CMOS Voltage Comparator Design
Ideal
Comparator Deviations from ideality Idealized View of Comparator Design Practical Design Issues
PRG, VCs, 1
Ideal Comparator
Analog input (vi+-vi-) vi+ V. C. viDigital output Latch signal Latch signal Properties: Zero offset Zero delay
not valid valid compared value
Digital output
PRG, VCs, 2
Important Deviations from Ideality
1. Transient Response
PRG, VCs, 3
Deviations from Ideality, Contd
2. DC Errors
vi
Vos V. C. Digital output
viLatch signal Key Parameters: Delay time: td = f(Vinit, Vod) Metastability Vos, PSRR, CMRR
PRG, VCs, 4
Consider an Idealized Case
Chain of identical, Balanced Stages:
Assumptions:
Large Rl, idealized device Only Cgs matters, Cgd=0, Cdb=0 Balanced condition at t=0 Devices behave approximately linearly
PRG, VCs, 5
Example SPICE Simulated Result (Soo, 1984)
Voltage output of Nth Stage, Vin = 10mV
Time, sec
PRG, VCs, 5.1
Idealized Case, Contd
Result:
Final Conclusion: t
=
dmin
1.2
v out ln v id
tot g m
C
=
+C gs p g m
C 1 1+ p 2f C t gs
Delay same as regenerative latch!
vo/vin = 1000, Cp<<Cgs PRG, VCs, 6
Effective ft vs. Channel Length Silicon MOSFET
10 9 8 7 Approximate 6 Value of NMOS 5 Device ft, Ghz 4
(Assumes bias point of Vgs-VT = 0.5V)
3 2 1 0.8u 5u 3u 2u 1.5u 1.2u 1u Drawn Channel Length
PRG, VCs, 7
0.6u
93
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When is Comparator Performance a Factor?
ADC type Serial Sigma-Delta Successive Approximation Flash Half-Flash Pipeline Vos No No Usually no Yes Yes No Delay No Usually opamp limited Yes Yes Yes Yes
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Key Design Considerations
How
many stages before latch? How to do Vos cancellation if needed How to realize common-mode biasing Whether to precharge nodes to balanced state How many latch stages needed to control metastability
PRG, VCs, 10
Practical Design Considerations
Dominated by 2 issues
Overload Recovery Offset removal
General Considerations:
Cant use simple latch- Offset usually too high
vi+ G viEnough Stages to realize required offset voltage
digital output
Latch
PRG, VCs, 11
The Overload Recovery Problem
Vin
V1
V2
V3
Vod
Vin
Vinit Vlatch
Vout
time V1 V2 V3
PRG, VCs, 12
Example Simulation Results, Overload Recovery (Soo, 1984UCB)
Resistor Loaded Inverters, gmRl=5 Vinit = -5V
Voltage at nth stage output, Volts
Time, sec
PRG, VCs, 13
Design approaches:
1. Use small values of Rl
Minimizes swing Shortens time constant
2. Use Passive Clamps
Limits Swing Adds parasitics
3. Use active nulling clamps
Good in principle Tough clock generation problem
PRG, VCs, 14
Design of Low-Rl Comparators in MOS
(Soo, 1984, UCB)
Conclusion:
Nonlinear Problem, no analytical solution Best empirical results with gmRl around 4-8 Optimum number of stages 4-6 Result: 5-10x slower than pre-nulled case
Ref: Soo, PhD, UCB, 1984 PRG, VCs, 15
CMOS Implementations
Poly or Diffusion loads- large tolerance and parasitics (Allstott, JSC, 6/82) Enhancement loads- Drop large voltage PMOS Triode loads- small parasitics, can use replica bias
Triode
Can be constant or PTAT to give desired TC to delay
Vref
Bias Ref
PRG, VCs, 16
Offset Nulling Strategies
1. Input Nulling Capacitors w/feedback
Caps must be big to control chg injection, Parasitics in signal path
2. Interstage Nulling Caps
Parasitics in signal path
3. Auxiliary input stage
Minimal loading of signal path Slow in actual nulling cycle Best is nulling duty cycle is low
Refs: Yee, JSC, 6/78;Allsott JSC 12/82, Degrauwe, JSC6/85 PRG, VCs, 17