Ina 236
Ina 236
Ina 236
INA236 48-V, 16-Bit, Ultra-Precise, Current, Voltage, and Power Monitor With an I2C
Interface
1 Features 3 Description
• High-side or low-side current sensing The INA236 device is a 16-bit digital current monitor
• Operates from a 1.7-V to 5.5-V power supply with an I2C/SMBus-compatible interface that is
• Reports current, voltage and power compliant with a wide range of digital bus voltages
• Programmable full scale range: 20mV / 80mV such as 1.2 V, 1.8 V, 3.3 V, and 5.0 V. The device
• Input common mode range: –0.3 V to 48 V monitors the voltage across an external sense resistor
• Current monitoring accuracy: and reports values for current, bus voltage, and
– 16-bit ADC resolution power.
– 0.1% gain error (maximum) The INA236 features programmable ADC conversion
– 5-µV offset (maximum) times and averaging. The device also has a
• Low input bias current: 10 nA (maximum) programmable calibration value with an internal
• Configurable averaging options multiplier that enables direct readouts of current in
• General call addressing allows conversion amperes and power in watts. The device monitors
synchronization among devices the bus voltage present on the IN– pin and can
• Alert limits for over and under current events alert on overcurent and undercurrent conditions as
• 1.2-V compliant I2C, SMBus interface well as overvoltage and undervoltage conditions. High
• Two device address options with a 4-pin selectable input impedance while in current measurement mode
address allows use of larger current sense resistors needed to
• DSBGA-8 Package (0.745 mm × 1.508 mm) measure small value system currents.
• SOT23-8 Package
• Operating temperature: –40°C and +125°C The INA236 senses current on common-mode bus
voltages that can vary from –0.3 V to 48 V,
2 Applications independent of the supply voltage. The device
• Mobile phones operates from a single 1.7-V to 5.5-V supply, drawing
• Smart speakers a typical supply current of 300 µA in normal operation.
• Wearables The device can be placed in a low-power standby
• Battery chargers mode where the typical operating current is 2.2 µA.
• Power management Package Information(1)
• Battery cell monitors and balancers
PART NUMBER(2) PACKAGE BODY SIZE (NOM)
• Rack servers
DSBGA (8) 0.745 mm × 1.508 mm
INA236
SOT-23 (8) 1.60 mm × 2.90 mm
C BYPASS
Bus Voltage 0.1 µF
(-0.3 V to 48 V)
TI Device
High-
VS
Side
Shunt
SDA
SCL
Load
x Power Register
2
V I C-, SMBus-,
IN+ Current Register Compatible
Low- ADC Interface
Side
I ALERT
Shunt IN- Voltage Register
A0
Alert Register
GND
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
INA236
SBOSA81D – MAY 2021 – REVISED AUGUST 2023 www.ti.com
Table of Contents
1 Features............................................................................1 7.4 Device Functional Modes..........................................14
2 Applications..................................................................... 1 7.5 Programming............................................................ 16
3 Description.......................................................................1 7.6 Register Maps...........................................................19
4 Revision History.............................................................. 2 8 Application and Implementation.................................. 24
5 Pin Configuration and Functions...................................3 8.1 Application Information............................................. 24
6 Specifications.................................................................. 4 8.2 Typical Application.................................................... 28
6.1 Absolute Maximum Ratings........................................ 4 8.3 Power Supply Recommendations.............................31
6.2 ESD Ratings............................................................... 4 8.4 Layout....................................................................... 31
6.3 Recommended Operating Conditions.........................4 9 Device and Documentation Support............................33
6.4 Thermal Information....................................................4 9.1 Device Support......................................................... 33
6.5 Electrical Characteristics.............................................5 9.2 Documentation Support............................................ 33
6.6 Timing Requirements (I2C)......................................... 7 9.3 Receiving Notification of Documentation Updates....33
6.7 Timing Diagram ..........................................................7 9.4 Support Resources................................................... 33
6.8 Typical Characteristics................................................ 8 9.5 Trademarks............................................................... 33
7 Detailed Description......................................................12 9.6 Electrostatic Discharge Caution................................33
7.1 Overview................................................................... 12 9.7 Glossary....................................................................33
7.2 Functional Block Diagram......................................... 12 10 Mechanical, Packaging, and Orderable
7.3 Feature Description...................................................12 Information.................................................................... 33
4 Revision History
Changes from Revision C (December 2022) to Revision D (August 2023) Page
• Changed Integral Non-Linearity typical value from ±2m% to ±1.5m%............................................................... 5
• Added Integral Non-Linearity maximum value of ±6m%.....................................................................................5
1 2
IN+ 1 8 ALERT
IN– 2 7 A0
A ALERT IN+
GND 3 6 SDA
VS 4 5 SCL
B A0 IN–
Not to scale
Figure 5-2. DDF Package8-Pin SOT-23 (Top View)
C SDA GND
D SCL VS
Not to scale
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
Vs Supply Voltage 6 V
Differential (VIN+) - (VIN-) –26 26 V
VIN+, VIN-
Common - mode GND – 0.3 50 V
VIO SDA, SCL, ALERT, A0 GND – 0.3 6 V
Input current into any pin 5 mA
Open-drain digital output current (SDA, ALERT) 10 mA
TA Operating Temperature –55 150 °C
TJ Junction temperature 150 °C
Tstg Storage temperature –65 150 °C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
at TA = 25°C, VS = 3.3 V, VSENSE = VIN+ - VIN- = 0 mV, VIN- = VBUS = 12V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SMBUS
SMBUS timeout 28 35 ms
DIGITAL INPUT / OUTPUT
Input capacitance 3 pF
VIH Logic input level, high VS = 1.7 V to 5.5 V, TA = –40°C to +125°C 0.9 5.5 V
VIL Logic input level, low VS = 1.7 V to 5.5 V, TA = –40°C to +125°C 0 0.4 V
VHYS Hysteresis 130 mV
IOL = 3 mA, VS = 1.7 V to 5.5 V, TA =
VOL Logic output level, low 0 0.3 V
–40°C to +125°C
Digital leakage input current 0 ≤ VINPUT ≤ VS –1 1 µA
SCL
SDA
t(BUF)
P S S P
−10
−20
Gain (dB)
−30
−40
−50
−60
1 10 100 1k 10k 100k
Frequency (Hz) G001
.
Figure 6-3. Shunt Input Offset Voltage Production Distribution
Figure 6-2. Frequency Response
Figure 6-4. Shunt Input Offset Voltage vs Temperature Figure 6-5. CMRR Production Distribution
Figure 6-6. Shunt Input CMRR vs Temperature Figure 6-7. Shunt Voltage Gain Error Production Distribution
Figure 6-8. Shunt Gain Error vs Temperature Figure 6-9. Shunt Gain Error vs Common-Mode Voltage
Figure 6-10. Bus Offset Voltage (VIN–) Production Distribution Figure 6-11. Bus Offset Voltage (VIN–) vs Temperature
Figure 6-12. Bus Voltage (VIN–) Gain Error Production Figure 6-13. Bus Voltage (VIN–) Gain Error vs Temperature
Distribution
Figure 6-14. Input Bias Current vs Differential Voltage Figure 6-15. Input Bias Current vs Common-Mode Voltage (IB+,
IB–)
Figure 6-16. Input Bias Current vs Temperature Figure 6-17. Input Bias Current vs Temperature (Shutdown)
Figure 6-18. Quiescent Current vs Temperature Figure 6-19. Quiescent Current vs Supply Voltage
Figure 6-20. Quiescent Current - Shutdown vs Supply Voltage Figure 6-21. Quiescent Current - Shutdown vs Temperature
Figure 6-22. Quiescent Current vs Clock (SCL) Frequency Figure 6-23. Quiescent Current - Shutdown vs SCL Frequency
7 Detailed Description
7.1 Overview
The INA236 is a digital current-sense amplifier with an I2C- and SMBus-compatible interface. The device reports
the sensed current and features programmable out-of-range limits to issue alerts when the current is outside
the normal range of operation. The integrated analog-to-digital converter (ADC) can be set to different averaging
modes and configured for continuous-versus-triggered operation. Device Registers provides detailed register
information for the INA236.
7.2 Functional Block Diagram
Supply Voltage
(1.7 V to 5.5 V)
C BYPASS
Bus Voltage 0.1 µF
(-0.3 V to 48 V)
TI Device
High-
VS
Side
Shunt
SDA
SCL
Load
x Power Register
V I2C-, SMBus-,
IN+ Current Register Compatible
Low- ADC Interface
Side
I ALERT
Shunt IN- Voltage Register
A0
Alert Register
GND
of the samples have been measured and the corresponding current and power calculations have been made,
the accumulated average for each of these parameters is then loaded to the corresponding output registers
where they can then be read. These calculations are performed in the background and do not add to the overall
conversion time.
Current Limit Detect Following Bus and Power Limit Detect
Every Shunt Voltage Conversion Following Every Bus Voltage Conversion
I V I V I V I V I V I V I V I V I V I V I V I V I V I V I V I V
P P P P P P P P P P P P P P P P
Power Average
conversions. The CVRF bit is set after all conversions, averaging, and multiplication operations are complete for
a single cycle.
The CVRF bit clears under these conditions:
1. Writing to the Configuration register, except when configuring the MODE bits for power-down mode; or
2. Reading the Mask/Enable register.
7.4.2 Device Shutdown
In addition to the two operating modes (continuous and triggered), the INA236 also has a power-down mode
that reduces the quiescent current and input bias current. The power-down mode reduces supply drain when
the device is not being used. Full recovery from power-down mode requires 100 µs. The device remains in
power-down mode until one of the active modes settings are written into the Configuration register.
7.4.3 Power-On Reset
Power-on reset (POR) is asserted when VS drops below 0.95 V (typical) at which all of the registers are reset
to their default values. The default power-up register values are shown in the reset column for each register
description. Table 7-2 provides links to the register descriptions.
7.4.4 Averaging and Conversion Time Considerations
The INA236 has programmable conversion times for both the shunt voltage and bus voltage measurements. The
conversion times for these measurements can be selected from as fast as 140 μs to as long as 8.244 ms. The
conversion time settings, along with the programmable averaging mode, allow the INA236 to be configured to
optimize the available timing requirements in a given application. For example, if a system requires that data
be read every 5 ms, the INA236 can be configured with the conversion times set to 588 μs and the averaging
mode set to 4. This configuration results in the data updating approximately every 4.7 ms. The INA236 can also
be configured with a different conversion time setting for the shunt and bus voltage measurements. This type of
approach is common in applications where the bus voltage tends to be relatively stable. This situation allows for
the time spent measuring the bus voltage to be reduced relative to the shunt voltage measurement. The shunt
voltage conversion time can be set to 4.156 ms with the bus voltage conversion time set to 588 μs, and the
averaging mode set to 1. This configuration also results in data updating approximately every 4.7 ms.
There are trade-offs associated with the conversion time settings and the averaging mode used. The averaging
feature can significantly improve the measurement accuracy by effectively filtering the signal. This approach
allows the INA236 to reduce noise in the measurement that may be caused by noise coupling into the signal.
A greater number of averages enables the INA236 to be more effective in reducing the noise component of the
measurement.
The conversion times selected can also have an effect on the measurement accuracy. Figure 7-2 shows
multiple conversion times to illustrate the effect of noise on the measurement. To achieve the highest accuracy
measurement possible, use a combination of the longest allowable conversion times and highest number of
averages, based on the timing requirements of the system.
7.5 Programming
7.5.1 I2C Serial Interface
The INA236 operates only as a target on both the SMBus and I2C interfaces. Connections to the bus are
made through the open-drain SDA and SCL lines. The SDA and SCL pins feature integrated spike suppression
filters and Schmitt triggers to minimize the effects of input spikes and bus noise. Although the device integrates
spike suppression into the digital I/O lines, proper layout techniques help minimize the amount of coupling into
the communication lines. This noise introduction could occur from capacitive coupling signal edges between
the two communication lines themselves or from other switching noise sources present in the system. Routing
traces in parallel with ground in between layers on a printed circuit board (PCB) typically reduces the effects of
coupling between the communication lines. Shielded communication lines reduce the possibility of unintended
noise coupling into the digital I/O lines that could be incorrectly interpreted as start or stop commands.
The INA236 supports the transmission protocol for fast mode up to 400 kHz and high-speed mode up to 2.94
MHz. All data bytes are transmitted most significant byte first and follow the SMBus 3.0 transfer protocol.
To communicate with the INA236, the controller must first address targets through a target address byte. The
target address byte consists of seven address bits and a direction bit that indicates whether the action is to be a
read or write operation.
The INA236 uses a single address pin, A0. Table 7-1 shows possible configurations for A0 and the
corresponding address for both the A and B versions of the device. The INA236 samples the state of the
A0 pin on every bus communication. The pin state for A0 must be established before any activity on the interface
occurs. When connecting the SDA pin to A0 to set the device address, make sure to add an additional hold time
of 100 ns on the MSB of the I2C address to ensure correct device addressing. The A and B device options,
each with four unique addresses, allows users to connect up to eight devices in a system without I2C address
conflicts.
Table 7-1. Address Pins and Target Addresses
A0 INA236A DEVICE OPTION INA236B DEVICE OPTION
GND 1000000 1001000
VS 1000001 1001001
SDA 1000010 1001010
SCL 1000011 1001011
SCL
A. The value of the Target Address byte is determined by the setting of the A0 address pin. Refer to Table 7-1.
B. The device does not support packet error checking (PEC) or perform clock stretching.
SCL
(3)
Start By ACK By From ACK By From No ACK By Stop
Controller Target Target Controller Target Controller
(1) (2) (2)
Frame 1 Two-Wire Target Address Byte Frame 2 Data MSByte Frame 3 Data LSByte
A. The value of the Target Address byte is determined by the setting of the A0 address pin. Refer to Table 7-1.
B. Read data is from the last register pointer location. If a new register is desired, the register pointer must be updated. See Figure 7-5.
C. ACK by the controller can also be sent.
D. The device does not support packet error checking (PEC) or perform clock stretching.
1 9 1 9
SCL
A. The value of the Target Address byte is determined by the setting of the A0 address pin. Refer to Table 7-1.
Complex bit access types are encoded to fit into small table cells. Table 7-3 shows the codes that are used for
access types in this section.
Table 7-3. Device Access Type Codes
Access Type Code Description
Read Type
R R Read
Write Type
W W Write
5. Add '1' to the complement to create the two's complement result = 1000 0011 0000 0000 = 8300h
If averaging is enabled, this register displays the averaged value.
Table 7-5. Shunt Voltage Register Field Descriptions
Bit Field Type Reset Description
15-0 VSHUNT R 0000h Differential voltage measured across the shunt output. Two's
complement value.
The device shunt voltage and bus voltage measurements are read through the Shunt Voltage register (1h) and
Bus Voltage register (2h), respectively. The digital output in shunt voltage and bus voltage registers is 16 bits.
The shunt voltage measurement can be positive or negative due to bidirectional currents in the system; therefore
the data value in shunt voltage register can be positive or negative. The bus voltage register data value is always
positive. The output data can be directly converted into voltage by multiplying the digital value by its respective
resolution size.
Furthermore, the device provides the flexibility to report calculated current in Amperes, power in Watts, as
described in Current and Power Calculations.
8.1.2 Current and Power Calculations
For the INA236 to report current values in Amperes, a constant conversion value must be written in the
calibration register that is dependent on the selected CURRENT_LSB and the shunt resistance used in the
application. The value of the calibration register is calculated based on Equation 1. The term CURRENT_LSB is
the chosen LSB step size for the CURRENT register where the current is stored. Equation 2 shows the minimum
value of CURRENT_LSB is based on the maximum expected current, and it directly defines the maximum
resolution of the CURRENT register. While the smallest CURRENT_LSB value yields highest resolution, it is
common to select a higher round-number (no higher than 8x) value for the CURRENT_LSB to simplify the
conversion of the CURRENT.
The RSHUNT term is the resistance value of the external shunt used to develop the differential voltage across the
IN+ and IN– pins. Use Equation 1 for ADCRANGE = 0. For ADCRANGE = 1, the value of SHUNT_CAL must be
divided by 4.
0.00512
SHUNT_CAL =
Current_LSB × RSHUNT (1)
where
• 0.00512 is an internal fixed value used to ensure scaling is maintained properly.
• CURRENT_LSB is a selected value for the current step size in amperes. Must be greater than or equal to
CURRENT_LSB (minimum), but less than 8 x CURRENT_LSB(minimum) to reduce resolution loss.
• The value of SHUNT_CAL must be divided by 4 for ADCRANGE = 1.
(2)
Note that the current is calculated following a shunt voltage measurement based on the value set in the
SHUNT_CAL register. If the value loaded into the SHUNT_CAL register is zero, the current value reported
through the CURRENT register is also zero.
After programming the SHUNT_CAL register with the calculated value, the measured current in Amperes can be
read from the CURRENT register. Use Equation 3 to calculate the final value scaled by the CURRENT_LSB:
where
• CURRENT is the value read from the CURRENT register
The power value can be read from the POWER register as a 16-bit value. Use Equation 4 to convert the power
to Watts:
where
• POWER is the value read from the POWER register.
• CURRENT_LSB is selected value for the lsb size of the current calculation used in Equation 1.
Refer to Detailed Design Procedure for a design example using these equations.
8.1.3 ADC Output Data Rate and Noise Performance
The INA236 noise performance and effective resolution depend on the ADC conversion time. The device
also supports digital averaging which can further help decrease digital noise. The flexibility of the device to
select ADC conversion time and data averaging offers increased signal-to-noise ratio and achieves the highest
dynamic range with lowest offset. The profile of the noise at lower signals levels is dominated by the system
noise that is comprised mainly of 1/f noise or white noise. The effective resolution of the ADC can be increased
by increasing the conversion time and increasing the number of averages.
Table 8-2 summarizes the output data rate conversion settings supported by the device. The fastest conversion
setting is 140 µs. Typical noise-free resolution is represented as Effective Number of Bits (ENOB) based on
device measured data. The ENOB is calculated based on noise peak-to-peak values, which assures that full
noise distribution is taken into consideration.
100 nF
VS
RFILTER
<100
IN+
RSHUNT RDIFF
<100
IN-
Load GND
CFILTER
0.1µF to 1µF
Overload conditions are another consideration for the device inputs. The device inputs are specified to tolerate
26 V across the inputs. A large differential scenario can be a short to ground on the load side of the shunt.
This type of event can result in full power-supply voltage across the shunt (as long the power supply or energy
storage capacitors can support this voltage). Removing a short to ground can result in inductive kickbacks
that can exceed the 26-V differential and 48-V common-mode rating of the device. Inductive kickback voltages
are best controlled by Zener-type, transient-absorbing devices (commonly called transzorbs) combined with
sufficient energy storage capacitance. The Current Shunt Monitor with Transient Robustness Reference Design
describes a high-side, current-shunt monitor used to measure the voltage developed across a current-sensing
resistor and how to better protect the current-sense device from transient overvoltage conditions.
In applications that do not have large energy storage electrolytics on one or both sides of the shunt, an input
overstress condition can result from an excessive dV/dt of the voltage applied to the input. A hard physical short
is the most likely cause of this event, and the excessive dV/dt can activate the ESD protection in systems with
large currents. Testing demonstrates that the addition of 10-Ω resistors in series with each input of the device
sufficiently protects against dV/dt failures up to the 48-V rating of the device. Selecting these resistors in the
range noted has minimal effect on accuracy.
8.2 Typical Application
Supply Voltage (VS):
1.7 V to 5.5 V
Bus Voltage
(upto 48 V) CBYPASS
0.1 µF
VS
SDA
IN+ SCL
RSHUNT
TI Device
IN-
Alert
A0
Load
GND
Table 8-3 lists the design requirements for the circuit shown in Figure 8-2.
Table 8-3. Design Parameters
DESIGN PARAMETER EXAMPLE VALUE
Power-supply voltage (VS) 3.3 V
Bus supply rail (VCM) 12 V
Average Current 6A
Overcurrent fault threshold 9A
Maximum current monitored (IMAX) 10 A
ADC Range Selection (VSENSE_MAX) ±81.92 mV
VSENSE_MAX
RSHUNT <
IMAX (5)
8.0 mΩ, which give a shunt voltage limit of 72 mV. Once the shunt voltage limit is known, the value for the shunt
over voltage limit register is calculated by dividing the shunt voltage limit by the shunt voltage LSB size.
For this case, the calculated value of the alert limit register is 72 mV / 2.5 μV = 28800d (7080h) .
Values stored in the alert limit register are set to the default values after VS power cycle events and need to be
reprogrammed each time power is applied.
8.2.2.5 Calculate Returned Values
Table 8-4 below shows the register values assuming the design requirements shown in Table 8-3. User
programmed values for the Configuration, Calibration, Mask/Enable and Alert limit registers are shown, as well
as, the returned values for shunt voltage, current, bus voltage and power. Parametric values are calculated by
multiplying the returned value by the LSB value.
Table 8-4. Calculate Returned Values
Register Contents LSB Value Calculated Value
Configuration (0h) 16679d (4127h) — —
Calibration (5h) 1280d (500h) — —
Mask/Enable (6h) 32768 (8000h) — —
Alert Limit (7h) 28800d (7080h) 2.5 μV/LSB 28800 × 2.5 μV = 0.072 V
Shunt Voltage (1h) 19200d (4B00h) 2.5 µV/LSB 19200 × 2.5 μV = 0.048 V
Bus Voltage (2h) 7500d (1D4Ch) 1.6 mV/LSB 7500 × 1.6 mV = 12 V
Current (4h) 12000d (2EE0h) 500 µA/LSB 12000 × 500 µA = 6 A
Power (3h) 4500d (1194h) Current LSB x 32 = 16 mW/LSB 4500 × 16 mW = 72 W
Shunt Voltage and Current return values in two's complement format. In two's complement format a negative
value in binary is represented by having a 1 in the most significant bit of the returned value. These values can
be converted to decimal by first inverting all the bits and adding 1 to obtain the unsigned binary value. This value
should then be converted to decimal with the negative sign applied.
8.2.3 Application Curves
Figure 8-3 shows the ALERT pin response to a shunt overvoltage limit of 72 mV for a conversion time (tCT)
of 140 µs and averaging set to 1. Figure 8-4 shows the response for the same limit but with the conversion
time increased to 1.1 ms. For the scope shots shown in these figures, persistence was enabled on the ALERT
channel. Figure 8-3 and Figure 8-4 show how the ALERT response time can vary depending on when the fault
condition occurs relative to the internal ADC clock of the INA236. For fault conditions that are just exceeding the
limit threshold, the response time for the ALERT pin can vary from one to two conversion cycles. As mentioned
previously, the variation is because of the timing on when the fault event occurs relative to the start time of the
internal ADC conversion cycle. For fault events that greatly exceed the limit threshold, the alert can respond in
less than one conversion cycle.
(50 mV / div)
(50 mV / div)
VSHUNT
VSHUNT
LIMIT: 72 mV LIMIT: 72 mV
(2 V / div)
ALERT
ALERT
Figure 8-3. Alert Response (tCT = 140 µs) Figure 8-4. Alert Response (tCT = 1.1 ms)
I2C Alert
RPULLUP3
ALERT IN+
RSHUNT
Device Address:
Connect to SDA, IN-
A0
SCL, VS, or GND
VIA to GND
RPULLUP1 SDA GND Plane
SCL VS
CBYPASS
I2C Voltage:
I2C Data I2C Clock Load
1.2 V to 5.5 V
I2C Alert
SOT23-8
RPULLUP3
IN+ 1 8 ALERT
RSHUNT
Device Address:
Connect to SDA,
IN- 2 7 A0 SCL, VS, or GND
VIA to GND
Plane GND 3 6 SDA RPULLUP1
VS 4 5 SCL
CBYPASS
I2C Voltage:
Load I2C Clock I2C Data
1.2 V to 5.5 V
9.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 14-Aug-2023
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
INA236AIDDFR ACTIVE SOT-23-THIN DDF 8 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 2QRF Samples
INA236AIYBJR ACTIVE DSBGA YBJ 8 3000 RoHS & Green SNAGCU Level-1-260C-UNLIM -40 to 125 1KZ Samples
INA236BIDDFR ACTIVE SOT-23-THIN DDF 8 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 31BF Samples
INA236BIYBJR ACTIVE DSBGA YBJ 8 3000 RoHS & Green SNAGCU Level-1-260C-UNLIM -40 to 125 1O4 Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
Addendum-Page 1
PACKAGE OPTION ADDENDUM
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Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Aug-2023
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
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Width (mm)
H
W
Pack Materials-Page 2
PACKAGE OUTLINE
DDF0008A SCALE 4.000
SOT-23 - 1.1 mm max height
PLASTIC SMALL OUTLINE
C
2.95 SEATING PLANE
TYP
2.65
A PIN 1 ID 0.1 C
AREA
6X 0.65
8
1
2.95
2.85 2X
NOTE 3 1.95
4
5
0.38
8X
0.22
1.65 0.1 C A B
B 1.1 MAX
1.55
0.20
TYP
0.08
SEE DETAIL A
0.25
GAGE PLANE
0.1
0 -8 0.6 0.0
0.3
DETAIL A
TYPICAL
4222047/C 10/2022
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
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EXAMPLE BOARD LAYOUT
DDF0008A SOT-23 - 1.1 mm max height
PLASTIC SMALL OUTLINE
8X (1.05)
SYMM
1
8
8X (0.45)
SYMM
6X (0.65)
5
4
(R0.05)
TYP (2.6)
4222047/C 10/2022
NOTES: (continued)
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EXAMPLE STENCIL DESIGN
DDF0008A SOT-23 - 1.1 mm max height
PLASTIC SMALL OUTLINE
8X (1.05) SYMM
(R0.05) TYP
1
8
8X (0.45)
SYMM
6X (0.65)
5
4
(2.6)
4222047/C 10/2022
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
7. Board assembly site may have different recommendations for stencil design.
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