CN100372088C - Automatic bonding method for MEMS high temperature pressure sensor - Google Patents
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Abstract
本发明提供的是一种MEMS高温压力传感器自动键合方法。它选择由台面、设置在台面上的物流台、操作手、加热炉和显微镜组成的自动键合机进行自动键合;自动键合机的操作手安装在由4个轴控制的4自由度操作手工作台上,加热炉安装在由2个轴控制的2自由度定位工作台上,显微镜安装在包括可上下运动的轴的显微镜自动调焦工作台上。本发明基于显微视觉的高精度、非接触式测量,实现了不论是正面还是反面MEMS高温压力传感器的高精度对准作业;融合视觉/微力觉信息,实现芯片和玻璃基的高精度、无损抓取和搬运;设备的高自动化程度使得其具有批量制造能力,提高了生产效率。
The invention provides an automatic bonding method for a MEMS high temperature pressure sensor. It chooses an automatic bonding machine consisting of a table, a logistics table set on the table, an operator, a heating furnace and a microscope for automatic bonding; the operator of the automatic bonding machine is installed in a 4-degree-of-freedom operation controlled by 4 axes On the manual worktable, the heating furnace is installed on a 2-DOF positioning table controlled by 2 axes, and the microscope is installed on a microscope auto-focusing workbench including an axis that can move up and down. The invention is based on the high-precision and non-contact measurement of microscopic vision, and realizes the high-precision alignment operation of the MEMS high-temperature pressure sensor whether it is the front or the back; fusion of visual/micro-force sense information realizes high-precision, non-destructive alignment of chips and glass substrates Grabbing and handling; the high degree of automation of the equipment enables it to have batch manufacturing capabilities and improve production efficiency.
Description
(一)技术领域 (1) Technical field
本发明涉及的是一种传感器的加工方法,具体地说是一种传感器静电键合方法。The invention relates to a sensor processing method, in particular to a sensor electrostatic bonding method.
(二)背景技术 (2) Background technology
硅-玻璃静电键合技术广泛应用在压力传感器的制造上,在MEMS和IC制造领域有着重要地位。同时也是MEMS高温压力传感器制造过程中的重要工艺流程。MEMS高温压力传感器的键合时,不论是正面敏感还是反面敏感。敏感电路中心须和导压孔中心对准。但是,目前在MEMS高温压力传感器的静电键合操作采用手工作业。和自动阳极键合技术相比,目前的手工键合作业有以下的不足和缺陷:1、对准精度低,芯片敏感电路中心和和玻璃基导压孔不能精确对准,尤其是在反面敏感传感器键合时,影响传感器的性能。2、一致性差,手工作业导致传感器性能的一致性差。3、效率低,限制了MEMS高温压力传感器的批量制造。Silicon-glass electrostatic bonding technology is widely used in the manufacture of pressure sensors, and plays an important role in the fields of MEMS and IC manufacturing. It is also an important process in the manufacturing process of MEMS high temperature pressure sensors. When bonding MEMS high-temperature pressure sensors, whether it is front-side sensitive or reverse-sensitive. The center of the sensitive circuit must be aligned with the center of the pressure guiding hole. However, the electrostatic bonding operation in MEMS high-temperature pressure sensors is currently manual. Compared with the automatic anode bonding technology, the current manual bonding operation has the following deficiencies and defects: 1. The alignment accuracy is low, and the center of the chip sensitive circuit and the glass-based pressure guiding hole cannot be accurately aligned, especially on the reverse side. When the sensor is bonded, it affects the performance of the sensor. 2. Poor consistency, manual work leads to poor consistency of sensor performance. 3. The efficiency is low, which limits the mass production of MEMS high-temperature pressure sensors.
(三)发明内容 (3) Contents of the invention
本发明的目的在于提供一种能够提高MEMS高温压力传感器的硅-玻璃阳极键合工艺过程中的高精度对准,提高产品质量,同时提高生产效率的MEMS高温压力传感器自动键合方法。The object of the present invention is to provide an automatic bonding method for MEMS high-temperature pressure sensors that can improve high-precision alignment in the silicon-glass anode bonding process of MEMS high-temperature pressure sensors, improve product quality, and improve production efficiency.
本发明的目的是这样实现的:它选择由台面、设置在台面上的物流台、操作手、加热炉和显微镜组成的自动键合机;自动键合机的操作手安装在由4个轴控制的4自由度操作手工作台上,加热炉安装在由2个轴控制的2自由度定位工作台上,显微镜安装在包括可上下运动的轴的显微镜自动调焦工作台上;The purpose of the present invention is achieved like this: it selects the automatic bonding machine that is made up of table top, the logistics table that is arranged on table top, operator, heating furnace and microscope; The 4-degree-of-freedom operator's workbench, the heating furnace is installed on the 2-degree-of-freedom positioning workbench controlled by 2 axes, and the microscope is installed on the microscope auto-focusing workbench including the axis that can move up and down;
1、传感器芯片和玻璃基片经过超声波清洗后,分别放置到承载盘中,放置到物流台上,加热炉加温到420℃;1. After the sensor chip and the glass substrate are ultrasonically cleaned, they are respectively placed on the carrier tray, placed on the logistics table, and the heating furnace is heated to 420°C;
2、系统初始化,启动操作手,旋转到物流台上方,在微力传感的控制下,无损抓取传感器芯片;2. System initialization, start the operator, rotate to the top of the logistics table, and under the control of the micro force sensor, grab the sensor chip without damage;
3、移动定位工作台,使得具有3个加热点的加热炉的第1加热点位于显微镜视场中心,旋转操作手,搬运传感器芯片于显微镜下,在微力传感的控制下放置到第1加热点处;3. Move the positioning workbench so that the first heating point of the heating furnace with three heating points is located in the center of the microscope field of view, rotate the operator, carry the sensor chip under the microscope, and place it on the first heating point under the control of the micro force sensor. hot spot;
4、在显微视觉的伺服控制下,通过图像处理和识别,控制定位工作台移动,使得传感器芯片敏感电路的中心位于视场中心;4. Under the servo control of microscopic vision, through image processing and recognition, control the movement of the positioning table so that the center of the sensitive circuit of the sensor chip is located in the center of the field of view;
5、操作手旋转到物流台上方,在微力传感的控制下,无损抓取玻璃基片;5. The operator rotates to the top of the logistics table, and under the control of the micro-force sensor, the glass substrate is grasped without damage;
6、旋转操作手,搬运玻璃基片于显微镜下;6. Rotate the operator to move the glass substrate under the microscope;
7、在显微视觉的伺服控制下,通过图像处理和识别,控制操作手移动,使得玻璃基片导压孔的中心位于视场中心;7. Under the servo control of microscopic vision, through image processing and recognition, the movement of the operator is controlled, so that the center of the pressure guiding hole of the glass substrate is located in the center of the field of view;
8、在微力传感的控制下竖直向下放置玻璃基片到传感器芯片上,当两者刚刚接触时,加直流电压1200V,正极和传感器芯片相通,负极和玻璃基片相通,键合开始;8. Under the control of the micro force sensor, place the glass substrate vertically downward on the sensor chip. When the two are just in contact, apply a DC voltage of 1200V, the positive electrode is connected to the sensor chip, the negative electrode is connected to the glass substrate, and the bonding starts. ;
9、封装头下压到玻璃基片上,加载,同时操作手撤出,用于第2个传感器的键合作业;9. The packaging head is pressed down on the glass substrate, loaded, and the operator withdraws at the same time, for the bonding operation of the second sensor;
依此类推,当操作手从第3个加热点撤出后,第1个传感器已经键合完毕,由操作手抓取取出,放置到物流台上,然后进行第4个传感器的键合作业,如此循环,实现了传感器的自动键合作业流程。By analogy, when the operator withdraws from the third heating point, the first sensor has been bonded, the operator grabs it out, puts it on the logistics table, and then performs the bonding operation of the fourth sensor. Such a cycle realizes the automatic bonding operation process of the sensor.
本发明为了实现MEMS高温压力传感器的硅-玻璃阳极键合工艺过程中的高精度对准,提高产品质量,同时提高生产效率,面向MEMS传感器的批量制造,选择具有批量制造功能的基于计算机控制的自动阳极技术该技术具有以下优点:In order to achieve high-precision alignment in the silicon-glass anode bonding process of MEMS high-temperature pressure sensors, improve product quality, and improve production efficiency at the same time, the present invention is oriented to batch manufacturing of MEMS sensors, and selects a computer-based control device with batch manufacturing functions. Automatic anode technology This technology has the following advantages:
1、基于显微视觉的高精度、非接触式测量,实现了不论是正面还是反面MEMS高温压力传感器的高精度对准作业;1. High-precision, non-contact measurement based on microscopic vision, which realizes high-precision alignment of MEMS high-temperature pressure sensors on both the front and back sides;
2、融合视觉/微力觉信息,实现芯片和玻璃基的高精度、无损抓取和搬运;2. Integrate visual/micro-force sense information to realize high-precision, non-destructive grasping and handling of chips and glass substrates;
3、设备的高自动化程度使得其具有批量制造能力,提高了生产效率。3. The high degree of automation of the equipment makes it capable of batch manufacturing and improves production efficiency.
(四)附图说明 (4) Description of drawings
图1是本发明的自动键合机的结构示意图;Fig. 1 is the structural representation of automatic bonding machine of the present invention;
图2是本发明的自动键合机的主视图;Fig. 2 is the front view of automatic bonding machine of the present invention;
图3是图1的俯视图;Fig. 3 is the top view of Fig. 1;
图4是图1的左视图。Fig. 4 is a left side view of Fig. 1 .
(五)具体实施方式 (5) Specific implementation methods
下面结合附图举例对本发明作更详细的描述:The present invention is described in more detail below in conjunction with accompanying drawing example:
MEMS高温压力传感器自动键合机的组成包括台面1,在台面上设置物流台2、操作手3、加热炉4和显微镜5。操作手安装在由轴I、轴II、轴III和轴IV控制的,可在X、Y、Z和W4个方面精确运动4自由度操作手工作台上。4自由度操作手工作台上用于控制操作手的定位运动,实现芯片、玻璃基以及键合后的成品的抓取和搬运;加热炉安装在由轴V和轴VI控制的,可在X、Y两个方面精确运动的2自由度定位工作台上。2自由度定位工作台用于控制加热炉沿X、Y两个方面精确运动以及在图像视觉的辅助下实现硅片和玻璃基的自动对准;显微镜安装在可Y方向精确运动的带轴VII的显微镜自动调焦工作台上。其中所述的显微镜是倍数可变的显微镜。显微镜自动调焦工作台用于控制倍数可变的显微镜,从而构成一个变焦距显微视觉系统。The MEMS high-temperature pressure sensor automatic bonding machine consists of a table top 1 on which a logistics table 2, an
下面对本发明的工作过程作进一步描述:The working process of the present invention is further described below:
1、芯片和基体经过超声波清洗后,分别放置到承载盘中,放置到物流台上,加热炉加温到420℃;1. After ultrasonic cleaning, the chip and the substrate are placed on the carrier tray and placed on the logistics table, and the heating furnace is heated to 420°C;
2、系统初始化,启动操作手,旋转到物流台上方,在微力传感的控制下,无损抓取传感器芯片;2. System initialization, start the operator, rotate to the top of the logistics table, and under the control of the micro force sensor, grab the sensor chip without damage;
3、移动定位工作台,使得具有3个加热点的加热炉的第1加热点位于显微镜视场中心。旋转操作手,搬运芯片于显微镜下,在微力传感的控制下放置到第1加热点处;3. Move and position the workbench so that the first heating point of the heating furnace with 3 heating points is located in the center of the field of view of the microscope. Rotate the operator, move the chip under the microscope, and place it at the first heating point under the control of the micro force sensor;
4、在显微视觉的伺服控制下,通过图像处理和识别,控制定位工作台移动,使得芯片敏感电路的中心位于视场中心;4. Under the servo control of microscopic vision, through image processing and recognition, control the movement of the positioning table so that the center of the chip sensitive circuit is located in the center of the field of view;
5、旋转到物流台上方,在微力传感的控制下,无损抓取玻璃基片;5. Rotate to the top of the logistics table, and grasp the glass substrate without damage under the control of the micro-force sensor;
6、旋转操作手,搬运芯片于显微镜下;6. Rotate the operator to move the chip under the microscope;
7、在显微视觉的伺服控制下,通过图像处理和识别,控制操作手移动,使得玻璃基片导压孔的中心位于视场中心;7. Under the servo control of microscopic vision, through image processing and recognition, the movement of the operator is controlled, so that the center of the pressure guiding hole of the glass substrate is located in the center of the field of view;
8、在微力传感的控制下竖直向下放置玻璃基片到芯片上,当两者刚刚接触时,加直流电压1200V,正极和芯片相通,负极和玻璃基片相通,键合开始;8. Under the control of the micro-force sensor, place the glass substrate vertically downward on the chip. When the two are just in contact, apply a DC voltage of 1200V, the positive electrode is connected to the chip, the negative electrode is connected to the glass substrate, and the bonding begins;
9、封装头下压到玻璃基片上,加载。同时操作手撤出,用于第2个传感器的键合作业;9. The packaging head is pressed down onto the glass substrate and loaded. At the same time, the operator is withdrawn for the bonding operation of the second sensor;
10、依此类推,当操作手从第3个加热点撤出后,第1个传感器已经键合完毕,由操作手抓取取出,放置到物流台上,然后进行第4个传感器的键合作业。如此循环,实现了传感器的自动键合作业流程。10. By analogy, when the operator withdraws from the third heating point, the first sensor has been bonded, the operator grabs it out, puts it on the logistics table, and then performs the bonding of the fourth sensor Industry. Such a cycle realizes the automatic bonding operation process of the sensor.
各项测试包括各轴工作台运动精度、图像对准精度和微力传感器指标测试结果如下:Various tests, including the motion accuracy of each axis table, image alignment accuracy and micro force sensor index test results are as follows:
操作手工作台检测结果Operator Workbench Test Results
定位工作台检测结果Positioning workbench test results
显微镜自动调焦工作台检测结果Microscope automatic focusing workbench test results
显微视觉系统检测结果(视觉定位精度)Inspection results of microscopic vision system (visual positioning accuracy)
微力传感器检测结果Micro force sensor test results
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CN103723677A (en) * | 2014-01-10 | 2014-04-16 | 苏州大学 | Assembling and packaging system and method of sensor |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1207253A (en) * | 1968-07-04 | 1970-09-30 | Valery Ivanovich Soin | A device for the precision bonding of circuits by thermocompression method |
JPH0669286A (en) * | 1992-08-19 | 1994-03-11 | Hitachi Ltd | Bonding device |
CN1136160C (en) * | 2000-06-02 | 2004-01-28 | 中国科学院上海冶金研究所 | A glass/silicon bonding device for making micromechanical devices and its use method |
CN1588618A (en) * | 2004-09-10 | 2005-03-02 | 北京工业大学 | Static bonding process with suspending movable sensitive structure |
CN1610056A (en) * | 2004-11-12 | 2005-04-27 | 江苏大学 | Silicon Chip/Glass Ring Bonding Device |
-
2006
- 2006-02-27 CN CNB200610009745XA patent/CN100372088C/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1207253A (en) * | 1968-07-04 | 1970-09-30 | Valery Ivanovich Soin | A device for the precision bonding of circuits by thermocompression method |
JPH0669286A (en) * | 1992-08-19 | 1994-03-11 | Hitachi Ltd | Bonding device |
CN1136160C (en) * | 2000-06-02 | 2004-01-28 | 中国科学院上海冶金研究所 | A glass/silicon bonding device for making micromechanical devices and its use method |
CN1588618A (en) * | 2004-09-10 | 2005-03-02 | 北京工业大学 | Static bonding process with suspending movable sensitive structure |
CN1610056A (en) * | 2004-11-12 | 2005-04-27 | 江苏大学 | Silicon Chip/Glass Ring Bonding Device |
Non-Patent Citations (2)
Title |
---|
MEMS器件微装配系统的设计与研制. 陈立国,孙立宁,荣伟彬等.中国机械工程,第16卷第14期. 2005 * |
MEMS封装技术. 陈一梅,黄元庆.传感器技术,第24卷第3期. 2005 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103723677A (en) * | 2014-01-10 | 2014-04-16 | 苏州大学 | Assembling and packaging system and method of sensor |
CN103723677B (en) * | 2014-01-10 | 2016-04-20 | 苏州大学 | A kind of sensor assembling package system and assembling method for packing |
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