AU2001227690A1 - Abbe error correction system and method - Google Patents
Abbe error correction system and methodInfo
- Publication number
- AU2001227690A1 AU2001227690A1 AU2001227690A AU2769001A AU2001227690A1 AU 2001227690 A1 AU2001227690 A1 AU 2001227690A1 AU 2001227690 A AU2001227690 A AU 2001227690A AU 2769001 A AU2769001 A AU 2769001A AU 2001227690 A1 AU2001227690 A1 AU 2001227690A1
- Authority
- AU
- Australia
- Prior art keywords
- axis
- sensor readings
- split
- present
- error correction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000012937 correction Methods 0.000 title abstract 2
- 238000006073 displacement reaction Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
- G05B19/19—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by positioning or contouring control systems, e.g. to control position from one programmed point to another or to control movement along a programmed continuous path
- G05B19/39—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by positioning or contouring control systems, e.g. to control position from one programmed point to another or to control movement along a programmed continuous path using a combination of the means covered by at least two of the preceding groups G05B19/21, G05B19/27 and G05B19/33
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
- B23K26/042—Automatically aligning the laser beam
- B23K26/043—Automatically aligning the laser beam along the beam path, i.e. alignment of laser beam axis relative to laser beam apparatus
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
- G03F7/70725—Stages control
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
- G05B19/404—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for compensation, e.g. for backlash, overshoot, tool offset, tool wear, temperature, machine construction errors, load, inertia
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0008—Apparatus or processes for manufacturing printed circuits for aligning or positioning of tools relative to the circuit board
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Manufacturing & Machinery (AREA)
- Human Computer Interaction (AREA)
- Automation & Control Theory (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Control Of Position Or Direction (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Radar Systems Or Details Thereof (AREA)
- Navigation (AREA)
- Attitude Control For Articles On Conveyors (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
- Automatic Control Of Machine Tools (AREA)
Abstract
The present invention preferably employs non-contact, small-displacement, capacitive sensors to determine Abbe errors due to the pitch, yaw, or roll of a near linear mechanical stage that are not indicated by an on-axis position indicator, such as a linear scale encoder or laser interferometer. The system is calibrated against a precise reference standard so the corrections depend only on sensing small changes in the sensor readings and not on absolute accuracy of the sensor readings. Although the present invention is preferred for use in split-axis positioning systems with inertially separated stages, the invention can be employed in typical split-axis or stacked stage systems to reduce their manufacturing costs.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US17599300P | 2000-01-11 | 2000-01-11 | |
US60175993 | 2000-01-11 | ||
PCT/US2001/000484 WO2001052004A1 (en) | 2000-01-11 | 2001-01-05 | Abbe error correction system and method |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001227690A1 true AU2001227690A1 (en) | 2001-07-24 |
Family
ID=22642517
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001227690A Abandoned AU2001227690A1 (en) | 2000-01-11 | 2001-01-05 | Abbe error correction system and method |
Country Status (11)
Country | Link |
---|---|
US (1) | US6430465B2 (en) |
EP (1) | EP1275036B1 (en) |
JP (1) | JP4860870B2 (en) |
KR (1) | KR100755335B1 (en) |
CN (1) | CN100437407C (en) |
AT (1) | ATE308071T1 (en) |
AU (1) | AU2001227690A1 (en) |
CA (1) | CA2396259A1 (en) |
DE (1) | DE60114397T2 (en) |
TW (1) | TW472177B (en) |
WO (1) | WO2001052004A1 (en) |
Families Citing this family (79)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE255482T1 (en) * | 1999-07-23 | 2003-12-15 | Heidelberg Instruments Mikrotechnik Gmbh | METHOD FOR PRODUCING MICRO-HOLES |
US7157038B2 (en) | 2000-09-20 | 2007-01-02 | Electro Scientific Industries, Inc. | Ultraviolet laser ablative patterning of microstructures in semiconductors |
US6676878B2 (en) | 2001-01-31 | 2004-01-13 | Electro Scientific Industries, Inc. | Laser segmented cutting |
JP2002096234A (en) * | 2000-09-20 | 2002-04-02 | Mori Seiki Co Ltd | Control method and control device for drive mechanism in NC machine tool |
US6806440B2 (en) * | 2001-03-12 | 2004-10-19 | Electro Scientific Industries, Inc. | Quasi-CW diode pumped, solid-state UV laser system and method employing same |
US6781090B2 (en) * | 2001-03-12 | 2004-08-24 | Electro Scientific Industries, Inc. | Quasi-CW diode-pumped, solid-state harmonic laser system and method employing same |
DE10156781C1 (en) * | 2001-11-19 | 2003-02-27 | Siemens Ag | Active compensator for mechanical vibrations and deformations has machine point moved in accordance with preset intended position value |
US6706998B2 (en) | 2002-01-11 | 2004-03-16 | Electro Scientific Industries, Inc. | Simulated laser spot enlargement |
US6677567B2 (en) * | 2002-02-15 | 2004-01-13 | Psia Corporation | Scanning probe microscope with improved scan accuracy, scan speed, and optical vision |
JP2004001067A (en) * | 2002-03-28 | 2004-01-08 | Fanuc Ltd | Laser beam machine and laser beam machining method |
US7209219B2 (en) * | 2003-03-06 | 2007-04-24 | Asml Netherlands B.V. | System for controlling a position of a mass |
KR100992120B1 (en) * | 2003-03-13 | 2010-11-04 | 삼성전자주식회사 | Silicon Crystallization System and Silicon Crystallization Method |
US20040204777A1 (en) * | 2003-04-14 | 2004-10-14 | Alon Harpaz | Precision motion control using feed forward of acceleration |
DE10317363B3 (en) * | 2003-04-15 | 2004-08-26 | Siemens Ag | Laser-powered hole boring machine for manufacture of substrates for electrical switching circuits has scanning system with oscillating mirrors and focusing lens |
JP3680064B2 (en) * | 2003-04-21 | 2005-08-10 | ファナック株式会社 | Numerical controller |
US7238913B2 (en) * | 2003-10-17 | 2007-07-03 | Gsi Group Corporation | Flexible scan field |
GB0411837D0 (en) * | 2004-05-27 | 2004-06-30 | Leuven K U Res & Dev | A measurement configuration based on linear scales able to measure to a target also moving perpendicular to the measurement axis |
US7133186B2 (en) * | 2004-06-07 | 2006-11-07 | Electro Scientific Industries, Inc. | AOM modulation techniques employing transducers to modulate different axes |
JP4791457B2 (en) * | 2004-06-07 | 2011-10-12 | エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド | AOM modulation technology to improve laser system performance |
US7352784B2 (en) * | 2004-07-20 | 2008-04-01 | Jds Uniphase Corporation | Laser burst boosting method and apparatus |
US7203569B2 (en) * | 2004-08-31 | 2007-04-10 | General Electric Company | Machine tool control methods and designs for fabricating mesoscopic surface structures on substrates |
US20060065085A1 (en) * | 2004-09-29 | 2006-03-30 | General Electric Company | Multi element tool designs for modifying surface characteristics of substrates |
JP4513574B2 (en) * | 2005-01-12 | 2010-07-28 | ウシオ電機株式会社 | Stage equipment |
US7826063B2 (en) * | 2005-04-29 | 2010-11-02 | Zygo Corporation | Compensation of effects of atmospheric perturbations in optical metrology |
US7512452B2 (en) * | 2005-06-13 | 2009-03-31 | Mauro George E | Positioning system for eliminating lost motion effect |
JP4291313B2 (en) * | 2005-09-13 | 2009-07-08 | 住友重機械工業株式会社 | Head operation control device, control method, and stage device |
US7638731B2 (en) | 2005-10-18 | 2009-12-29 | Electro Scientific Industries, Inc. | Real time target topography tracking during laser processing |
US20070181545A1 (en) * | 2006-02-06 | 2007-08-09 | Boyette James E | Method and apparatus for controlling sample position during material removal or addition |
US7605343B2 (en) * | 2006-05-24 | 2009-10-20 | Electro Scientific Industries, Inc. | Micromachining with short-pulsed, solid-state UV laser |
US8084706B2 (en) * | 2006-07-20 | 2011-12-27 | Gsi Group Corporation | System and method for laser processing at non-constant velocities |
KR101638306B1 (en) * | 2006-08-31 | 2016-07-08 | 가부시키가이샤 니콘 | Mobile body drive system and mobile body drive method, pattern formation apparatus and method, exposure apparatus and method, device manufacturing method, and decision method |
KR101565275B1 (en) | 2006-08-31 | 2015-11-02 | 가부시키가이샤 니콘 | Mobile body drive method and mobile body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method |
KR101493661B1 (en) | 2006-08-31 | 2015-02-13 | 가부시키가이샤 니콘 | Mobile body drive method and mobile body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method |
KR101881716B1 (en) | 2006-09-01 | 2018-07-24 | 가부시키가이샤 니콘 | Mobile object driving method, mobile object driving system, pattern forming method and apparatus, exposure method and apparatus, device manufacturing method and calibration method |
KR101452524B1 (en) * | 2006-09-01 | 2014-10-21 | 가부시키가이샤 니콘 | Moving body driving method and moving body driving system, pattern forming method and apparatus, exposure method and apparatus, and device manufacturing method |
JP5276595B2 (en) * | 2006-11-15 | 2013-08-28 | ザイゴ コーポレーション | Distance measuring interferometer and encoder measuring system used in lithography tools |
US7894075B2 (en) * | 2006-12-11 | 2011-02-22 | Zygo Corporation | Multiple-degree of freedom interferometer with compensation for gas effects |
US7812965B2 (en) * | 2006-12-11 | 2010-10-12 | Zygo Corporation | Multiple-degree of freedom interferometer with compensation for gas effects |
DE102007000999B4 (en) * | 2007-02-26 | 2012-06-28 | Vistec Semiconductor Systems Gmbh | Method for eliminating error sources of the system correction of a coordinate measuring machine |
US8118440B1 (en) | 2007-06-12 | 2012-02-21 | Nvidia Corporation | Capture system and method equipped with at least one steerable deflecting mirror |
US8100543B1 (en) * | 2007-06-12 | 2012-01-24 | Nvidia Corporation | Display system and method equipped with at least one steerable deflecting mirror |
US8173931B2 (en) * | 2008-06-13 | 2012-05-08 | Electro Scientific Industries, Inc. | Automatic recipe management for laser processing a work piece |
US8024060B2 (en) * | 2008-06-16 | 2011-09-20 | Electro Scientific Industries, Inc. | Method for defining safe zones in laser machining systems |
US8450641B2 (en) | 2008-10-10 | 2013-05-28 | Ipg Microsystems Llc | Laser machining systems and methods with moving laser scanning stage(s) providing force cancellation |
TWI594828B (en) | 2009-05-28 | 2017-08-11 | 伊雷克托科學工業股份有限公司 | Acousto-optic deflector applications in laser processing of features in a workpiece, and related laser processing method |
DE102010018032A1 (en) * | 2010-04-23 | 2011-10-27 | Osram Opto Semiconductors Gmbh | Method and device for processing a workpiece with a laser |
US8925931B2 (en) | 2010-04-29 | 2015-01-06 | Black & Decker Inc. | Oscillating tool |
US9073195B2 (en) | 2010-04-29 | 2015-07-07 | Black & Decker Inc. | Universal accessory for oscillating power tool |
US9186770B2 (en) | 2010-04-29 | 2015-11-17 | Black & Decker Inc. | Oscillating tool attachment feature |
CN102259503B (en) * | 2010-05-26 | 2014-02-12 | 宏恒胜电子科技(淮安)有限公司 | Automatic code spraying system and application method thereof |
JP5014471B2 (en) * | 2010-06-30 | 2012-08-29 | ファナック株式会社 | Numerical controller for multi-axis machines |
US8847113B2 (en) * | 2010-10-22 | 2014-09-30 | Electro Scientific Industries, Inc. | Laser processing systems and methods for beam dithering and skiving |
US9149923B2 (en) | 2010-11-09 | 2015-10-06 | Black & Decker Inc. | Oscillating tools and accessories |
CN102540783B (en) * | 2010-12-31 | 2014-11-12 | 上海微电子装备有限公司 | Automatic calibration device and method for abbe cosine error of interferometer |
IT1405141B1 (en) * | 2011-02-25 | 2013-12-20 | Camozzi Machine Tools S P A Ora Innse Berardi S P A | MACHINE TOOL WITH COMPENSATION OF THERMAL DEFORMATIONS OF MEASUREMENT ORGANS |
USD832666S1 (en) | 2012-07-16 | 2018-11-06 | Black & Decker Inc. | Oscillating saw blade |
US9397587B2 (en) * | 2013-11-20 | 2016-07-19 | Massachusetts Institute Of Technology | Multi-actuator design and control for a high-speed/large-range nanopositioning system |
US9269149B2 (en) * | 2014-05-08 | 2016-02-23 | Orbotech Ltd. | Calibration of a direct-imaging system |
CN104654997B (en) * | 2015-02-14 | 2018-03-13 | 中国科学院测量与地球物理研究所 | A kind of multiple degrees of freedom differential capacitance calibration device for displacement sensor |
CN104759753B (en) * | 2015-03-30 | 2016-08-31 | 江苏大学 | The co-ordination of multisystem automatization improves the method for induced with laser cavitation reinforcement |
US11077526B2 (en) | 2015-09-09 | 2021-08-03 | Electro Scientific Industries, Inc. | Laser processing apparatus, methods of laser-processing workpieces and related arrangements |
JP6761590B2 (en) * | 2015-12-24 | 2020-09-30 | 株式会社リコー | Optical processing equipment |
TWI564131B (en) * | 2015-12-29 | 2017-01-01 | Hiwin Tech Corp | Method and method of path planning for array pick - up using robotic arm The compensator used by the path planning method |
CN105574287B (en) * | 2016-01-07 | 2018-10-02 | 安徽理工大学 | Machine tool error modeling method based on bidimensional Abbe error and Instantaneous center |
WO2018126078A1 (en) | 2016-12-30 | 2018-07-05 | Electro Scientific Industries, Inc. | Method and system for extending optics lifetime in laser processing apparatus |
US10265778B2 (en) | 2017-01-16 | 2019-04-23 | Black & Decker Inc. | Accessories for oscillating power tools |
USD814900S1 (en) | 2017-01-16 | 2018-04-10 | Black & Decker Inc. | Blade for oscillating power tools |
KR102230321B1 (en) | 2017-05-25 | 2021-03-19 | 미쓰비시덴키 가부시키가이샤 | Laser processing equipment |
CN116275467A (en) | 2018-06-05 | 2023-06-23 | 伊雷克托科学工业股份有限公司 | Laser processing apparatus, method of operating the same, and method of processing workpiece using the same |
NL2022539B1 (en) * | 2019-02-08 | 2020-08-19 | Dutch United Instr B V | Positioning system for positioning an object |
JP7431550B2 (en) * | 2019-10-03 | 2024-02-15 | 三井精機工業株式会社 | Adjustment method that enables higher accuracy of machine tools |
US11969845B2 (en) | 2020-02-18 | 2024-04-30 | Hiwin Mikrosystem Corp. | Quick measurement module |
DE102020104708B4 (en) | 2020-02-22 | 2022-01-27 | Hiwin Mikrosystem Corp. | Fast measurement module |
DE102020204232B4 (en) * | 2020-04-01 | 2023-05-17 | P&L Gmbh & Co. Kg | Machine tool with high-precision machining capability and operating method |
CN111338291B (en) * | 2020-04-07 | 2023-07-14 | 湖北文理学院 | Abbe error compensation method and system based on machine tool positioning accuracy measurement |
TWI728812B (en) * | 2020-05-19 | 2021-05-21 | 鴻勁精密股份有限公司 | Correction method for a moving device |
CN112066881B (en) * | 2020-09-15 | 2021-10-22 | 成都明杰科技有限公司 | Use method of control system for precisely measuring Abbe error |
CN112643228A (en) * | 2021-01-21 | 2021-04-13 | 上海维宏电子科技股份有限公司 | Method, system, device, processor and storage medium for realizing capacitance compensation control on cutting head temperature drift in laser cutting system |
CN116088414B (en) * | 2021-11-08 | 2024-12-13 | 苏州维嘉科技股份有限公司 | Deviation correction method, device, equipment, storage medium, and stacking production line |
Family Cites Families (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3786332A (en) | 1969-03-19 | 1974-01-15 | Thomson Houston Comp Francaise | Micro positioning apparatus |
FR2330997A1 (en) | 1975-11-07 | 1977-06-03 | Sagem | IMPROVEMENTS IN PROCESSES AND MACHINES FOR MEASURING PART DIMENSIONS |
GB2042719B (en) | 1978-12-27 | 1983-03-09 | Ferranti Ltd | Positional measuring apparatus |
US4378482A (en) | 1981-04-27 | 1983-03-29 | Control Data Corporation | Electron-beam stage X-Y positioning instrumentation |
US4532402A (en) | 1983-09-02 | 1985-07-30 | Xrl, Inc. | Method and apparatus for positioning a focused beam on an integrated circuit |
US4724525A (en) | 1984-12-12 | 1988-02-09 | Moore Special Tool Co., Inc. | Real-time data collection apparatus for use in multi-axis measuring machine |
US4782598A (en) | 1985-09-19 | 1988-11-08 | Digital Electronic Automation, Inc. | Active error compensation in a coordinate measuring machine |
US4676649A (en) * | 1985-11-27 | 1987-06-30 | Compact Spindle Bearing Corp. | Multi-axis gas bearing stage assembly |
GB8616431D0 (en) | 1986-07-05 | 1986-08-13 | Renishaw Plc | Locating co-ordinates of object |
DE3743902A1 (en) | 1986-12-26 | 1988-07-07 | Mitsubishi Electric Corp | LASER MACHINING DEVICE |
US4877939A (en) | 1987-01-30 | 1989-10-31 | Duley Walter W | Means of enhancing laser processing efficiency of metals |
US4820899A (en) | 1987-03-03 | 1989-04-11 | Nikon Corporation | Laser beam working system |
US4789770A (en) | 1987-07-15 | 1988-12-06 | Westinghouse Electric Corp. | Controlled depth laser drilling system |
FR2620223B1 (en) | 1987-09-09 | 1994-03-25 | Institut Superieur Etat Surface | METHOD FOR SLIDING A MOBILE MEDIUM ON A REFERENCE SURFACE AND ASSOCIATED DEVICE |
US4939678A (en) | 1987-11-19 | 1990-07-03 | Brown & Sharpe Manufacturing Company | Method for calibration of coordinate measuring machine |
GB8730169D0 (en) | 1987-12-24 | 1988-02-03 | Renishaw Plc | Optical apparatus for use with interferometric measuring devices |
JPH01266983A (en) | 1988-04-20 | 1989-10-24 | Hitachi Seiko Ltd | Piercing machine for printed board |
US4941082A (en) | 1988-04-25 | 1990-07-10 | Electro Scientific Industries, Inc. | Light beam positioning system |
JP2704734B2 (en) * | 1988-09-05 | 1998-01-26 | キヤノン株式会社 | Stage positioning correction method and apparatus |
US5315526A (en) * | 1989-12-07 | 1994-05-24 | Okuma Corporation | Numerically controlled lathe |
US5280677A (en) | 1990-05-17 | 1994-01-25 | Canon Kabushiki Kaisha | Positioning mechanism |
US5255199A (en) * | 1990-12-14 | 1993-10-19 | Martin Marietta Energy Systems, Inc. | Cutting tool form compensaton system and method |
US5290992A (en) | 1992-10-07 | 1994-03-01 | International Business Machines Corporation | Apparatus for maximizing light beam utilization |
US5408318A (en) | 1993-08-02 | 1995-04-18 | Nearfield Systems Incorporated | Wide range straightness measuring stem using a polarized multiplexed interferometer and centered shift measurement of beam polarization components |
US5798195A (en) * | 1993-09-24 | 1998-08-25 | Nikon Corporation | Stepping accuracy measuring method |
DE4342312A1 (en) | 1993-12-11 | 1995-06-14 | Zeiss Carl Fa | Method for correcting vibration-related measurement errors in coordinate measuring machines |
DE4436507A1 (en) | 1994-10-13 | 1996-04-18 | Zeiss Carl Fa | Coordinate measurement of workpiece using coordinate measuring unit |
US5841099A (en) | 1994-07-18 | 1998-11-24 | Electro Scientific Industries, Inc. | Method employing UV laser pulses of varied energy density to form depthwise self-limiting blind vias in multilayered targets |
US5552888A (en) | 1994-12-02 | 1996-09-03 | Nikon Precision, Inc. | Apparatus for measuring position of an X-Y stage |
US5847960A (en) * | 1995-03-20 | 1998-12-08 | Electro Scientific Industries, Inc. | Multi-tool positioning system |
US5751585A (en) | 1995-03-20 | 1998-05-12 | Electro Scientific Industries, Inc. | High speed, high accuracy multi-stage tool positioning system |
CN2238417Y (en) * | 1995-04-11 | 1996-10-23 | 中国科学院长春光学精密机械研究所 | Sensor for measuring micro linear displacement |
JP3153099B2 (en) | 1995-04-20 | 2001-04-03 | キヤノン株式会社 | Positioning device |
US5832416A (en) | 1995-09-01 | 1998-11-03 | Brown & Sharpe Manufacturing Company | Calibration system for coordinate measuring machine |
US5812420A (en) | 1995-09-05 | 1998-09-22 | Nikon Corporation | Vibration-preventive apparatus and exposure apparatus |
JP3460074B2 (en) | 1995-11-24 | 2003-10-27 | 株式会社トプコン | Electronic level horizontal error correction mechanism |
US5699621A (en) | 1996-02-21 | 1997-12-23 | Massachusetts Institute Of Technology | Positioner with long travel in two dimensions |
JPH1041205A (en) * | 1996-07-18 | 1998-02-13 | Nikon Corp | Scanning alligner |
JPH09317767A (en) * | 1996-05-28 | 1997-12-09 | Nippon Seiko Kk | Positioning device |
JPH11233403A (en) * | 1998-02-10 | 1999-08-27 | Nikon Corp | Method for adjusting stage and scanning aligner using the same |
-
2001
- 2001-01-05 AU AU2001227690A patent/AU2001227690A1/en not_active Abandoned
- 2001-01-05 CA CA002396259A patent/CA2396259A1/en not_active Abandoned
- 2001-01-05 EP EP01901835A patent/EP1275036B1/en not_active Expired - Lifetime
- 2001-01-05 DE DE60114397T patent/DE60114397T2/en not_active Expired - Lifetime
- 2001-01-05 JP JP2001552159A patent/JP4860870B2/en not_active Expired - Fee Related
- 2001-01-05 CN CNB018036155A patent/CN100437407C/en not_active Expired - Fee Related
- 2001-01-05 KR KR1020027008743A patent/KR100755335B1/en not_active IP Right Cessation
- 2001-01-05 WO PCT/US2001/000484 patent/WO2001052004A1/en active IP Right Grant
- 2001-01-05 US US09/755,950 patent/US6430465B2/en not_active Expired - Lifetime
- 2001-01-05 AT AT01901835T patent/ATE308071T1/en not_active IP Right Cessation
- 2001-01-08 TW TW090100352A patent/TW472177B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE60114397T2 (en) | 2006-08-03 |
EP1275036B1 (en) | 2005-10-26 |
ATE308071T1 (en) | 2005-11-15 |
US6430465B2 (en) | 2002-08-06 |
KR100755335B1 (en) | 2007-09-05 |
EP1275036A1 (en) | 2003-01-15 |
KR20020067600A (en) | 2002-08-22 |
CN100437407C (en) | 2008-11-26 |
JP4860870B2 (en) | 2012-01-25 |
CA2396259A1 (en) | 2001-07-19 |
CN1419663A (en) | 2003-05-21 |
DE60114397D1 (en) | 2005-12-01 |
TW472177B (en) | 2002-01-11 |
US20010029674A1 (en) | 2001-10-18 |
JP2003523567A (en) | 2003-08-05 |
WO2001052004A1 (en) | 2001-07-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
AU2001227690A1 (en) | Abbe error correction system and method | |
CN101936791B (en) | Digital pressure gauge | |
CN103983290B (en) | Compound absolute value encoder | |
US20160231150A1 (en) | Test indicator | |
EP1770374A2 (en) | Absolute liner encoder | |
WO2002027354A3 (en) | Noncontacting position indicating system | |
CA2641684C (en) | Angle measurement apparatus | |
SG146616A1 (en) | Pressure sensor | |
WO2000015016A3 (en) | Method and device for calibrating a displacement path and/or angular position of a holding device in a device for producing electrical assembly groups and calibration substrate | |
CN101706250A (en) | Absolute intersection angle measuring device with large scale and high accuracy | |
CN201754115U (en) | Digital pressure meter | |
ES2137155T3 (en) | DEVICE FOR MEASURING A MAGNETIC FIELD OF WEAK FLOW. | |
EP1217333A3 (en) | Position encoder | |
SE8404266L (en) | ASSUME THE ACCURACY OF A LENGTH SYSTEM BY CALIBRATING THIS AGAINST A CLOSER REFERENCE SYSTEM | |
US10288511B2 (en) | Relative pressure sensor | |
WO2008054468A3 (en) | Precision spacecraft payload platforms | |
CN103322919A (en) | Grating ruler and method for finding null position of grating ruler quickly | |
CN201522288U (en) | Device for measuring multiturn absolute angle of rotator | |
AU3359289A (en) | Measuring compass | |
CN110398203A (en) | Long range laser length measurement method and device | |
CN101726273B (en) | Measuring instrument | |
Kobata | Characterization of quartz Bourdon-type high-pressure transducers | |
CN208937006U (en) | A kind of steer angle measuring device | |
WO2006083267A3 (en) | System for interferometric sensing | |
CN203323704U (en) | Grating scales for quick homing |