taking PU as the material of the polishing pad and PC as the window material, please refer to the following chemical formula 2, and hydrogen bonds will also be generated between the window and the polishing pad body:

Figure A20061012635400071
Figure A20061012635400071

化学式2chemical formula 2

另外,以PU为抛光垫本体材料,窗口材料选用PMA,在窗口与抛光垫本体之间同样也会产生氢键,请参阅以下的化学式3:In addition, if PU is used as the body material of the polishing pad, and the window material is PMA, hydrogen bonds will also be generated between the window and the body of the polishing pad. Please refer to the following chemical formula 3:

Figure A20061012635400072
Figure A20061012635400072

化学式3chemical formula 3

如上所述,本发明的抛光垫中的窗口与抛光垫本体之间具有化学键,其较传统抛光垫中利用物理作用结合的窗口与抛光垫本体更紧密,所以本发明的抛光垫中的窗口具有较佳的防水效果,在研磨过程中,可防止研浆从窗口与抛光垫本体之间渗透至抛光垫底下,进而达到较佳的CMP研磨结果。As mentioned above, there is a chemical bond between the window in the polishing pad of the present invention and the polishing pad body, which is closer than the window and the polishing pad body that utilize physical action in the traditional polishing pad, so the window in the polishing pad of the present invention has Better waterproof effect, during the grinding process, it can prevent the slurry from penetrating from the gap between the window and the polishing pad body to the bottom of the polishing pad, so as to achieve better CMP grinding results.

接着请参考图5,其为本发明抛光垫的剖面图,其中虚线所包围的区域30为窗口,40为抛光垫本体,由图中可清楚得知抛光垫的窗口30的上、下表面与抛光垫本体40的上、下表面为共平面。Then please refer to Fig. 5, it is the sectional view of polishing pad of the present invention, wherein the area 30 that dotted line surrounds is window, and 40 is polishing pad body, can clearly know that the upper and lower surfaces of window 30 of polishing pad and The upper and lower surfaces of the polishing pad body 40 are coplanar.

为了测试抛光垫的窗口防水效果,将抛光垫成型后的最初状态的上、下表面切除,得到较为平坦的上、下表面的抛光垫,以制作真空测试用的抛光垫样品。请再参阅图5,沿着虚线C切割的面称为切削面(polishing side),其在研磨过程中作为与研浆的接触面;沿着虚线D切割的面称为贴合面(back side),其在研磨过程中作为与平台的贴合面,其中最初的抛光垫厚度E约为5.5mm,切割后的抛光垫厚度F约为4.85mm,所切割掉的上、下表面的厚度G约为0.35mm。In order to test the window waterproof effect of the polishing pad, the upper and lower surfaces of the initial state of the polishing pad after molding were cut off to obtain a polishing pad with a relatively flat upper and lower surface to make a polishing pad sample for vacuum testing. Please refer to Figure 5 again, the surface cut along the dotted line C is called the cutting surface (polishing side), which is used as the contact surface with the slurry during the grinding process; the surface cut along the dotted line D is called the back side (back side) ), which is used as a bonding surface with the platform during the grinding process, wherein the initial thickness E of the polishing pad is about 5.5mm, the thickness F of the polishing pad after cutting is about 4.85mm, and the thickness G of the cut upper and lower surfaces About 0.35mm.

抛光垫的窗口防水效果其测试方法为利用真空测试,将切割后的抛光垫测试样品贴在平台上,并将抽真空装置放置于窗口的切削面上,抽真空5秒钟后停止,静待30秒后测量其真空度的变化值,所得到的变化值愈小,表示窗口的漏气量较少,即表示窗口的防水效果较佳。The test method of the window waterproof effect of the polishing pad is to use a vacuum test, stick the cut polishing pad test sample on the platform, and place the vacuum device on the cutting surface of the window, stop after 5 seconds of vacuuming, and wait After 30 seconds, measure the change value of the vacuum degree. The smaller the change value obtained, it means that the air leakage of the window is less, which means that the waterproof effect of the window is better.

将本发明的抛光垫,与传统的抛光垫比较,以PU为抛光垫的材料,PC为窗口的材料为例,其窗口防水效果的真空测试结果如下表1所列:With polishing pad of the present invention, compare with traditional polishing pad, take PU as the material of polishing pad, PC is the material of window as example, the vacuum test result of its window waterproof effect is listed in table 1 below:

表1Table 1

本发明的抛光垫真空度变化测试(psi)Polishing Pad Vacuum Variation Test (psi) of the present invention 传统的抛光垫真空度变化测试(psi)Traditional Polishing Pad Vacuum Change Test (psi) 时间time 5秒5 seconds 30秒30 seconds 变化值change value 5秒5 seconds 30秒30 seconds 变化值change value 切削面cutting surface 80.280.2 79.979.9 0.30.3 8080 79.479.4 0.60.6 贴合面Fitting surface 80.380.3 8080 0.30.3 80.180.1 79.579.5 0.60.6

由表1的测试结果可得知,本发明的抛光垫其真空度变化值为0.3,比传统方式制造的抛光垫的真空度变化值0.6低,因此本发明的抛光垫其窗口防水效果较传统抛光垫增加一倍。As can be known from the test results in Table 1, the vacuum variation value of the polishing pad of the present invention is 0.3, which is lower than the vacuum variation value of 0.6 of the polishing pad manufactured in the traditional way, so its window waterproofing effect of the polishing pad of the present invention is more traditional. Double the polishing pad.

虽然本发明已公开优选实施例如上,然其并非用来限定本发明,任何本领域的技术人员,在不脱离本发明的精神和范围内,可做些许更动与修饰,因此本发明的保护范围应以所附的权利要求书所界定的为准。Although the present invention has disclosed the preferred embodiment as above, it is not intended to limit the present invention, and any person skilled in the art can make some changes and modifications without departing from the spirit and scope of the present invention, so the protection of the present invention The scope should be defined by the appended claims.

Claims (15)

1. polishing pad comprises:
One polishing pad body; And
One window, it is embedded in this polishing pad body,
Wherein has chemical bond between this window and this polishing pad body.
2. polishing pad as claimed in claim 1, wherein this polishing pad body is a macromolecular material.
3. polishing pad as claimed in claim 2, wherein this polishing pad body is polyurethane (polyurethane is called for short PU).
4. polishing pad as claimed in claim 1, wherein this window is transparent macromolecular material.
5. polishing pad as claimed in claim 4, wherein this window is Merlon (polycarbonate is called for short PC), polyurethane (polyurethane is called for short PU) or PMA (polymethyl acrylate is called for short PMA).
6. polishing pad as claimed in claim 1, wherein totally one plane, the upper and lower surface of the upper and lower surface of this window and this polishing pad body.
7. polishing pad as claimed in claim 1, wherein this chemical bond comprises hydrogen bond.
8. the manufacture method of a polishing pad comprises:
One uncured colloid is positioned in the mould of a polishing pad;
The material of one polishing pad is flow in this mould;
The forming materials of this polishing pad is formed a polishing pad body, and make this uncured colloid solidify to form a window, wherein form chemical bond between this window and this polishing pad body; And
This mould is removed, to obtain the polishing pad of a tool window.
9. the manufacture method of polishing pad as claimed in claim 8, wherein the material of this polishing pad is a macromolecular material.
10. the manufacture method of polishing pad as claimed in claim 9, wherein the material of this polishing pad is a polyurethane.
11. the manufacture method of polishing pad as claimed in claim 8, wherein this window is transparent macromolecular material.
12. the manufacture method of polishing pad as claimed in claim 11, wherein this window is Merlon, polyurethane or PMA.
13. the manufacture method of polishing pad as claimed in claim 8, wherein this chemical bond comprises hydrogen bond.
14. the manufacture method of polishing pad as claimed in claim 8, wherein totally one plane, the upper and lower surface of the upper and lower surface of this window and this polishing pad body.
15. the manufacture method of polishing pad as claimed in claim 8, wherein the forming materials mode of this polishing pad is a foaming.
CNA2006101263546A 2006-08-30 2006-08-30 Polishing pad and method for manufacturing the same Pending CN101134303A (en)

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CN103260828A (en) * 2010-09-30 2013-08-21 内克斯普拉纳公司 Polishing pad for eddy current end-oint detection
KR20130108172A (en) * 2012-03-22 2013-10-02 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 Method of manufacturing chemical mechanical polishing layers having a window
KR20130108168A (en) * 2012-03-22 2013-10-02 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 Method of manufacturing chemical mechanical polishing layers
CN103692370A (en) * 2012-09-27 2014-04-02 罗门哈斯电子材料Cmp控股股份有限公司 Method of manufacturing grooved chemical mechanical polishing layers
CN114670118A (en) * 2017-08-04 2022-06-28 应用材料公司 Polishing pad with window and method of making the same

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CN103260828A (en) * 2010-09-30 2013-08-21 内克斯普拉纳公司 Polishing pad for eddy current end-oint detection
CN103260828B (en) * 2010-09-30 2017-08-15 嘉柏微电子材料股份公司 The method for making the polishing pad for polishing Semiconductor substrate
CN102950550B (en) * 2011-08-16 2015-10-28 罗门哈斯电子材料Cmp控股股份有限公司 The method of preparative chemistry machine glazed finish layer
CN102950550A (en) * 2011-08-16 2013-03-06 罗门哈斯电子材料Cmp控股股份有限公司 Method of manufacturing chemical mechanical polishing layers
CN103358238B (en) * 2012-03-22 2016-02-24 罗门哈斯电子材料Cmp控股股份有限公司 The manufacture method of chemical mechanical polishing layer
CN103358226A (en) * 2012-03-22 2013-10-23 罗门哈斯电子材料Cmp控股股份有限公司 Method of manufacturing chemical mechanical polishing layers having a window
CN103358238A (en) * 2012-03-22 2013-10-23 罗门哈斯电子材料Cmp控股股份有限公司 Method of manufacturing chemical mechanical polishing layers
CN103358226B (en) * 2012-03-22 2016-02-24 罗门哈斯电子材料Cmp控股股份有限公司 There is the manufacture method of the chemical mechanical polishing layer of window
KR20130108168A (en) * 2012-03-22 2013-10-02 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 Method of manufacturing chemical mechanical polishing layers
KR20130108172A (en) * 2012-03-22 2013-10-02 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 Method of manufacturing chemical mechanical polishing layers having a window
KR102028208B1 (en) * 2012-03-22 2019-10-02 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 Method of manufacturing chemical mechanical polishing layers having a window
KR102028207B1 (en) * 2012-03-22 2019-10-02 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 Method of manufacturing chemical mechanical polishing layers
CN103692370A (en) * 2012-09-27 2014-04-02 罗门哈斯电子材料Cmp控股股份有限公司 Method of manufacturing grooved chemical mechanical polishing layers
CN103692370B (en) * 2012-09-27 2016-08-17 罗门哈斯电子材料Cmp控股股份有限公司 The method preparing reeded chemical mechanical polishing layer
CN114670118A (en) * 2017-08-04 2022-06-28 应用材料公司 Polishing pad with window and method of making the same

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