Classifications

• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
  • H01J37/02—Details
  • H01J37/244—Detectors; Associated components or circuits therefor
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
  • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
  • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
  • G01N23/2255—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams
  • G01N23/2258—Measuring secondary ion emission, e.g. secondary ion mass spectrometry [SIMS]
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
  • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
  • H01J43/04—Electron multipliers
  • H01J43/06—Electrode arrangements
  • H01J43/18—Electrode arrangements using essentially more than one dynode
  • H01J43/24—Dynodes having potential gradient along their surfaces
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/26—Mass spectrometers or separator tubes
  • H01J49/28—Static spectrometers
  • H01J49/282—Static spectrometers using electrostatic analysers
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
  • H01J49/46—Static spectrometers
  • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
  • H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
  • H01J2237/244—Detection characterized by the detecting means
  • H01J2237/24435—Microchannel plates
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
  • H01J2237/244—Detection characterized by the detecting means
  • H01J2237/2449—Detector devices with moving charges in electric or magnetic fields
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
  • H01J2237/245—Detection characterised by the variable being measured
  • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
  • H01J2237/245—Detection characterised by the variable being measured
  • H01J2237/24571—Measurements of non-electric or non-magnetic variables
  • H01J2237/24585—Other variables, e.g. energy, mass, velocity, time, temperature

Landscapes

• Chemical & Material Sciences (AREA)
• Analytical Chemistry (AREA)
• Physics & Mathematics (AREA)
• Health & Medical Sciences (AREA)
• Life Sciences & Earth Sciences (AREA)
• Spectroscopy & Molecular Physics (AREA)
• Molecular Biology (AREA)
• Biochemistry (AREA)
• General Health & Medical Sciences (AREA)
• General Physics & Mathematics (AREA)
• Immunology (AREA)
• Pathology (AREA)
• Analysing Materials By The Use Of Radiation (AREA)
• Electron Tubes For Measurement (AREA)

Applications Claiming Priority (1)

Publications (1)

Family

ID=19820233

Family Applications (1)

Country Status (7)

Families Citing this family (14)

Family Cites Families (4)

• 1973
  • 1973-12-20 NL NL7317436A patent/NL7317436A/nl unknown
• 1974
  • 1974-11-19 US US05/525,190 patent/US3970849A/en not_active Expired - Lifetime
  • 1974-12-07 DE DE2458025A patent/DE2458025C2/de not_active Expired
  • 1974-12-12 CA CA216,027A patent/CA1015467A/en not_active Expired
  • 1974-12-17 GB GB54443/74A patent/GB1487960A/en not_active Expired
  • 1974-12-17 JP JP49144893A patent/JPS5741066B2/ja not_active Expired
  • 1974-12-19 FR FR7442016A patent/FR2255596B1/fr not_active Expired

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