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"A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of ..."
Tony Tae-Hyoung Kim et al. (2015)
- Tony Tae-Hyoung Kim, Pong-Fei Lu, Keith A. Jenkins, Chris H. Kim:
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. IEEE Trans. Very Large Scale Integr. Syst. 23(7): 1360-1364 (2015)
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