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ORCIDJungChak Ahn
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- affiliation: Samsung, Seoul, South Korea
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2020 – today
- 2023
[j4]Dongsuk Yoo
, Youngtae Jang, Youngchan Kim, Jihun Shin, Kangsun Lee, Seok-Yong Park, Seungho Shin, Hongsuk Lee, Seojoo Kim, Joongseok Park, Cheonho Park, Moosup Lim, Hyungjin Bae, Soeun Park, Minwook Jung, Sungkwan Kim, Shinyeol Choi, Sejun Kim, Jin-kyeong Heo, Hojoon Lee, KyungChoon Lee, Youngkyun Jeong, Youngsun Oh, Min-Sun Keel, Bumsuk Kim, Haechang Lee, JungChak Ahn:
Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range. Sensors 23(22): 9150 (2023)- [c20]Hyuncheol Kim, Yun Hyeok Kim, Sanghyuck Moon, Hwanwoong Kim, Byeongjun Yoo, Jueun Park, Seyoung Kim, June-Mo Koo, Sewon Seo, Hye Ji Shin, Younghwan Choi, Jinwoo Kim, Kyungil Kim, Jae-Hoon Seo, Seunghyun Lim, Taesub Jung, Howoo Park, Sangil Jung, Juhyun Ko, Kyungho Lee, JungChak Ahn, Joonseo Yim:
A 0.64μm 4-Photodiode 1.28μm 50Mpixel CMOS Image Sensor with 0.98e- Temporal Noise and 20Ke- Full-Well Capacity Employing Quarter-Ring Source-Follower. ISSCC 2023: 96-97 - 2022
- [j3]Min-Woong Seo, Myunglae Chu, Hyun-Yong Jung, Suksan Kim, Jiyoun Song, Daehee Bae, Sanggwon Lee, Junan Lee, Sung-Yong Kim, Jongyeon Lee, Minkyung Kim, Gwi-Deok Lee, Heesung Shim, Changyong Um, Changhwa Kim, In-Gyu Baek, Doowon Kwon, Hongki Kim, Hyuksoon Choi, Jonghyun Go, JungChak Ahn, Jaekyu Lee, Chang-Rok Moon, Kyupil Lee, Hyoung-Sub Kim:
2.45 e-RMS Low-Random-Noise, 598.5 mW Low-Power, and 1.2 kfps High-Speed 2-Mp Global Shutter CMOS Image Sensor With Pixel-Level ADC and Memory. IEEE J. Solid State Circuits 57(4): 1125-1137 (2022) - [c19]Changhyun Park, Hongsuk Lee, Eun Sub Shim, Jungbin Yun, Kyungho Lee, Yun-Hwan Jung, Sukki Yoon, Ilyun Jeong, JungChak Ahn, Duckhyun Chang:
World's first 16: 4: 1 triple conversion gain sensor with all-pixel AF for 82.4dB single exposure HDR. Imaging Sensors and Systems 2022: 1-4 - [c18]Taesub Jung, Masato Fujita, Jeongjin Cho, Kyungduck Lee, Doosik Seol, Sungmin An, Chanhee Lee, Youjin Jeong, Minji Jung, Sachoun Park, Seungki Baek, Seungki Jung, Seunghwan Lee, Jungbin Yun, Eun Sub Shim, Heetak Han, Eunkyung Park, Haesick Sul, Sehyeon Kang, Kyungho Lee, JungChak Ahn, Duckhyun Chang:
A 1/1.57-inch 50Mpixel CMOS Image Sensor With 1.0μm All-Directional Dual Pixel by 0.5μm-Pitch Full-Depth Deep-Trench Isolation Technology. ISSCC 2022: 102-104 - [c17]Jungbin Yun, Seungjoon Lee, Seungwon Cha, Jihun Kim, Jeongho Lee, Hanseok Kim, Eungkyu Lee, Seonok Kim, Seunghan Hong, Hyungchae Kim, Jinsuk Huh, Sungchul Kim, Kazunori Kakehi, Jae-Ho Kim, June-Mo Koo, Eunsang Cho, Heegeun Jeong, Howoo Park, Kyungho Lee, JungChak Ahn, Joonseo Yim:
A 0.6 ㎛ Small Pixel for High Resolution CMOS Image Sensor with Full Well Capacity of 10, 000e- by Dual Vertical Transfer Gate Technology. VLSI Technology and Circuits 2022: 351-352 - [c16]Hye Yeon Park, Yunki Lee, Jonghoon Park, Hyunseok Song, Taesung Lee, Hyung Keun Gweon, Yunji Jung, Jeongmin Bae, Boseong Kim, Junwon Han, Seungwon Kim, Cheolsang Yoon, Jeongki Kim, Changkeun Lee, Sehoon Yoo, Euiyeol Kim, Hyunmin Baek, Howoo Park, Bumsuk Kim, JungChak Ahn, Joonseo Yim:
Advanced novel optical stack technologies for high SNR in CMOS Image Sensor. VLSI Technology and Circuits 2022: 353-354 - 2021
- [j2]Min-Sun Keel, Daeyun Kim, Yeomyung Kim, Myunghan Bae, Myoungoh Ki, Bumsik Chung, Sooho Son, Hoyong Lee, Seung-Chul Shin, Myeonggyun Kye, Jaeil An, Yonghun Kwon, Sungyoung Seo, Sunghyuck Cho, Youngchan Kim, Young-Gu Jin, Youngsun Oh, Yitae Kim, JungChak Ahn, Jesuk Lee:
A 1.2-Mpixel Indirect Time-of-Flight Image Sensor With 4-Tap 3.5-μm Pixels for Peak Current Mitigation and Multi-User Interference Cancellation. IEEE J. Solid State Circuits 56(11): 3209-3219 (2021) - [c15]Seung-Wook Lee, Seungwon Cha, Dongyoung Jang, Mihye Kim, Haewon Lee, Nakyung Lee, Seonok Kim, Kwan-Young Oh, Daehyung Lee, Seunghan Hong, Hana Lee, Sunghoon Oh, Donghyuk Park, Yitae Kim, JungChak Ahn:
A Low-Voltage 0.7 µm Pixel with 6000 e- Full-Well Capacity for a Low-Power CMOS Image Sensor. Imaging Sensors and Systems 2021: 1-6 - [c14]Jungwook Lim, Jihun Kim, Long Yan, Hyunpil Noh, Seungki Jung, Doosik Seol, Junghyung Pyo, Taesub Jung, Jungbin Yun, Dukseo Park, Howoo Park, Kyungho Lee, Takashi Nagano, JungChak Ahn:
A single chip PPG sensor with enhanced IR sensitivity for low power and small size. Imaging Sensors and Systems 2021: 1-5 - [c13]Min-Sun Keel, Daeyun Kim, Yeomyung Kim, Myunghan Bae, Myoungoh Ki, Bumsik Chung, Sooho Son, Hoyong Lee, Heeyoung Jo, Seung-Chul Shin, Sunjoo Hong, Jaeil An, Yonghun Kwon, Sungyoung Seo, Sunghyuck Cho, Youngchan Kim, Young-Gu Jin, Youngsun Oh, Yitae Kim, JungChak Ahn, Kyoungmin Koh, Yongin Park:
A 4-tap 3.5 μm 1.2 Mpixel Indirect Time-of-Flight CMOS Image Sensor with Peak Current Mitigation and Multi-User Interference Cancellation. ISSCC 2021: 106-108 - [c12]Jongeun Park, Sungbong Park, Kwansik Cho, Taehun Lee, Changkyu Lee, Donghyun Kim, Beomsuk Lee, SungIn Kim, Ho-Chul Ji, Dongmo Im, Haeyong Park, Jinyoung Kim, Jungho Cha, Tae-Hoon Kim, Insung Joe, Soojin Hong, Chongkwang Chang, Jingyun Kim, WooGwan Shim, Taehee Kim, Jamie Lee, Donghyuk Park, Euiyeol Kim, Howoo Park, Jaekyu Lee, Yitae Kim, JungChak Ahn, Youngki Chung, ChungSam Jun, Hyunchul Kim, Chang-Rok Moon, Ho-Kyu Kang:
7.9 1/2.74-inch 32Mpixel-Prototype CMOS Image Sensor with 0.64μ m Unit Pixels Separated by Full-Depth Deep-Trench Isolation. ISSCC 2021: 122-124 - [c11]Insung Joe, Yunki Lee, Hye Yeon Park, Jong Uk Kim, Dongyeon Kang, Taehoon Kim, Minkwan Kim, Kwangmin Lee, Minsung Heo, Inho Ro, Jinhyung Kim, Inyong Park, Seokjin Kwon, Kisang Yoon, Dami Park, Changkyu Lee, Eunyoung Jo, Minhwan Jeon, Chanho Park, Kyung Rae Byun, Chong Kwang Chang, JaeSung Hur, Kijoong Yoon, Taeksoo Jeon, Jaehak Lee, Jungho Park, Bumsuk Kim, JungChak Ahn, Hyunchul Kim, Chang-Rok Moon, Hyoung-Sub Kim:
Development of Advanced Inter-Color-Filter Grid on Sub-Micron-Pixel CMOS Image Sensor for Mobile Cameras with High Sensitivity and High Resolution. VLSI Circuits 2021: 1-2 - [c10]Min-Woong Seo, Myunglae Chu, Hyun-Yong Jung, Suksan Kim, Jiyoun Song, Junan Lee, Sung-Yong Kim, Jongyeon Lee, Sung-Jae Byun, Daehee Bae, Minkyung Kim, Gwi-Deok Lee, Heesung Shim, Changyong Um, Changhwa Kim, In-Gyu Baek, Doowon Kwon, Hongki Kim, Hyuksoon Choi, Jonghyun Go, JungChak Ahn, Jaekyu Lee, Changrok Moon, Kyupil Lee, Hyoung-Sub Kim:
A 2.6 e-rms Low-Random-Noise, 116.2 mW Low-Power 2-Mp Global Shutter CMOS Image Sensor with Pixel-Level ADC and In-Pixel Memory. VLSI Circuits 2021: 1-2 - [c9]Eun Sub Shim, Kyungho Lee, Junghyung Pyo, Wooseok Choi, Jungbin Yun, Taesub Jung, Kyungduck Lee, Seyoung Kim, Chanhee Lee, Seungki Baek, Hyuncheol Kim, Sungsoo Choi, Junseok Yang, Kyoungmok Son, Jongwon Choi, Howoo Park, Bumsuk Kim, JungChak Ahn, Duckhyun Chang:
All-Directional Dual Pixel Auto Focus Technology in CMOS Image Sensors. VLSI Circuits 2021: 1-2 - 2020
- [c8]Jaekyu Lee, Seung Sik Kim, In-Gyu Baek, Heesung Shim, Taehoon Kim, Taehyoung Kim, Jungchan Kyoung, Dongmo Im, Jinyong Choi, KeunYeong Cho, Daehoon Kim, Haemin Lim, Min-Woong Seo, JuYoung Kim, Doowon Kwon, Jiyoun Song, Jiyoon Kim, Minho Jang, Joosung Moon, Hyunchul Kim, Chong Kwang Chang, JinGyun Kim, Kyoungmin Koh, Hanjin Lim, JungChak Ahn, Hyeongsun Hong, Kyupil Lee, Ho-Kyu Kang:
5.5 A 2.1e- Temporal Noise and -105dB Parasitic Light Sensitivity Backside-Illuminated 2.3µm-Pixel Voltage-Domain Global Shutter CMOS Image Sensor Using High-Capacity DRAM Capacitor Technology. ISSCC 2020: 102-104 - [c7]Hyunchul Kim, Jongeun Park, Insung Joe, Doowon Kwon, Joo Hyoung Kim, Dongsuk Cho, Taehun Lee, Changkyu Lee, Haeyong Park, Soojin Hong, Chongkwang Chang, Jingyun Kim, Hanjin Lim, Youngsun Oh, Yitae Kim, Seungjoo Nah, Sangil Jung, Jaekyu Lee, JungChak Ahn, Hyeongsun Hong, Kyupil Lee, Ho-Kyu Kang:
5.6 A 1/2.65in 44Mpixel CMOS Image Sensor with 0.7µm Pixels Fabricated in Advanced Full-Depth Deep-Trench Isolation Technology. ISSCC 2020: 104-106
2010 – 2019
- 2014
- [c6]JungChak Ahn, Kyungho Lee, Yitae Kim, Heegeun Jeong, Bumsuk Kim, Hongki Kim, Jongeun Park, Taesub Jung, Wonje Park, Taeheon Lee, Eunkyung Park, Sangjun Choi, Gyehun Choi, Haeyong Park, Yujung Choi, Seungwook Lee, Yunkyung Kim, Y. J. Jung, Donghyuk Park, Seungjoo Nah, Youngsun Oh, Mihye Kim, Yooseung Lee, Youngwoo Chung, Ihara Hisanori, Joon-Hyuk Im, Daniel-K J Lee, Byunghyun Yim, GiDoo Lee, Heesang Kown, Sungho Choi, Jeonsook Lee, Dongyoung Jang, Youngchan Kim, Tae Chan Kim, Hiroshige Goto, Chi-Young Choi, Duckhyung Lee, Gab-soo Han:
7.1 A 1/4-inch 8Mpixel CMOS image sensor with 3D backside-illuminated 1.12μm pixel with front-side deep-trench isolation and vertical transfer gate. ISSCC 2014: 124-125 - 2013
- [c5]Sung Ho Choi, Yi Tae Kim, Min Seok Oh, Younghwan Park, Jeongjin Cho, Youngheup Jang, Hyungjun Han, Jongwon Choi, Howoo Park, Sangil Jung, Hoon Sang Oh, Jung Chak Ahn, Hiroshige Goto, Chi-Young Choi, Yonghan Roh:
A novel pixel design with hybrid type isolation scheme for low dark current in CMOS image sensor. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2013: 86590F - 2012
- [c4]Min Seok Oh, Hae Kyung Kong, Han Soo Lee, Kyungil Kim, Kwanghyuk Bae, Soo Bang Kim, Sungkwan Kim, Moosup Lim, Jung Chak Ahn, Tae-Chan Kim, Hiroshige Goto, Seoung Hyun Kim, Dong-Ki Min, Yong Jei Lee:
Backside-illumination 14µm-pixel QVGA time-of-flight CMOS imager. NEWCAS 2012: 325-328 - 2011
- [c3]Sangjoo Lee, Kyungho Lee, Jongeun Park, Hyungjun Han, Younghwan Park, Taesub Jung, Youngheup Jang, Bumsuk Kim, Yitae Kim, Shay Hamami, Uzi Hizi, Mickey Bahar, Changrok Moon, JungChak Ahn, Duckhyung Lee, Hiroshige Goto, Yun-Tae Lee:
A 1/2.33-inch 14.6M 1.4μm-pixel backside-illuminated CMOS image sensor with floating diffusion boosting. ISSCC 2011: 416-418 - 2010
- [c2]Johannes Solhusvik, Jung-Chak Ahn, Jan T. Bosiers, Boyd Fowler, Makoto Ikeda, Shoji Kawahito, Jerry Lin, Dan McGrath, Katsu Nakamura, Jun Ohta, Ramchan Woo:
High-speed image sensor technologies. ISSCC 2010: 516-517
2000 – 2009
- 2006
- [c1]Young Chan Kim, Yi Tae Kim, Sung Ho Choi, Hae Kyung Kong, Sung In Hwang, Juhyun Ko, Bumsuk Kim, Tetsuo Asaba, Su Hun Lim, June Soo Hahn, Joon Hyuk Im, Tae Seok Oh, Duk Min Yi, Jong Moon Lee, Woon Phil Yang, Jung Chak Ahn, Eun Seung Jung, Yong Hee Lee:
1/2-inch 7.2MPixel CMOS Image Sensor with 2.25µm Pixels Using 4-Shared Pixel Structure for Pixel-Level Summation. ISSCC 2006: 1994-2003 - 2004
- [j1]Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee:
Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements. Microelectron. Reliab. 44(1): 47-51 (2004)
Coauthor Index
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