Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Simulation of system backend dielectric reliability."

Chang-Chih Chen et al. (2014)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2014.01.008

access: closed

type: Journal Article

metadata version: 2022-04-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/ChenBMKL14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/ChenBMKL14
Chang-Chih Chen, Muhammad Bashir, Linda S. Milor, Daehyun Kim, Sung Kyu Lim:
Simulation of system backend dielectric reliability. Microelectron. J. 45(10): 1327-1334 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.