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ATE122814T1 - Testscheiben. - Google Patents

Testscheiben.

Info

Publication number
ATE122814T1
ATE122814T1 AT90305551T AT90305551T ATE122814T1 AT E122814 T1 ATE122814 T1 AT E122814T1 AT 90305551 T AT90305551 T AT 90305551T AT 90305551 T AT90305551 T AT 90305551T AT E122814 T1 ATE122814 T1 AT E122814T1
Authority
AT
Austria
Prior art keywords
test discs
single frequency
predetermined track
discs
test
Prior art date
Application number
AT90305551T
Other languages
English (en)
Inventor
Noriyuki C O Patents Ishimura
Katsuji C O Patents D Yokoyama
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1142322A external-priority patent/JP2882588B2/ja
Priority claimed from JP1142321A external-priority patent/JP2892041B2/ja
Application filed by Sony Corp filed Critical Sony Corp
Application granted granted Critical
Publication of ATE122814T1 publication Critical patent/ATE122814T1/de

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10Digital recording or reproducing
    • G11B20/18Error detection or correction; Testing, e.g. of drop-outs
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10Digital recording or reproducing
    • G11B20/18Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816Testing
    • G11B20/182Testing using test patterns
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/146Laser beam

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Optical Record Carriers And Manufacture Thereof (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Holo Graphy (AREA)
  • Liquid Developers In Electrophotography (AREA)
  • Luminescent Compositions (AREA)
  • Holding Or Fastening Of Disk On Rotational Shaft (AREA)
AT90305551T 1989-06-05 1990-05-22 Testscheiben. ATE122814T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP1142322A JP2882588B2 (ja) 1989-06-05 1989-06-05 評価用光ディスクおよび評価用光ディスクの製造方法
JP1142321A JP2892041B2 (ja) 1989-06-05 1989-06-05 評価用光ディスクおよび光ディスクプレーヤの評価方法

Publications (1)

Publication Number Publication Date
ATE122814T1 true ATE122814T1 (de) 1995-06-15

Family

ID=26474371

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90305551T ATE122814T1 (de) 1989-06-05 1990-05-22 Testscheiben.

Country Status (9)

Country Link
US (1) US5258974A (de)
EP (1) EP0402002B1 (de)
KR (1) KR100233413B1 (de)
AT (1) ATE122814T1 (de)
AU (1) AU640928B2 (de)
BR (1) BR9002641A (de)
CA (1) CA2018168C (de)
DE (1) DE69019419T2 (de)
ES (1) ES2072391T3 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5627818A (en) * 1992-10-13 1997-05-06 International Business Machines Corporation Optical disk with marks used for calibrating an optical detector to minimize noise from undesired perturbations in disk surfaces
US5448550A (en) * 1993-06-16 1995-09-05 Mok; Fai Selecting sectors in a storage medium
US5790489A (en) * 1997-01-21 1998-08-04 Dell Usa, L.P. Smart compact disk including a processor and a transmission element
US5875027A (en) * 1997-03-28 1999-02-23 Hitachi Electronics Engineering Co. Sensitivity calibration disk for surface defect tester
US5898491A (en) * 1997-03-28 1999-04-27 Hitachi Electronics Engineering Co. Ltd. Surface defect test method and surface defect tester
US20040252298A1 (en) * 2003-06-12 2004-12-16 Luey Kenneth T. Emulative particle contamination standard fabricated by particulate formation processes
DE102006007667A1 (de) * 2006-02-18 2007-08-23 Bayerische Motoren Werke Ag Laufwerk für einen wechselbaren Datenträger
JP2007299471A (ja) * 2006-04-28 2007-11-15 Fujitsu Ltd 再生装置製造方法、記録媒体および検査プログラム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0740377B2 (ja) * 1983-08-30 1995-05-01 ティーディーケイ株式会社 光記録媒体
WO1985001381A1 (en) * 1983-09-19 1985-03-28 Storage Technology Partners Ii Preformatted diagnostic information recording disk
EP0166614A3 (en) * 1984-06-29 1987-12-23 Minnesota Mining And Manufacturing Company Encoated optical recording medium
JPH0778908B2 (ja) * 1986-06-16 1995-08-23 松下電器産業株式会社 光デイスクのテストデイスク
JPH0778909B2 (ja) * 1986-06-16 1995-08-23 松下電器産業株式会社 光デイスクのテストデイスク
JPH0770173B2 (ja) * 1987-03-06 1995-07-31 松下電器産業株式会社 情報記録再生装置

Also Published As

Publication number Publication date
EP0402002A2 (de) 1990-12-12
KR100233413B1 (ko) 2000-01-15
EP0402002A3 (de) 1992-04-22
US5258974A (en) 1993-11-02
CA2018168C (en) 2000-05-09
BR9002641A (pt) 1991-08-20
DE69019419T2 (de) 1995-10-05
KR910001726A (ko) 1991-01-31
DE69019419D1 (de) 1995-06-22
CA2018168A1 (en) 1990-12-05
EP0402002B1 (de) 1995-05-17
AU640928B2 (en) 1993-09-09
ES2072391T3 (es) 1995-07-16
AU5519990A (en) 1990-12-06

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee