HIPOT TEST The Truth About Arc Detection
HIPOT TEST The Truth About Arc Detection
HIPOT TEST The Truth About Arc Detection
According to the standard, arcing tion failure displayed by an AR hipot circuit permits the test operator to set
and corona aren’t necessarily indica- is separate from the high-limit failure a distinct sensitivity level correspond-
tive of a dielectric breakdown. In some displayed when dielectric breakdown ing to the arc intensity. If relatively
cases, however, arcing can be a sign of has occurred. low-level arcing is deemed permissible
a problem with the DUT’s insulation or by the DUT’s manufacturer, the arc
the manufacturing process. Why Is Arc Detection detector can be set to a low sensitivity
So how is an arc detected? High- Important? level so arcs of lower magnitude could
impedance arcs and corona generate An arc causes momentary high-fre- be neglected while high-level arcs will
high-frequency current pulses that ride quency current spikes that ride on the result in an arc failure condition.
on the lower-frequency wave of the low-frequency current waveform. Al- The addition of an adjustable sensitiv-
applied test-current waveform. These though these current spikes may not be ity level, however, has led to discrepan-
pulses may have a frequency ranging the result of a catastrophic breakdown cies between arc detectors of different
from less than 30 kHz to more than of the DUT’s insulation, they could hipot manufacturers. Many hipot cus-
1 MHz and be very short in duration. indicate a problem with the insulation tomers have questioned how the results
Many times these pulses last much less system that might become a safety issue can differ from manufacturer to manu-
than 10 µs (Figure 1). at a later date. facturer or even hipot to hipot. Despite
For instance, these discrepancies, the addition of the
sometimes arc- arc detector to the hipot test does result
ing can occur as in a hipot tester that provides manufac-
the result of a turers with more information about what
series fault con- is happening in their DUTs.
dition. Usually
stemming from When Should Arc Detection
a manufactur- Be Used?
ing defect such From a quality-control standpoint,
as a loose con- more information always is useful in
nection, a series determining product safety. Perhaps
fault condition several products have been damaged
creates an arc during shipping, resulting in poor gap
that is current- spacing between a conductor and the
Figure 1. Arcing Condition limited by the insulation. This condition may not result
impedance of the in a dielectric breakdown, but with arc
circuit it is in se- detection turned on, it would be possible
ries with. Since to catch this problem before the faulty
the arc is cur- products find their way into customers’
rent-limited, this hands.
condition never Maybe the integrity of a product’s
will trigger the insulation has been weakened during the
high-limit failure manufacturing process or a component
monitored by a has become damaged during shipping
standard hipot and, when subjected to a hipot test,
test but could low-level arcing results. Although the
create a poten- product might pass the hipot test, the arc
tial fire hazard. detector could pick up the arcing condi-
Without arc de- tion and produce an arc failure.
Figure 2. An Arc Detector
tection, manu- Despite the many scenarios in which
Associated Research’s (AR) arc detec- facturers of products with inherent arc detection can be beneficial, a ma-
tion circuitry consists of a high pass filter arcing conditions could potentially pass jor source of confusion surrounding
circuit that responds only to frequencies faulty products or products that may fail the technology is the apparent lack of
greater than 10 kHz. These high-fre- prematurely. test standards for using arc detection
quency signals are fed into a comparator AR’s arc detection circuitry allows during a hipot test. There are very few
and checked against an operator-pro- for the hipot to differentiate between sources of information available to help
grammed sensitivity level selected dur- the current spikes caused by an arc’s a manufacturer determine if arc detec-
ing the test setup (Figure 2). rate of change of current over time tion is a necessary part of a DUT’s test
If this level is exceeded, an inter- (∆di/dt) and the excessive leakage procedure, and those standards that do
rupt signal is fed into the CPU, which current associated with dielectric exist are relatively subjective.
shuts down the hipot. The arc detec- breakdown. Further, the arc detection