CN101123336B - 用于具有带完全球栅格兼容性的集成滑块的bga ic装置的老化插座 - Google Patents
用于具有带完全球栅格兼容性的集成滑块的bga ic装置的老化插座 Download PDFInfo
- Publication number
- CN101123336B CN101123336B CN2007101384827A CN200710138482A CN101123336B CN 101123336 B CN101123336 B CN 101123336B CN 2007101384827 A CN2007101384827 A CN 2007101384827A CN 200710138482 A CN200710138482 A CN 200710138482A CN 101123336 B CN101123336 B CN 101123336B
- Authority
- CN
- China
- Prior art keywords
- slide block
- rib
- wall extension
- finger piece
- top surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/193—Means for increasing contact pressure at the end of engagement of coupling part, e.g. zero insertion force or no friction
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Connecting Device With Holders (AREA)
Abstract
Description
Claims (4)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/463,114 | 2006-08-08 | ||
US11/463,114 US7318736B1 (en) | 2006-08-08 | 2006-08-08 | Burn-in sockets for BGA IC devices having an integrated slider with full ball grid compatibility |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101123336A CN101123336A (zh) | 2008-02-13 |
CN101123336B true CN101123336B (zh) | 2013-12-04 |
Family
ID=38920990
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101384827A Active CN101123336B (zh) | 2006-08-08 | 2007-08-08 | 用于具有带完全球栅格兼容性的集成滑块的bga ic装置的老化插座 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7318736B1 (zh) |
JP (1) | JP5094267B2 (zh) |
KR (1) | KR101333874B1 (zh) |
CN (1) | CN101123336B (zh) |
TW (1) | TW200820517A (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201117941Y (zh) * | 2007-08-21 | 2008-09-17 | 富士康(昆山)电脑接插件有限公司 | 电连接器 |
KR100977729B1 (ko) * | 2008-04-11 | 2010-08-24 | 김인하 | 전자부품 테스트용 접촉기 |
CN201285908Y (zh) * | 2008-08-05 | 2009-08-05 | 富士康(昆山)电脑接插件有限公司 | 电连接器 |
KR101246105B1 (ko) * | 2011-07-07 | 2013-03-20 | 주식회사 오킨스전자 | 반도체 패키지 테스트용 소켓 |
KR101944693B1 (ko) * | 2018-12-04 | 2019-02-01 | 황동원 | 반도체 소자 테스트용 bga 소켓장치 |
JP7316192B2 (ja) * | 2019-10-29 | 2023-07-27 | タイコエレクトロニクスジャパン合同会社 | ソケット |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1459888A (zh) * | 2002-04-09 | 2003-12-03 | 蒂科电子公司 | 用于插脚栅格阵列接插件的接触件及其形成方法 |
CN1787298A (zh) * | 2004-12-06 | 2006-06-14 | 富士康(昆山)电脑接插件有限公司 | 平面栅格阵列电连接器 |
US20060246758A1 (en) * | 2004-08-27 | 2006-11-02 | Aries Electronics, Inc. | Top loaded burn-in socket |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3256796B2 (ja) * | 1994-08-23 | 2002-02-12 | 日本テキサス・インスツルメンツ株式会社 | ソケット及びソケットを用いた電気部品の試験方法 |
JP4251423B2 (ja) * | 2000-01-28 | 2009-04-08 | 株式会社センサータ・テクノロジーズジャパン | ソケット |
JP2002025731A (ja) | 2000-07-07 | 2002-01-25 | Texas Instr Japan Ltd | ソケット及び電子部品装着装置 |
JP4845304B2 (ja) | 2000-10-25 | 2011-12-28 | 株式会社センサータ・テクノロジーズジャパン | ソケット及びこれを備えた電子部品装着装置 |
JP2003217775A (ja) * | 2002-01-16 | 2003-07-31 | Yamaichi Electronics Co Ltd | Icソケットの電気的接続方法およびicソケット |
JP3803099B2 (ja) * | 2002-12-17 | 2006-08-02 | 山一電機株式会社 | 半導体装置用ソケット |
DE102005007593B4 (de) * | 2005-02-18 | 2008-05-29 | Qimonda Ag | Sockel-Vorrichtung zum Testen von Halbleiter-Bauelementen und Verfahren zum Aufnehmen eines Halbleiter-Bauelements in einer Sockel-Vorrichtung |
JP4729346B2 (ja) * | 2005-06-30 | 2011-07-20 | 株式会社エンプラス | 電気部品用ソケット |
-
2006
- 2006-08-08 US US11/463,114 patent/US7318736B1/en active Active
-
2007
- 2007-06-29 TW TW096123621A patent/TW200820517A/zh unknown
- 2007-08-07 JP JP2007205159A patent/JP5094267B2/ja active Active
- 2007-08-07 KR KR1020070079017A patent/KR101333874B1/ko active IP Right Grant
- 2007-08-08 CN CN2007101384827A patent/CN101123336B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1459888A (zh) * | 2002-04-09 | 2003-12-03 | 蒂科电子公司 | 用于插脚栅格阵列接插件的接触件及其形成方法 |
US20060246758A1 (en) * | 2004-08-27 | 2006-11-02 | Aries Electronics, Inc. | Top loaded burn-in socket |
CN1787298A (zh) * | 2004-12-06 | 2006-06-14 | 富士康(昆山)电脑接插件有限公司 | 平面栅格阵列电连接器 |
Also Published As
Publication number | Publication date |
---|---|
KR101333874B1 (ko) | 2013-11-27 |
JP5094267B2 (ja) | 2012-12-12 |
CN101123336A (zh) | 2008-02-13 |
US7318736B1 (en) | 2008-01-15 |
TW200820517A (en) | 2008-05-01 |
KR20080013781A (ko) | 2008-02-13 |
JP2008051809A (ja) | 2008-03-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20090320 Address after: Massachusetts USA Applicant after: Sensata Technologies Massachusetts, Inc. Address before: Massachusetts USA Applicant before: Sensata Technologies, Inc. |
|
ASS | Succession or assignment of patent right |
Owner name: SENSATA SCIENCE MASSACHUSETTS CO.,LTD. Free format text: FORMER OWNER: SENSATA TECHNOLOGIES CO.,LTD. Effective date: 20090320 |
|
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220224 Address after: Massachusetts Patentee after: Sensata Electronic Technology Co.,Ltd. Address before: Massachusetts Patentee before: Sensata Technologies Massachusetts, Inc. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220726 Address after: California, USA Patentee after: LTI Holdings Address before: Massachusetts Patentee before: Sensata Electronic Technology Co.,Ltd. |