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The system is characterized using a wideband polarized photomixer based phase and amplitude beam pattern setup at 1.5THz. Two separate measurements with orthogonal source polarizations enable the co and cross polarization to be extracted, showing the full system low cross-polarization needed for many future polarimetric applications. Such a measurement setup is additionally of potential interest for the characterization of future missions (for example in the Far Infra-Red): to obtain the optical beam quality and verifying the optical interfaces on a component/sub-component level. We present and discuss this setup and the characterization of the lens-antenna coupled MKID camera.
We measured the 270-600 GHz dielectric losses of hydrogenated amorphous silicon carbide in superconducting microstrip lines. Furthermore, we measured the complex dielectric constant of the hydrogenated amorphous silicon carbide in the 3-100 THz range using Fourier transform spectroscopy. We modeled the loss data from 0.27-100 THz using a Maxwell-Helmholtz-Drude dispersion model. Our results demonstrate that phonon modes above 10 THz dominate the mm-submm losses in deposited dielectrics.
Here we discuss the mathematical framework used in an analysis pipeline developed to process complex field radiation pattern measurements. This routine determines and compensates misalignments of the instrument and scanning system. We begin with an overview of Gaussian beam formalism and how it relates to complex field pattern measurements. Next we discuss a scan strategy using an offset in z along the optical axis that allows first-order optical standing waves between the scanned source and optical system to be removed in post-processing. Also discussed is a method by which the co- and cross-polarization fields can be extracted individually for each pixel by rotating the two orthogonal measurement planes until the signal is the co-polarization map is maximized (and the signal in the cross-polarization field is minimized). We detail a minimization function that can fit measurement data to an arbitrary beam shape model. We conclude by discussing the angular plane wave spectral (APWS) method for beam propagation, including the near-field to far-field transformation.
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