[go: up one dir, main page]

CN100372088C - Automatic bonding method for MEMS high temperature pressure sensor - Google Patents

Automatic bonding method for MEMS high temperature pressure sensor Download PDF

Info

Publication number
CN100372088C
CN100372088C CNB200610009745XA CN200610009745A CN100372088C CN 100372088 C CN100372088 C CN 100372088C CN B200610009745X A CNB200610009745X A CN B200610009745XA CN 200610009745 A CN200610009745 A CN 200610009745A CN 100372088 C CN100372088 C CN 100372088C
Authority
CN
China
Prior art keywords
operator
sensor
microscope
under
glass substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB200610009745XA
Other languages
Chinese (zh)
Other versions
CN1834601A (en
Inventor
谢晖
荣伟彬
孙立宁
陈立国
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Harbin Institute of Technology Shenzhen
Original Assignee
Harbin Institute of Technology Shenzhen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Harbin Institute of Technology Shenzhen filed Critical Harbin Institute of Technology Shenzhen
Priority to CNB200610009745XA priority Critical patent/CN100372088C/en
Publication of CN1834601A publication Critical patent/CN1834601A/en
Application granted granted Critical
Publication of CN100372088C publication Critical patent/CN100372088C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Pressure Sensors (AREA)
  • Micromachines (AREA)

Abstract

本发明提供的是一种MEMS高温压力传感器自动键合方法。它选择由台面、设置在台面上的物流台、操作手、加热炉和显微镜组成的自动键合机进行自动键合;自动键合机的操作手安装在由4个轴控制的4自由度操作手工作台上,加热炉安装在由2个轴控制的2自由度定位工作台上,显微镜安装在包括可上下运动的轴的显微镜自动调焦工作台上。本发明基于显微视觉的高精度、非接触式测量,实现了不论是正面还是反面MEMS高温压力传感器的高精度对准作业;融合视觉/微力觉信息,实现芯片和玻璃基的高精度、无损抓取和搬运;设备的高自动化程度使得其具有批量制造能力,提高了生产效率。

Figure 200610009745

The invention provides an automatic bonding method for a MEMS high temperature pressure sensor. It chooses an automatic bonding machine consisting of a table, a logistics table set on the table, an operator, a heating furnace and a microscope for automatic bonding; the operator of the automatic bonding machine is installed in a 4-degree-of-freedom operation controlled by 4 axes On the manual worktable, the heating furnace is installed on a 2-DOF positioning table controlled by 2 axes, and the microscope is installed on a microscope auto-focusing workbench including an axis that can move up and down. The invention is based on the high-precision and non-contact measurement of microscopic vision, and realizes the high-precision alignment operation of the MEMS high-temperature pressure sensor whether it is the front or the back; fusion of visual/micro-force sense information realizes high-precision, non-destructive alignment of chips and glass substrates Grabbing and handling; the high degree of automation of the equipment enables it to have batch manufacturing capabilities and improve production efficiency.

Figure 200610009745

Description

MEMS高温压力传感器自动键合方法 Automatic bonding method for MEMS high temperature pressure sensor

(一)技术领域 (1) Technical field

本发明涉及的是一种传感器的加工方法,具体地说是一种传感器静电键合方法。The invention relates to a sensor processing method, in particular to a sensor electrostatic bonding method.

(二)背景技术 (2) Background technology

硅-玻璃静电键合技术广泛应用在压力传感器的制造上,在MEMS和IC制造领域有着重要地位。同时也是MEMS高温压力传感器制造过程中的重要工艺流程。MEMS高温压力传感器的键合时,不论是正面敏感还是反面敏感。敏感电路中心须和导压孔中心对准。但是,目前在MEMS高温压力传感器的静电键合操作采用手工作业。和自动阳极键合技术相比,目前的手工键合作业有以下的不足和缺陷:1、对准精度低,芯片敏感电路中心和和玻璃基导压孔不能精确对准,尤其是在反面敏感传感器键合时,影响传感器的性能。2、一致性差,手工作业导致传感器性能的一致性差。3、效率低,限制了MEMS高温压力传感器的批量制造。Silicon-glass electrostatic bonding technology is widely used in the manufacture of pressure sensors, and plays an important role in the fields of MEMS and IC manufacturing. It is also an important process in the manufacturing process of MEMS high temperature pressure sensors. When bonding MEMS high-temperature pressure sensors, whether it is front-side sensitive or reverse-sensitive. The center of the sensitive circuit must be aligned with the center of the pressure guiding hole. However, the electrostatic bonding operation in MEMS high-temperature pressure sensors is currently manual. Compared with the automatic anode bonding technology, the current manual bonding operation has the following deficiencies and defects: 1. The alignment accuracy is low, and the center of the chip sensitive circuit and the glass-based pressure guiding hole cannot be accurately aligned, especially on the reverse side. When the sensor is bonded, it affects the performance of the sensor. 2. Poor consistency, manual work leads to poor consistency of sensor performance. 3. The efficiency is low, which limits the mass production of MEMS high-temperature pressure sensors.

(三)发明内容 (3) Contents of the invention

本发明的目的在于提供一种能够提高MEMS高温压力传感器的硅-玻璃阳极键合工艺过程中的高精度对准,提高产品质量,同时提高生产效率的MEMS高温压力传感器自动键合方法。The object of the present invention is to provide an automatic bonding method for MEMS high-temperature pressure sensors that can improve high-precision alignment in the silicon-glass anode bonding process of MEMS high-temperature pressure sensors, improve product quality, and improve production efficiency.

本发明的目的是这样实现的:它选择由台面、设置在台面上的物流台、操作手、加热炉和显微镜组成的自动键合机;自动键合机的操作手安装在由4个轴控制的4自由度操作手工作台上,加热炉安装在由2个轴控制的2自由度定位工作台上,显微镜安装在包括可上下运动的轴的显微镜自动调焦工作台上;The purpose of the present invention is achieved like this: it selects the automatic bonding machine that is made up of table top, the logistics table that is arranged on table top, operator, heating furnace and microscope; The 4-degree-of-freedom operator's workbench, the heating furnace is installed on the 2-degree-of-freedom positioning workbench controlled by 2 axes, and the microscope is installed on the microscope auto-focusing workbench including the axis that can move up and down;

1、传感器芯片和玻璃基片经过超声波清洗后,分别放置到承载盘中,放置到物流台上,加热炉加温到420℃;1. After the sensor chip and the glass substrate are ultrasonically cleaned, they are respectively placed on the carrier tray, placed on the logistics table, and the heating furnace is heated to 420°C;

2、系统初始化,启动操作手,旋转到物流台上方,在微力传感的控制下,无损抓取传感器芯片;2. System initialization, start the operator, rotate to the top of the logistics table, and under the control of the micro force sensor, grab the sensor chip without damage;

3、移动定位工作台,使得具有3个加热点的加热炉的第1加热点位于显微镜视场中心,旋转操作手,搬运传感器芯片于显微镜下,在微力传感的控制下放置到第1加热点处;3. Move the positioning workbench so that the first heating point of the heating furnace with three heating points is located in the center of the microscope field of view, rotate the operator, carry the sensor chip under the microscope, and place it on the first heating point under the control of the micro force sensor. hot spot;

4、在显微视觉的伺服控制下,通过图像处理和识别,控制定位工作台移动,使得传感器芯片敏感电路的中心位于视场中心;4. Under the servo control of microscopic vision, through image processing and recognition, control the movement of the positioning table so that the center of the sensitive circuit of the sensor chip is located in the center of the field of view;

5、操作手旋转到物流台上方,在微力传感的控制下,无损抓取玻璃基片;5. The operator rotates to the top of the logistics table, and under the control of the micro-force sensor, the glass substrate is grasped without damage;

6、旋转操作手,搬运玻璃基片于显微镜下;6. Rotate the operator to move the glass substrate under the microscope;

7、在显微视觉的伺服控制下,通过图像处理和识别,控制操作手移动,使得玻璃基片导压孔的中心位于视场中心;7. Under the servo control of microscopic vision, through image processing and recognition, the movement of the operator is controlled, so that the center of the pressure guiding hole of the glass substrate is located in the center of the field of view;

8、在微力传感的控制下竖直向下放置玻璃基片到传感器芯片上,当两者刚刚接触时,加直流电压1200V,正极和传感器芯片相通,负极和玻璃基片相通,键合开始;8. Under the control of the micro force sensor, place the glass substrate vertically downward on the sensor chip. When the two are just in contact, apply a DC voltage of 1200V, the positive electrode is connected to the sensor chip, the negative electrode is connected to the glass substrate, and the bonding starts. ;

9、封装头下压到玻璃基片上,加载,同时操作手撤出,用于第2个传感器的键合作业;9. The packaging head is pressed down on the glass substrate, loaded, and the operator withdraws at the same time, for the bonding operation of the second sensor;

依此类推,当操作手从第3个加热点撤出后,第1个传感器已经键合完毕,由操作手抓取取出,放置到物流台上,然后进行第4个传感器的键合作业,如此循环,实现了传感器的自动键合作业流程。By analogy, when the operator withdraws from the third heating point, the first sensor has been bonded, the operator grabs it out, puts it on the logistics table, and then performs the bonding operation of the fourth sensor. Such a cycle realizes the automatic bonding operation process of the sensor.

本发明为了实现MEMS高温压力传感器的硅-玻璃阳极键合工艺过程中的高精度对准,提高产品质量,同时提高生产效率,面向MEMS传感器的批量制造,选择具有批量制造功能的基于计算机控制的自动阳极技术该技术具有以下优点:In order to achieve high-precision alignment in the silicon-glass anode bonding process of MEMS high-temperature pressure sensors, improve product quality, and improve production efficiency at the same time, the present invention is oriented to batch manufacturing of MEMS sensors, and selects a computer-based control device with batch manufacturing functions. Automatic anode technology This technology has the following advantages:

1、基于显微视觉的高精度、非接触式测量,实现了不论是正面还是反面MEMS高温压力传感器的高精度对准作业;1. High-precision, non-contact measurement based on microscopic vision, which realizes high-precision alignment of MEMS high-temperature pressure sensors on both the front and back sides;

2、融合视觉/微力觉信息,实现芯片和玻璃基的高精度、无损抓取和搬运;2. Integrate visual/micro-force sense information to realize high-precision, non-destructive grasping and handling of chips and glass substrates;

3、设备的高自动化程度使得其具有批量制造能力,提高了生产效率。3. The high degree of automation of the equipment makes it capable of batch manufacturing and improves production efficiency.

(四)附图说明 (4) Description of drawings

图1是本发明的自动键合机的结构示意图;Fig. 1 is the structural representation of automatic bonding machine of the present invention;

图2是本发明的自动键合机的主视图;Fig. 2 is the front view of automatic bonding machine of the present invention;

图3是图1的俯视图;Fig. 3 is the top view of Fig. 1;

图4是图1的左视图。Fig. 4 is a left side view of Fig. 1 .

(五)具体实施方式 (5) Specific implementation methods

下面结合附图举例对本发明作更详细的描述:The present invention is described in more detail below in conjunction with accompanying drawing example:

MEMS高温压力传感器自动键合机的组成包括台面1,在台面上设置物流台2、操作手3、加热炉4和显微镜5。操作手安装在由轴I、轴II、轴III和轴IV控制的,可在X、Y、Z和W4个方面精确运动4自由度操作手工作台上。4自由度操作手工作台上用于控制操作手的定位运动,实现芯片、玻璃基以及键合后的成品的抓取和搬运;加热炉安装在由轴V和轴VI控制的,可在X、Y两个方面精确运动的2自由度定位工作台上。2自由度定位工作台用于控制加热炉沿X、Y两个方面精确运动以及在图像视觉的辅助下实现硅片和玻璃基的自动对准;显微镜安装在可Y方向精确运动的带轴VII的显微镜自动调焦工作台上。其中所述的显微镜是倍数可变的显微镜。显微镜自动调焦工作台用于控制倍数可变的显微镜,从而构成一个变焦距显微视觉系统。The MEMS high-temperature pressure sensor automatic bonding machine consists of a table top 1 on which a logistics table 2, an operator 3, a heating furnace 4 and a microscope 5 are arranged. The manipulator is installed on the manipulator table with 4 degrees of freedom for precise movement in X, Y, Z and W directions controlled by axes I, II, III and IV. The 4-degree-of-freedom manipulator workbench is used to control the positioning movement of the manipulator to realize the grabbing and handling of chips, glass substrates and bonded finished products; the heating furnace is installed on the axis V and VI controlled , Y two aspects of precise movement of the 2 degrees of freedom positioning on the table. The 2-degree-of-freedom positioning table is used to control the precise movement of the heating furnace along the X and Y directions and to realize the automatic alignment of the silicon wafer and the glass substrate with the aid of image vision; the microscope is installed on the belt axis VII that can move precisely in the Y direction Microscope auto-focus workbench. The microscope described therein is a variable magnification microscope. Microscope automatic focusing workbench is used to control the microscope with variable magnification, so as to constitute a zoom microscopic vision system.

下面对本发明的工作过程作进一步描述:The working process of the present invention is further described below:

1、芯片和基体经过超声波清洗后,分别放置到承载盘中,放置到物流台上,加热炉加温到420℃;1. After ultrasonic cleaning, the chip and the substrate are placed on the carrier tray and placed on the logistics table, and the heating furnace is heated to 420°C;

2、系统初始化,启动操作手,旋转到物流台上方,在微力传感的控制下,无损抓取传感器芯片;2. System initialization, start the operator, rotate to the top of the logistics table, and under the control of the micro force sensor, grab the sensor chip without damage;

3、移动定位工作台,使得具有3个加热点的加热炉的第1加热点位于显微镜视场中心。旋转操作手,搬运芯片于显微镜下,在微力传感的控制下放置到第1加热点处;3. Move and position the workbench so that the first heating point of the heating furnace with 3 heating points is located in the center of the field of view of the microscope. Rotate the operator, move the chip under the microscope, and place it at the first heating point under the control of the micro force sensor;

4、在显微视觉的伺服控制下,通过图像处理和识别,控制定位工作台移动,使得芯片敏感电路的中心位于视场中心;4. Under the servo control of microscopic vision, through image processing and recognition, control the movement of the positioning table so that the center of the chip sensitive circuit is located in the center of the field of view;

5、旋转到物流台上方,在微力传感的控制下,无损抓取玻璃基片;5. Rotate to the top of the logistics table, and grasp the glass substrate without damage under the control of the micro-force sensor;

6、旋转操作手,搬运芯片于显微镜下;6. Rotate the operator to move the chip under the microscope;

7、在显微视觉的伺服控制下,通过图像处理和识别,控制操作手移动,使得玻璃基片导压孔的中心位于视场中心;7. Under the servo control of microscopic vision, through image processing and recognition, the movement of the operator is controlled, so that the center of the pressure guiding hole of the glass substrate is located in the center of the field of view;

8、在微力传感的控制下竖直向下放置玻璃基片到芯片上,当两者刚刚接触时,加直流电压1200V,正极和芯片相通,负极和玻璃基片相通,键合开始;8. Under the control of the micro-force sensor, place the glass substrate vertically downward on the chip. When the two are just in contact, apply a DC voltage of 1200V, the positive electrode is connected to the chip, the negative electrode is connected to the glass substrate, and the bonding begins;

9、封装头下压到玻璃基片上,加载。同时操作手撤出,用于第2个传感器的键合作业;9. The packaging head is pressed down onto the glass substrate and loaded. At the same time, the operator is withdrawn for the bonding operation of the second sensor;

10、依此类推,当操作手从第3个加热点撤出后,第1个传感器已经键合完毕,由操作手抓取取出,放置到物流台上,然后进行第4个传感器的键合作业。如此循环,实现了传感器的自动键合作业流程。10. By analogy, when the operator withdraws from the third heating point, the first sensor has been bonded, the operator grabs it out, puts it on the logistics table, and then performs the bonding of the fourth sensor Industry. Such a cycle realizes the automatic bonding operation process of the sensor.

各项测试包括各轴工作台运动精度、图像对准精度和微力传感器指标测试结果如下:Various tests, including the motion accuracy of each axis table, image alignment accuracy and micro force sensor index test results are as follows:

操作手工作台检测结果Operator Workbench Test Results

  名称name  检测项目 Test items   x轴x-axis   y轴y-axis   z轴z-axis   w轴w axis   工作台workbench  运动行程(mm)Movement stroke(mm)   50mm50mm   50mm50mm   10mm10mm   274°274°  重复定位精度(μm)Repeat positioning accuracy (μm)   1.5μm1.5μm   1.5μm1.5μm   1.5μm1.5μm   0.015°0.015°  运动分辨率(μm)Motion Resolution (μm)   0.5μm0.5μm   0.5μm0.5μm   0.5μm0.5μm   0.005°0.005°

定位工作台检测结果Positioning workbench test results

  名称name   检测项目 Test items   x轴x-axis   y轴y-axis   工作台workbench   运动行程(mm)Movement stroke (mm)   80mm80mm   10mm10mm   重复定位精度(μm)Repeat positioning accuracy (μm)   1.5μm1.5μm   1.5μm1.5μm   运动分辨率(μm)Motion resolution (μm)   0.5μm0.5μm   0.5μm0.5μm

显微镜自动调焦工作台检测结果Microscope automatic focusing workbench test results

  名称name  检测项目 Test items   技术指标Technical indicators   工作台workbench  运动行程(mm)Movement stroke(mm)   20mm20mm  重复定位精度(μm)Repeat positioning accuracy (μm)   1.5μm1.5μm  运动分辨率(μm)Motion Resolution (μm)   0.5μm0.5μm

显微视觉系统检测结果(视觉定位精度)Inspection results of microscopic vision system (visual positioning accuracy)

  名称name   检测项目 Test items   技术指标Technical indicators   检测结果 Test results   物镜objective lens   定位分辨率(μm)Positioning resolution (μm)   4.0μm4.0μm   3.813.81   3.793.79   3.803.80   3.813.81   3.803.80

微力传感器检测结果Micro force sensor test results

  名称name   量程(mN)Range (mN)   精度(%F.S)Accuracy (%F.S)   分辨率(mN)Resolution (mN)   一维力传感器One-dimensional force sensor   30003000   0.5%0.5%   55

Claims (1)

1.一种MEMS高温压力传感器自动键合方法,其特征是:它选择由台面、设置在台面上的物流台、操作手、加热炉和显微镜组成的自动键合机;自动键合机的操作手安装在由4个轴控制的4自由度操作手工作台上,加热炉安装在由2个轴控制的2自由度定位工作台上,显微镜安装在包括可上下运动的轴的显微镜自动调焦工作台上;1. A MEMS high-temperature pressure sensor automatic bonding method is characterized in that: it selects an automatic bonding machine composed of a table top, a logistics platform arranged on the table top, an operator, a heating furnace and a microscope; the operation of the automatic bonding machine The hand is installed on the 4-DOF manipulator table controlled by 4 axes, the heating furnace is installed on the 2-DOF positioning table controlled by 2 axes, and the microscope is installed on the microscope automatic focusing including the axis that can move up and down on the workbench; (1)、传感器芯片和玻璃基片经过超声波清洗后,分别放置到承载盘中,放置到物流台上,加热炉加温到420℃;(1) After the sensor chip and the glass substrate are ultrasonically cleaned, they are respectively placed on the carrier tray, placed on the logistics table, and heated to 420°C in the heating furnace; (2)、系统初始化,启动操作手,旋转到物流台上方,在微力传感的控制下,无损抓取传感器芯片;(2) Initialize the system, start the operator, rotate to the top of the logistics platform, and grasp the sensor chip without damage under the control of the micro force sensor; (3)、移动定位工作台,使得具有3个加热点的加热炉的第1加热点位于显微镜视场中心,旋转操作手,搬运传感器芯片于显微镜下,在微力传感的控制下放置到第1加热点处;(3) Move the positioning workbench so that the first heating point of the heating furnace with three heating points is located in the center of the microscope field of view, rotate the operator, transport the sensor chip under the microscope, and place it under the control of the micro force sensor. 1 at the heating point; (4)、在显微视觉的伺服控制下,通过图像处理和识别,控制定位工作台移动,使得传感器芯片敏感电路的中心位于视场中心;(4) Under the servo control of microscopic vision, through image processing and recognition, control the movement of the positioning workbench, so that the center of the sensitive circuit of the sensor chip is located in the center of the field of view; (5)、操作手旋转到物流台上方,在微力传感的控制下,无损抓取玻璃基片;(5) The operator rotates to the top of the logistics table, and under the control of the micro-force sensor, the glass substrate is grasped without damage; (6)、旋转操作手,搬运玻璃基片于显微镜下;(6) Rotate the operator to move the glass substrate under the microscope; (7)、在显微视觉的伺服控制下,通过图像处理和识别,控制操作手移动,使得玻璃基片导压孔的中心位于视场中心;(7) Under the servo control of microscopic vision, through image processing and recognition, the movement of the operator is controlled, so that the center of the pressure guiding hole of the glass substrate is located in the center of the field of view; (8)、在微力传感的控制下竖直向下放置玻璃基片到传感器芯片上,当两者刚刚接触时,加直流电压1200V,正极和传感器芯片相通,负极和玻璃基片相通,键合开始;(8) Under the control of the micro force sensor, place the glass substrate vertically downward on the sensor chip. When the two are just in contact, apply a DC voltage of 1200V, the positive electrode is connected to the sensor chip, and the negative electrode is connected to the glass substrate. together start; (9)、封装头下压到玻璃基片上,加载,同时操作手撤出,用于第2个传感器的键合作业;(9) The encapsulation head is pressed down onto the glass substrate, loaded, and the operator is withdrawn at the same time, for the bonding operation of the second sensor; 依此类推,当操作手从第3个加热点撤出后,第1个传感器已经键合完毕,由操作手抓取取出,放置到物流台上,然后进行第4个传感器的键合作业,如此循环,实现了传感器的自动键合作业流程。By analogy, when the operator withdraws from the third heating point, the first sensor has been bonded, the operator grabs it out, puts it on the logistics table, and then performs the bonding operation of the fourth sensor. Such a cycle realizes the automatic bonding operation process of the sensor.
CNB200610009745XA 2006-02-27 2006-02-27 Automatic bonding method for MEMS high temperature pressure sensor Expired - Fee Related CN100372088C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB200610009745XA CN100372088C (en) 2006-02-27 2006-02-27 Automatic bonding method for MEMS high temperature pressure sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB200610009745XA CN100372088C (en) 2006-02-27 2006-02-27 Automatic bonding method for MEMS high temperature pressure sensor

Publications (2)

Publication Number Publication Date
CN1834601A CN1834601A (en) 2006-09-20
CN100372088C true CN100372088C (en) 2008-02-27

Family

ID=37002432

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB200610009745XA Expired - Fee Related CN100372088C (en) 2006-02-27 2006-02-27 Automatic bonding method for MEMS high temperature pressure sensor

Country Status (1)

Country Link
CN (1) CN100372088C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103723677A (en) * 2014-01-10 2014-04-16 苏州大学 Assembling and packaging system and method of sensor

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102275869B (en) * 2011-08-03 2014-04-09 苏州大学 Equipment and method for bonding single chip and wafer
CN102659072B (en) * 2012-05-18 2014-08-06 山东理工大学 Bonding equipment for chips and wafers
CN103204462B (en) * 2013-03-27 2015-05-20 山东理工大学 Low-temperature ultrasonic anodic bonding device for silicon wafers and glass pieces
CN103145096B (en) * 2013-03-27 2015-04-08 山东理工大学 Low-temperature ultrasound anodic bonding method of silicon wafer and glass sheet
CN103280417A (en) * 2013-06-17 2013-09-04 华进半导体封装先导技术研发中心有限公司 Flexible substrate encapsulating device
CN104051318B (en) * 2014-07-04 2017-02-01 格科微电子(上海)有限公司 Automatic packaging system and automatic packaging method of image sensor chip
CN104528633A (en) * 2014-12-02 2015-04-22 哈尔滨工业大学 Multifunctional bonding experimental facility based on micro-electromechanical system technology
CN106365113B (en) * 2016-10-26 2017-10-31 华东师范大学 A kind of automatic calibration type operating desk of stacking two-dimensional layer dissimilar materials
CN108408684B (en) * 2018-04-17 2020-06-16 大连理工大学 Alignment bonding device for manufacturing MEMS (micro-electromechanical system) device
CN108981998B (en) * 2018-08-08 2020-09-29 重庆大学 A kind of electrostatic adsorption force test platform and force measurement method thereof
CN112973814B (en) * 2021-03-03 2022-03-18 北京理工大学 An interlayer automatic alignment bonding device and method for a multi-layer microfluidic chip
CN113457755B (en) * 2021-04-12 2022-09-13 清华大学 Micro-fluidic chip bonding equipment integrating alignment and hot baking based on microscopic imaging

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1207253A (en) * 1968-07-04 1970-09-30 Valery Ivanovich Soin A device for the precision bonding of circuits by thermocompression method
JPH0669286A (en) * 1992-08-19 1994-03-11 Hitachi Ltd Bonding device
CN1136160C (en) * 2000-06-02 2004-01-28 中国科学院上海冶金研究所 A glass/silicon bonding device for making micromechanical devices and its use method
CN1588618A (en) * 2004-09-10 2005-03-02 北京工业大学 Static bonding process with suspending movable sensitive structure
CN1610056A (en) * 2004-11-12 2005-04-27 江苏大学 Silicon Chip/Glass Ring Bonding Device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1207253A (en) * 1968-07-04 1970-09-30 Valery Ivanovich Soin A device for the precision bonding of circuits by thermocompression method
JPH0669286A (en) * 1992-08-19 1994-03-11 Hitachi Ltd Bonding device
CN1136160C (en) * 2000-06-02 2004-01-28 中国科学院上海冶金研究所 A glass/silicon bonding device for making micromechanical devices and its use method
CN1588618A (en) * 2004-09-10 2005-03-02 北京工业大学 Static bonding process with suspending movable sensitive structure
CN1610056A (en) * 2004-11-12 2005-04-27 江苏大学 Silicon Chip/Glass Ring Bonding Device

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
MEMS器件微装配系统的设计与研制. 陈立国,孙立宁,荣伟彬等.中国机械工程,第16卷第14期. 2005 *
MEMS封装技术. 陈一梅,黄元庆.传感器技术,第24卷第3期. 2005 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103723677A (en) * 2014-01-10 2014-04-16 苏州大学 Assembling and packaging system and method of sensor
CN103723677B (en) * 2014-01-10 2016-04-20 苏州大学 A kind of sensor assembling package system and assembling method for packing

Also Published As

Publication number Publication date
CN1834601A (en) 2006-09-20

Similar Documents

Publication Publication Date Title
CN100372088C (en) Automatic bonding method for MEMS high temperature pressure sensor
CN206696201U (en) A kind of multiple dimensioned Automatic Visual Inspection device towards flexible PCB
CN108426839B (en) A detection method of additive manufacturing components based on correlation analysis of laser ultrasonic signal scanning by manipulator
CN103091521B (en) Method of probe and lead foot automatic aiming and probe station testing system thereof
CN103575593A (en) In-situ uniaxial tension observation device for mesoscale metal material
JP2015085490A (en) Robot system, inspection method, and inspection object production method
CN209663912U (en) A kind of automatic laser cleaning machine
CN108890144A (en) A kind of laser cutting machine
CN106799595B (en) A kind of spinning head process automation production system and method
CN107152915A (en) It is intended for the grand micro- combination integrated detecting device of multiple degrees of freedom of various structures feature
WO2023134168A1 (en) Automated ball-planting testing system using welding ball array packaging
CN108120717B (en) Automatic visual imaging hole inspection through hole equipment
CN1319892C (en) Automatic bonding machine for MEMS high temp. pressure sensor
CN111054702A (en) Laser cleaning equipment for surface treatment of annular component
CN103273310A (en) Micro-part automatic aligning device and method based on multipath micro-vision
Wang et al. Automated 3-D micrograsping tasks performed by vision-based control
CN106018415A (en) System for detecting quality of small parts based on micro-vision
JP5445160B2 (en) Wafer processing apparatus, wafer processing method, and device manufacturing method
CN222112635U (en) Double-clamping-disc testing system
Jantzen et al. Microclamping principles from the perspective of micrometrology–A review
CN206811964U (en) A kind of flexible electronic product 3D printing automation equipment
CN108122787B (en) Chip bonding device and die bonding method
CN109060607B (en) Compliant operation device based on visual feedback and liquid bridge force automatic detection method
Kawakami et al. Automated microhand system for measuring cell stiffness by using two plate end-effectors
Jasper et al. Automated robot-based separation and palletizing of microcomponents

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20080227

Termination date: 20110227