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Keith A. Jenkins
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2010 – 2019
- 2018
- [c19]C. Zhou, Keith A. Jenkins, P. I. Chuang, Christos Vezyrtzis:
Effect of HCI degradation on the variability of MOSFETS. IRPS 2018: 1 - [c18]Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song:
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. IRPS 2018: 6 - 2017
- [c17]Eduard Cartier, Atreya Majumdar, K.-T. Lee, Takashi Ando, Martin M. Frank, John Rozen, Keith A. Jenkins, C. Liang, C.-W. Cheng, John Bruley, M. Hopstaken, Pranita Kerber, J.-B. Yau, X. Sun, Renee T. Mo, Chun-Chen Yeh, Effendi Leobandung, Vijay Narayanan
:
Electron mobility in thin In0.53Ga0.47As channel. ESSDERC 2017: 292-295 - 2016
- [c16]Bruce M. Fleischer, Christos Vezyrtzis, Karthik Balakrishnan, Keith A. Jenkins:
A statistical critical path monitor in 14nm CMOS. ICCD 2016: 507-511 - 2015
- [j18]Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban:
The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking. IEEE J. Solid State Circuits 50(1): 10-23 (2015) - [j17]Tony Tae-Hyoung Kim, Pong-Fei Lu, Keith A. Jenkins, Chris H. Kim:
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. IEEE Trans. Very Large Scale Integr. Syst. 23(7): 1360-1364 (2015) - [c15]Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song:
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. IRPS 2015: 2 - [c14]Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler:
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. IRPS 2015: 6 - 2014
- [j16]Pong-Fei Lu, Keith A. Jenkins, Tobias Webel, Oliver Marquardt
, Birgit Schubert:
Long-term NBTI degradation under real-use conditions in IBM microprocessors. Microelectron. Reliab. 54(11): 2371-2377 (2014) - [c13]Phillip J. Restle, David Shan, David Hogenmiller, Yong Kim, Alan J. Drake, Jason Hibbeler, Thomas J. Bucelot, Gregory S. Still, Keith A. Jenkins, Joshua Friedrich:
5.3 Wide-frequency-range resonant clock with on-the-fly mode changing for the POWER8TM microprocessor. ISSCC 2014: 100-101 - 2013
- [j15]Keith A. Jenkins, Pong-Fei Lu:
On-chip circuit to monitor long-term NBTI and PBTI degradation. Microelectron. Reliab. 53(9-11): 1252-1256 (2013) - [c12]Jente B. Kuang, Keith A. Jenkins, Kevin Stawiasz, Jeremy D. Schaub:
Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators. ESSCIRC 2013: 419-422 - [c11]Keith A. Jenkins, Phillip J. Restle, P. Z. Wang, D. Hogenmiller, David W. Boerstler, Thomas J. Bucelot:
On-chip circuit for measuring multi-GHz clock signal waveforms. VTS 2013: 1-4 - 2011
- [c10]Karthik Balakrishnan, Keith A. Jenkins, Duane S. Boning:
A simple array-based test structure for the AC variability characterization of MOSFETs. ISQED 2011: 539-544
2000 – 2009
- 2009
- [j14]Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim:
A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry. IEEE J. Solid State Circuits 44(9): 2616-2623 (2009) - [c9]Keith A. Jenkins, Lionel Li:
A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset. VTS 2009: 185-188 - 2008
- [j13]Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy:
An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process. IEEE J. Solid State Circuits 43(9): 1951-1963 (2008) - [j12]Woogeun Rhee
, Keith A. Jenkins, John C. Liobe, Herschel A. Ainspan:
Experimental Analysis of Substrate Noise Effect on PLL Performance. IEEE Trans. Circuits Syst. II Express Briefs 55-II(7): 638-642 (2008) - [c8]Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim:
A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement. ISSCC 2008: 412-413 - 2007
- [c7]Keith A. Jenkins, Kenneth L. Shepard, Zheng Xu:
On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks. CICC 2007: 157-160 - [c6]Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy:
Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure. ISSCC 2007: 400-611 - 2005
- [j11]John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang:
Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection. IBM J. Res. Dev. 49(4-5): 725-754 (2005) - [c5]Keith A. Jenkins, Anup P. Jose, David F. Heidel:
An on-chip jitter measurement circuit with sub-picosecond resolution. ESSCIRC 2005: 157-160 - [c4]Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds:
On-Chip Spectrum Analyzer for Analog Built-In Self Test. VTS 2005: 131-136 - 2004
- [c3]Tian Xia, Peilin Song, Keith A. Jenkins, Jien-Chung Lo:
Delay chain based programmable jitter generator. ETS 2004: 16-21 - [c2]Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho:
CMOS IC diagnostics using the luminescence of OFF-state leakage currents. ITC 2004: 134-139 - 2003
- [j10]Jean-Olivier Plouchart, Noah Zamdmer, Jonghae Kim, Melanie Sherony, Yue Tan, Asit Ray, Mohamed Talbi
, Lawrence F. Wagner, Kun Wu, Naftali E. Lustig, Shreesh Narasimha, Patricia O'Neil, Nghia Phan, Michael Rohn, James Strom, David M. Friend, Stephen V. Kosonocky, Daniel R. Knebel, Suhwan Kim, Keith A. Jenkins, Michel M. Rivier:
Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits. IBM J. Res. Dev. 47(5-6): 611-630 (2003) - 2001
- [j9]Phillip J. Restle, Timothy G. McNamara, David A. Webber, Peter J. Camporese, Kwok F. Eng, Keith A. Jenkins, David H. Allen, Michael J. Rohn, Michael P. Quaranta, David W. Boerstler, Charles J. Alpert, Craig A. Carter, Roger N. Bailey, John G. Petrovick, Byron L. Krauter, Bradley D. McCredie:
A clock distribution network for microprocessors. IEEE J. Solid State Circuits 36(5): 792-799 (2001) - 2000
- [j8]Keith A. Jenkins, James P. Eckhardt:
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops. IEEE Des. Test Comput. 17(2): 86-93 (2000)
1990 – 1999
- 1998
- [j7]Phillip J. Restle, Keith A. Jenkins, Alina Deutsch, Peter W. Cook:
Measurement and modeling of on-chip transmission line effects in a 400 MHz microprocessor. IEEE J. Solid State Circuits 33(4): 662-665 (1998) - [j6]Joachim N. Burghartz, Daniel C. Edelstein, Mehmet Soyuer, Herschel A. Ainspan, Keith A. Jenkins:
RF circuit design aspects of spiral inductors on silicon. IEEE J. Solid State Circuits 33(12): 2028-2034 (1998) - [c1]Stephen V. Kosonocky, Arthur A. Bright, Kevin W. Warren, Ruud A. Haring, Steve Klepner, Sameh W. Asaad, S. Basavaiah, Bob Havreluk, David F. Heidel, Michael Immediato, Keith A. Jenkins, Rajiv V. Joshi, Benjamin D. Parker, T. V. Rajeevakumar, Kevin Stawiasz:
Designing a Testable System on a Chip. VTS 1998: 2-7 - 1997
- [j5]Keith A. Jenkins:
Detecting and Preventing Measurement Errors. IEEE Des. Test Comput. 14(4): 78-86 (1997) - [j4]Joachim N. Burghartz, Mehmet Soyuer, Keith A. Jenkins, Michael Kies, Margaret Dolan, Kenneth J. Stein, John Malinowski, David L. Harame:
Integrated RF components in a SiGe bipolar technology. IEEE J. Solid State Circuits 32(9): 1440-1445 (1997) - [j3]Mehmet Soyuer, Joachim N. Burghartz, Herschel A. Ainspan, Keith A. Jenkins, Peter Xiao, Arvin R. Shahani, Margaret S. Dolan, David L. Harame:
An 11 GHz 3-V SiGe voltage controlled oscillator with integrated resonator. IEEE J. Solid State Circuits 32(9): 1451-1454 (1997) - 1996
- [j2]Mehmet Soyuer, Keith A. Jenkins, Joachim N. Burghartz, Herschel A. Ainspan, Frank J. Canora, Slaila Ponnapalli, John F. Ewen, William E. Pence:
A 2.4-GHz silicon bipolar oscillator with integrated resonator. IEEE J. Solid State Circuits 31(2): 268-270 (1996) - [j1]Mehmet Soyuer, Keith A. Jenkins, Joachim N. Burghartz, Michael D. Hulvey:
A 3-V 4-GHz nMOS voltage-controlled oscillator with integrated resonator. IEEE J. Solid State Circuits 31(12): 2042-2045 (1996)
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