US7069101B1
(en)
|
1999-07-29 |
2006-06-27 |
Applied Materials, Inc. |
Computer integrated manufacturing techniques
|
US9785140B2
(en)
|
2000-02-01 |
2017-10-10 |
Peer Intellectual Property Inc. |
Multi-protocol multi-client equipment server
|
US7200671B1
(en)
*
|
2000-08-23 |
2007-04-03 |
Mks Instruments, Inc. |
Method and apparatus for monitoring host to tool communications
|
US8149048B1
(en)
|
2000-10-26 |
2012-04-03 |
Cypress Semiconductor Corporation |
Apparatus and method for programmable power management in a programmable analog circuit block
|
US8176296B2
(en)
|
2000-10-26 |
2012-05-08 |
Cypress Semiconductor Corporation |
Programmable microcontroller architecture
|
US7765095B1
(en)
|
2000-10-26 |
2010-07-27 |
Cypress Semiconductor Corporation |
Conditional branching in an in-circuit emulation system
|
US8160864B1
(en)
|
2000-10-26 |
2012-04-17 |
Cypress Semiconductor Corporation |
In-circuit emulator and pod synchronized boot
|
US8103496B1
(en)
|
2000-10-26 |
2012-01-24 |
Cypress Semicondutor Corporation |
Breakpoint control in an in-circuit emulation system
|
US6724220B1
(en)
|
2000-10-26 |
2004-04-20 |
Cyress Semiconductor Corporation |
Programmable microcontroller architecture (mixed analog/digital)
|
US7188142B2
(en)
|
2000-11-30 |
2007-03-06 |
Applied Materials, Inc. |
Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility
|
US6873172B2
(en)
*
|
2001-05-14 |
2005-03-29 |
Bandwidth9, Inc. |
Automated laser diode test system
|
US6910947B2
(en)
|
2001-06-19 |
2005-06-28 |
Applied Materials, Inc. |
Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life
|
US7082345B2
(en)
|
2001-06-19 |
2006-07-25 |
Applied Materials, Inc. |
Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities
|
US7698012B2
(en)
|
2001-06-19 |
2010-04-13 |
Applied Materials, Inc. |
Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
|
US7160739B2
(en)
|
2001-06-19 |
2007-01-09 |
Applied Materials, Inc. |
Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
|
US7047099B2
(en)
|
2001-06-19 |
2006-05-16 |
Applied Materials Inc. |
Integrating tool, module, and fab level control
|
US6913938B2
(en)
|
2001-06-19 |
2005-07-05 |
Applied Materials, Inc. |
Feedback control of plasma-enhanced chemical vapor deposition processes
|
US7101799B2
(en)
|
2001-06-19 |
2006-09-05 |
Applied Materials, Inc. |
Feedforward and feedback control for conditioning of chemical mechanical polishing pad
|
US7403987B1
(en)
*
|
2001-06-29 |
2008-07-22 |
Symantec Operating Corporation |
Transactional SAN management
|
TWI244603B
(en)
*
|
2001-07-05 |
2005-12-01 |
Dainippon Screen Mfg |
Substrate processing system for managing device information of substrate processing device
|
US7337019B2
(en)
|
2001-07-16 |
2008-02-26 |
Applied Materials, Inc. |
Integration of fault detection with run-to-run control
|
WO2003009071A1
(en)
*
|
2001-07-20 |
2003-01-30 |
Applied Materials, Inc. |
System and method for exporting or importing object data in a manufacturing execution system
|
DE10138142B4
(en)
*
|
2001-08-09 |
2006-08-31 |
Infineon Technologies Ag |
Method for analyzing an integrated electrical circuit
|
US6984198B2
(en)
|
2001-08-14 |
2006-01-10 |
Applied Materials, Inc. |
Experiment management system, method and medium
|
US7406674B1
(en)
|
2001-10-24 |
2008-07-29 |
Cypress Semiconductor Corporation |
Method and apparatus for generating microcontroller configuration information
|
US6842660B2
(en)
*
|
2001-10-31 |
2005-01-11 |
Brooks Automation, Inc. |
Device and method for communicating data in a process control system
|
US8078970B1
(en)
|
2001-11-09 |
2011-12-13 |
Cypress Semiconductor Corporation |
Graphical user interface with user-selectable list-box
|
US7526422B1
(en)
|
2001-11-13 |
2009-04-28 |
Cypress Semiconductor Corporation |
System and a method for checking lock-step consistency between an in circuit emulation and a microcontroller
|
US8042093B1
(en)
|
2001-11-15 |
2011-10-18 |
Cypress Semiconductor Corporation |
System providing automatic source code generation for personalization and parameterization of user modules
|
US7086014B1
(en)
*
|
2001-11-19 |
2006-08-01 |
Cypress Semiconductor Corporation |
Automatic generation of application program interfaces, source code, interrupts, and datasheets for microcontroller programming
|
US8069405B1
(en)
*
|
2001-11-19 |
2011-11-29 |
Cypress Semiconductor Corporation |
User interface for efficiently browsing an electronic document using data-driven tabs
|
US7844437B1
(en)
|
2001-11-19 |
2010-11-30 |
Cypress Semiconductor Corporation |
System and method for performing next placements and pruning of disallowed placements for programming an integrated circuit
|
US7774190B1
(en)
|
2001-11-19 |
2010-08-10 |
Cypress Semiconductor Corporation |
Sleep and stall in an in-circuit emulation system
|
US7770113B1
(en)
|
2001-11-19 |
2010-08-03 |
Cypress Semiconductor Corporation |
System and method for dynamically generating a configuration datasheet
|
US6971004B1
(en)
|
2001-11-19 |
2005-11-29 |
Cypress Semiconductor Corp. |
System and method of dynamically reconfiguring a programmable integrated circuit
|
US7225047B2
(en)
|
2002-03-19 |
2007-05-29 |
Applied Materials, Inc. |
Method, system and medium for controlling semiconductor wafer processes using critical dimension measurements
|
US20030199112A1
(en)
|
2002-03-22 |
2003-10-23 |
Applied Materials, Inc. |
Copper wiring module control
|
US8103497B1
(en)
|
2002-03-28 |
2012-01-24 |
Cypress Semiconductor Corporation |
External interface for event architecture
|
US7308608B1
(en)
|
2002-05-01 |
2007-12-11 |
Cypress Semiconductor Corporation |
Reconfigurable testing system and method
|
US6999836B2
(en)
|
2002-08-01 |
2006-02-14 |
Applied Materials, Inc. |
Method, system, and medium for handling misrepresentative metrology data within an advanced process control system
|
US7761845B1
(en)
|
2002-09-09 |
2010-07-20 |
Cypress Semiconductor Corporation |
Method for parameterizing a user module
|
WO2004046835A2
(en)
|
2002-11-15 |
2004-06-03 |
Applied Materials, Inc. |
Method, system and medium for controlling manufacture process having multivariate input parameters
|
JP2004193208A
(en)
*
|
2002-12-09 |
2004-07-08 |
Canon Inc |
Information processing apparatus
|
US7333871B2
(en)
|
2003-01-21 |
2008-02-19 |
Applied Materials, Inc. |
Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools
|
US7953842B2
(en)
*
|
2003-02-19 |
2011-05-31 |
Fisher-Rosemount Systems, Inc. |
Open network-based data acquisition, aggregation and optimization for use with process control systems
|
DE10319551A1
(en)
*
|
2003-04-30 |
2004-11-25 |
Siemens Ag |
Automation system with automatic provision of diagnostic information
|
DE20307101U1
(en)
*
|
2003-05-07 |
2003-07-10 |
Siemens AG, 80333 München |
Automation system with simplified diagnostics and troubleshooting
|
US7205228B2
(en)
|
2003-06-03 |
2007-04-17 |
Applied Materials, Inc. |
Selective metal encapsulation schemes
|
US7354332B2
(en)
|
2003-08-04 |
2008-04-08 |
Applied Materials, Inc. |
Technique for process-qualifying a semiconductor manufacturing tool using metrology data
|
US20050075841A1
(en)
*
|
2003-08-05 |
2005-04-07 |
Netanel Peles |
Automated defect classification system and method
|
US20050060243A1
(en)
*
|
2003-09-12 |
2005-03-17 |
Siemens Westinghouse Power Corporation |
Method for managing tools in a power plant service environment
|
GB2407243A
(en)
*
|
2003-10-14 |
2005-04-20 |
Boc Group Plc |
Creating a pictorial representation of an installation using stylesheet and status data
|
US7480709B2
(en)
*
|
2003-11-14 |
2009-01-20 |
Rockwell Automation Technologies, Inc. |
Dynamic browser-based industrial automation interface system and method
|
US7093207B1
(en)
*
|
2003-11-17 |
2006-08-15 |
Kla-Tencor Technologies Corporation |
Data analysis flow engine
|
US7356377B2
(en)
|
2004-01-29 |
2008-04-08 |
Applied Materials, Inc. |
System, method, and medium for monitoring performance of an advanced process control system
|
US7295049B1
(en)
|
2004-03-25 |
2007-11-13 |
Cypress Semiconductor Corporation |
Method and circuit for rapid alignment of signals
|
US7146237B2
(en)
*
|
2004-04-07 |
2006-12-05 |
Mks Instruments, Inc. |
Controller and method to mediate data collection from smart sensors for fab applications
|
US6961626B1
(en)
|
2004-05-28 |
2005-11-01 |
Applied Materials, Inc |
Dynamic offset and feedback threshold
|
US7096085B2
(en)
|
2004-05-28 |
2006-08-22 |
Applied Materials |
Process control by distinguishing a white noise component of a process variance
|
US20060025880A1
(en)
*
|
2004-07-29 |
2006-02-02 |
International Business Machines Corporation |
Host control for a variety of tools in semiconductor fabs
|
US8069436B2
(en)
|
2004-08-13 |
2011-11-29 |
Cypress Semiconductor Corporation |
Providing hardware independence to automate code generation of processing device firmware
|
US8286125B2
(en)
*
|
2004-08-13 |
2012-10-09 |
Cypress Semiconductor Corporation |
Model for a hardware device-independent method of defining embedded firmware for programmable systems
|
US7332976B1
(en)
|
2005-02-04 |
2008-02-19 |
Cypress Semiconductor Corporation |
Poly-phase frequency synthesis oscillator
|
US7400183B1
(en)
|
2005-05-05 |
2008-07-15 |
Cypress Semiconductor Corporation |
Voltage controlled oscillator delay cell and method
|
US8089461B2
(en)
|
2005-06-23 |
2012-01-03 |
Cypress Semiconductor Corporation |
Touch wake for electronic devices
|
US7787477B2
(en)
*
|
2005-07-11 |
2010-08-31 |
Mks Instruments, Inc. |
Address-transparent device and method
|
US7574683B2
(en)
*
|
2005-08-05 |
2009-08-11 |
John Wilson |
Automating power domains in electronic design automation
|
US8055727B2
(en)
*
|
2005-09-22 |
2011-11-08 |
Fisher-Rosemount Systems, Inc. |
Use of a really simple syndication communication format in a process control system
|
US8085067B1
(en)
|
2005-12-21 |
2011-12-27 |
Cypress Semiconductor Corporation |
Differential-to-single ended signal converter circuit and method
|
WO2007095732A1
(en)
*
|
2006-02-20 |
2007-08-30 |
Topeer Corporation |
System and method for controlling local computer applications using a web interface
|
US8067948B2
(en)
|
2006-03-27 |
2011-11-29 |
Cypress Semiconductor Corporation |
Input/output multiplexer bus
|
US7606681B2
(en)
*
|
2006-11-03 |
2009-10-20 |
Air Products And Chemicals, Inc. |
System and method for process monitoring
|
US8516025B2
(en)
|
2007-04-17 |
2013-08-20 |
Cypress Semiconductor Corporation |
Clock driven dynamic datapath chaining
|
US9564902B2
(en)
|
2007-04-17 |
2017-02-07 |
Cypress Semiconductor Corporation |
Dynamically configurable and re-configurable data path
|
US8092083B2
(en)
|
2007-04-17 |
2012-01-10 |
Cypress Semiconductor Corporation |
Temperature sensor with digital bandgap
|
US8130025B2
(en)
|
2007-04-17 |
2012-03-06 |
Cypress Semiconductor Corporation |
Numerical band gap
|
US8040266B2
(en)
|
2007-04-17 |
2011-10-18 |
Cypress Semiconductor Corporation |
Programmable sigma-delta analog-to-digital converter
|
US7737724B2
(en)
|
2007-04-17 |
2010-06-15 |
Cypress Semiconductor Corporation |
Universal digital block interconnection and channel routing
|
US8026739B2
(en)
|
2007-04-17 |
2011-09-27 |
Cypress Semiconductor Corporation |
System level interconnect with programmable switching
|
US8065653B1
(en)
|
2007-04-25 |
2011-11-22 |
Cypress Semiconductor Corporation |
Configuration of programmable IC design elements
|
US8266575B1
(en)
|
2007-04-25 |
2012-09-11 |
Cypress Semiconductor Corporation |
Systems and methods for dynamically reconfiguring a programmable system on a chip
|
US9720805B1
(en)
|
2007-04-25 |
2017-08-01 |
Cypress Semiconductor Corporation |
System and method for controlling a target device
|
WO2008135372A1
(en)
*
|
2007-05-04 |
2008-11-13 |
Siemens Aktiengesellschaft |
Method and system design system for creating system-specific data
|
KR100906568B1
(en)
*
|
2007-07-20 |
2009-07-07 |
호서대학교 산학협력단 |
Semiconductor device interface device and monitoring system using same
|
US8049569B1
(en)
|
2007-09-05 |
2011-11-01 |
Cypress Semiconductor Corporation |
Circuit and method for improving the accuracy of a crystal-less oscillator having dual-frequency modes
|
DE102008043522A1
(en)
*
|
2008-11-06 |
2010-05-12 |
Manroland Ag |
Apparatus and method for collecting and providing data to at least one printing press
|
US9448964B2
(en)
|
2009-05-04 |
2016-09-20 |
Cypress Semiconductor Corporation |
Autonomous control in a programmable system
|
CN102142971B
(en)
*
|
2010-01-29 |
2015-08-19 |
新奥特(北京)视频技术有限公司 |
Realize supervisory control system and the method for supervising of subscription-collection mechanism
|
CN102569009B
(en)
*
|
2010-12-07 |
2015-07-01 |
北京北方微电子基地设备工艺研究中心有限责任公司 |
Process data acquisition method, device and system
|
US9021349B1
(en)
*
|
2012-04-25 |
2015-04-28 |
Cadence Design Systems, Inc. |
System, method, and computer program product for identifying differences in a EDA design
|
US20140143261A1
(en)
*
|
2012-11-21 |
2014-05-22 |
International Business Machines Corporation |
Automated semantic enrichment of data
|
US10132309B2
(en)
*
|
2013-03-15 |
2018-11-20 |
Integrated Designs, L.P. |
Apparatus and method for the remote monitoring, viewing and control of a semiconductor process tool
|