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AU2001278691A1 - Radiation detector and scintillator panel and production methods therefor - Google Patents

Radiation detector and scintillator panel and production methods therefor

Info

Publication number
AU2001278691A1
AU2001278691A1 AU2001278691A AU7869101A AU2001278691A1 AU 2001278691 A1 AU2001278691 A1 AU 2001278691A1 AU 2001278691 A AU2001278691 A AU 2001278691A AU 7869101 A AU7869101 A AU 7869101A AU 2001278691 A1 AU2001278691 A1 AU 2001278691A1
Authority
AU
Australia
Prior art keywords
radiation detector
production methods
scintillator panel
methods therefor
therefor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001278691A
Other languages
English (en)
Inventor
Takuya Homme
Toshio Takabayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of AU2001278691A1 publication Critical patent/AU2001278691A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20188Auxiliary details, e.g. casings or cooling
    • G01T1/20189Damping or insulation against damage, e.g. caused by heat or pressure

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
AU2001278691A 2000-08-03 2001-08-03 Radiation detector and scintillator panel and production methods therefor Abandoned AU2001278691A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000-235879 2000-08-03
JP2000235879A JP4283427B2 (ja) 2000-08-03 2000-08-03 放射線検出器およびシンチレータパネル
PCT/JP2001/006701 WO2002012920A1 (fr) 2000-08-03 2001-08-03 Detecteur de rayonnement et panneau scintillateur et leurs procedes de fabrication

Publications (1)

Publication Number Publication Date
AU2001278691A1 true AU2001278691A1 (en) 2002-02-18

Family

ID=18728014

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001278691A Abandoned AU2001278691A1 (en) 2000-08-03 2001-08-03 Radiation detector and scintillator panel and production methods therefor

Country Status (4)

Country Link
US (1) US7019302B2 (ja)
JP (1) JP4283427B2 (ja)
AU (1) AU2001278691A1 (ja)
WO (1) WO2002012920A1 (ja)

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DE60144280D1 (en) * 2000-05-19 2011-05-05 Hamamatsu Photonics Kk Lung
JP4247017B2 (ja) * 2003-03-10 2009-04-02 浜松ホトニクス株式会社 放射線検出器の製造方法
US20040209066A1 (en) * 2003-04-17 2004-10-21 Swisher Robert G. Polishing pad with window for planarization
CN101552265B (zh) * 2004-05-11 2012-07-18 浜松光子学株式会社 放射线摄像装置
JP2006058168A (ja) * 2004-08-20 2006-03-02 Hamamatsu Photonics Kk 放射線撮像素子および放射線撮像方法
US20060089095A1 (en) * 2004-10-27 2006-04-27 Swisher Robert G Polyurethane urea polishing pad
US20060089094A1 (en) * 2004-10-27 2006-04-27 Swisher Robert G Polyurethane urea polishing pad
US20060089093A1 (en) * 2004-10-27 2006-04-27 Swisher Robert G Polyurethane urea polishing pad
DE102005029459B3 (de) * 2005-06-24 2006-10-19 Siemens Ag Verfahren zum Ausgleichen einer Butting-Struktur und Röntgensystem
DE102006038969B4 (de) * 2006-08-21 2013-02-28 Siemens Aktiengesellschaft Röntgenkonverterelement und Verfahren zu dessen Herstellung
JP2008082852A (ja) * 2006-09-27 2008-04-10 Toshiba Corp 放射線検出装置
JP2008107133A (ja) * 2006-10-24 2008-05-08 Konica Minolta Medical & Graphic Inc 放射線画像検出器及び放射線画像検出器の作製方法
WO2008078702A1 (ja) * 2006-12-27 2008-07-03 Kabushiki Kaisha Toshiba 放射線検出器
KR101436387B1 (ko) * 2007-10-05 2014-09-02 삼성전자주식회사 이미지 드럼 및 그 제조방법
FR2922319B1 (fr) * 2007-10-10 2013-08-02 Commissariat Energie Atomique Scintillateur pour dispositif d'imagerie, module scintillateur, dispositif d'imagerie avec un tel scintillateur et procede de fabrication d'un scintillateur
US7737390B2 (en) * 2008-01-14 2010-06-15 Tower Semiconductor, Ltd. Horizontal row drivers for CMOS image sensor with tiling on three edges
JP2011137665A (ja) * 2009-12-26 2011-07-14 Canon Inc シンチレータパネル及び放射線撮像装置とその製造方法、ならびに放射線撮像システム
US8797432B2 (en) * 2011-01-20 2014-08-05 Aptina Imaging Corporation Imaging system with an array of image sensors
JP6000680B2 (ja) * 2012-06-20 2016-10-05 キヤノン株式会社 放射線検出装置、その製造方法及び撮像システム
JP6077787B2 (ja) * 2012-08-22 2017-02-08 キヤノン株式会社 放射線撮像装置及び放射線撮像システム
JP2014048061A (ja) * 2012-08-29 2014-03-17 Canon Inc 放射線撮像装置、その製造方法、及び放射線撮像システム
EP3004930B1 (en) * 2013-05-24 2019-07-10 Teledyne Dalsa B.V. A moisture protection structure for a device and a fabrication method thereof
JP2015090292A (ja) * 2013-11-05 2015-05-11 キヤノン株式会社 放射線撮像装置および放射線撮像システム
JP6576064B2 (ja) * 2015-03-18 2019-09-18 キヤノン株式会社 放射線検出装置、放射線撮像システム及び放射線検出装置の製造方法
JP6487263B2 (ja) * 2015-04-20 2019-03-20 浜松ホトニクス株式会社 放射線検出器及びその製造方法
JP2019070605A (ja) * 2017-10-11 2019-05-09 キヤノン電子管デバイス株式会社 放射線検出モジュール、シンチレータパネル、および放射線検出器
JP7325295B2 (ja) * 2019-10-24 2023-08-14 浜松ホトニクス株式会社 シンチレータパネル、放射線検出器、シンチレータパネルの製造方法、及び、放射線検出器の製造方法
US11253212B2 (en) * 2020-01-07 2022-02-22 General Electric Company Tileable X-ray detector cassettes
JP7457640B2 (ja) * 2020-12-23 2024-03-28 浜松ホトニクス株式会社 放射線検出器、及び放射線検出器の製造方法
JP7470631B2 (ja) * 2020-12-23 2024-04-18 浜松ホトニクス株式会社 放射線検出器、放射線検出器の製造方法、及びシンチレータパネルユニット
JP7608148B2 (ja) * 2020-12-23 2025-01-06 浜松ホトニクス株式会社 放射線検出器、放射線検出器の製造方法、及びシンチレータパネルユニット
JP7587980B2 (ja) 2020-12-23 2024-11-21 浜松ホトニクス株式会社 放射線検出器、放射線検出器の製造方法、及びシンチレータパネルユニット

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Publication number Priority date Publication date Assignee Title
JPS59122988A (ja) 1982-12-29 1984-07-16 Shimadzu Corp 放射線計測素子
JPS63243781A (ja) 1987-03-30 1988-10-11 Kanegafuchi Chem Ind Co Ltd X線検出装置
JPH01114780A (ja) 1987-10-28 1989-05-08 Kanegafuchi Chem Ind Co Ltd X線検出装置
TW331667B (en) 1995-09-05 1998-05-11 Canon Kk Photoelectric converter
JP3544075B2 (ja) 1995-09-05 2004-07-21 キヤノン株式会社 光電変換装置の製造方法
EP0932053B1 (en) 1997-02-14 2002-01-09 Hamamatsu Photonics K.K. Radiation detection device and method of producing the same
CN1133881C (zh) * 1997-02-14 2004-01-07 浜松光子学株式会社 放射线检测元件及其制造方法
FR2774175B1 (fr) 1998-01-27 2000-04-07 Thomson Csf Capteur electronique matriciel photosensible
JPH11345956A (ja) * 1998-03-16 1999-12-14 Canon Inc 撮像装置
CA2310017C (en) 1998-06-18 2005-10-25 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
KR100638915B1 (ko) * 1998-12-14 2006-10-25 하마마츠 포토닉스 가부시키가이샤 광학소자 및 이것을 사용한 방사선 검출기
DE19914701B4 (de) * 1999-03-31 2005-07-07 Siemens Ag Verfahren zur Herstellung eines Festkörperbilddetektors sowie Festkörperbilddetektor

Also Published As

Publication number Publication date
WO2002012920A1 (fr) 2002-02-14
US7019302B2 (en) 2006-03-28
US20040089813A1 (en) 2004-05-13
JP4283427B2 (ja) 2009-06-24
JP2002048870A (ja) 2002-02-15

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