CN101081395A - Method for Cleaning Surface Contaminants of Substrates with Composite Type - Google Patents
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Abstract
Description
技术领域technical field
本发明涉及一种以复合式洁净基板的表面污染物的方法,尤其涉及一种不需耗费大量资源及能源,且更不会造成环保问题,并能有效清除各种有机污染物与微粒的复合式洁净基板的表面污染物的方法。The invention relates to a method for cleaning the surface pollutants of a substrate with a composite method, in particular to a method for effectively removing the composite of various organic pollutants and particles without consuming a large amount of resources and energy, and without causing environmental problems. A method for cleaning substrates from surface contamination.
背景技术Background technique
目前无论是半导体产业、平面显示器(FPD)产业、印刷电路板(PCB)产业、软性线路板(FPCB)产业等,其所生产产品的清洗方式,主要使用湿式工艺,以去除油脂、指纹、残留溶剂等有机污染物,以及金属或氧化物等微粒。At present, whether it is the semiconductor industry, the flat panel display (FPD) industry, the printed circuit board (PCB) industry, the flexible circuit board (FPCB) industry, etc., the cleaning methods of the products produced mainly use wet processes to remove grease, fingerprints, Organic pollutants such as residual solvents, and particulates such as metals or oxides.
然而,现有技术湿式清洗工艺技术会有化学品排放法规限制,以及纯水与溶剂成本不断增加的缺点,且因使用大量的水、溶剂、化学品,衍生环保问题而且浪费资源与能源,此时较环保的干式清洗工艺逐渐被开发出来。However, the existing wet cleaning process technology has the disadvantages of chemical emission regulations and increasing costs of pure water and solvents, and because of the use of a large amount of water, solvents, and chemicals, it leads to environmental problems and wastes resources and energy. At that time, the more environmentally friendly dry cleaning process was gradually developed.
目前现有技术为解决上述湿式清洗工艺的问题,结合RF等离子与二氧化碳雪花喷洗的方法,并应用于晶圆的去光阻工艺,其虽能较现有技术湿式清洗工艺加速污染物移除,但其也有以下缺点:例如耗时较久而且能量大可能对基板的表面有损伤、需要真空腔体以产生无线频率(RF)等离子、真空设备成本高而且不适合大尺寸平板工件的快速清洗。因此,目前在平面显示器如TFT-LCD面板的清洗方面,为避免面板表面有损伤,故仍旧采用湿式水洗工艺,尤其现今第五代厂以上的玻璃基板尺寸更大,因而清洗设备也更加庞大,当然相对也相当耗水。而现有技术干式清洗工艺如以UV/03(紫外线/臭氧)、大气等离子作有机污染物的去除,具有环保、省水、设备占地面积小、清洗速度快等优点,但其只对有机污染物的去除有效果,对于微粒的去除几乎无效果,因此仍需搭配去离子(De-ionized)水洗与烘干步骤,导致目前商业化效益不大。At present, in order to solve the above-mentioned problems of the wet cleaning process, the existing technology combines the method of RF plasma and carbon dioxide snowflake spray cleaning, and applies it to the photoresist removal process of the wafer. Although it can accelerate the removal of pollutants compared with the existing wet cleaning process , but it also has the following disadvantages: for example, it takes a long time and the energy may damage the surface of the substrate, a vacuum chamber is required to generate radio frequency (RF) plasma, the cost of vacuum equipment is high, and it is not suitable for rapid cleaning of large-sized flat workpieces . Therefore, in the cleaning of flat-panel displays such as TFT-LCD panels, in order to avoid damage to the panel surface, the wet washing process is still used, especially the size of glass substrates above the fifth generation factory is larger, so the cleaning equipment is also more bulky. Of course, it also consumes a lot of water. And the prior art dry cleaning process such as using UV/03 (ultraviolet/ozone) and atmospheric plasma to remove organic pollutants has the advantages of environmental protection, water saving, small footprint of equipment, and fast cleaning speed, but it is only for The removal of organic pollutants is effective, but it has almost no effect on the removal of particles. Therefore, it still needs to be combined with deionized (De-ionized) washing and drying steps, resulting in little commercialization benefits at present.
因此,针对上述的基板表面的污染物去除效果,湿式清洗工艺有着浪费资源与能源的劣势,而干式清洗工艺却只能针对有机污染物的去除有效果,若运用于微粒的去除则几乎无效果,所以如何重新设计一种去除基板的表面污染物的方法,其能有效提升有机污染物与微粒的去除效果,且避免现有技术湿式清洗工艺与干式清洗工艺的缺失,即为本发明的标的。Therefore, for the above-mentioned pollutant removal effect on the substrate surface, the wet cleaning process has the disadvantage of wasting resources and energy, while the dry cleaning process can only be effective for the removal of organic pollutants, and it is almost useless if it is applied to the removal of particles. Therefore, how to redesign a method for removing surface pollutants of the substrate, which can effectively improve the removal effect of organic pollutants and particles, and avoid the lack of the prior art wet cleaning process and dry cleaning process, is the present invention target.
发明内容Contents of the invention
本发明所要解决的技术问题在于提供一种以复合式洁净基板的表面污染物的方法,用以解决现有技术湿式清洗工艺有着使用大量的水及化学溶剂的资源浪费、能源消耗与环保的缺失,同时也克服现有技术干式清洗工艺只能针对有机污染物的去除,而无法有效去除微粒的缺点。The technical problem to be solved by the present invention is to provide a method for cleaning the surface pollutants of the substrate in a composite manner, so as to solve the problems of waste of resources, energy consumption and environmental protection caused by the use of a large amount of water and chemical solvents in the prior art wet cleaning process , At the same time, it also overcomes the shortcoming that the dry cleaning process in the prior art can only be aimed at the removal of organic pollutants, but cannot effectively remove particles.
为实现上述目的,本发明提供一种以复合式洁净基板的表面污染物的方法,其包含提供一基板步骤、提供一等离子供应单元步骤、提供一二氧化碳雪花供应单元步骤、进行等离子喷洗基板操作、进行等离子及二氧化碳雪花喷洗基板操作,先提供一基板步骤,此基板表面具有污染物;再提供一等离子供应单元步骤,其位于此基板上方;提供一二氧化碳雪花供应单元步骤,其位于基板上方且置于等离子供应单元一侧,又,进行等离子喷洗基板操作步骤,此基板与此等离子供应单元相对移动以进行等离子喷洗基板,以及进行等离子及二氧化碳雪花喷洗基板操作步骤,基板与该等离子供应单元以及二氧化碳雪花供应单元二者相对移动以进行等离子及二氧化碳雪花喷洗基板。In order to achieve the above object, the present invention provides a method for compound cleaning substrate surface pollutants, which includes providing a substrate step, providing a plasma supply unit step, providing a carbon dioxide snowflake supply unit step, performing plasma spray cleaning substrate operation 1. Perform plasma and carbon dioxide snowflake spraying substrate operation, first provide a substrate step, the substrate surface has pollutants; then provide a plasma supply unit step, which is located above the substrate; provide a carbon dioxide snowflake supply unit step, which is located above the substrate And put it on the side of the plasma supply unit, and perform the operation step of plasma spraying the substrate, the substrate and the plasma supply unit move relatively to perform plasma spraying the substrate, and perform the operation steps of plasma and carbon dioxide snowflake spraying the substrate, the substrate and the The plasma supply unit and the carbon dioxide snow supply unit move relative to each other to spray the substrate with plasma and carbon dioxide snow.
本发明一种以复合式洁净基板的表面污染物的方法,具备下述数点优于现有技术作法,并具备如下所述的显著功效增进。The method of the present invention for cleaning the surface pollutants of the substrate with the following points is superior to the prior art, and has the following remarkable efficiency improvement.
1.本发明的一种以复合式洁净基板的表面污染物的方法,通过本发明的一种复合式洁净基板的表面污染物的方法实施运用,由于其结合大气等离子的有机污染物去除能力与二氧化碳雪花的微粒去除能力,故能有效提升基板的表面污染物的洁净效果。1. A kind of method with the surface pollutant of composite type clean substrate of the present invention, implement and use by the method for the surface pollutant of a kind of composite type clean substrate of the present invention, because it combines the organic pollutant removal ability of atmospheric plasma and The particle removal ability of carbon dioxide snowflakes can effectively improve the cleaning effect of surface pollutants on the substrate.
2.本发明的一种以复合式洁净基板的表面污染物的方法,通过本发明的一种复合式洁净基板的表面污染物的方法实施运用,由于其结合大气等离子与二氧化碳雪花,二者均在常压下即能实施,故能适用于大尺寸平板工件的连续式清洗,且二氧化碳还可同时作为大气等离子的解离气体及二氧化碳雪花产生来源。2. A kind of method of the surface pollutant of composite clean substrate of the present invention, implement and use by the method of a kind of composite clean substrate surface pollutant of the present invention, because it combines atmospheric plasma and carbon dioxide snowflake, both all It can be implemented under normal pressure, so it is suitable for continuous cleaning of large-sized flat workpieces, and carbon dioxide can also be used as a dissociated gas of atmospheric plasma and a source of carbon dioxide snowflakes.
3.本发明的一种以复合式洁净基板的表面污染物的方法,通过本发明的一种复合式洁净基板的表面污染物的方法实施运用,其能在常压下操作,故不需真空腔体,因而能降低设备成本。3. A method of the present invention to clean the surface pollutants of the composite substrate is implemented by the method of the present invention to clean the surface pollutants of the substrate, and it can be operated under normal pressure, so no vacuum is needed cavity, thus reducing equipment cost.
以下结合附图和具体实施例对本发明进行详细描述,但不作为对本发明的限定。The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.
附图说明Description of drawings
图1为本发明以复合式洁净基板的表面污染物的方法流程示意图;以及Fig. 1 is the schematic flow chart of the method of the present invention to clean the surface pollutants of the composite substrate; and
图2为本发明以复合式洁净基板的表面污染物的方法进行清洗基板示意图。FIG. 2 is a schematic diagram of cleaning a substrate by a composite method for cleaning surface pollutants of the substrate according to the present invention.
其中,附图标记:Among them, reference signs:
S1复合式洁净基板的表面污染物的方法S1 Composite Cleaning Method for Surface Contaminants of Substrates
步骤S10提供一基板Step S10 provides a substrate
步骤S20提供一等离子供应单元Step S20 provides a plasma supply unit
步骤S30提供一二氧化碳雪花供应单元Step S30 provides a carbon dioxide snow supply unit
步骤S40进行等离子喷洗基板操作Step S40 is to carry out the operation of plasma spraying the substrate
步骤S50进行等离子及二氧化碳雪花喷洗基板操作In step S50, plasma and carbon dioxide snowflakes are sprayed to clean the substrate
10基板10 substrates
20等离子供应单元20 plasma supply unit
30二氧化碳雪花供应单元30 CO2 Snowflake Supply Units
40遮挡件40 shades
50吸气装置50 suction device
具体实施方式Detailed ways
如图1所示,本发明的一种以复合式洁净基板的表面污染物的方法,此复合式洁净基板的表面污染物的方法S1包含提供一基板(步骤S10)、提供一等离子供应单元(步骤S20)、提供一二氧化碳雪花供应单元(步骤S30)、进行等离子喷洗基板操作(步骤S40)及进行等离子及二氧化碳雪花喷洗基板操作(步骤S50)。As shown in FIG. 1 , a method of the present invention for cleaning surface pollutants of a composite substrate, the method S1 of the composite cleaning substrate surface pollutants includes providing a substrate (step S10), providing a plasma supply unit ( Step S20 ), providing a carbon dioxide snowflake supply unit (step S30 ), performing plasma spraying operation on the substrate (step S40 ), and performing plasma and carbon dioxide snowflake spraying operation on the substrate (step S50 ).
参考图1及图2,本发明的一种以复合式洁净基板的表面污染物的方法,此复合式洁净基板的表面污染物的方法S1,先进行提供一基板(步骤S10),基板10表面具有污染物,且此基板10可移动,即是将基板10设置于一运动机构(图中未示)上以达到基板进行移动;再提供一等离子供应单元(步骤S20),此等离子供应单元20设置于基板10上方,且等离子供应单元20可移动,同理即是等离子供应单元20设置于一运动机构(图中未示)上以能进行运动;又,提供一二氧化碳雪花供应单元(步骤S30),此二氧化碳雪花供应单元30位于基板10上方,与置于等离子供应单元20的一侧,且二氧化碳雪花供应单元30可移动,更具体而言,将二氧化碳雪花供应单元30设置于一运动机构(图中未示)上以能进行运动;此方法还包含一遮挡件40,设置于等离子供应单元20及二氧化碳雪花供应单元30之间,用以消除静电荷,并隔离二氧化碳雪花喷发对于等离子供应单元20造成的干扰;及上述基板10外围还能设置有一吸气装置50,用以吸离上述基板10表面洁净后所产生的废气与污染物;又再进行等离子喷洗基板操作(步骤S40),此基板10与等离子供应单元20相对移动以进行等离子喷发以清洗基板10;最后,进行等离子及二氧化碳雪花喷洗基板操作(步骤S50),基板10与等离子供应单元20及二氧化碳雪花供应单元30相对移动以进行等离子及二氧化碳雪花喷洗上述基板10表面的污染物。With reference to Fig. 1 and Fig. 2, a kind of method of the present invention is with the method S1 of the surface contamination of composite cleaning substrate, the method S1 of the surface contamination of this composite cleaning substrate, firstly provide a substrate (step S10),
本发明的一种以复合式洁净基板的表面污染物的方法,此复合式洁净基板的表面污染物的方法S1,上述遮挡件40为一离子产生源。又,本发明的一种以复合式洁净基板的表面污染物的方法,此复合式洁净基板的表面污染物的方法S1,上述揭露基板10与等离子供应单元20相对移动,为基板10相对等离子供应单元20移动;又或者,为等离子供应单元20相对基板10移动。另外,上述进行等离子喷洗基板操作步骤(步骤S40)及进行等离子及二氧化碳雪花喷洗基板操作步骤(步骤S50),能同时进行或前后步骤进行。According to the present invention, a composite method for cleaning substrate surface pollutants, in the composite method S1 for cleaning substrate surface pollutants, the
当然,本发明还可有其它多种实施例,在不背离本发明精神及其实质的情况下,熟悉本领域的技术人员当可根据本发明作出各种相应的改变和变形,但这些相应的改变和变形都应属于本发明所附的权利要求的保护范围。Certainly, the present invention also can have other multiple embodiments, without departing from the spirit and essence of the present invention, those skilled in the art can make various corresponding changes and deformations according to the present invention, but these corresponding Changes and deformations should belong to the scope of protection of the appended claims of the present invention.
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101733258B (en) * | 2008-11-14 | 2012-09-19 | 乐金显示有限公司 | Washing device |
CN103203341A (en) * | 2013-03-17 | 2013-07-17 | 上海宏科半导体技术有限公司 | Cleaning device and cleaning method for electronic product packaging plate |
CN104492761A (en) * | 2014-12-24 | 2015-04-08 | 京东方科技集团股份有限公司 | Mask cleaning device and cleaning method thereof |
CN110662363A (en) * | 2018-06-28 | 2020-01-07 | 雷立强光电科技股份有限公司 | cleaning method |
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2006
- 2006-05-31 CN CN2006100832959A patent/CN101081395B/en active Active
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101733258B (en) * | 2008-11-14 | 2012-09-19 | 乐金显示有限公司 | Washing device |
CN103203341A (en) * | 2013-03-17 | 2013-07-17 | 上海宏科半导体技术有限公司 | Cleaning device and cleaning method for electronic product packaging plate |
CN103203341B (en) * | 2013-03-17 | 2017-12-26 | 上海宏科半导体技术有限公司 | A kind of cleaning device and its cleaning method for electronic product packaging tray |
CN104492761A (en) * | 2014-12-24 | 2015-04-08 | 京东方科技集团股份有限公司 | Mask cleaning device and cleaning method thereof |
US9636718B2 (en) | 2014-12-24 | 2017-05-02 | Boe Technology Group Co., Ltd. | Mask cleaning apparatus and mask cleaning method |
CN110662363A (en) * | 2018-06-28 | 2020-01-07 | 雷立强光电科技股份有限公司 | cleaning method |
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