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ATE172811T1 - Gerät zur informationsverarbeitung - Google Patents

Gerät zur informationsverarbeitung

Info

Publication number
ATE172811T1
ATE172811T1 AT92108160T AT92108160T ATE172811T1 AT E172811 T1 ATE172811 T1 AT E172811T1 AT 92108160 T AT92108160 T AT 92108160T AT 92108160 T AT92108160 T AT 92108160T AT E172811 T1 ATE172811 T1 AT E172811T1
Authority
AT
Austria
Prior art keywords
recording medium
probe electrode
information processing
processing device
collision
Prior art date
Application number
AT92108160T
Other languages
English (en)
Inventor
Akihiko Yamano
Katsunori Hatanaka
Kunihiro Sakai
Takahiro Oguchi
Shunichi Shido
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE172811T1 publication Critical patent/ATE172811T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
    • G11B9/1436—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other
    • G11B9/1445—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other switching at least one head in operating function; Controlling the relative spacing to keep the head operative, e.g. for allowing a tunnel current flow
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00—Applications, other than SPM, of scanning-probe techniques
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/85—Scanning probe control process
    • Y10S977/851—Particular movement or positioning of scanning tip
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/861—Scanning tunneling probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/88—Manufacture, treatment, or detection of nanostructure with arrangement, process, or apparatus for testing
    • Y10S977/881—Microscopy or spectroscopy, e.g. sem, tem
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943—Information storage or retrieval using nanostructure
    • Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Debugging And Monitoring (AREA)
AT92108160T 1991-05-15 1992-05-14 Gerät zur informationsverarbeitung ATE172811T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3139631A JP2930447B2 (ja) 1991-05-15 1991-05-15 情報処理装置

Publications (1)

Publication Number Publication Date
ATE172811T1 true ATE172811T1 (de) 1998-11-15

Family

ID=15249780

Family Applications (1)

Application Number Title Priority Date Filing Date
AT92108160T ATE172811T1 (de) 1991-05-15 1992-05-14 Gerät zur informationsverarbeitung

Country Status (6)

Country Link
US (2) US5299184A (de)
EP (1) EP0513790B1 (de)
JP (1) JP2930447B2 (de)
AT (1) ATE172811T1 (de)
CA (1) CA2068587C (de)
DE (1) DE69227399T2 (de)

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JP2744359B2 (ja) * 1991-04-24 1998-04-28 キヤノン株式会社 情報再生及び／又は情報記録装置
CA2080251C (en) * 1991-10-15 1997-12-02 Shunichi Shido Information processing apparatus with tracking mechanism
JPH05325275A (ja) * 1992-05-20 1993-12-10 Canon Inc 記録再生装置
JP3025120B2 (ja) * 1992-12-21 2000-03-27 キヤノン株式会社 記録再生装置
JP3073616B2 (ja) * 1992-12-24 2000-08-07 キヤノン株式会社 マルチプローブを具備する情報処理装置
US5517128A (en) * 1993-01-05 1996-05-14 Sentech Instruments Gmbh Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning
JP3135753B2 (ja) * 1993-08-26 2001-02-19 キヤノン株式会社 プローブを用いた記録再生方法および装置
US6337479B1 (en) * 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
US5751683A (en) * 1995-07-24 1998-05-12 General Nanotechnology, L.L.C. Nanometer scale data storage device and associated positioning system
US6339217B1 (en) * 1995-07-28 2002-01-15 General Nanotechnology Llc Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
JP3599440B2 (ja) * 1994-12-05 2004-12-08 キヤノン株式会社 情報処理装置の探針位置制御機構および探針位置制御方法、情報処理装置
JP3610108B2 (ja) * 1995-01-13 2005-01-12 キヤノン株式会社 情報処理装置
JP3581421B2 (ja) * 1995-02-23 2004-10-27 キヤノン株式会社 情報処理装置
US6507553B2 (en) 1995-07-24 2003-01-14 General Nanotechnology Llc Nanometer scale data storage device and associated positioning system
US5835477A (en) * 1996-07-10 1998-11-10 International Business Machines Corporation Mass-storage applications of local probe arrays
JP3679525B2 (ja) * 1996-10-07 2005-08-03 キヤノン株式会社 情報記録再生装置、および情報記録再生方法
JPH10312592A (ja) * 1997-05-13 1998-11-24 Canon Inc 情報処理装置および情報処理方法
US6459088B1 (en) 1998-01-16 2002-10-01 Canon Kabushiki Kaisha Drive stage and scanning probe microscope and information recording/reproducing apparatus using the same
US6787768B1 (en) 2001-03-08 2004-09-07 General Nanotechnology Llc Method and apparatus for tool and tip design for nanomachining and measurement
US6802646B1 (en) * 2001-04-30 2004-10-12 General Nanotechnology Llc Low-friction moving interfaces in micromachines and nanomachines
US6923044B1 (en) 2001-03-08 2005-08-02 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US6752008B1 (en) 2001-03-08 2004-06-22 General Nanotechnology Llc Method and apparatus for scanning in scanning probe microscopy and presenting results
US7196328B1 (en) 2001-03-08 2007-03-27 General Nanotechnology Llc Nanomachining method and apparatus
US6506087B1 (en) * 1998-05-01 2003-01-14 Canon Kabushiki Kaisha Method and manufacturing an image forming apparatus having improved spacers
JP4090695B2 (ja) * 1999-02-03 2008-05-28 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 並列制御されるアクチュエータを有する光学走査装置
US6448553B1 (en) 1999-04-26 2002-09-10 Canon Kabushiki Kaisha Signal detector to be used with scanning probe and atomic force microscope
EP1196939A4 (de) * 1999-07-01 2002-09-18 Gen Nanotechnology Llc Vorrichtung und verfahren zur untersuchung und/oder veränderungsobjekt
US6931710B2 (en) * 2001-01-30 2005-08-23 General Nanotechnology Llc Manufacturing of micro-objects such as miniature diamond tool tips
US7253407B1 (en) 2001-03-08 2007-08-07 General Nanotechnology Llc Active cantilever for nanomachining and metrology
JP2002310882A (ja) * 2001-04-17 2002-10-23 Canon Inc 走査型プローブによる信号検出装置、該装置によるプローブ顕微鏡、及び走査型プローブによる信号検出方法、該方法を用いてサンプル表面を観察する観察方法
US6714033B1 (en) * 2001-07-11 2004-03-30 Lam Research Corporation Probe for direct wafer potential measurements
US7053369B1 (en) * 2001-10-19 2006-05-30 Rave Llc Scan data collection for better overall data accuracy
US6813937B2 (en) 2001-11-28 2004-11-09 General Nanotechnology Llc Method and apparatus for micromachines, microstructures, nanomachines and nanostructures
JP2005538855A (ja) 2002-09-09 2005-12-22 ジェネラル ナノテクノロジー エルエルシー 走査型プローブ顕微鏡の流体送達
KR100552698B1 (ko) * 2003-11-24 2006-02-20 삼성전자주식회사 정보 저장 장치 및 그 정보 추종 방법
US8302456B2 (en) * 2006-02-23 2012-11-06 Asylum Research Corporation Active damping of high speed scanning probe microscope components
US7486403B2 (en) * 2006-07-20 2009-02-03 Canon Kabushiki Kaisha Droplet shape measuring method and apparatus
US8066757B2 (en) * 2007-10-17 2011-11-29 Mindframe, Inc. Blood flow restoration and thrombus management methods
US9383388B2 (en) 2014-04-21 2016-07-05 Oxford Instruments Asylum Research, Inc Automated atomic force microscope and the operation thereof

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US4575822A (en) * 1983-02-15 1986-03-11 The Board Of Trustees Of The Leland Stanford Junior University Method and means for data storage using tunnel current data readout
JPS6180536A (ja) * 1984-09-14 1986-04-24 ゼロツクス　コーポレーシヨン 原子規模密度情報記緑および読出し装置並びに方法
JPS6396756A (ja) * 1986-10-13 1988-04-27 Nippon Telegr & Teleph Corp <Ntt> 記憶装置
JPS63142527A (ja) * 1986-12-05 1988-06-14 Hitachi Ltd 光デイスク装置のフオ−カス引込み方法
DE3752099T2 (de) * 1986-12-24 1997-11-13 Canon Kk Aufzeichnungsgerät und Wiedergabegerät
JP2556492B2 (ja) * 1986-12-24 1996-11-20 キヤノン株式会社 再生装置及び再生法
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JP2603270B2 (ja) * 1987-08-25 1997-04-23 キヤノン株式会社 記録装置および再生装置
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JP2523144B2 (ja) * 1987-11-18 1996-08-07 株式会社日立製作所 情報記録再生装置および情報記録媒体
JP2896794B2 (ja) * 1988-09-30 1999-05-31 キヤノン株式会社 走査型トンネル電流検出装置，走査型トンネル顕微鏡，及び記録再生装置
JP2859715B2 (ja) * 1989-08-10 1999-02-24 キヤノン株式会社 記録媒体用基板及びその製造方法、記録媒体、記録方法、記録再生方法、記録装置、記録再生装置
JP2783646B2 (ja) * 1990-04-18 1998-08-06 キヤノン株式会社 情報記録再生装置

Also Published As

Publication number Publication date
JPH04339337A (ja) 1992-11-26
DE69227399T2 (de) 1999-06-17
EP0513790A3 (en) 1995-02-15
EP0513790A2 (de) 1992-11-19
CA2068587C (en) 1997-12-02
DE69227399D1 (de) 1998-12-03
EP0513790B1 (de) 1998-10-28
JP2930447B2 (ja) 1999-08-03
US5299184A (en) 1994-03-29
CA2068587A1 (en) 1992-11-16
US5485451A (en) 1996-01-16

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties