ATE63163T1 - Resonator-wandlersystem mit temperaturkompensation. - Google Patents
Resonator-wandlersystem mit temperaturkompensation.Info
- Publication number
- ATE63163T1 ATE63163T1 AT84111246T AT84111246T ATE63163T1 AT E63163 T1 ATE63163 T1 AT E63163T1 AT 84111246 T AT84111246 T AT 84111246T AT 84111246 T AT84111246 T AT 84111246T AT E63163 T1 ATE63163 T1 AT E63163T1
- Authority
- AT
- Austria
- Prior art keywords
- frequencies
- frequency
- variation
- temperature
- vibratory element
- Prior art date
Links
- 239000013078 crystal Substances 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000010453 quartz Substances 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/32—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using change of resonant frequency of a crystal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
- G01D3/032—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure affecting incoming signal, e.g. by averaging; gating undesired signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/10—Measuring force or stress, in general by measuring variations of frequency of stressed vibrating elements, e.g. of stressed strings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/10—Measuring force or stress, in general by measuring variations of frequency of stressed vibrating elements, e.g. of stressed strings
- G01L1/106—Constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/16—Measuring force or stress, in general using properties of piezoelectric devices
- G01L1/162—Measuring force or stress, in general using properties of piezoelectric devices using piezoelectric resonators
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S73/00—Measuring and testing
- Y10S73/04—Piezoelectric
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
- Measuring Fluid Pressure (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
- Networks Using Active Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/538,171 US4535638A (en) | 1983-10-03 | 1983-10-03 | Resonator transducer system with temperature compensation |
| EP84111246A EP0136627B1 (de) | 1983-10-03 | 1984-09-20 | Resonator-Wandlersystem mit Temperaturkompensation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE63163T1 true ATE63163T1 (de) | 1991-05-15 |
Family
ID=24145814
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT84111246T ATE63163T1 (de) | 1983-10-03 | 1984-09-20 | Resonator-wandlersystem mit temperaturkompensation. |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4535638A (de) |
| EP (1) | EP0136627B1 (de) |
| JP (1) | JPS60105917A (de) |
| AT (1) | ATE63163T1 (de) |
| CA (1) | CA1224938A (de) |
| DE (1) | DE3484528D1 (de) |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5937495A (ja) * | 1982-08-25 | 1984-02-29 | 株式会社日立製作所 | 電導性流体の流速、温度および音響を検出するためのセンサ並びに検出装置 |
| ATE78368T1 (de) * | 1983-04-01 | 1992-08-15 | Quartex Inc | Doppelstabresonator-kraftwandler mit beschraenkter longitudinal-pumpwirkung. |
| DE3505165C2 (de) * | 1985-02-15 | 1986-12-04 | Danfoss A/S, Nordborg | Verfahren und Vorrichtung zum Messen einer Kraft |
| JPS62249024A (ja) * | 1986-04-21 | 1987-10-30 | Yamato Scale Co Ltd | 力測定装置 |
| US4936147A (en) * | 1986-12-29 | 1990-06-26 | Halliburton Company | Transducer and sensor apparatus and method |
| US4802370A (en) * | 1986-12-29 | 1989-02-07 | Halliburton Company | Transducer and sensor apparatus and method |
| US4779461A (en) * | 1987-02-24 | 1988-10-25 | Lansmont Corporation | Method of and apparatus for measuring and recording the drop height of a container in transit |
| GB8720355D0 (en) * | 1987-08-28 | 1987-10-07 | Emi Plc Thorn | Measuring fluid density |
| US4872343A (en) * | 1988-08-10 | 1989-10-10 | Sundstrand Data Control, Inc. | Matched pairs of force transducers |
| US5012151A (en) * | 1989-09-12 | 1991-04-30 | Halliburton Company | Thermally matched strip mounted resonator and related mounting method |
| US5112642A (en) * | 1990-03-30 | 1992-05-12 | Leybold Inficon, Inc. | Measuring and controlling deposition on a piezoelectric monitor crystal |
| GB9013056D0 (en) * | 1990-06-12 | 1990-08-01 | Stc Plc | Temperature sensor |
| GB2248353B (en) * | 1990-09-29 | 1994-04-27 | Stc Plc | Frequency reference circuit |
| CH684441A5 (de) * | 1991-03-19 | 1994-09-15 | Mettler Toledo Ag | Elektromechanische Waage mit Saitenschwinger. |
| US5221873A (en) * | 1992-01-21 | 1993-06-22 | Halliburton Services | Pressure transducer with quartz crystal of singly rotated cut for increased pressure and temperature operating range |
| US5319965A (en) * | 1992-03-02 | 1994-06-14 | Halliburton Company | Multiple channel pressure recorder |
| US5338929A (en) * | 1992-03-30 | 1994-08-16 | Shell Oil Company | Micromachined sensor device using a beam of light with a frequency swept modulated intensity to activate at least two resonance modes of the sensor element |
| US5391844A (en) | 1992-04-03 | 1995-02-21 | Weigh-Tronix Inc | Load cell |
| US5442146A (en) | 1992-04-03 | 1995-08-15 | Weigh-Tronix, Inc. | Counting scale and load cell assembly therefor |
| US5313023A (en) | 1992-04-03 | 1994-05-17 | Weigh-Tronix, Inc. | Load cell |
| US5336854A (en) | 1992-04-03 | 1994-08-09 | Weigh-Tronix, Inc. | Electronic force sensing load cell |
| US5458000A (en) * | 1993-07-20 | 1995-10-17 | Honeywell Inc. | Static pressure compensation of resonant integrated microbeam sensors |
| US5511427A (en) * | 1993-07-21 | 1996-04-30 | Honeywell Inc. | Cantilevered microbeam temperature sensor |
| US5417115A (en) * | 1993-07-23 | 1995-05-23 | Honeywell Inc. | Dielectrically isolated resonant microsensors |
| US5471882A (en) * | 1993-08-31 | 1995-12-05 | Quartzdyne, Inc. | Quartz thickness-shear mode resonator temperature-compensated pressure transducer with matching thermal time constants of pressure and temperature sensors |
| US5501103B1 (en) * | 1994-02-15 | 1998-08-04 | Allied Signal Inc | Two-port electromagnetic drive for a double-ended tuning fork |
| IL113556A (en) * | 1994-05-11 | 1998-04-05 | Allied Signal Inc | A double-ended collar |
| US5629489A (en) * | 1995-02-06 | 1997-05-13 | Weigh-Tronix, Inc. | Load cell assembly with linearization and common mode discrimination of complementary force-responsive signals |
| US5837946A (en) * | 1995-06-16 | 1998-11-17 | Weigh-Tronix, Inc. | Force sensitive scale and dual load sensor cell for use therewith |
| US5869763A (en) * | 1995-10-19 | 1999-02-09 | The United States Of America As Represented By The Secretary Of The Army | Method for measuring mass change using a quartz crystal microbalance |
| US5772322A (en) * | 1996-05-31 | 1998-06-30 | Honeywell Inc. | Resonant microbeam temperature sensor |
| US6230565B1 (en) * | 1997-05-29 | 2001-05-15 | Alliedsignal Inc. | Pressure-compensated transducers, pressure-compensated accelerometers, force-sensing methods, and acceleration-sensing methods |
| US5965817A (en) * | 1998-07-28 | 1999-10-12 | Quasar International, Inc. | Temperature compensation of resonant frequency measurements for the effects of temperature variations |
| US6328802B1 (en) | 1999-09-14 | 2001-12-11 | Lsi Logic Corporation | Method and apparatus for determining temperature of a semiconductor wafer during fabrication thereof |
| GB0007325D0 (en) | 2000-03-27 | 2000-05-17 | Atherton Eric | High temperature sensor |
| US6595054B2 (en) * | 2001-05-14 | 2003-07-22 | Paroscientific, Inc. | Digital angular rate and acceleration sensor |
| JP2006228776A (ja) * | 2005-02-15 | 2006-08-31 | Advantest Corp | 荷電粒子ビーム露光装置及び荷電粒子ビーム露光方法 |
| US7042230B1 (en) * | 2005-02-28 | 2006-05-09 | Alain Izadnegahdar | Multi-parameter sensing system |
| US7871826B2 (en) | 2007-09-26 | 2011-01-18 | Air Products And Chemicals, Inc. | Method for determining carbon content of a hydrocarbon-containing mixture |
| EP2106028A1 (de) * | 2008-03-26 | 2009-09-30 | Nokia Siemens Networks Oy | Schaltungsanordnung und Betriebsverfahren dafür |
| US9038263B2 (en) | 2011-01-13 | 2015-05-26 | Delaware Capital Formation, Inc. | Thickness shear mode resonator sensors and methods of forming a plurality of resonator sensors |
| CH709395A1 (de) * | 2014-03-21 | 2015-09-30 | Kistler Holding Ag | Piezoelektrisches Messelement zur Messung des dynamischen Druckes sowie des statischen Druckes und/oder der Temperatur. |
| EP2955497B1 (de) | 2014-06-09 | 2019-01-02 | Nxp B.V. | Kraftsensor mit Kompensation |
| BR112018003579A2 (pt) * | 2015-08-31 | 2018-09-25 | Koninklijke Philips N.V. | sistema e método de detecção |
| US10330553B2 (en) * | 2016-08-16 | 2019-06-25 | Kulite Semiconductor Products, Inc. | Lowpass resonator and particulate filter for a pressure transducer |
| CN109633205B (zh) * | 2019-01-16 | 2020-12-04 | 南京理工大学 | 一种石英谐振加速度计温度补偿方法 |
| CN111721366A (zh) * | 2020-07-22 | 2020-09-29 | 潜江菲利华石英玻璃材料有限公司 | 一种石英玻璃料面分析视觉检测系统和装置 |
| US11953514B2 (en) * | 2022-04-02 | 2024-04-09 | Emcore Corporation | Self-compensating resonantly vibrating accelerometer driven in multiple vibrational modes |
| US11965907B2 (en) * | 2022-04-02 | 2024-04-23 | Emcore Corporation | Resonantly vibrating accelerometer driven in multiple vibrational modes |
| US11959935B2 (en) * | 2022-04-02 | 2024-04-16 | Emcore Corporation | Resonantly vibrating accelerometer with cross-coupling signal suppression |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3561832A (en) * | 1969-12-05 | 1971-02-09 | Hewlett Packard Co | Quartz resonator pressure transducer |
| US3879992A (en) * | 1970-05-12 | 1975-04-29 | California Inst Of Techn | Multiple crystal oscillator measuring apparatus |
| US4175243A (en) * | 1977-11-17 | 1979-11-20 | Corbett James P | Temperature compensated oscillating crystal force transducer systems |
| US4144747A (en) * | 1978-01-30 | 1979-03-20 | The Bendix Corporation | Simultaneously resonated, multi-mode crystal force transducer |
| JPS5838738B2 (ja) * | 1979-01-11 | 1983-08-25 | 横河電機株式会社 | 圧力計 |
| JPS5857693B2 (ja) * | 1979-01-12 | 1983-12-21 | 横河電機株式会社 | 温度計 |
| JPS60611B2 (ja) * | 1979-01-19 | 1985-01-09 | 横河電機株式会社 | 検出装置 |
| US4311053A (en) * | 1979-05-14 | 1982-01-19 | Rosemount, Inc. | Vibrating beam pressure sensor |
| US4372173A (en) * | 1980-10-20 | 1983-02-08 | Quartex, Inc. | Resonator force transducer |
| JPS57129012A (en) * | 1980-11-05 | 1982-08-10 | Schlumberger Overseas | Stress compensation type crystal vibrator |
| LU83598A1 (de) * | 1981-09-02 | 1982-01-20 | Mettler Instrumente Ag | Auswerteeinrichtung fuer kraftmesser mit einer vorgespannten biegesteifen,queschwingenden saite |
-
1983
- 1983-10-03 US US06/538,171 patent/US4535638A/en not_active Expired - Lifetime
-
1984
- 1984-09-17 CA CA000463286A patent/CA1224938A/en not_active Expired
- 1984-09-20 AT AT84111246T patent/ATE63163T1/de not_active IP Right Cessation
- 1984-09-20 EP EP84111246A patent/EP0136627B1/de not_active Expired - Lifetime
- 1984-09-20 DE DE8484111246T patent/DE3484528D1/de not_active Expired - Fee Related
- 1984-10-02 JP JP59206957A patent/JPS60105917A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP0136627B1 (de) | 1991-05-02 |
| JPS60105917A (ja) | 1985-06-11 |
| EP0136627A3 (en) | 1988-01-07 |
| US4535638A (en) | 1985-08-20 |
| CA1224938A (en) | 1987-08-04 |
| DE3484528D1 (de) | 1991-06-06 |
| EP0136627A2 (de) | 1985-04-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |