CN100339939C - 半导体装置以及其制造方法、电光学装置和电子机器 - Google Patents
半导体装置以及其制造方法、电光学装置和电子机器 Download PDFInfo
- Publication number
- CN100339939C CN100339939C CNB031082947A CN03108294A CN100339939C CN 100339939 C CN100339939 C CN 100339939C CN B031082947 A CNB031082947 A CN B031082947A CN 03108294 A CN03108294 A CN 03108294A CN 100339939 C CN100339939 C CN 100339939C
- Authority
- CN
- China
- Prior art keywords
- substrate
- substrates
- semiconductor device
- manufacturing
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0231—Manufacture or treatment of multiple TFTs using masks, e.g. half-tone masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/1201—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
- H10K71/13—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
- H10K71/135—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing using ink-jet printing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/13613—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit the semiconductor element being formed on a first substrate and thereafter transferred to the final cell substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68354—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to support diced chips prior to mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68359—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used as a support during manufacture of interconnect decals or build up layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68363—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used in a transfer process involving transfer directly from an origin substrate to a target substrate without use of an intermediate handle substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68368—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used in a transfer process involving at least two transfer steps, i.e. including an intermediate handle substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
- H01L2224/48465—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12044—OLED
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/30105—Capacitance
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/129—Chiplets
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/18—Tiled displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/40—Thermal treatment, e.g. annealing in the presence of a solvent vapour
- H10K71/421—Thermal treatment, e.g. annealing in the presence of a solvent vapour using coherent electromagnetic radiation, e.g. laser annealing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/80—Manufacture or treatment specially adapted for the organic devices covered by this subclass using temporary substrates
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Electroluminescent Light Sources (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
- Recrystallisation Techniques (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP200293321 | 2002-03-28 | ||
JP2002093321 | 2002-03-28 | ||
JP2003076904A JP4329368B2 (ja) | 2002-03-28 | 2003-03-20 | 半導体装置及びその製造方法 |
JP200376904 | 2003-03-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1448987A CN1448987A (zh) | 2003-10-15 |
CN100339939C true CN100339939C (zh) | 2007-09-26 |
Family
ID=28793506
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB031082947A Expired - Lifetime CN100339939C (zh) | 2002-03-28 | 2003-03-27 | 半导体装置以及其制造方法、电光学装置和电子机器 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7101729B2 (zh) |
JP (1) | JP4329368B2 (zh) |
KR (1) | KR100515774B1 (zh) |
CN (1) | CN100339939C (zh) |
TW (1) | TWI239078B (zh) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7585703B2 (en) * | 2002-11-19 | 2009-09-08 | Ishikawa Seisakusho, Ltd. | Pixel control element selection transfer method, pixel control device mounting device used for pixel control element selection transfer method, wiring formation method after pixel control element transfer, and planar display substrate |
TWI366701B (en) * | 2004-01-26 | 2012-06-21 | Semiconductor Energy Lab | Method of manufacturing display and television |
JP2006049800A (ja) | 2004-03-10 | 2006-02-16 | Seiko Epson Corp | 薄膜デバイスの供給体、薄膜デバイスの供給体の製造方法、転写方法、半導体装置の製造方法及び電子機器 |
JP3956955B2 (ja) * | 2004-04-22 | 2007-08-08 | セイコーエプソン株式会社 | 半導体基板の製造方法、電気光学装置の製造方法 |
JP4016968B2 (ja) * | 2004-05-24 | 2007-12-05 | セイコーエプソン株式会社 | Da変換器、データ線駆動回路、電気光学装置、その駆動方法及び電子機器 |
EP2650907B1 (en) * | 2004-06-04 | 2024-10-23 | The Board Of Trustees Of The University Of Illinois | Methods and devices for fabricating and assembling printable semiconductor elements |
US7521292B2 (en) | 2004-06-04 | 2009-04-21 | The Board Of Trustees Of The University Of Illinois | Stretchable form of single crystal silicon for high performance electronics on rubber substrates |
WO2006011664A1 (en) * | 2004-07-30 | 2006-02-02 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
WO2007000695A2 (en) * | 2005-06-29 | 2007-01-04 | Koninklijke Philips Electronics N.V. | Package, subassembly and methods of manufacturing thereof |
US20070001927A1 (en) * | 2005-07-01 | 2007-01-04 | Eastman Kodak Company | Tiled display for electronic signage |
JP4897882B2 (ja) * | 2006-07-05 | 2012-03-14 | アリゾナ ボード オブ リージェンツ ア ボディー コーポレート アクティング オン ビハーフ オブ アリゾナ ステイト ユニバーシティ | 硬質担体を基板に暫定的に取り付ける方法 |
US8581393B2 (en) * | 2006-09-21 | 2013-11-12 | 3M Innovative Properties Company | Thermally conductive LED assembly |
KR100826982B1 (ko) * | 2006-12-29 | 2008-05-02 | 주식회사 하이닉스반도체 | 메모리 모듈 |
WO2009011699A1 (en) * | 2007-07-18 | 2009-01-22 | Nanolumens Acquisition, Inc. | Voltage partitioned display |
DE102007061473A1 (de) * | 2007-09-27 | 2009-04-02 | Osram Opto Semiconductors Gmbh | Strahlungsemittierende Vorrichtung |
CN101556966B (zh) * | 2008-04-10 | 2010-12-15 | 中芯国际集成电路制造(上海)有限公司 | 一种可减小等离子体损伤效应的mos管 |
JP5401831B2 (ja) * | 2008-04-15 | 2014-01-29 | 株式会社リコー | 表示装置 |
JP2010211647A (ja) * | 2009-03-11 | 2010-09-24 | Seiko Epson Corp | タッチパネル装置、電気光学装置および電子機器 |
US8305294B2 (en) * | 2009-09-08 | 2012-11-06 | Global Oled Technology Llc | Tiled display with overlapping flexible substrates |
EP2487671A1 (en) * | 2009-10-08 | 2012-08-15 | Sharp Kabushiki Kaisha | Light emitting panel device wherein a plurality of panels respectively having light emitting sections are connected , and image display device and illuminating device provided with the light emitting panel device |
CN102640200B (zh) | 2009-12-03 | 2014-10-29 | 夏普株式会社 | 图像显示装置、面板和面板的制造方法 |
KR101221871B1 (ko) * | 2009-12-07 | 2013-01-15 | 한국전자통신연구원 | 반도체 소자의 제조방법 |
TWI490426B (zh) * | 2011-07-29 | 2015-07-01 | Light emitting device | |
US8704448B2 (en) * | 2012-09-06 | 2014-04-22 | Cooledge Lighting Inc. | Wiring boards for array-based electronic devices |
KR102049735B1 (ko) * | 2013-04-30 | 2019-11-28 | 엘지디스플레이 주식회사 | 유기전계발광표시장치 및 그 제조방법 |
JP6076270B2 (ja) * | 2014-01-08 | 2017-02-08 | パナソニック株式会社 | ディスプレイ装置及びパネルユニット |
KR102396760B1 (ko) * | 2015-04-08 | 2022-05-11 | 삼성디스플레이 주식회사 | 표시 장치 |
CN112542468A (zh) * | 2016-07-05 | 2021-03-23 | 群创光电股份有限公司 | 显示装置 |
CN109844848A (zh) * | 2016-10-19 | 2019-06-04 | 奥加诺电路股份有限公司 | 有源矩阵led显示器 |
KR102512945B1 (ko) * | 2017-07-11 | 2023-03-22 | 코닝 인코포레이티드 | 타일링된 디스플레이들 및 그 제조 방법들 |
KR102599722B1 (ko) * | 2018-12-28 | 2023-11-09 | 삼성디스플레이 주식회사 | 표시 패널 및 이를 포함하는 타일드 표시 장치 |
TWI694280B (zh) * | 2019-03-05 | 2020-05-21 | 友達光電股份有限公司 | 顯示裝置及其製造方法 |
KR102084353B1 (ko) * | 2019-05-21 | 2020-03-03 | 김종하 | 태양광을 이용한 시트지형 led 조명장치 및 그 제조방법 |
KR102105806B1 (ko) * | 2020-02-12 | 2020-04-28 | 김종하 | 태양광을 이용한 시트지형 led 조명장치 및 그 제조방법 |
WO2021235114A1 (ja) * | 2020-05-20 | 2021-11-25 | ソニーグループ株式会社 | 表示モジュール、表示装置、およびセンサモジュール |
CN112599030B (zh) * | 2020-12-11 | 2022-09-30 | 季华实验室 | 一种拼接缝隙填充装置以及led显示屏 |
US20250008793A1 (en) * | 2021-05-13 | 2025-01-02 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05127605A (ja) * | 1991-04-23 | 1993-05-25 | Hitachi Ltd | 大画面液晶表示装置 |
US5287205A (en) * | 1991-03-26 | 1994-02-15 | Semiconductor Energy Laboratory Co., Ltd. | Gradation method for driving liquid crystal device with ramp and select signal |
CN1120178A (zh) * | 1994-09-02 | 1996-04-10 | 夏普公司 | 液晶显示装置 |
CN1223384A (zh) * | 1997-12-25 | 1999-07-21 | 夏普公司 | 液晶显示装置 |
CN1256791A (zh) * | 1998-02-27 | 2000-06-14 | 精工爱普生株式会社 | 3维器件的制造方法 |
CN1262499A (zh) * | 1999-01-29 | 2000-08-09 | 张云祥 | 液晶组合式大型彩色显示器 |
CN1305119A (zh) * | 1999-10-21 | 2001-07-25 | 夏普公司 | 液晶显示装置 |
WO2002022374A1 (en) * | 2000-09-15 | 2002-03-21 | 3M Innovative Properties Company | Thermal transfer of light-emitting polymers |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4548470A (en) * | 1984-06-11 | 1985-10-22 | Apogee, Inc. | Projection screen |
GB9106720D0 (en) * | 1991-03-28 | 1991-05-15 | Secr Defence | Large area liquid crystal displays |
US5834327A (en) * | 1995-03-18 | 1998-11-10 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing display device |
JP4619462B2 (ja) | 1996-08-27 | 2011-01-26 | セイコーエプソン株式会社 | 薄膜素子の転写方法 |
KR100229676B1 (ko) * | 1996-08-30 | 1999-11-15 | 구자홍 | 셀프얼라인 박막트랜지스터 제조방법 |
JPH11272209A (ja) | 1998-01-30 | 1999-10-08 | Hewlett Packard Co <Hp> | 表示用集積回路ビデオ・タイル |
FR2781925B1 (fr) * | 1998-07-30 | 2001-11-23 | Commissariat Energie Atomique | Transfert selectif d'elements d'un support vers un autre support |
JP3906653B2 (ja) * | 2000-07-18 | 2007-04-18 | ソニー株式会社 | 画像表示装置及びその製造方法 |
EP1313149A1 (en) * | 2001-11-14 | 2003-05-21 | STMicroelectronics S.r.l. | Process for fabricating a dual charge storage location memory cell |
KR100662780B1 (ko) * | 2002-12-18 | 2007-01-02 | 엘지.필립스 엘시디 주식회사 | 테스트화소를 구비한 액정표시장치 및 이를 이용한 블랙 매트릭스를 제작하는 방법 |
-
2003
- 2003-03-20 US US10/392,191 patent/US7101729B2/en not_active Expired - Lifetime
- 2003-03-20 JP JP2003076904A patent/JP4329368B2/ja not_active Expired - Fee Related
- 2003-03-27 TW TW092106986A patent/TWI239078B/zh not_active IP Right Cessation
- 2003-03-27 KR KR10-2003-0019123A patent/KR100515774B1/ko not_active Expired - Fee Related
- 2003-03-27 CN CNB031082947A patent/CN100339939C/zh not_active Expired - Lifetime
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5287205A (en) * | 1991-03-26 | 1994-02-15 | Semiconductor Energy Laboratory Co., Ltd. | Gradation method for driving liquid crystal device with ramp and select signal |
JPH05127605A (ja) * | 1991-04-23 | 1993-05-25 | Hitachi Ltd | 大画面液晶表示装置 |
CN1120178A (zh) * | 1994-09-02 | 1996-04-10 | 夏普公司 | 液晶显示装置 |
CN1223384A (zh) * | 1997-12-25 | 1999-07-21 | 夏普公司 | 液晶显示装置 |
CN1256791A (zh) * | 1998-02-27 | 2000-06-14 | 精工爱普生株式会社 | 3维器件的制造方法 |
CN1262499A (zh) * | 1999-01-29 | 2000-08-09 | 张云祥 | 液晶组合式大型彩色显示器 |
CN1305119A (zh) * | 1999-10-21 | 2001-07-25 | 夏普公司 | 液晶显示装置 |
WO2002022374A1 (en) * | 2000-09-15 | 2002-03-21 | 3M Innovative Properties Company | Thermal transfer of light-emitting polymers |
Also Published As
Publication number | Publication date |
---|---|
US20040080032A1 (en) | 2004-04-29 |
JP2004006724A (ja) | 2004-01-08 |
KR100515774B1 (ko) | 2005-09-23 |
TWI239078B (en) | 2005-09-01 |
TW200403817A (en) | 2004-03-01 |
US7101729B2 (en) | 2006-09-05 |
CN1448987A (zh) | 2003-10-15 |
KR20030085471A (ko) | 2003-11-05 |
JP4329368B2 (ja) | 2009-09-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN100339939C (zh) | 半导体装置以及其制造方法、电光学装置和电子机器 | |
CN1132054C (zh) | 复合柔性布线基板及其制造方法、电光装置、电子装置 | |
CN1265340C (zh) | 显示装置和电子设备 | |
CN1286148C (zh) | 电光装置及其制造方法以及电子仪器 | |
CN1192338C (zh) | 电光装置及其制造方法和电子设备 | |
CN1311558C (zh) | 半导体器件 | |
CN1163968C (zh) | 半导体器件及其制造方法 | |
CN1533561A (zh) | 显示装置及其制造方法 | |
CN1875298A (zh) | 制作光学膜的方法 | |
CN1703938A (zh) | 发光装置、其制造方法、电光学装置和电子仪器 | |
CN1727975A (zh) | 液晶显示装置及其制造方法 | |
CN101046588A (zh) | 显示装置、制造该显示装置的方法以及电子设备 | |
CN1517753A (zh) | 液晶显示器件以及其制作方法 | |
CN1450841A (zh) | 发光设备、液晶显示设备及它们的制造方法 | |
CN1822738A (zh) | 电光学装置及其制造方法、以及电子仪器 | |
CN1538363A (zh) | 显示装置 | |
CN1328268A (zh) | 液晶装置、其制造方法及电子装置 | |
CN1447958A (zh) | 图像显示装置及制造图像显示装置的方法 | |
CN1871711A (zh) | 显示器件及其制造方法,以及电视接收机 | |
CN1684559A (zh) | 发光器件、其制造方法以及电子设备 | |
CN101031947A (zh) | 显示装置、显示装置的驱动方法及电子设备 | |
CN1200312C (zh) | 信号传输膜、控制信号部分以及包括该膜的液晶显示器 | |
CN1447637A (zh) | 配线基板的连接结构及显示装置 | |
CN1280922C (zh) | 半导体器件及其制造方法、电光装置及电子设备 | |
CN1689375A (zh) | 发光装置的制造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SAMSUNG LED CO., LTD. Free format text: FORMER OWNER: SEIKO EPSON CORP. Effective date: 20120328 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20120328 Address after: Gyeonggi Do, South Korea Patentee after: Samsung LED Co.,Ltd. Address before: Tokyo, Japan Patentee before: Seiko Epson Corp. |
|
ASS | Succession or assignment of patent right |
Owner name: SAMSUNG ELECTRONICS CO., LTD. Free format text: FORMER OWNER: SAMSUNG LED CO., LTD. Effective date: 20121213 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20121213 Address after: Gyeonggi Do, South Korea Patentee after: SAMSUNG ELECTRONICS Co.,Ltd. Address before: Gyeonggi Do, South Korea Patentee before: Samsung LED Co.,Ltd. |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20070926 |