CN101118268B - System and method for testing external component interconnection extension slot - Google Patents

Abstract

The invention discloses a test system and a test method for an external component interconnection extension slot, which are characterized in that at least one external component interconnection slot and at least one high-speed external component interconnection slot are arranged on an interface specification steering card to convert the interface specification of the external component interconnection slot and the interface specification of the high-speed external component interconnection slot into the interface specification of the external component interconnection extension, and then external component interconnection signals and high-speed external component interconnection signals are led out from the external component interconnection extension slot. Further, the direct memory access transfer function of the external component interconnection and the high-speed external component interconnection is tested at a time through the direct memory access transfer.

Description

Test system and method for external component interconnect extension slot

technical field

The invention relates to a slot testing method, in particular to a testing system and method for an external component interconnect extension (PCIX) slot.

Background technique

At present, the external component interconnect extension (PCIX) slots of some new motherboards can have both PCI signals and high-speed external component interconnect (PCI-E) signals, that is, the motherboard supports ordinary external component interconnect devices as well as Supports high-speed external component interconnect devices. When testing the external component interconnect (PCI) signal and high-speed external component interconnect (PCI-E) signal on the external component interconnect extension (PCIX) slot of the motherboard, it is necessary to use the external component interconnect extension (PCIX) slot Corresponding interface turning cards are provided on the board to connect the external component interconnection card or the high-speed external component interconnection card, and then lead out the above two signals of the external component interconnection extension (PCIX) slot for testing.

However, in the signal test of the above-mentioned external component interconnection extension slot, the prior art cannot simultaneously test all pins of the external component interconnection extension slot in one test. If you want to fully test the external component interconnection signal and high-speed external component interconnection signal of the external component interconnection extension slot, you must first insert the external component interconnection (PCI) interface transfer card and the external component interconnection test card into the external component interconnection Connect to the extension (PCIX) slot for testing. After the test, shut down and replace another set of high-speed external component interconnection (PCIE) interface steering card and high-speed external component interconnection test card, and then restart the test, or vice versa. Therefore, the above-mentioned testing method not only takes time and effort, but also may neglect the testing of certain types of signals.

In addition, when testing the direct memory access (Direct Memory Access, DMA) transmission capability of the external component interconnect (PCI) and the high-speed external component interconnect (PCI-E), it was necessary to open up two relatively large blocks on the operating system in the past. Large contiguous physical internal memory as a test medium. Due to the different specifications of PCI and PCI-E, as well as the constraints of the operating system, it is difficult to develop the internal memory of the continuous entity. In addition, this test method also needs to consume a large amount of internal memory resources of the entity, and conflicts with other test items that need to occupy a large amount of internal memory resources.

For this reason, there is currently a method for testing through the built-in static memory of the external component interconnection test card. Compared with the above-mentioned existing testing method, this testing method can save a continuous physical internal memory. However, this test method is limited by the operating system and cannot allocate a continuous physical internal memory of the same size as the test card's built-in internal memory. Therefore, multiple transfers are often used to allocate the physical internal memory. However, the current test program can only allocate 64k of continuous physical internal memory, and only moving 64k each time cannot form enough test pressure, and the one-time direct memory access required by the internal memory cannot be realized, and the test efficiency is reduced due to waste of time. Due to the competition of each test item for the internal memory, the long-term test will lead to the inability to allocate a continuous physical internal memory that meets the requirements, and then the normal test cannot be performed.

Contents of the invention

The technical problem to be solved by the present invention is to provide a test system and method for a peripheral component interconnect extension slot, which can test all PCI signals and high-speed External Component Interconnect (PCIE) signals, saving test time and increasing test program versatility.

Another object of the present invention is to provide a test system and method for interconnecting extension slots of external components, which can avoid the bottleneck problem of opening up continuous physical internal memory as a test intermediary, and can realize direct memory access (DMA) in a real sense pressure test.

To achieve the above object, the present invention provides a test system for a peripheral component interconnection extension slot, which is used to connect to a peripheral component interconnection extension (PCIX) slot on the motherboard, and can perform a peripheral component interconnection (PCIX) slot. ) test card and a high-speed external component interconnection (PCIE) test card signal test, wherein the test system includes: an interface conversion module and a test module; here, the interface conversion module is provided with at least one external component interconnection ( PCI) slot and at least one high-speed external component interconnection (PCIE) slot, wherein this external component interconnection (PCI) slot is connected with external component interconnection (PCI) test card, high-speed external component interconnection (PCIE) plug The slot is connected with a high-speed external component interconnect (PCIE) test card; and the interface conversion module is connected with the external component interconnect extension (PCIX) slot on the mainboard, and then the interface conversion module converts the external component interconnect (PCI) slot The interface specification of the interface specification and the high-speed external component interconnection (PCIE) slot is the interface specification of the external component interconnection extension (PCIX) slot, to draw the external component interconnection ( PCI) test card signals and PCI Express external component interconnect (PCIE) test card signals. The test module tests the direct memory access (DMA) transfer function of the peripheral component interconnect (PCI) test card and the high-speed peripheral component interconnect (PCIE) test card through direct memory access (DMA) transfer.

According to the test system of the external component interconnect extension slot of the present invention, wherein the test module is tested by a first static memory (SRAM) built in the external component interconnect (PCI) test card and a high-speed external component interconnect (PCIE) A second static memory (SRAM) built in the card executes a direct memory access (DMA) transfer test between the first static memory and the second static memory. Or, the interface conversion module is provided with a continuous physical internal memory, and then the test module is built in a first static memory (SRAM) or a high-speed external component interconnection (PCIE) test card through the external component interconnection (PCI) test card. A second static memory (SRAM) built, between the first static memory and the continuous physical internal memory of the interface conversion module or between the second static memory and the continuous physical internal memory of the interface conversion module, perform direct memory access ( DMA) transfer test.

In addition, the present invention also provides a test method for an external component interconnect extension slot, comprising the following steps: setting at least one external component interconnect (PCI) slot and at least one high-speed external component interconnect (PCIE) slot on An interface specification is turned on the card; the interface specification of the PCI slot and the interface specification of the high-speed external component interconnection (PCIE) slot are converted into an external component interconnection extension (PCIX) by this interface specification turning card The interface specifications of the slot, and then lead out a peripheral component interconnect (PCI) signal and a high-speed peripheral component interconnect (PCIE) signal from the peripheral component interconnect extension (PCIX) slot; and through direct memory access (DMA) The transfer of a high-speed external component interconnect test card connected to this external component interconnect (PCI) slot with a test of the direct memory storage of a high-speed external component interconnect test card connected to this high-speed external component interconnect (PCIE) slot Take (DMA) transfer function.

According to the test method of the external component interconnection extension slot of the present invention, wherein a test external component interconnection test card connected with a high-speed external component interconnection (PCIE) slot is connected with a high-speed external component interconnection (PCIE) slot. The steps of the direct memory access (DMA) transfer function of the high-speed external component interconnection test card, a first static memory ( SRAM), a second static memory (SRAM) built into the high-speed external component interconnection (PCIE) test card connected to the high-speed external component interconnection (PCIE) slot, and then between the first static memory and the second static memory Perform direct memory access (DMA) transfer tests in between. For this preferred scheme, when testing the direct memory access (DMA) transfer function of the PCI test card connected to the PCI slot, the direct memory of the PCI test card is set to Access (DMA) transmission destination bit address is the second static memory address of high-speed external component interconnection (PCIE) test card; When the direct memory access (DMA) transfer function of the high-speed external component interconnection (PCIE) test card is connected to the (PCIE) slot, set the direct memory access (DMA) transfer destination address of the high-speed external component interconnection (PCIE) test card It is the first static memory address of the PCI test card; and the data of the second static memory is transferred to the first static memory.

Or, it is preferable to be provided with a continuous physical internal memory on the interface specification turning card, and then an external component interconnection test card connected to a test external component interconnection (PCI) slot and a high-speed external component interconnection (PCIE) A high-speed External Component Interconnect (PCI) test card connected via a PCI slot in the steps of the Direct Memory Access (DMA) transfer function of the card built-in A first static memory (SRAM) or a high-speed external component interconnection (PCIE) test card built-in a second static memory (SRAM) connected to the high-speed external component interconnection (PCIE) slot, in the first static memory and interface A direct memory access (DMA) transfer test is performed between the contiguous physical internal memory of the specification diverting card or between the second static memory and the contiguous physical internal memory of the interface specification diverting card.

The test system and method of the external component interconnection extension slot of the present invention can draw a plurality of external component interconnection (PCI) slots and High-speed external component interconnect (PCIE) slot, realizes simultaneous testing of external component interconnect (PCI) signals and high-speed external component interconnect (PCIE) signals, avoiding the trouble of plugging and unplugging test cards and restarting the machine.

In addition, the present invention utilizes two built-in physical internal memories of the external component interconnection (PCI) test card and the high-speed external component interconnection (PCIE) test card, or the built-in physical internal memory of the above-mentioned two kinds of test cards is respectively connected with the interface specification Turn to the continuous physical internal memory set inside the card to perform direct memory access (DMA) test transfers between each other, thus getting rid of the limitation of separately allocating physical internal memory as a test intermediary, not only saving system resources, but also avoiding the need to communicate with other tests Items that rob internal memory resources also increase the breadth and reliability of the test.

Description of drawings

FIG. 1 is a system block diagram of a testing system for external component interconnect extension slots according to a first embodiment of the present invention;

2 is a system block diagram of a test system for external component interconnect extension slots according to a second embodiment of the present invention; and

FIG. 3 , and FIG. 4 to FIG. 5 are flowcharts of a testing method for an external component interconnect extension slot according to an embodiment of the present invention.

Among them, reference signs:

12: Interface conversion module

14: External component interconnection test card

16: High-speed external component interconnection test card

18: External component interconnect extension slot

20: Test Module

22: External component interconnect bus

24: High-speed external component interconnect bus

Step 101 arranging at least one external component interconnection slot and at least one high-speed external component interconnection slot on an interface specification steering card

Step 102 Detect whether the interface specification steering card is connected with the external component interconnection test card and the high-speed external component interconnection test card?

Step 103 prompts that the test card is not inserted

Step 104 Convert the interface specification of the external component interconnection slot and the interface specification of the high-speed external component interconnection slot into an interface specification of an external component interconnection extension through the interface specification steering card

Step 105 searches the configuration space of the external component interconnection by browsing the physical internal memory address of the external component interconnection test card on the interface specification steering card

Step 106 searches the configuration space of the external component interconnection by browsing the physical internal memory address of the high-speed external component interconnection test card on the interface specification steering card

Step 107 sets the direct memory access transmission destination bit address of the external component interconnection test card to be the entity internal memory address of the high-speed external component interconnection test card

Step 108 writes identifiable data into the internal memory of the external component interconnection test card

Step 109 opens the direct memory access of the external device interconnection test card to transfer the internal memory content in the card to the internal memory of the high-speed external device interconnection test card in one piece

Step 110: Read the data of the internal memory of the high-speed external component interconnection test card, and compare it with the data of the internal memory of the external component interconnection test card?

Step 111 Restore the settings of the external component interconnection test card

Step 112 sets the direct memory access transmission destination bit address of the high-speed external component interconnection test card as the entity internal memory address of the external component interconnection test card

Step 113 fetches and writes back the internal memory data of the high-speed external component interconnection test card

Step 114 starts the direct memory access transmission of the high-speed external device interconnection test card, and transfers the contents of the internal memory of the high-speed external device interconnection test card to the body internal memory of the external device interconnection test card in one piece

Step 115: Read the data of the internal memory of the external component interconnection test card, and compare it with the data of the internal memory of the high-speed external component interconnection test card?

Step 116 restore related settings

Step 117 Restore the settings of the High Speed External Component Interconnect Test Card

Detailed ways

Regarding the features and implementation of the present invention, the preferred embodiments are described in detail below in conjunction with the drawings.

As shown in FIG. 1 , this figure is a system block diagram of a testing system for external component interconnect extension slots according to a first embodiment of the present invention. As shown in the figure, the test system of the external component interconnect extension slot of the present invention includes an interface conversion module 12, wherein the interface conversion module 12 is provided with at least one external component interconnection (PCI) slot and at least one high-speed external component Interconnection (PCIE) slot, and a peripheral component interconnection (PCI) test card 14 can be connected in this external component interconnection (PCI) slot, and a high-speed external component interconnection (PCIE) slot can be connected with a high-speed external component Interconnect (PCIE) test card 16 .

The test system of the peripheral component interconnection extension slot of the present invention also includes a peripheral component interconnection extension (PCIX) slot 18 , which is arranged on the computer motherboard and connected to the interface conversion module 12 . In addition, the external component interconnection extension (PCIX) slot 18 is connected with the external component interconnection (PCI) bus 22 and the high-speed external component interconnection (PCIE) bus 24 respectively, so the external component interconnection extension slot 18 has external components at the same time. Interconnect (PCI) signals and External Component Interconnect Express (PCIE) signals.

The interface conversion module 12 can convert the interface specification of the external component interconnect (PCI) slot and the interface specification of the high-speed external component interconnect (PCIE) slot to the interface specification of the external component interconnect extension (PCIX) slot, so when When the interface conversion module 12 is inserted into the external component interconnect extension slot 18, it can independently obtain the respective required signals from different signal pins, so that the converted external component interconnect (PCI) slot is interconnected with high-speed external components (PCIE) slots can be used at the same time.

The test system of the external component interconnection extension slot of the present invention comprises a test module 20, and the signal of the external component interconnection (PCI) test card 14 and the high-speed external component interconnection are tested once by the transmission of direct memory access (DMA) (PCIE) tests the direct memory access (DMA) transfer function of the card 16 . Therefore, when testing the external component interconnection extension slot, peripheral component interconnections can be respectively inserted in the external component interconnection (PCI) slot and the high-speed external component interconnection (PCIE) slot of the interface conversion module 12. The test card 14 is interconnected with the high-speed external components and the test card 16, so that all signal pins of the external component interconnection extension slots can be completely tested without restarting the machine during the testing process.

In addition, because the existing test method needs to open up a continuous entity internal memory on the operating system as a test intermediary, wherein the external component interconnect (PCI) requires 512K, and the high-speed external component interconnect (PCIE) requires 4M, this existing test method Not only is it difficult to implement due to operating system limitations, but it also causes waste of internal memory. Therefore, in this embodiment, the test module 20 of the present invention utilizes the built-in physical internal memory of the external component interconnection test card 14 and the high-speed external component interconnection test card 16, utilizes respective static memory (SRAM) to test, and A direct memory access (DMA) transfer test is performed between the static memory of the external device interconnect test card 14 and the static memory of the high speed external device interconnect test card 16 .

According to the foregoing embodiment, when testing, the direct memory access (DMA) transfer destination bit address of the PCI test card 14 needs to be set to be the static memory address of the high-speed peripheral component interconnect (PCIE) test card 16, Or set the direct memory access (DMA) transfer destination bit address of the high-speed peripheral component interconnect (PCIE) test card 16 as the static memory address of the peripheral component interconnect (PCI) test card 14 . Therefore, as shown by the arrow in the figure, by transferring the data of the static memory of each test card to the other party's static memory in turn, the external component interconnection (PCI) and the external component interconnection (PCI) of the external component interconnection extension slot 18 can be tested simultaneously. Direct Memory Access (DMA) transfer capability for Peripheral Component Interconnect Express (PCIE).

In addition, according to the present invention, a continuous physical internal memory can also be provided on the interface conversion module 12. For details, please refer to FIG. block diagram.

In this embodiment, the same numbers in FIG. 2 as those in FIG. 1 are used to indicate the same components and functions, so details are not repeated here. Different from Fig. 1, a continuous entity internal memory can be set on the interface conversion module 12, so the test module 20 is interconnected with external components by the continuous entity internal memory provided on the interface conversion module 12 when performing a test (PCI ) the built-in static memory of the test card 14, to perform direct memory access (DMA) transfer according to the direction of the solid line arrow of the icon; or, through the continuous entity internal memory on the interface conversion module 12 and the high-speed external component interconnection (PCIE) Test the built-in static memory of the card 16, and perform direct memory access (DMA) transmission according to the direction of the dotted arrow of the icon, and then test the connection between the external component interconnection (PCI) test card and the high-speed external component interconnection (PCIE) test card at a time Direct memory access (DMA) transfer function.

With the above-mentioned method of the present invention, it is possible to realize a larger memory, such as a transfer of 4M, to complete a real direct memory access stress test without the need for the system to open up another physical internal memory, thereby getting rid of the shackles of the operating system, increasing The compatibility of test items also saves system resources and avoids the problem of robbing internal memory resources with other test items, such as memory tests.

It should be pointed out that, on the premise that at least one PCI slot and at least one high-speed PCI slot are provided on the interface conversion module 12, the PCI extension plug of the present invention The test system of the slot can also use the existing test method to realize the simultaneous test of the external component interconnect (PCI) signal and the high-speed external component interconnect (PCIE) signal by opening up one or two continuous internal memories.

As shown in FIG. 3 , FIG. 4 and FIG. 5 , they are flowcharts of a testing method for an external component interconnect extension slot according to an embodiment of the present invention.

As shown in the figure, firstly, at least one PCI slot and at least one PCI Express slot are arranged on an interface specification turn card (step 101 ). During the test, it may first be detected whether the interface specification steering card is connected with the external component interconnection test card and the high-speed external component interconnection test card (step 102 ), so as to prompt the test operation. If the corresponding test card is not connected, the operator will be prompted that the test card has not been inserted (step 103), and then proceed to step 116 to restore the relevant equipment (step 116), indicating that the test fails.

If it is detected that the interface specification turning card is connected with an external component interconnection test card and a high-speed external component interconnection test card, then the interface specification of the interface specification turning card to the external component interconnection (PCI) slot is connected with the high-speed external component interconnection test card. The interface specification of the PCIE slot is converted to obtain the interface specification of the External Component Interconnect Extension (PCIX). Therefore, the peripheral component interconnect (PCI) signal and the peripheral component interconnect express (PCIE) signal can be simultaneously led out on the PCI extension slot (step 104 ).

Preferably, the test method of the external component interconnection extension slot of the present invention can carry out direct memory storage by the internal memory of the external component interconnection test card and the high-speed external component interconnection test card itself, such as static memory (SRAM) Take a (DMA) test transfer. At this time, by browsing the configuration space of the external component interconnection, to find the physical internal memory address (step 105) of the external component interconnection test card on the interface specification steering card, and to find the physical internal memory address of the high-speed component interconnection test card (step 106).

Then, if the direct memory access (DMA) transfer function of the external component interconnection is tested at first, then the Field Programmable Gate Array (Field Programmable GateArray, FPGA) control register of the external component interconnection test card is set, and the external component interconnection Even the direct memory access transmission destination bit address of the test card is set to the internal memory address (step 107) of the high-speed external component interconnection test card, and writes identifiable data in the internal memory of the external component interconnection test card (step 108), such as 0x55AA.... Then enable the direct memory access of the external device interconnection test card to transfer the contents of the internal memory of the card to the high-speed external device interconnection test card to the internal memory in one piece (step 109 ). Read the data of the internal memory of the high-speed external component interconnection test card, and compare with the data of the internal memory of the external component interconnection test card to determine whether they are the same (step 110). If not, restore the relevant settings (step 116), indicating that the test failed; otherwise, restore the settings of the external component interconnection test card (step 111).

Next, test the direct memory access (DMA) transfer function of the high-speed external component interconnection, then set the field programmable gate array control register of the high-speed external component interconnection test card to set the direct memory access (DMA) of the high-speed external component interconnection test card The memory access transmission destination bit address is the physical internal memory address of the external component interconnect test card (step 112). Then, invert and write back the data in the internal memory of the high-speed external component interconnection test card (step 113). Thereupon, the direct memory access transmission of the high-speed external component interconnection test card is opened, and the contents of the internal memory of the high-speed external component interconnection test card are transferred in one block, so as to be transmitted to the entity internal static memory of the external component interconnection test card ( Step 114).

Then read the data of the internal static memory of the external component interconnection test card, and compare it with the data of the internal static memory of the high-speed external component interconnection test card to determine whether they are the same (step 115). If identical, then restore the setting (step 117) of the high-speed external component interconnection test card, at this moment promptly represent that the external component interconnection test card and the high-speed external component interconnection test card pass the test; Otherwise, restore relevant settings (step 116), Indicates a test failed for this card.

In addition, preferably, the test method of the external component interconnection extension slot of the present invention can also be provided with a continuous physical internal memory on the interface specification steering card, and then the internal memory built in the test card can be interconnected with the external component. Interface specifications turn to the continuous physical internal memory of the card, or the built-in internal memory of the high-speed external component interconnection test card and the continuous physical internal memory of the interface specification steering card, perform the transfer test of direct memory access (DMA) respectively in turn, to simultaneously Test the direct memory access (DMA) transfer function of the peripheral component interconnect (PCI) and the peripheral component interconnect express (PCIE) of the PCI expansion slot at one time.

Here, different from the above-mentioned embodiment using the external component interconnection test card and the internal memory of the high-speed external component interconnection test card to carry out the respective test transmissions, the external component is tested in the continuous physical internal memory of the interface specification steering card. When the direct memory access (DMA) transfer function of the interconnection (PCI), it is necessary to set the direct memory access (DMA) transfer destination bit address of the external component interconnection (PCI) test card to the interface specification and turn to the continuous physical internal memory of the card address; and transfer the data of the first static memory of the PCI to the continuous physical internal memory of the interface specification steering card.

Likewise, when testing the direct memory access (DMA) transfer function of a high-speed peripheral component interconnection (PCIE) using the continuous physical internal memory of the interface specification steering card, it is necessary to set up the direct memory access (DMA) of the high-speed peripheral component interconnection (PCIE) test card. Access (DMA) transfer destination bit address is the continuous physical internal memory address of the interface specification steering card; and the data of the second static memory of the high-speed external component interconnect (PCIE) test card is transferred to the continuous physical internal storage of the interface specification steering card middle.

Certainly, the present invention also can have other various embodiments, without departing from the spirit and essence of the present invention, those skilled in the art can make various corresponding changes and deformations according to the present invention, but these Corresponding changes and deformations should belong to the scope of protection of the appended claims of the present invention.

Claims (10)

1. A test system for an external component interconnection extension slot, which is used to connect to an external component interconnection extension slot on a motherboard, and can perform an external component interconnection test card and a high-speed external component interconnection test card The signal test is characterized in that the test system includes: An interface conversion module is provided with at least one external component interconnection slot and at least one high-speed external component interconnection slot, so that the external component interconnection test card and the high-speed external component interconnection test card are respectively connected; and the interface The conversion module is connected to the external component interconnection extension slot on the motherboard, and then the interface conversion module converts the interface specification of the external component interconnection slot and the interface specification of the high-speed external component interconnection slot into the external component interconnection slot. Connect the interface specification of the extension slot, so that the signal of the external component interconnection test card and the signal of the high-speed external component interconnection test card are drawn from the external component interconnection extension slot; and A test module is used to test the direct memory access transmission function of the external component interconnection test card and the high-speed external component interconnection test card through direct memory access transmission. 2. The test system of the external component interconnection extension slot according to claim 1, wherein the test module is interconnected with the high-speed external component by a first static memory built into the external component interconnection test card A second static memory built in the test card is used to perform a direct memory access transmission test between the first static memory and the second static memory. 3. The test system of the external component interconnection extension slot according to claim 1, characterized in that, the interface conversion module is provided with a continuous physical internal memory, and then the test module is built into the external component interconnection test card A first static memory or a second static memory built in the high-speed external component interconnection test card, between the first static memory and the continuous physical internal memory of the interface conversion module or between the second static memory and the The direct memory access transfer test is performed between the continuous physical internal memories of the interface conversion module. 4. A method for testing an external component interconnect extension slot, characterized in that the method comprises the following steps: Setting at least one external component interconnection slot and at least one high-speed external component interconnection slot on an interface specification steering card; Convert the interface specification of the external component interconnection slot and the interface specification of the high-speed external component interconnection slot into an interface specification of an external component interconnection extension slot through the interface specification steering card, and then extend the external component interconnection An external device interconnection signal and a high-speed external device interconnection signal are drawn out on the slot; and Direct memory access of a high-speed external device interconnect test card connected to the high-speed external device interconnect socket and a high-speed external device interconnect test card connected to the high-speed external device interconnect socket at a time by transmission of direct memory access transfer function. 5. The test method of the external component interconnection extension slot according to claim 4, characterized in that, an external component interconnection test card connected to the external component interconnection slot for this one-time test is interconnected with the high-speed external component The step of the direct memory access transmission function of a high-speed external component interconnection test card connected to the slot, a first static memory built in the external component interconnection test card connected through the external component interconnection slot, and the A second static memory built in the high-speed external component interconnection test card connected to the high-speed external component interconnection slot, and then execute the transmission test of the direct memory access between the first static memory and the second static memory . 6. The testing method of the external component interconnection extension slot according to claim 5, wherein when testing the direct memory access transmission function of the external component interconnection test card connected to the external component interconnection slot , which also includes the following steps: Setting the DMA transfer destination bit address of the EDI test card as the second static memory address of the high-speed EDI test card; and Moving the data of the first static memory to the second static memory. 7. The test method of the external component interconnection extension slot according to claim 5, wherein when testing the direct memory access transmission of the high-speed external component interconnection test card connected to the high-speed external component interconnection slot function, the following steps are also included: Setting the DMA transmission destination bit address of the high-speed external device interconnection test card as the first static memory address of the external device interconnection test card; and The data in the second static memory is transferred to the first static memory. 8. The method for testing the external component interconnection extension slot according to claim 4, further comprising the step of setting a continuous physical internal memory on the interface specification steering card, and then testing the external In the step of direct memory access transmission function of a high-speed external component interconnection test card connected to the component interconnection slot and a high-speed external component interconnection test card connected to the external component interconnection slot, through the external component interconnection A first static memory built into the external component interconnection test card connected to the slot or a second static memory built into the high-speed external component interconnection test card connected to the high-speed external component interconnection slot, in the first A direct memory access transmission test is performed between a static memory and the continuous physical internal memory of the interface specification steering card or between the second static memory and the continuous physical internal memory of the interface specification steering card. 9. The testing method of the external component interconnection extension slot according to claim 8, wherein when testing the direct memory access transmission function of the external component interconnection test card connected to the external component interconnection slot , which also includes the following steps: Setting the DMA transfer destination bit address of the external component interconnection test card to the continuous physical internal memory address of the interface specification steering card; and Transfer the data of the first static memory to the continuous physical internal memory of the interface specification steering card. 10. The test method of the external component interconnection extension slot according to claim 8, wherein when testing the direct memory access transmission of the high-speed external component interconnection test card connected to the high-speed external component interconnection socket function, the following steps are also included: Setting the DMA transmission destination bit address of the high-speed external device interconnect test card to the continuous physical internal memory address of the interface specification steering card; and Transfer the data of the second static memory to the continuous physical internal memory of the interface specification steering card.

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