General Troubleshooting

Please review this section beforeyou call BakerInstrument Company or

return the unit.

Self Help and Diagnostics

Problems in testing often crop up. If you are experiencing a problem and believe the
probk m might be with the Baker Instrument Company Digital Tester, please take the
following steps before calling or returning the unit.

By pe •forming thèse procédures and havihg the requested information available, Baker
Instru rient Company's Service or Applications Departments will be able to better
analyze your situation and provide the appropriate response. Either department may be
reached toll-free at 800-752-8272 or 970-282-1200 for assistance.

Step §1: Basic Information

Take cown ail basic instrument information, including the following:

Mode # example: D12000

Sériai # example: A951
Product # example: 99-115-0894

Note: Ail information above is located on the rear panel product label. If the tester has
spécial options installed that you are aware of, please note thèse. Any and ail information
you knaw or can dérive would be of help! A great tool would be a printout or sketch of
the wa/eforms displayed on the tester.

Step #2: Applications or Service Problem?

Gênera lly, if a problem is noted Only when testing a spécifie motor/generator or other
coil tyr. e, then Applications would be involved. See Applications: What to do First!
Please :all Baker Instrument Company, Sales Department for Applications assistance.

If you (an Not say the problem is associated with any One type of motor/generator, or
other coil type, then Service would be involved. See Service: What to do First!

Applications: What to do First!

Review the section below on Common Application Problems. Please hâve Basic
Inforrmtion about your tester and spécifie information about the motor you are testing
available when calling or faxing to assist Baker Instrument Company personnel in
determining a solution to your problem.

Baker Instrument Company

TheMeasitre oj'Quality
masser

Examples: Hp rating
kW rating
RPM rating
Operating voltage & current
How the item being tested is wound and/or number
and type of coils
Application of motor/generator

In short, any and ail information you know or can dérive from the motor
nameplate would be of help. A great tool is a printout or sketch of the waveforms
displayed on the tester. If you hâve a FAX available, send a draft to 970-282-
1010, attn: Applications.

Common Application Problems

There are a few common application-related problems which many users encounter.
Pleas<; review the following cases.

• T le surge tester will not give the desired output test voltage for the apparatus
biiing tested.

This may happen when the test motor is too large for the instrument being used, or if the
impecance of the windings is too low. Refer to Surge Testing in the users manual for
spécifie test procédures and results. There may also be a problem with the tester in this
case. DO NOT continue testing until you hâve contacted Baker Instrument Company
Applications Department.

• Séparation of compared wave patterns is seen when surge testing on coils that
are assumed to be good, even on brand new motors or windings. Often
séparation is seen in ail three possible comparisons but to varying degrees.
There may not be séparation throughout the whole wave pattern.

This situation can be seen in DC field or rotating pôles. Be sure the coils being compared
are bejing tested in identical configurations; i.e. both coils are wound clockwise beginning
to end.

On very large equipment, slight différences in capacitance to ground may be the cause.
At lovjf voltage levels, begin the test again with the black ground lead removed from the
motor frame. If the séparation is now gone, capacitance to ground was afïecting the test.

If the àbove situation does not apply there is probably an imbalance of the impédance
windir gs that is inhérent to the design. The most common case is found in basket or
concentric wound motors. The phases are not magnetically balanced due to différent coil
length;

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• T hère is no damped sinusoïdal wave pattern on the display when testing a coil.
The wave pattern rises on the Ieft and then slowly drops as it trails off to the
ri ght. It may or may not cross the zéro/base Une. The pattern looks like that in
tlie figure on the next page.

The t sst coil probably has too high an impédance to get a good working pattern. The coil
may lie very high in résistance and turns count. The inability to surge test this coil, or
grouti of coils in séries, will remain unless they can be broken down to smaller units of
lowei impédance.

You may also hâve a broken test lead or lead to the test winding. With heavy use, test
leads should be checked weekly to ensure there is no breakage. Test leads are easily
checked for breakage by firmly grasping the boot and clip in one hand while pulling on
the le id with the other. A broken lead will stretch. A good lead will not.

Service: What to do First!

STOP! Do not aggravate any possible problem by INCREASING OUTPUT

TO MAXIMUM lookingfor a screen display!

Becai se history has shown that several simple solutions which do not require return of a
unit may arise, please perform the following checks.

Printer Check

• The printer does not work when "Print" is selected.

The d gital tester will only output to an "Epson FX" compatible dot matrix printer
connefcted
corn to a tester. Refer to the manual that came with your printer for the DIP switch
settings that make the printer "Epson FX" compatible.

Open Condition Display

Note the figure below. Is the display you are seeing like this?

If yes, the unit may hâve at least one broken test

lead ciiusing the Open condition. The test lead that
corresponds to the TLS position that produces this
type o 'wave pattern is the lead, which is broken.
Verify this by pulling on the boot/clip assembly of
the lea i A broken test lead will stretch. If it
doesn' t repeat this procédure at one-foot intervais
for the length of the lead. If the leads of the tester
are good, check the continuity of the winding
under test.

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Hipol Display Checks

The Hipot display shows only the VOLTAGE or CURRENT bar. One of three
prob ems might exist.

• T le item being tested is in fact faulty and has either low insulation résistance or open
connections.

• T le tester has an internai problem.

• T le tester has a test lead problem as shown above for an Open Condition.

Discc nnect the test leads from the motor and isolate the tester from any grounded surface.
Redu ;e the Output to minimum and attempt a Hipot test with an open lead condition.
Your display should indicate a rising voltage bar. The current bar may rise slightly but
fall back to zéro when the output increase is stopped. Do not exceed 10% rotation of
the Cutput control! There is no need to perform this test at high voltage.

If the display still shows NO voltage bar call Baker Instrument Company Service
Depa rtment. Use a meter to confirm the insulation résistance of the device being tested.

Current bar opération can be tested by shorting test lead #1 and the ground lead together.
Under this condition, the voltage bar will NOT move offthe zéro line and the current bar
should rise very rapidly and activate the Hipot Overcurrent Trip warning light (Hipot
Trip). If the Hipot Trip light does not light, check for open test leads at either test lead
#1 or the ground lead (see Open Condition Display). If the problem persists, contact
Baker Instrument Company Service Department.

Hipoi Trip Check

The llipot Trip lamp either does not activate (under known-shorted conditions) or it
will not go out when test is discontinued.

Call t îe Service Department immediately for assistance. Please record information off
the unit and the spécifie problem prior to calling.

Open Ground Check

The Open Gnd Lamp is on and you are not able to test.

Answer thèse questions:

• H ive you recently moved the unit to a new location with possibly an ungrounded
ontlet?

Is the unit being operated in a field where the AC power source is unknown?

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• Is the unit being operated on a scope cart that has its own outlet or power source?

• Is the unit being operated using a two-wire extension cord?

• Are you testing from a generator?

• Is the unit being operated on a transformer-isolated circuit?

If you answer is yes to any of thèse questions, the unit is probably operational and
indicé ting you hâve an open AC line ground connection.

In the case of numbers 1 through 3 above, use an outlet tester to assure proper wiring
connections to the outlet. For number 4, replace the two-wire extension cord with a two-
wire/'vith ground extension cord. For number 5, or any of the conditions noted above,
use a grounding strap to a good earth ground.

In the case of number 6, call Baker Instrument Company Service for assistance. There is
an override available but précautions should be taken.

Limited Output Surge Waveform

The dusplay shows a limited output (amplitude) surge waveform. The display rises
norm ally but stops at some point. Alternatively, you must continually increase the
output control for successive tests to achieve the same output test amplitude.

Call t le Service Department immediately for assistance on this or any other abnormal
condition noted. Please record basic information from the tester and the spécifie problem
prior to calling.

Précautions for Proper Opération

• Never raise the output control to attain a display from a blank screen!

Never attempt "simulated" problems by disconnecting the leads and positioning

tnem to arc against each other!

N ever corne in contact with the item being tested and the test leads or with the
tester and the item being tested!

• Nlever attempt a two-party opération. Always knowwhat test is being

p< rformed and WHEN!

N ever attempt a "Burn-Out" of a detected fault with the tester!

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 digital Troubleshooting Procédures
&Fault Listing
î. Kjnurr case removal.

2. Rittal case removal.

3. AyD board, I/O board, and controller board access instructions.

4. Vloltage Busline and Crystal Checkout.

5. Open Ground fault indicator lamp lit.

• Open Ground circuit disable instructions for 6kV, 12kV, 24kV, D-Series
testers.

Hjpot Trip fault indicator lamp lit.

Hipot Current Bar display not présent.

8. CRT blank when PTT button depressed/surge mode,

9. Hipot voltage bar display not présent.

10 S^conds/div, volts/div, jiA/div, or function display incorrect.

11 Ptinter does not work properly.

12 No Baker logo displayed.

13 No Hipot voltage at test leads.

14 No surge voltage display.

15 V|oltage drops when PTT button released.

16 Z<;ro Start Interlock does not engage.

17. P Value or current measurement inconsistent.

1 8. Djsplay locked up after self-test.

19 Display unreadable and flashes on/off, does not initiate self-tests.

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 Knurr Case Removal
Aildigital séries 6kV and 12kV models manufactured before August 1998 are enclosed
in a blueshock mounted Knurr design case. Removal from the case is necessary to
access internai components. Removal procédure is as follows.

1. Ujnlock the rear cover latches and unhinge the rear cover.

2. Lbcate and remove four (4) Phillips M4 x 10mm screws. Two are located on the left
sipe and two are located on the right side.

3. Rbinstall the rear cover.

4. Lbcate and remove on the front panel four (4) M5 x 16mm black hex head screws.
T wo are on the extrême left edge on the front panel and two are located on the
extrême right edge ofthe front panel.
5. Gjrasp the CRT bezel inone hand and the test leads with the other hand and pull
jtraight out of the blue Knurr case.

Handle Asscmbly for Knurr Case

-L; I
=,.^.J

•:::J

•hi^'lZS, /

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 Rittal Case Removal
The IJLittal case has been used on the Digital 6kV and 12kV models after sériai number
327. Removal of this case is as foliows.

1. Lbcate and pry open, with a small slotted screwdriver, six plastic covers that overlap
sk M4 screws that hold the top cover to the case assembly.

2. Rpmove thèse six (6) M4 screws and remove the top cover.

3. Lbcate and remove four (4) Ml6 x 16mm screws that secure the front panel to the
case assembly. Two screws are located to the left of the CRT bezel and two are
located to the right of the test lead set as they exit from the front panel.

4. Lbcate and remove five (5) M5 x 12mm black hex head screws that secure the bottom
châssis to the left and right side case L brackets. Two are located to the left of the
CRT shield, two are located to the right of the high voltage transformer, and one is
lqcated underneath the test sélect switch.

5. Lbcate and unplug the two (2) pin molex connector from the 12 volt fan to the wiring
hurness. This fan is located directly behind the CRT tube. It may be necessary to
remove a tie wrap that secures the molex connector to the side case frame.

6. S ide the front panel and bottom assembly forward to remove from the case assembly.

Acce »s will now be gained to ail internai components and assemblies except the I/O
boarc, A/D board and the Controller Board. See the following instructions for access to
thèse assemblies.

Note) For D12000 and DS212 units that are Power Pack capable, this will involve an
additional step for removal of a pot core that is mounted adjacent to the 12 volt fan.

x;^
-Wf%-
"W

Handle Assembly for Rittal Case

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 À/D Board, I/O Board, and Controller
Board A ccess Instr uctions.

Thesè assemblies can be accessed from the front panel from either the Knurr or Rittal
case. They are installed in the card cage portion of the unit.

1. To access the I/O board, locate on the front panel the small panel which has the
fonction knob, volts/div knob and the seconds/div knob.

2. Remove two (2) M3 x 7mm hex head screws located above the fonction knob and
b;low the seconds/div knob.

3. Grasp the function knob and the volts/div knob and pull away from the front panel.
Thèse assemblies are 96-pin plug in type cards that slide on a card guide System and
p ug into mating 96 pin connectors mounted on the Mother Board.

4. To remove the A/D board, locate the panel with the open ground/hipot trip indicator
lamps, intensity, vertical, and horizontal position knobs.

5. Remove two (2) M3 x 7mm hex head screws located above the open ground indicator
and below the horizontal position knobs.

6. P osition fingertips behind the stenciled panel for this assembly and pull away from
the front panel.

7. Access to the Controller card is now gained, it will be the only card left in the card
cage. Simply grasp this assembly and pull away from the front panel.

Note: Thèse assemblies contain C-MOS logic, which is ESD sensitive. Removal of
thèse cards are recommended to be performed at a grounded station by personnel
wearing a grounded wrist strap. Failure to do this may resuit in integrated circuit
danuge.

Voltage Busline and Crystal Checkout

Ail digital models are equipped with a Power Supply board which supplies +5 volts, +12
volts, -12 volts, and several crystals on the A/D board and Controller board. A loss or
loadiijig ofany ofthèse supplies will resuit in the following conditions. To narrow down
to which assembly is defective can be done quickly by unplugging sequentially the I/O,
A/D, and the Controller boards and the CRT 10 pin connector one at a time and

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TheMeasure ofQuality
meas jring if the supply that is defective is restored. If not, replacement of the Power
Supply board would be required. If a board is found to be loading a supply then any
comp onent on that board that is tied to the supplycan be suspect. To narrow to the
comp onent level will require a one component at a time isolation from the supply via
desoljdering.
1. Lbss of or loading of the -12 volt supply will cause no output in the surge mode when
the PTT button is depressed. The trace will be visible at its most right upper position
oi the CRT and will be non-adjustable with the vertical or horizontal position
potentiometers.

Surge trigger will be présent, but no surge waveform will be attainable when the
PTT is engaged.
In the Hipot mode, a Hipot trip LED will illuminate and the voltage bar will show
a six (6) division up and the current bar will be extended off the screen. No Hipot
output will be attainable and numeric display for voltage and current will stay at
zéro (0).

2. Lbss of or loading of the +12 volt supply will cause a total non-operation of the tester.
1ère will be no display upon power up or self-tests or no change when any of the
output controls are used.

Loss of or loading of+5 volt supply will cause a total non-operation of the tester.
T lere will be no display upon power up or self-tests or no change when any of the
output controls are used.

4. Loss of crystal frequency XI on the A/D board will cause the loss of positional trace
control with the surge waveform in the upper right quadrant.

• In the Hipot mode, after PTT is depressed hipot voltage and current bars will
be the same as in step #1 but numeric display for voltage will show 11950
volts and the current will show 996.0 piA. Replace XI.

5. Loss of crystal frequency on U6 on the A/D board will show an erratic unstable
sawtoothed pattern once the PTT button is depressed and also will fail the A/D
m3mory self-test upon power up. Replace U6.

6. Loss of crystal frequency on XTA1 on the Controller board will cause total non-
operation of the tester. There will be no display upon power up or self-test, or no
change when any of the tester controls are used. Replace XTA1.

7. Loss of frequency on Yl on the Controller board will cause a blinking effect on the
te ster CRT with no recognizable lettering or numeric display. Tester will not initiate
it's self-tests nor will any controls hâve any change on the display. Replace Yl.

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as,
Baker
Open ground fault indicator lamp l i t
1. dlieck that the tester is being operated with a two wire cord with a ground prong.

2. Oheck for a broken ground connection in the power cord.

3. Gheck that if being powered from an isolation transformer that a proper ground is
sipplied to the tester.
4. Check the mating ground pin réceptacle at the power outlet for a bad connection.

5. Cjheck continuity from the ground prong on the input power réceptacle to the Power
bfcard P2 pin 1 and also to châssis ground.
6. Cjheck MOV 1, MOV 2, MOV 3 for electrical damage. If damage is found also check
fer burnt traces on both sides of this assembly. Replace Power board if traces are
djimaged.
Also to prevent future damage to this assembly or possible further damage,
measure and correct line voltage fluctuations so that they remain consistently with
the following parameters.

Unit Line Voltage Range

Lower Upper
D6000 100 Volts AC 120 Volts AC

D12000 100 Volts AC 120 Volts AC

DS206 220 Volts AC 250 Volts AC

DS212 220 Volts AC 250 Volts AC

7. C îeck signal at Ql collector on the Power board for a .4 volt ripple, if not replace Ql.

8. C leck U9 pin 3 on the I/O board for a 0 volts and U9 pin 4 for five (5) volts DC, if
nd>t replace U9.

9. Check Q6 on the I/O board for a collector to emitter short, ifso then replace Q6.

10. Check for a shorted Open Ground LED.

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Open Ground Circuit Disable instructions for 6kV, 12kV, and 24kV D
Seriîs Testers.

In a t îsting environment where no ground can be supplied to the surge tester, the
following steps can be done so that the tester will operate. Read and follow thèse
instructions prior to proceeding.

1. Locate and remove the two (2) M4 x 7mm black hex head screws on the front panel.
T îe first is located above the function switch knob, and the second is below the
se conds/division knob.

2. Grasp the function switch knob in one hand and the seconds/division knob with the
olher hand and pull away from the tester. By doing this the I/O board will no unplug
from the Motherboard.

3. Locate and remove the two (2) M4 x 7mm black hex head screws on the front panel.
T îe first is above the open ground lamp socket and the second is below the horizontal
potentiometer knob.

4. With your fingertips, grasp behind the front panel A/D board assembly and pull away
from the tester. By doing this the Power board will now unplug from the
Motherboard. Caution: DO NOT damage the potentiometers or cause fractured
solder joints at the legs of the potentiometers.

5. Remove the remaining printed circuit board, the Controller board. Grasp at the edges
oi this assembly and pull away from the testers front panel.

6. For the 15kV and 24kV only locate and remove four (4) Phillips screws that secure
th 2 blue top cover to the case assembly. Two (2) will be located on the left side and
two (2) will be located on the right side. This step applies to 15kV, and 24kV models
or ly. Remove the top cover. Skip to step 10.

7. Fc r 6kV or 12kV models manufactured before August 1998 which are enclosed in a
blue shock mounted Knurr design case, removal of the inner châssis from the case
will be necessary. If enclosed in a Tan Rittal design case proceed to step 9.

8. Unlock the rear cover latches and unhinge the rear cover. Locate and remove four (4)
PI illips M4 x 10mm screws. Two are located on the left side and two are located on
the right side. Reinstall the rear cover. Locate and remove the front panel four (4)
M 5 x 16mm black hex head screws. Two are on the extrême left edge and two are
located on the extrême right side of the front panel. Grasp the CRT bezel in one hand
and the test leads with the other hand and pull straight out of the Knurr case. Skip to
step 10.

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9. Iifa 6kV or 12kV model was manufactured after August 1998 and is enclosed in a tan
Rittal design case locate six (6) gray hinge covers on the top cover. With a small
slotted screw3driver pry the covers so that six (6) Phillips screws that secure the top
cover are visible. Remove ail six (6) screws to remove the top cover.

10. Lacate the card cage that houses the Power and Signal Boards.

11. Remove the top cover of the card cage. It is secured by eight (8) M4 x 7mm black
hex head screws and two (2) M4 kep nuts. Remove this hardware. Position one hand
irside the card cage and lift up at the back end to remove the top cover.

12. Lbcate on the Motherboard an insulated jumper wire J7 that is positioned between
connectors J2 and J3. If you intention is to run the tester without a supplied ground
permanently, set step 14.

13. If your intentions is to move the tester between environments that do and do not hâve
a supplied ground, see step 15.

14. Remove jumper at J7.

15. Remove jumper at J7. Install two 22 gauge wires one at each connector hole at J7
and exit thèse wires from the right side of the card cage. The length of thèse wires
should be long enough to reach the front panel. Tie wrap and secure thèse wires
along the right side of the card cage. Obtain a two-position toggle switch that has a
common/ NO and NC contacts. Drill a hole between the leads energized light and the
ri*ht side of the card cage and mount this toggle switch to the front panel

16. Solder the wires from the J7 connector to the toggle switch. This will now enable
you to more easily disable the open ground fault détection circuit.

Note: The Open Ground LED will still be lit when the tester does not sensé a ground
connc ction, but now the tester will operate.

Hipot Trip fa ul t indica tor lamp lit

1. C leck that the winding under test is not indeed shorted.

2. Cieck for a shorted high voltage transformer secondary to ground. Measure with a
multimeter from D3 anode on the Stack board to ground. Normal measurements are
atiproximately 12Kohmswith the function switch in either the 10 or 100 jaA position
oi approximately 20K ohms in the 1 jliA position. If found to be much lower
résistance, replace Tl high voltage transformer.

3. Coeck for shorted SCR's on the Stack board by measuring the résistance across ail
cathode/anode junctions of each SCR. Thèse measurements can be obtained easily by
8
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TheMeasure ofQuality
 rceasuring across resistors RI through RIO. Good measurements will be 70K ohms
o •higher. Replace any SCR's found to be shorted.

4. Check U2 pin 7 on the I/O board, this should be a zéro (0) volts DC, if at five (5)
volts DC then replace U2 and U7.

5. Check Q3 on the I/O board for a collector to emitter short, if so replace Q3.

6. Check for shorted Hipot trip lamp on the A/D board, if so replace D3.

h rIPOT CURRENT BAR/DISPLA Y NOT PRESENT

1. Qheck continuity from test lead one (1) alligator clip to deck one (1) of the selector
switch

2. Cjheck continuity from test lead ground alligator clip to the métal spacer adjacent to
D1 and D2 on the Discharge board.

3. Fbr the purposes of troubleshooting this circuit, set up will require the tester to be in
the Hipot mode with leads one (1) and ground connected to a 10 megohm 35 watt
resistor. Use a digital multimeter from thèse measurements with the négative lead of
the meter connected to pin 29C on the I/O board. Set tester to 1OOjjA/division.

4. IV easure at Ul 1 pin 3 on the I/O board and raise output control to 6 kV. The
rreasurement should increase negatively as more current is drawn through the test
lead. At 6 kV this should be approximately -.040 volts DC. Measurement at the
output Ul 1 pin 6 on the I/O board should be identical. If not replace Ul 1.

IV easure at U10 pin 6 as the output control is raised to 6kV. At 6kV, this
measurement will increase to approximately 2.9 volts DC. If not replace U10.

fy easure at RPK1 pin 15 and then pin 2 for the output as described in step 5, if not
présent at RPK1 pin 2, Replace RPK1.

iV easure at U25 pin 8, use a 10X scope probe, set scope to 1 volt/division and 5 ms
and an internai trigger at the 3 volt level. Raise output of tester to 6kV across the 10
megohm load. Measure for approximately 3 volts with a négative going square wave
approximately .4 volts at a 5 ms duration. If not présent, replace U25.

8. N. easure at U22 pin 18 for the same signal as in step 7 and then measure at U22 pin 9,
the output of u22 should be doubled to approximately 6 volts with the same négative
going square waveform. If not replace U22.

fy easure at U23 pin 7, if same measurements taken in step 8 is not présent, replace
U23.

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sailœr

CRTblank when PTT button

DEPRESSED/SURGE MODE
This particular fault is associated with the loss of one or more of the following signais:
line tjigger, stack power, real test or sync trigger.
1. Cjheck the stack power signal at PI pin 2 on the Power board, this signal should be a
360 volt AC sine wave with the négative portion clipped at zéro (0) volts. Frequency
will be at approximately 60 Hz. If not présent remove the PI connector on the Power
board and remeasure at R2. If still not présent, check Tl, Dl, and R2 for defects and
replace. If this signal is loaded down upon reconnecting, then check FET Q6 on the
:ack board for defects.

2. Cjheck the line trigger signal starting at the junction RI and Tl pin 5 on the Power
board. This signal will be an AC sine wave with an approximate amplitude of 900
volts peak to peak with a 60 Hz frequency. At PI pin 1 this signal changes due to
components tied to this signal line on the I/O board. At his point, this signal will be a
1 2-volt square wave with a frequency of 60 Hz. If this signal is not présent or
ir correct proceed to the I/O board. Check Dl, Q2, and U9 for defects and replace if
necessary. Signal at U19 pin 3 should be a 5-volt square wave with a frequency of 60
Hz.

3. Cjheck the real test signal at U29 pin 16 on the Controller board. This signal will be
•volt logic and should be a positively pulsed waveform with a changing high state
diration of approximately 1 to 20ms. Frequency will be 5 Hz. Depressing the PTT
button will activate this signal. This signal is then routed to the I/O board at U19 pin
and also through an inverter U4 to U19 pin 4, if thèse signais are missing or
ir correct, then any of the three components listed above are suspected to be faulty.

4. SVnc trigger will be the output from the flip-flop U19 pin 1. This signal should be a
positively pulsed waveform with an approximately 450jjS high state duration with a
frequency of 6 Hz.

5. Ttie PTT button again needs to be depressed to activate this signal. If signal is not
présent, replace Ul 9 on the I/O board. Check the stack trigger signal at R22 on the
A/D board for a 10-volt positively pulsed waveform with a frequency of 5 Hz. If not
présent, check Ql, Q2, and Q3 for faults. The Stack trigger signal is then routed to Jl
p n 4 on the Stack board. Possible loading of this signal can also be attributed to
component defects in the Stack board trigger and charging circuit such as Cl or Q6.

10
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ffl I B (

.1.1 ptn IA M<4hri°t»o.iril

I) Utai .lnm|>rr Iront I l»i*u(> lu l'I pin 1 \ l() IVunl

Hipot Vol ta ge Bar/displa y not présent

1. Check DC voltage at Jl pin 1 on the Stack board. Voltage output will dépend on
w 1ère the output control is set. A normal range will be from zéro (0) volts at
minimum output setting to approximately 3 volts DC at 6 kV output. If not présent
check ail SCR's Ql through Q10 for shorts by measuring the résistance across ail
cîthode to anode junctions of each SCR. Replace those SCR's found to be shorted.
R ;adings should be 700K ohms or higher. Bad junctions will read much lower.

2. C îeck for same rise in DC voltage at U12 pin 3 on the I/O board, if not présent, check
connection between thèse two points.

3. C îeck at U12 pin 6 on the I/O board for the same increase in voltage, if not présent,
realace U12.

4. Clieck U3 pin 6 on the I/O board for the same increase, if not présent, replace U3.
11
Baker Instrument Company
TheMeasure ofQuality
5. Check U25 pin 4 on the A/D board for the same increase in voltage, if not présent,
check connection between U3 pin 6 on the I/O board and RPK1 pin 16. Then check
RfKl pin 16 to RPK1 pin 1 for 47K ohms résistance. If open replace RPK1.

6. Check U25 pin 8 for a 2.5-volt positively pulsed waveform with a frequency of
200ms with the tester set at 6kV output with no current deflection on the CRT. If not
piesent check U25 pins 1, 15, 16. Only pin 1 should hâve a signal which should be a
5-volt waveform pulsing negatively to zéro (0) volts every 200ms. If thèse signais
ars présent at pins 1,15, and 15 with a measured input at U25 pin 4 then replace U25.

7. Check U22 pin 9 for a 5-volt positively pulsed waveform with a frequency of 200ms.
Set the tester to 6 kV output with no current deflection on the CRT. If not présent
reDlace U22.

8. Clieck U23 pin 7 for the same signal. If not présent, replace U23.

Seconds/Div, Volts/Div, /jA/Divor

function displa y incorrect.

The seconds/division display is controlled by switch SI on the I/O board and pull up
re iistors R40, R41, RI 6, R2, R3, R4, RI 9, R20, and R43. This in turn connected to a
séries of AND, NAND and Inverter IC's set up to control a binary pattern for control
lires Sweep A, B, C, and D. See4 binary chart on the I/O board. A typical fault
would be seen as a duplication of any one of the possible displayed sweep settings
such as CHANGE, 2|liS, 6fiS, lOuS, 20uS, 60uS, lOOuS, 200uS, 600nS, or lmS.
Pc ssible failures can include a logic gâte stuck high or low such as Ul, U8, U4, U5 or
Uo or mux U18. Check the pull up resistors listed above. Check that SI grounds
se luentially as it is rotated.

2. The volts/division display is controlled by switch S2 on the I/O board and pull up
resistors RIO, R8, and RI 1. This in turn is connected to a séries of Inverters and/or
gâtes to set up a binary pattern for control lines V DIV 1 and V DIV 2. See binary
charge on the I/O board. A typical fault will be seen as a duplication of any one of
th<; possible volts/division settings such as 500 volts, 1000 volts, 2000 volts, or 3000
volts. Possible failures can include a logic gâte stuck high or low such as U4 or U5 or
mux U17. Check the pullup resistors listed above. Check that switch S2 grounds
sequentially as it is rotated.

3. THe |j./A divisiondisplay is controlled by switch S3:A on the I/O board and pull up
resistors R36 and R38. This in turn is connected to a séries of Inverters to set up a
biiary pattern for control lines uA/DIV 1 and fjA/Div 2. See binary chart on the I/O
boird. A typical fault will be seen as a duplication of any one of the possible uA/
12
Baker Instrument Company
TheMeasure ofQuality
aalicr
division settings such as 100|J.A, 10|jA, or IjjA. Possible failures can include a logic
gâte stuck high or low such as U6 or mux Ul7. Check the pull up resistors listed
above. Check that switch S3:A grounds sequentially as it is rotated.

4. The function display is controlled by switch S3:A on the I/O board and pull up
resistors R42, RI 2, and RI 4. This is in turn connected to a séries of Inverters at U6.
A typical fault will be seen as the CRT display not matching the function control
knob. Possible failures can include a logic gâte stuck high or low such as U6, U5,
mux IC's U17 or U15. Check pull up resistors listed above and also pull up resistors
at RPK3 pins 8 and 9. Check that switch S3:A grounds sequentially as it is rotated.

Printer does not workproperly

1. Cpeck that the printer cable is plugged into the printer port.

2. Check for faulty or damaged printer cable by checking continuity between ail 25 pins
in| both ends. Trya replacement printer cable.

3. Digital models with a sériai number 001 through sériai number 370 or ones
manufactured before December 1997 must be used with an Epson FX dot matrix
printer. And it must be configured properly to interface. Firmware revision 1.35 is
used with the Epson dot matrix printer. Digital models after sériai number 370 or
ones manufactured after December 1997 will hâve firmware revision 1.36 which will
use an Epson DeskJet 600 printer.

4. C îeck for faulty printer, try a substitute printer.

5. Ivj easure with a lOx-scope probe the following points on the I/O board. To activate
thèse signal lines a printer will need to be connected and the print softkey will need to
be depressed. Monitor PRN DB0 through PRN DB7 from U14 on the I/O board for
ai ta transfer. Data transfer is defined as a 5-volt logic level that changes in frequency
>f puises as the data transfer séquence changes. Set the oscilloscope to 5
volts/division and a 5ms-sweep rate. If this output is not det4ected on one or more
printer lines, check the résistance of ail resistors in RPK2. Replace if defective. If
R3K2 checks good, replace U14, U16, and U9. Check also the résistance of RPK1
ar|d R50 through R54. Replace ifnecessary.

No Baker Logo displa yed

1. Ubon power up if no display is seen on the CRT, the first step to ensure is that the
in ensity output potentiometer is turned clockwise are enough to see a display,
generally at least a 2 O'clock position should be sufficient.

13
Baker Instrument Company
The Measure ofQuality
BE,
Baker
2. S se Voltage Busline and Crystal Checkout procédures and correct any voltage
Busline or crystal output and frequency problems.

3. Td détermine if the CRT tube is defective a check is needed to ensure that +12VDC is
présent on PI CRT pin 7 and then pins 1 and 10 are grounded.

4. Check PI CRT pin 2 with a digital multimeter, this measurement will be adjustable
with the intensity potentiometer, it should range from -14VDC to +5.6VDC, if not
check R9 on the A/D board and its connections.

5. C îeck PI CRT pin 3, this measurement should be approximately -110VDC.

6. Ctieck PI CRT pin 4, this measurement will be adjustable with the intensity
potentiometer and will range from -110VDC to +5.6 VDC, if not check R9 on the
A T) board.

C leck PI CRT pin 6 for a 4-volt square waveform pulsing negatively to zéro (0)
volts. Répétition rate will be every 30jjS and the négative duration will be 4|uS. If
si mal is not présent trace back to U24 pin 4 and then to Ul on the Controller board.
Replace if necessary.

C îeck PI CRT pin 9 for a 5-volt positively pulsed waveform. Répétition rate will be
every 17mS and the positive duration should be 500u.S. If not présent, trace signal
back to Ul on the Controller board. Replace if necessary.

9. C îeck PI CRT pin 8 for 2.4 volt data entering from the Controller board U27 pin 13,
replace if necessary.

10. If above signais and voltages are correct, replace CRT tube.

No Hipot voltage at test leads

1. Eiisure the tester function switch is in the hipot mode at 100|u.A/Divisionand that the
test lead sélect switch is in the Hipot sélection.

2. Measure at T2 pin 2 with a digital multimeter, connect positive lead at this point and
the négative lead to châssis ground. Set the meter to AC volts. This point should be a
line voltage upon turning the on/off switch to the on position.

3. Mleasure at T2 pin 3, this point will be variable depending on the position of the
oi tput control knob. At the fiill counter-clockwise position this voltage will be less
than 3 volts AC. At approximately !/2 output turning clockwise this voltage will be !/2
lire voltage. If not présent, check the neutral connection to the variac, if this
connection is présent replace T2.
14
Baker Instrument Company
The Measure ofQuality
4. Check at the terminal block adjacent to the high voltage transformer Tl at the orange
w re for the same AC voltage starting with the output control to fUll counter-
clockwise position and than at Vi output. If not présent, see the section on the Zéro
Stjart Interlock does not engage.
5. Lècate the secondary Tl high voltage transformer wire connected to D3 anode on the
Stack board and disconnect. Connect a P6015A high voltage scope probe or
ec uivalent to the Tl secondary wire with the probe négative lead connected to châssis
giound. Set the volts/div on the oscilloscope to 2 volts and the timebase to 5ms.
Turn the output control approximately to I/2 output. This measurement should be
l4kV AC peak to peak.
6. Vbrify that ail other primary and secondary wires of Tl are connected to their
respective destinations with a digital multimeter. Ensue that power is offand
disconnect when making thèse measurements. If measurement in step 5 is not présent
ar d ail connections are verified, then replace the high voltage transformer Tl.

Rîconnect Tl secondary wire and lift D3 cathode on the Stack board. Connect the
15A probe to this point with the négative lead to châssis ground and turn output
cdntrol to V2 output. Set scope settings to the same as in step 5. This measurement
ould be approximately 7kV AC with the négative portion clipped by the diode. If
not présent replace D3 on the Stack board.

C îeck the SCR cathode to anode résistance for Q1-Q10. Ensue that the power is ofF
aid disconnected. Thèse measurements can be obtained by measuring across RI
through RIO. Replace any SCR's that are shorted. Good measurements will be 700K
ohms or higher while defective SCR's will hâve much lower readings.

9. Check the résistance of the 25K-ohm 25-watt resistor that connects to the J5 wire
1the Stack board. Replace if open.
10. Check continuity from lead 1 alligator clip to the 25K 25 watt resistor. If open,
replace test lead 1. Check continuity from the ground lead alligator clip to the
Discharge board ground stud. If open, replace the ground lead.

No Surge Vol ta ge displa y

1. Ehsure the tester function switch is in the surge mode and that the test lead sélect
switch is in a test lead sélection. Set the tester to 500 volts/division and at
6||iS/Division. Connect test load across test leads.
2. Measure at T2 pin 2 with a digital multimeter, connect positive lead at this point and
the négative lead to châssis ground. Set the meter to AC volts. This point should be
at line voltage upon turning on/off switch to the on position.

15
BakerInstrument Company
The Measure ofQuality
BB.
Baker
3. N/ easure at T2 pin 3, this point will be variable depending on the position of the
output control knob. At the full counter-clockwise position this voltage will be less
than 3 volts AC. At approximately 14 output turning clockwise this voltage will be Vi
line voltage. If not présent, check the neutral connection to the variac, if this
connection is présent replace T2.

4. C heck at the terminal block adjacent to the high voltage transformer Tl at the orange
wire for the same AC voltage starting with the output control to full counter-
cbckwise position then at Vi output. If not présent, see the section on the Zéro Start
Ir terlock does not engage.

5. Locate the secondary Tl high voltage transformer wire connected to D3 anode on the
S ack board and disconnect. Connect a P6015A high voltage scope probe or
équivalent to the Tl secondary wire with the probe négative lead connected to châssis
giound. See the volts/div on the oscilloscope to 2 volts and the timebase to 5ms.
Torn the output control approximately to xh output. This measurement should be
14kV AC peak to peak.

6. Verify that ail other primary and secondary wires of Tl are connected to their
respective destinations with a digital multimeter. Ensure that power is off and
disconnected when making thèse measurements. If measurement in step 5 is not
présent and ail connections are verified, then replace the high voltage transformer Tl.

7. Rsconnect Tl secondary wire and lift D3 cathode on the Stack board. Connect the
P6015A probe to this point with the négative lead to châssis ground and turn output
control to Vi output. Set scope settings to the same as in step 5. This measurement
should be approximately 7kV AC with the négative portion clipped by the diode. If
not présent replace D3 on the Stack board.

8. C leck the SCR cathode to anode résistance for Q1-Q10. Ensure that the power is off
and disconnected. Thèse measurements can be obtained by measuring across RI
through RIO. Replace any SCR's that are shorted. Good measurements will be 70K
olims or higher while defective SR's will hâve much lower readings.

9. C îeck continuity of test leads 1, 2, and 3 back to the selector switch, replace any
found to be open.

10. C aeck continuity from the ground lead alligator clip to the Discharge board ground
st jd. If open, replace the ground lead.

11. With a 10X scope probe measure at pin 32B on the I/O board with the négative probe
leid connected to châssis ground. After engaging the zéro interlockturn the output
control to approximately Va output. Set the oscilloscope to 1 volt/div and IOjlxS sweep
rate. The signal at this point should be about a 1.8-volt surge waveform. If not check
continuity with the tester AC input disconnected from PI pin 32B & 32C on the I/O
board to Jl pins 3 and 4 on the Discharge board.
16
Baker Instrument Company
The Measure ofQuality
flâner

12. Axess the Discharge board by removing the Stack board and check résistance
measurements of the following components and replace if necessary. Ensure that
power is disconnected when making thèse measurements and disassembling the unit.
Cieck RI through RI4.

13. Iflthe signal in step 11 was noted proceed to check that relay Kl on the I/O board has
contact résistance between pins 2 and 3. If pin 7 of the relay is at a low state and
contact résistance is detected, replace relay Kl. If pin 7 is at approximately +12 volts
DC], then check U6 pin for +5 volts DC, then replace Ql on the I/O board. If U6 pin
is at a low state, replace U6.

14. Replace U19, U20 and U14 on the A/D board.

Voltage drops when PTT button

RELEASED

In ail digital models previous to sériai number 210, an intermittent problem was detected
in that when an operator of the test was to attain the desired test voltage and release the
PTT button, the displayed voltage would drop approximately 10%. To correct this
problîm the addition of Kl and K2 châssis relays were added. In older revisions the AC
line v sltage was switched directly from the PTT button or the footswitch to the T2 variac.
The 2!ero Start Interlock board would switch the voltage from T2 pin 3 to the primary of
the high voltage transformer. To engage the Zéro Interlock, the following needs to occur
at the Zéro Start Interlock board.

1 A|C line voltage is connected through the footswitch or PTT button to Jl pin 1,

2. + 3 volts DC is supplied to J2 pin 5 supplied from the I/O board Jl pin 2B.

3. /F|TT signal at J2 pin 2 needs to switch from +5.6 volts DC to .4 volts DC when the
T button is depressed.

4. Tpe output control variac needs to be adjusted completely counter-clockwise.

After Sériai number 210 Baker has changed from revision D to a revision F châssis
wiring diagram. Major changes incorporate using a +12 volt DC supply wired through
the footswitch and the PTT button. Also Kl and K2 were added. Thèse relays hold the
displayed test voltage slightly longer so that the A/D memory has enough time to capture
the displayed test voltage. Relay K2 can be fitted to mount o the side of the card cage
above the Zéro Start Interlock board and Kl can be mounted on the châssis next to the
Zéro Start Interlock board. Mount by drilling two mounting holes and securing with
mounting hardware. Wiring additions or changes involve the following. To perform this
modification removal from the case is required. Remove mounting hardware on the
17
Baker Instrument Company
TheMeasure ofQuality
variac and selector switch for easier access. Remove the A/D, I/O and the Controller
boarc s from the card cage.

1. Remove the AC Hot (black) wires from the PTT button and the footswitch. Connect
the black wire to Kl :B common, K2:B common, and K2C common.

2. Connect a 20 gauge red wire to TB2 pin 1 on the Power Supply board and terminate
the other end to the footswitch pin l,one end of the PTT button and one end of Kl :A
coil.

3. Remove wiring from footswitch pin 2 (red) to the PT button to Jl pin 1 on the Zéro
Siart Interlock board to T2 pin 2.

4. Replace the wiring on the other end of the PTT button with a wht/grn wire and
connect to the footswitch pin 2 and also K2:A coil and an added 1N4936 cathode.

5. C Dnnect the other end of K2:A coil to the 1N4936 anode and also to the ground
terminal block.

6. Connect a red 20 gauge wire from Jl pin 1 on the Zéro Start Interlock board to K2:C
NO contact.

7. C înnect a red 20-gauge wire from T2 pin 2 to Kl :B NO and Kl :A NO.

8. Connect a 26-gauge jumper on the rear of the I/O board from U6 to PI pin 1A.

9. Rîmove top cover of card cage held by eight (8) M4 x 7mm black hex head screws
and two (2) M4 kep nuts.

10. Rîmove four (4) kep nuts securing the Motherboard to the back of the card cage and
se lder a 26 gauge wire to the rear of the Motherboard J3 connector pin 1A. Run this
wire out of the card to a small breadboard containing a 4.7K ohm Va watt resistor and
a >N2222 transistor. See schematic for electrical connection of this circuit. This
breadboard needs to be mounted on the side of the card cage by drilling one hole and
m Dunting with a nylon spacer and M4 hardware adjacent to the K2 relay.

11. Run a 20 gauge green wire from the 2N2222-transistor emitter and connect to the
ground terminal block.

12. Reassemble unit.

Zéro Start Interlock does not enga ge

1. Check that the output control knob is completely adjusted counter-clockwise.

18
Baker Instrument Company
TheMeasure oj Quality
2. Ensure that the test lead sélect switch is not positioned in the leads ground position.

3. Clîeck that the unit is supplied a proper ground.

4. With a digital multimeter set to DC volts, check the voltage at J2 pin 5 on the Zéro
Start Interlock board with the négative lead connected to châssis ground. This
measurement should be approximately +13.5 volts DC and drop to about +12.7 volts
w îen the PTT button is depressed. If this voltage is not présent or is low the fault can
be in the following circuits. The microswitch S1 which is mounted on the test lead
se ect switch can be open. Check Q5 base on the I/O board for +12.6 volts DC, if
prîsent replace Q5.

5. Check at Q4 base on the I/O board, this should be approximately .7 volts DC, if
présent replace Q4.

6. Check U8 pin 13 for a +5.5 volts DC, if measured low replace U7.

7. Check U8 pin 12 also for a +5.5 volts DC, if at a low state check R13 and U9.

8. Check at U8 pin 11 for low state, if at +5.5 volts DC, replace U8.

9. Mi;asure at J2 pin 2 on the Zéro Start Interlock board, this measurement needs to be
+5 5 volts DC and change to approximately .4 volts DC when the PTT button is
de Dressed. If this is présent check Ql through Q5 and OC1, OC2, and OC3 for faults.

10. Measure between R9 and KE2 pin 1, this coil voltage should change from -6.4 volts
DC to -.7 volts DC when the PTT button is depressed. If this is noted, replace Kl
rehy on the Zéro Start Interlock board.

11. If ihe measurement at step 9 is not présent, check U15, U7, and RI 8 for defects,
replace if necessary.

PI VALUE OR CURENT MEASUREMENT IS

INCONSISTENT

The digital séries design tester will produce accurate results to a +/- 5% spécifications.
The operators of the digital séries may notice fluctuations in the current readings,
megohms values and PI data due to fluctuations in the input line power. Small variations
in the 1ine power specificallyat the one-minute and ten-minute intervais may cause
incons stent readings even when the same windings are analyzed. To greatly improve
this occurrence, the steps below can be followed.

h The use of a Patriot line conditioner in séries with the power to the tester will reduce
line fluctuations. Contact Baker Instrument Company for price and availability.

19
BakerInstrument Company
TheMeasure ofQuality
2. ConnectingAC power from an isolated outlet does not hâve other equipment with
high current demands.

To clieck the internai current calibration of the tester will require the I/O board to be on
an ex ender card. Follow the steps in the Quality Control and Calibration Procédure. If
one or more range readings outside of +1-5% still occur, see the steps below.

1. Firther adjustment may be necessary by altering the values of R33, R35, and R37.
ight résistive value changes of no more than 10% of the existing value up or down.

2. Cbntinue monitoring offset value at the I/O board pin 2A to pin 29C for an offset
wliich drifts away from the nominal measurement of 0.000 volts +/-0.010. If drifting
is detected, replaced U10 and U1 h

Display locked up after self-test

In thi >fault mode, an operator will see after the on/off switch to the on position that the
tester will illuminate the Baker logo and proceed with it's internai memory test. Ail self-
tests vill pass. After an attempt to begin testing by depressing the PTT button, there will
be no change in the testers display. Also no change will take place when a softkey is
used. A shorted softkey or a faulty mux integrated circuit on the I/O board is more than
likely the cause.

1. C îeck that ail softkeys are not stuck, closed, or shorted. This type is normally open
arçd should hâve high résistance across the two terminais used.

2. Check at U15 pin 2 for a high state, if this state is not high replace RPK3. Depress
softkey 1. At this point it should change to a low state.

3. C îeck at Ul 5 pin 4 for a high state, if this is not high replace RPK3. Depress softkey
2\ At this point it should change to a low state.

4. Check at Ul 5 pin 6 for a high state, if this is not high replace RPK3. Depress softkey
At this point it should change to a low state.

5. Check at Ul5 pin 8 for a high state, ifthis is not high replace RPK3. Depress softkey
At this point it should change to a low state.

6. Change U15.

20
Baker Instrument Company
The Measure ofQuality
 DlSPLA Y UNREADABLE AND FLASHES
ON/OFF, DOES NOTINITIATE SELF TEST
1. A check of the DC supplies and crystal frequency to verify proper conditions, see
Voltage Busline and Crystal Checkout procédures.

2. A loss or loading of any one or more of the following lines due to faulty components
or connections will cause this occurrence. Since thèse signal lines are tied to the A/D
board, I/O board, and the Controller card it will be necessary to troubleshoot in the
manner outlined in step 3.

RD, Reset, CRT Enable, 103 Enable, 102 Enable, 101 Enable, SAD, RD/WR, ALE,
Reset, DBO through DB7, AD1 through AD7 and AD8 through AD 14.

3. Te détermine which printed circuit is defective, unplug the A/D board and the I/O
bo ird with the power off. Turn on the tester and observe the tester response. If the
tester now begins with a Baker logo then the fault is not on the Controller card. The
tester will fail the A/D Memory test due to the A/D card not being inserted into the
Motherboard. Turn off the testers power.

4. Insert the A/D board into the Jl connector and switch power on. If the display returns
to :he original fault condition, then a fault will be on the A/D board. Turn off tester
po ver.

5. Insert the I/O card into the J3 connector of the Motherboard and turn on the testers
po1 ver. If the display returns to the original fault condition, then the fault will be
locited on the I/O board.

6. After détermination as to which card is defective, remove power and the defective
card. Install the faulty card on an extender card and apply power.

7. Wi h a lOX-scope probe begin monitoring the data, address and signal lines noted in
ste ) 2. It will be helpfui to record ail lines, which do not hâve data présent. See
Mctherboard DST Séries schematic for pinout contacts of thèse signal lines to each
cari. Data is defined as a high frequency 0 to 5-volt amplitude logic level changes
determined by the programmed U3 27C256 EEPROM located on the Controller card.

Aft îr détermination as to which signal lines are stuck low or high, it will be necessary
to t race the defective signal lines to ail components that are tied to the same line and
rep ace one at a time. It may also be necessary to check defective signais lines with a
digital multimeter set to ohms for shorts to GND and to +5 volts DC. Also check

21
Baker Instrument Company
The Measure ofQuality
maHier
ce ntinuity on defective signal lines from components that are tied to the same signal
lire.

9. If the fault is located to either A/D board or the Controller card, replacement boards
can be sent without affecting the calibration on the unit. An I/O board replacement
will require a calibration of the unit.

a/d board, i/o board, controller

Board Access Instructions

When MTA for Windows is installed or an Epson 640 or compatible printer is used, it
will be necessary to replace U3 on the Controller Board. For this program to function,
install ;he replacement 08-01 IR, firmware revision 1.37 for a 12kV tester. Please see the
MTA or Windows users manual for further explanation of the procédure.

1. Th îse assemblies can be accessed from the front panel from the Knurr, Rittal or
Schroff design cases. Thèse assemblies are installed in the card cage portion of the
unit located to the right of the CRT display.

2. To access the I/O board, Baker part 80-108, locate on the front panel which has the
funetion knob, Volts/Division knob and the Seconds/Division knob.

3. Remove two (2) M3 x 7mm hex head screws located above the function knob and
below the Seconds/Division knob.

4. Gr£sp the Function knob and the Volts/Division knob and pull away from the front
panel. This assembly is a 96-pin plug in type card that slides on a card guide System
and plugs into mating 96 pin connectors mounted on the Motherboard.

5. To emove the A/D board, Baker part 80-106, locate the panel with the Open
Ground/Hipot trip indicator lamps Intensity, Vertical and Horizontal Position knobs.

6. Remove two (2) M3 x 7mm hex head screws located above the Open round indicator
and below the Horizontal position knob.

7. Pos tion fingertips behind the stenciled panel for this assembly and pull away from
the ront panel.

8. Ace îss to the Controller board, Baker part 80-107, is now gained. This will be the
onl> board left in the card cage. Simply grasp this assembly and pull away from the
front panel.

9. Rerqove the Controller board and replace U3 with one labeled firmware revision 1.37.
22
Baker Instrument Company
The Measure ofQuality
BB.
oaAer
10. Install ail boards back into the card cage and secure with the original hardware.

NOTE: Thèse assemblies contain C-MOS logic which are ES D sensitive. Removal of
thèse boards are recommended to be performed at a grounded station by personnel
wearng a grounded wrist strip. Failure to do this may resuit in integrated circuit damage.

ECO Record
Engiieering changes hâve taken place since the manufacturer of D12000 S/D 001.
D12000 séries after sériai number 210 should hâve thèse changes installed at the factory.
Thèse changes are designed to add more capabilityand improve the tester's performance.
Also they will increase the tester's reliability by protecting components and circuits
whic i hâve shown over the years to be vulnérable to failure in certain testing
applications. The following is a list of thèse changes we recommend to be checked for
installed during servicing.

1. A cooling fan for the CRT circuits was added to eliminate scrolling of the CRT
c isplay when internai températures reach above 105 degrees.

2. Power board components R3 and Cl were changed to increase reliability of Ql on the

Power board.

3. Discharge board changes include changes in the value of resistor R5 to provide for a
Éreater incoming signal to the I/O board. This allows for a better capability to shape
t rie surge signal so that the displayed surge signal on the CRT display more closely
resembles what is shown at the test leads on an oscilloscope.

Other changes to this assembly isolation of the surge readout cable from Discharge
board ground and ground routing changes. This will improve the noise resolution
seen of the first displayed positive peak when surge testing at higher voltages.

Changes in the values of Stack board components RI and R34 were performed to add
j;reater reliability in SCR's Q1-Q5.

Changes in the revision of the Zéro Start Interlock board form a common neutral
cesign to a common ground design. This revision change allows for the élimination
of false hipot trips and adds the capability to disable the Zéro Start Interlock when
tjesting armatures when a footswitch is used.

he addition of relays Kl and K2 and associated wiring harness changes were added
tjo eliminate the condition where the displayed surge voltage on the CRT would drop
i pproximately 10% when the PTT button was released.

23
BakerInstrument Company
The Measure of Quality
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EEPROM IC U3 is now at revision level 1.37. Thèse firmware revision changes hâve
added the following capability. A Polarization Index clock was added so that the
ooerator can reset the clock after proper test voltage was reached, resulting in a full
o le or ten minute megohm test. Other changes in the firmware hâve added the
capability to recall in any summary ail three-surge test patterns with the test voltages
ofeach lead displayed. This 1.37 revision change is necessary to upgrade to an inkjet
Epson 640 printer or compatible printer. It is also necessary to be installed if this
tester is used with MTA for Windows operating software System.

9. A/D board grounding changes, clamping diodes and bypass capacitors were added to
ir crease the reliability of IC U14.

24
Baker Instrument Company
TheMeasure ofQuality