AU1332601A - Strategic method for process control - Google Patents
Strategic method for process controlInfo
- Publication number
- AU1332601A AU1332601A AU13326/01A AU1332601A AU1332601A AU 1332601 A AU1332601 A AU 1332601A AU 13326/01 A AU13326/01 A AU 13326/01A AU 1332601 A AU1332601 A AU 1332601A AU 1332601 A AU1332601 A AU 1332601A
- Authority
- AU
- Australia
- Prior art keywords
- process control
- strategic method
- strategic
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B15/00—Systems controlled by a computer
- G05B15/02—Systems controlled by a computer electric
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/32—Operator till task planning
- G05B2219/32345—Of interconnection of cells, subsystems, distributed simulation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL132663 | 1999-10-31 | ||
IL13266399A IL132663A (en) | 1999-10-31 | 1999-10-31 | Knowledge-engineering protocol-suite |
US09/588,681 US6952688B1 (en) | 1999-10-31 | 2000-06-07 | Knowledge-engineering protocol-suite |
US09588681 | 2000-06-07 | ||
US09633824 | 2000-08-07 | ||
US09/633,824 US7461040B1 (en) | 1999-10-31 | 2000-08-07 | Strategic method for process control |
PCT/US2000/028318 WO2001033277A1 (en) | 1999-10-31 | 2000-10-13 | Strategic method for process control |
Publications (1)
Publication Number | Publication Date |
---|---|
AU1332601A true AU1332601A (en) | 2001-05-14 |
Family
ID=27271918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU13326/01A Abandoned AU1332601A (en) | 1999-10-31 | 2000-10-13 | Strategic method for process control |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1234204A1 (en) |
AU (1) | AU1332601A (en) |
WO (1) | WO2001033277A1 (en) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7069101B1 (en) | 1999-07-29 | 2006-06-27 | Applied Materials, Inc. | Computer integrated manufacturing techniques |
US7188142B2 (en) | 2000-11-30 | 2007-03-06 | Applied Materials, Inc. | Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility |
US6913938B2 (en) | 2001-06-19 | 2005-07-05 | Applied Materials, Inc. | Feedback control of plasma-enhanced chemical vapor deposition processes |
US7160739B2 (en) | 2001-06-19 | 2007-01-09 | Applied Materials, Inc. | Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles |
US7101799B2 (en) | 2001-06-19 | 2006-09-05 | Applied Materials, Inc. | Feedforward and feedback control for conditioning of chemical mechanical polishing pad |
US7082345B2 (en) | 2001-06-19 | 2006-07-25 | Applied Materials, Inc. | Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities |
US7201936B2 (en) | 2001-06-19 | 2007-04-10 | Applied Materials, Inc. | Method of feedback control of sub-atmospheric chemical vapor deposition processes |
US6910947B2 (en) | 2001-06-19 | 2005-06-28 | Applied Materials, Inc. | Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life |
US7047099B2 (en) | 2001-06-19 | 2006-05-16 | Applied Materials Inc. | Integrating tool, module, and fab level control |
US7337019B2 (en) | 2001-07-16 | 2008-02-26 | Applied Materials, Inc. | Integration of fault detection with run-to-run control |
US6984198B2 (en) | 2001-08-14 | 2006-01-10 | Applied Materials, Inc. | Experiment management system, method and medium |
US7225047B2 (en) | 2002-03-19 | 2007-05-29 | Applied Materials, Inc. | Method, system and medium for controlling semiconductor wafer processes using critical dimension measurements |
WO2003088067A1 (en) | 2002-04-10 | 2003-10-23 | Kendro Laboratory Products, Lp | Data-centric automation |
KR20050026099A (en) | 2002-08-01 | 2005-03-14 | 어플라이드 머티어리얼즈 인코포레이티드 | Method, system, and medium for handling misrepresentative metrology data within an advanced process control system |
CN1720490B (en) | 2002-11-15 | 2010-12-08 | 应用材料有限公司 | Method and system for controlling manufacture process having multivariate input parameters |
US7333871B2 (en) | 2003-01-21 | 2008-02-19 | Applied Materials, Inc. | Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools |
US7205228B2 (en) | 2003-06-03 | 2007-04-17 | Applied Materials, Inc. | Selective metal encapsulation schemes |
US7354332B2 (en) | 2003-08-04 | 2008-04-08 | Applied Materials, Inc. | Technique for process-qualifying a semiconductor manufacturing tool using metrology data |
US7356377B2 (en) | 2004-01-29 | 2008-04-08 | Applied Materials, Inc. | System, method, and medium for monitoring performance of an advanced process control system |
US7444197B2 (en) | 2004-05-06 | 2008-10-28 | Smp Logic Systems Llc | Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes |
US7799273B2 (en) | 2004-05-06 | 2010-09-21 | Smp Logic Systems Llc | Manufacturing execution system for validation, quality and risk assessment and monitoring of pharmaceutical manufacturing processes |
US6961626B1 (en) | 2004-05-28 | 2005-11-01 | Applied Materials, Inc | Dynamic offset and feedback threshold |
US7096085B2 (en) | 2004-05-28 | 2006-08-22 | Applied Materials | Process control by distinguishing a white noise component of a process variance |
EP1932116A2 (en) * | 2005-08-26 | 2008-06-18 | Camtek Ltd. | Method and system for automatic defect detection of articles in visual inspection machines |
CN109063218B (en) * | 2018-10-29 | 2025-03-07 | 洪启集成电路(珠海)有限公司 | A statistical process control method and system |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6112126A (en) * | 1997-02-21 | 2000-08-29 | Baker Hughes Incorporated | Adaptive object-oriented optimization software system |
US6122555A (en) * | 1997-05-05 | 2000-09-19 | Honeywell International Inc. | System and methods for globally optimizing a process facility |
-
2000
- 2000-10-13 AU AU13326/01A patent/AU1332601A/en not_active Abandoned
- 2000-10-13 WO PCT/US2000/028318 patent/WO2001033277A1/en not_active Application Discontinuation
- 2000-10-13 EP EP00975247A patent/EP1234204A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
EP1234204A1 (en) | 2002-08-28 |
WO2001033277A1 (en) | 2001-05-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |