A

Micro-Project Report
ON
“BUILD A DIGITAL IC TESTER ”
Partial Fulfillment of the Requirement for the Diploma in Computer Engineering,

By
1)Kadam Priti [2014660140]
2)Shaikh Suhana [2014660141]
3)Tarate Gayatri [ ]
4)Pacharne Gayatri [ ]

Guided By
Prof. Sase Ankita

Shree Samarth Academy’s

Shree Samarth Polytechnic
Mhasane Phata, Ahmednagar
Maharashtra State Board of Technical Education
(2020-2021)

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 Shree Samarth Academy’s
Shree Samarth Polytechnic
Department of Computer Engineering.

CERTIFICATE
This is to certify that the project work entitled
“BUILD A DIGITAL IC TESTER’’

Is
Submitted by
1)Kadam Priti [2014660140]
2)Shaikh Suhana [2014660141]
3)Tarate Gayatri [ ]
4)Pacharne Gayatri [ ]

in the partial fulfillment of Diploma in Computer Engineering has been Satisfactory

carried out under my guidance as per the requirement of Maharashtra State Board of
Technical Education, Mumbai during the academic year 2020-2021
Date:
Place:

GUIDE HOD PRINCIPAL

(Prof. Sase Ankita ) (Prof. Chaure S. M) (Prof. Anarse B.V.)

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 ABSTRACT

The digital IC tester is implemented by using the 89C51 microcontroller board.The

processing of the inputs and outputs is done by the microcontroller. The display part
onthe microcontroller board is modeled using LCD. After the successful testing of
the IC, theresult is displayed on the LCD.The basic function of the digital IC tester
is to test a digital IC for correct logicalfunctioning as described in the truth table
and/or function table. It can test digital ICs having amaximum of 24 pins. Since it is
programmable, any number of ICs can be tested within theconstraint of the memory
available. This model applies the necessary signals to the inputs of the IC,
monitoring the outputs at each stage and comparing them with the outputs in the
truthtable. Any discrepancy in the functioning of the IC results in a fail indication,
displays the faultyand good gates on the LCD. The testing procedure is
accomplished with the help of keyspresent on the main board.At this stage we had
completed to test the most common used digital IC's used in ourlaboratories, mainly
belonging to the 74TTL series and successfully completed writingassembly code for
10 IC’s.

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 Micro-Project Proposal

“BUILD A DIGITAL IC TESTER”

1.0 Brief Introduction:

In any manufacturing industry there are continuous efforts in cost reductions,

upgradequality and improve overall efficiencies. In electronic industry, with
dramatic increase in circuitcomplexity and the need for the higher levels of
reliability, a major contributor cost in anyproduct can be in the testing. However we
should recognize in the real world that no productis perfect, so that testing and in
particular automatic testing will be an essential part of production in the foreseeable
future.In industries, research centers and college, some common IC's are frequently
used;many times people face problems due to some fault in these integrated circuits.
So it is veryessential to test them before actually using them in any of the
applications. Microcontrollerbased digital IC tester is best solution for these
problems.This project has the capability of testing any available digital IC of the
TTL or CMOSfamily of 24 pins. The main advantage over the industry standard for
the project is its low costand eases of updating to any new IC design which may be
inducted in the market by anycompany only through software updating.The IC-tester
tests the basic logic gates used in the digital laboratory of colleges. Ituses 89c51 as
the controlling and processing unit. The keyboard and the display circuits
areinterfaced with the master microcontroller. The input is given to the
corresponding pins of theIC to be tested using program stored in micro-controller
acting as slave. The output is takenfrom the relevant pin. It is compared with the
look-up table of that IC being stored in thememory. Depending on the result of
comparison, the output is displayed in the LCD display Microcontrollers have

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become ubiquitous in electronic applications.However the system supported by
these devices has become exceedingly complex in terms of functionality and the
quantity of peripheral components. In recent years the boundaries of suchsystems
have stretched to include additional peripheral components marking the advent
of system-on-chip(S o C). The motivation to develop such devices has been to
increasefunctionality and performance while reducing system cost, integrity
complexity and powerdissipation.

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 3.0 Action plan:

Planned Planned Name of Responsible

Sr.no. Details of activity
start date Finish date Team Member
SEARCHING
1. INFORMATION KADAM PRITI
ABOUT TOPIC
FINDING PACHARNE
2.
INFORMATION GAYATRI
DISCUS WITH
3. TARATE GAYATRI
SUBJECT TEACHER
4. MAKING PROPOSAL SHAIKH SUHANA
5. MAKING REPORT KADAM PRITI
SUBMIT TO SUBJECT ALL GROUP
6.0
TEACHER. MEMBERS

4.0 Actual Resources Used:

S.NO Name of Resource/material Specifications Qty Remarks

1 MS OFFICE 2013 Application 1 -

2 Google Search engine 1 -

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 Format for Micro-Project Report

“ANALOG CLOCK”
Brief Description:

BACKGROUND OF DIGITAL IC TESTER :-

The digital IC tester is implemented in order to test the digitalIC’s toverify the
faultygates and the good gates. The necessary inputs to the gates of the IC to be
tested which isplaced in the ZIF socket is received from the slave micro-controller
IC and correspondingoutputs are accumulated and sent to the same controller IC
where the output is comparedwith the functional or the logic table and if any
discrepancy results, it displays the fail in theLCD display screen. Analog IC tester is
also available in the market which was replaced by thisdigital IC tester which is more
sophisticated by performing the tasks in a much easier fashionand the execution time
also very fast in itThe primary purpose of this digital IC tester is that it can easily
check the IC within duecourse of time and if any discrepancy results then it
determines the gates which were goodones and which were the bad ones. The manual
operation or a human intervention includestesting of each individual IC by making
necessary connections and verifying the outputs foreach gate by the truth table is a
time taking and tedious process.With the implementation of the micro controller
units it makes the job much easier toreceive data for the respective gates and process
output and display results. The operation of a MCU based controller is determined
primarily by its program.Microcontrollers are versatile. MCUs are very useful, since
its approach isprogrammable, many additional features are possible at little or no
added cost.

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Block Diagram Of Ic Tester

FEATURES OF IC TESTER

1: User friendly set up and operates.

2:16 X 2 character LCD display.

3: Built in 2 functions and 10 numerical keys.

4: Identifies over 10 CMOS / TTL digital ICs (up to16 pins).

5: Various LED’S and LCD display to present the test results FAIL or PASS

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EXPERIMENTAL ASPECTS CIRCUIT DIAGRAM

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Track Side

Component Side

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ALGORITHM OF CODE FOR DIGITAL IC TESTER

 Begin
 Reset the circuit
 Initialize the LCD
 Display the message “Enter IC number
 Wait for some time
 Press the IC number on the keypad
 Display the IC number
 Send the code of the respective IC from master microcontroller to slave
microcontroller
 Check the working of IC depending upon the truth tables and functional tables
 Depending upon the output, give the control signals to the master microcontroller
todisplay respective messages on LCD
 Stop

LOGIC TO TEST AN IC

The logic to test an IC is very simple. We can test it using their truth tables
andfunctional tables. In case of logic gates, we should check truth tables and in cas

of ICs likeshift register, full adder, multiplexer etc we should check functional
tables.Let us take an example of logic gate IC 7400 i.e. NAND gate.

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 CONCLUSIONS

The project has been successfully completed and the main objective of emulating an
IC testeron 89c51 micro controller has been achieved. For a given specification a IC

can be checkedfor its functionality. It takes more time to test an IC manually, with
the implementation of thesystem with microcontroller makes the testing

procedure simpler.So we conclude that any digital IC with the given specifications
can be implemented onIC tester circuit. This system is capable of testing the IC’s
having up to 24 pins.

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 FUTURE SCOPE OF WORK

This digital IC tester can test various digital IC families just by the softwareupdating.
In this project the code is written for 10 IC’s which can be extended to digitalfamilies
of 74XX and 40XX, but the code written might be reaching out of bounds of
memorythat is available in the microcontroller. That is due to the RAM may not be
sufficient to supportthe whole code so we have to interface extra memory chips.The
availability of large memory capacity makes the PIC processor the best
suitedsurrogate for microcontroller with optimal features. So far the IC to be tested
is mounted onthe ZIF socket, and the respective details of the IC are selected form
the menu provided in themicro controller board. This in turn produces the results by
displaying if the IC is working ornot by mentioning the gates. One special feature
which makes this project, true equipment forindustrial purpose is that to have a
search procedure included in it. The search procedure isused, so that if we place an
IC in the ZIF socket the entire process of identifying the IC and then selecting and
sending the inputs to the IC’s should be done by this procedure. This circuit has
been designed with an aim to test an IC having up to 24 pins. Sonecessary steps
should be taken in order to utilize this project to be implemented for digital IC’s
having pins more than 24.

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 Teacher Evaluation Sheet
Name of Student………………………………………………………………………………………
Enrollment No………………………………………………...….………...….………...….………...
Name of Program…………………………………………………….….....….………...….………...
Semester……………………………………………………………….…....….………...….………..
Course Title…………………………………………………………….…...….………...….………..
Code………………………………………………………………………...….………...….………...
Title of the Micro-Project……………………………………………………………………………...
Course Outcomes Achieved
………………………………………………………………………………………………………………
………………………………………………………………………………………………………………
………………………………………………………………………………………………………………

Evaluation as per suggested Rubric for Assessment of Micro-Project

Sr. Characteristic to be Poor Average Good Excellent
No. assessed (Marks 1-3) (Marks 4- (Marks 6- (Marks 9-10)
5) 8)
1 Relevance to the course
2 Literature survey/
Information Collection
3 Project Proposal
4 Completion of the
Target as per project
proposal
5 Analysis of Data &
Representation
6 Quality of
Prototype/Model
7 Report Preparation
8 Presentation

Micro-Project Evaluation Sheet

Process Assessment Product Assessment Total
Part A- Project Part B-Project Individual Marks
Project Methodology Report/Working Model Presentation/Viva 10
Proposal (2 mark) (2 marks) (4 mark)
(2 marks)

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Note:
Every course teacher is expected to assign marks for group evolution in first 3 columns & individual
evaluation in 4th columns for each group of students as per rubrics

Comments/Suggestions about team work/leadership/inter-personal communication (if any).

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Any other comment:

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Name and designation of the faculty member........................................................

Signature...................................................................

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