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Chang-Chih Chen
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2020 – today
- 2022
- [j13]Chang-Chih Chen, Chia-Chien Chang, Edward W. Sun
, Min-Teh Yu:
Optimal decision of dynamic wealth allocation with life insurance for mitigating health risk under market incompleteness. Eur. J. Oper. Res. 300(2): 727-742 (2022) - 2020
- [j12]Rui Zhang
, Taizhi Liu
, Kexin Yang
, Chang-Chih Chen, Linda Milor
:
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 620-633 (2020)
2010 – 2019
- 2018
- [j11]Taizhi Liu, Chang-Chih Chen, Linda Milor
:
Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors. IEEE Trans. Emerg. Top. Comput. 6(2): 219-232 (2018) - 2016
- [j10]Woongrae Kim, Chang-Chih Chen, Dae Hyun Kim
, Linda Milor
:
Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array. IEEE Trans. Very Large Scale Integr. Syst. 24(7): 2521-2534 (2016) - [j9]Chang-Chih Chen, Taizhi Liu, Linda Milor
:
System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection. IEEE Trans. Very Large Scale Integr. Syst. 24(8): 2712-2725 (2016) - [c8]Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor
:
SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection. ICCD 2016: 225-232 - 2015
- [j8]Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor
:
Processor-level reliability simulator for time-dependent gate dielectric breakdown. Microprocess. Microsystems 39(8): 950-960 (2015) - [j7]Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor
:
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems. Microelectron. Reliab. 55(9-10): 1290-1296 (2015) - [j6]Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor
:
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown. Microelectron. Reliab. 55(9-10): 1334-1340 (2015) - [j5]Chang-Chih Chen, Linda S. Milor
:
Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms. IEEE Trans. Very Large Scale Integr. Syst. 23(10): 2065-2076 (2015) - [c7]Taizhi Liu, Chang-Chih Chen, Linda S. Milor
:
Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines. ISQED 2015: 272-279 - [c6]Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor
:
Estimation of remaining life using embedded SRAM for wearout parameter extraction. IWASI 2015: 243-248 - [c5]Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor
:
MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array. VTS 2015: 1-6 - 2014
- [j4]Chang-Chih Chen, Muhammad Bashir, Linda S. Milor
, Daehyun Kim, Sung Kyu Lim:
Simulation of system backend dielectric reliability. Microelectron. J. 45(10): 1327-1334 (2014) - [j3]Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor
, Dae Hyun Kim, Sung Kyu Lim
:
Backend Dielectric Reliability Full Chip Simulator. IEEE Trans. Very Large Scale Integr. Syst. 22(8): 1750-1762 (2014) - [c4]Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor
:
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS 2014: 1-6 - 2013
- [j2]Chang-Chih Chen, Fahad Ahmed, Linda Milor
:
Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysis. Microelectron. Reliab. 53(9-11): 1183-1188 (2013) - [c3]Chang-Chih Chen, Linda Milor
:
System-level modeling and microprocessor reliability analysis for backend wearout mechanisms. DATE 2013: 1615-1620 - [c2]Chang-Chih Chen, Linda Milor
:
System-level modeling and reliability analysis of microprocessor systems. IWASI 2013: 178-183 - 2012
- [j1]Chang-Chih Chen, Fahad Ahmed, Dae Hyun Kim, Sung Kyu Lim
, Linda Milor
:
Backend dielectric reliability simulator for microprocessor system. Microelectron. Reliab. 52(9-10): 1953-1959 (2012) - [c1]Chang-Chih Chen, Fahad Ahmed, Linda Milor
:
A comparative study of wearout mechanisms in state-of-art microprocessors. ICCD 2012: 271-276
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aka: Linda Milor
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