ATE448175T1 - Schutz von in einer fläche eines mikrostrukturierten elements mündenden hohlräumen - Google Patents
Schutz von in einer fläche eines mikrostrukturierten elements mündenden hohlräumenInfo
- Publication number
- ATE448175T1 ATE448175T1 AT07727715T AT07727715T ATE448175T1 AT E448175 T1 ATE448175 T1 AT E448175T1 AT 07727715 T AT07727715 T AT 07727715T AT 07727715 T AT07727715 T AT 07727715T AT E448175 T1 ATE448175 T1 AT E448175T1
- Authority
- AT
- Austria
- Prior art keywords
- cavities
- finishing
- protection
- microstructured element
- microstructured
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00777—Preserve existing structures from alteration, e.g. temporary protection during manufacturing
- B81C1/00833—Methods for preserving structures not provided for in groups B81C1/00785 - B81C1/00825
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
- H01J9/022—Manufacture of electrodes or electrode systems of cold cathodes
- H01J9/025—Manufacture of electrodes or electrode systems of cold cathodes of field emission cathodes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/03—Static structures
- B81B2203/0315—Cavities
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0174—Manufacture or treatment of microstructural devices or systems in or on a substrate for making multi-layered devices, film deposition or growing
- B81C2201/019—Bonding or gluing multiple substrate layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/05—Temporary protection of devices or parts of the devices during manufacturing
- B81C2201/053—Depositing a protective layers
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Micromachines (AREA)
- Materials For Medical Uses (AREA)
- Cold Cathode And The Manufacture (AREA)
- Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
- Heat Treatment Of Articles (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Spinning Methods And Devices For Manufacturing Artificial Fibers (AREA)
- Air Bags (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0651210A FR2899572B1 (fr) | 2006-04-05 | 2006-04-05 | Protection de cavites debouchant sur une face d'un element microstructure |
PCT/EP2007/053244 WO2007113300A1 (fr) | 2006-04-05 | 2007-04-03 | Protection de cavites debouchant sur une face d'un element microstructure. |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE448175T1 true ATE448175T1 (de) | 2009-11-15 |
Family
ID=37467469
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT07727715T ATE448175T1 (de) | 2006-04-05 | 2007-04-03 | Schutz von in einer fläche eines mikrostrukturierten elements mündenden hohlräumen |
Country Status (7)
Country | Link |
---|---|
US (1) | US8153503B2 (de) |
EP (1) | EP2054338B1 (de) |
JP (1) | JP2009532836A (de) |
AT (1) | ATE448175T1 (de) |
DE (1) | DE602007003233D1 (de) |
FR (1) | FR2899572B1 (de) |
WO (1) | WO2007113300A1 (de) |
Family Cites Families (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2634059B1 (fr) * | 1988-07-08 | 1996-04-12 | Thomson Csf | Microcomposant electronique autoscelle sous vide, notamment diode, ou triode, et procede de fabrication correspondant |
US5038070A (en) * | 1989-12-26 | 1991-08-06 | Hughes Aircraft Company | Field emitter structure and fabrication process |
JP3007654B2 (ja) * | 1990-05-31 | 2000-02-07 | 株式会社リコー | 電子放出素子の製造方法 |
US5332627A (en) * | 1990-10-30 | 1994-07-26 | Sony Corporation | Field emission type emitter and a method of manufacturing thereof |
EP0503638B1 (de) * | 1991-03-13 | 1996-06-19 | Sony Corporation | Anordnung von Feldemissionskathoden |
JPH0594761A (ja) * | 1991-10-02 | 1993-04-16 | Sharp Corp | 電界放出型真空管及びその製造方法 |
JPH05299009A (ja) * | 1992-04-23 | 1993-11-12 | New Japan Radio Co Ltd | 電界放射装置 |
JP3231528B2 (ja) * | 1993-08-17 | 2001-11-26 | 株式会社東芝 | 電界放出型冷陰極およびその製造方法 |
US5564959A (en) * | 1993-09-08 | 1996-10-15 | Silicon Video Corporation | Use of charged-particle tracks in fabricating gated electron-emitting devices |
US5559389A (en) * | 1993-09-08 | 1996-09-24 | Silicon Video Corporation | Electron-emitting devices having variously constituted electron-emissive elements, including cones or pedestals |
JPH07104682A (ja) * | 1993-09-29 | 1995-04-21 | Futaba Corp | 電界放出陰極を用いた表示装置 |
JPH07147130A (ja) * | 1993-11-24 | 1995-06-06 | Nec Kansai Ltd | 陰極線管の製造方法 |
US5451830A (en) * | 1994-01-24 | 1995-09-19 | Industrial Technology Research Institute | Single tip redundancy method with resistive base and resultant flat panel display |
FR2715502B1 (fr) * | 1994-01-26 | 1996-04-05 | Commissariat Energie Atomique | Structure présentant des cavités et procédé de réalisation d'une telle structure. |
GB9416754D0 (en) * | 1994-08-18 | 1994-10-12 | Isis Innovation | Field emitter structures |
EP0700063A1 (de) * | 1994-08-31 | 1996-03-06 | International Business Machines Corporation | Aufbau und Verfahren zur Herstellung einer Feldemissionsanordnung |
US5509840A (en) * | 1994-11-28 | 1996-04-23 | Industrial Technology Research Institute | Fabrication of high aspect ratio spacers for field emission display |
KR100351070B1 (ko) * | 1995-01-27 | 2003-01-29 | 삼성에스디아이 주식회사 | 전계방출표시소자의제조방법 |
KR100343213B1 (ko) * | 1995-11-14 | 2002-11-27 | 삼성에스디아이 주식회사 | 전계방출소자의제조방법 |
US5693235A (en) * | 1995-12-04 | 1997-12-02 | Industrial Technology Research Institute | Methods for manufacturing cold cathode arrays |
US5710483A (en) * | 1996-04-08 | 1998-01-20 | Industrial Technology Research Institute | Field emission device with micromesh collimator |
US5882532A (en) * | 1996-05-31 | 1999-03-16 | Hewlett-Packard Company | Fabrication of single-crystal silicon structures using sacrificial-layer wafer bonding |
KR100262144B1 (ko) * | 1997-07-02 | 2000-07-15 | 하제준 | 일체화된 mosfet로 조절되는 fea 및 그 제조방법 |
US6010383A (en) * | 1997-10-31 | 2000-01-04 | Candescent Technologies Corporation | Protection of electron-emissive elements prior to removing excess emitter material during fabrication of electron-emitting device |
DE19804192A1 (de) * | 1998-02-03 | 1999-08-12 | Siemens Ag | Verfahren zur Herstellung eines Leistungshalbleiterbauelementes |
US6064149A (en) * | 1998-02-23 | 2000-05-16 | Micron Technology Inc. | Field emission device with silicon-containing adhesion layer |
US6137212A (en) * | 1998-05-26 | 2000-10-24 | The United States Of America As Represented By The Secretary Of The Army | Field emission flat panel display with improved spacer architecture |
US6176754B1 (en) * | 1998-05-29 | 2001-01-23 | Candescent Technologies Corporation | Method for forming a conductive focus waffle |
US6369497B1 (en) * | 1999-03-01 | 2002-04-09 | Micron Technology, Inc. | Method of fabricating row lines of a field emission array and forming pixel openings therethrough by employing two masks |
US6197607B1 (en) * | 1999-03-01 | 2001-03-06 | Micron Technology, Inc. | Method of fabricating field emission arrays to optimize the size of grid openings and to minimize the occurrence of electrical shorts |
JP2000285795A (ja) * | 1999-03-31 | 2000-10-13 | Sony Corp | 電子放出源およびその製造方法ならびにディスプレイ装置 |
JP2001035352A (ja) * | 1999-07-22 | 2001-02-09 | Sharp Corp | 電子源、その製造方法及びそれを用いて形成した画像形成装置 |
KR100314094B1 (ko) * | 1999-08-12 | 2001-11-15 | 김순택 | 전기 영동법을 이용한 카본나노튜브 필드 에미터의 제조 방법 |
FR2803438B1 (fr) * | 1999-12-29 | 2002-02-08 | Commissariat Energie Atomique | Procede de realisation d'une structure d'interconnexions comprenant une isolation electrique incluant des cavites d'air ou de vide |
KR100480771B1 (ko) * | 2000-01-05 | 2005-04-06 | 삼성에스디아이 주식회사 | 전계방출소자 및 그 제조방법 |
KR100464314B1 (ko) * | 2000-01-05 | 2004-12-31 | 삼성에스디아이 주식회사 | 전계방출소자 및 그 제조방법 |
US6753544B2 (en) * | 2001-04-30 | 2004-06-22 | Hewlett-Packard Development Company, L.P. | Silicon-based dielectric tunneling emitter |
FR2834123B1 (fr) * | 2001-12-21 | 2005-02-04 | Soitec Silicon On Insulator | Procede de report de couches minces semi-conductrices et procede d'obtention d'une plaquette donneuse pour un tel procede de report |
CN100416840C (zh) * | 2002-11-01 | 2008-09-03 | 株式会社半导体能源研究所 | 半导体装置及半导体装置的制作方法 |
US7138329B2 (en) * | 2002-11-15 | 2006-11-21 | United Microelectronics Corporation | Air gap for tungsten/aluminum plug applications |
KR100879293B1 (ko) * | 2002-12-26 | 2009-01-19 | 삼성에스디아이 주식회사 | 다층 구조로 형성된 전자 방출원을 구비한 전계 방출표시장치 |
US20050095814A1 (en) * | 2003-11-05 | 2005-05-05 | Xu Zhu | Ultrathin form factor MEMS microphones and microspeakers |
US7564178B2 (en) * | 2005-02-14 | 2009-07-21 | Agere Systems Inc. | High-density field emission elements and a method for forming said emission elements |
-
2006
- 2006-04-05 FR FR0651210A patent/FR2899572B1/fr not_active Expired - Fee Related
-
2007
- 2007-04-03 EP EP07727715A patent/EP2054338B1/de not_active Not-in-force
- 2007-04-03 JP JP2009503574A patent/JP2009532836A/ja active Pending
- 2007-04-03 AT AT07727715T patent/ATE448175T1/de not_active IP Right Cessation
- 2007-04-03 US US12/295,997 patent/US8153503B2/en not_active Expired - Fee Related
- 2007-04-03 WO PCT/EP2007/053244 patent/WO2007113300A1/fr active Application Filing
- 2007-04-03 DE DE602007003233T patent/DE602007003233D1/de active Active
Also Published As
Publication number | Publication date |
---|---|
FR2899572A1 (fr) | 2007-10-12 |
US20090263920A1 (en) | 2009-10-22 |
EP2054338A1 (de) | 2009-05-06 |
DE602007003233D1 (de) | 2009-12-24 |
US8153503B2 (en) | 2012-04-10 |
WO2007113300A1 (fr) | 2007-10-11 |
JP2009532836A (ja) | 2009-09-10 |
FR2899572B1 (fr) | 2008-09-05 |
EP2054338B1 (de) | 2009-11-11 |
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ATE448175T1 (de) | Schutz von in einer fläche eines mikrostrukturierten elements mündenden hohlräumen |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |