Ratajski, 1968 - Google Patents
Force-frequency coefficient of singly rotated vibrating quartz crystalsRatajski, 1968
- Document ID
- 9749848734655908009
- Author
- Ratajski J
- Publication year
- Publication venue
- IBM Journal of Research and Development
External Links
Snippet
Frequency perturbations in vibrating quartz crystals, caused by externally applied forces, have been investigated for some time. The parameters affecting the force-frequency sensitivity were recently established and evaluated, making possible the derivation of a …
- 229910052904 quartz 0 title abstract description 12
Classifications
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezo-electric or electrostrictive material
- H03H9/56—Monolithic crystal filters
- H03H9/562—Monolithic crystal filters comprising a ceramic piezoelectric layer
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02062—Details relating to the vibration mode
- H03H9/0207—Details relating to the vibration mode the vibration mode being harmonic
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02157—Dimensional parameters, e.g. ratio between two dimension parameters, length, width or thickness
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02015—Characteristics of piezoelectric layers, e.g. cutting angles
- H03H9/02039—Characteristics of piezoelectric layers, e.g. cutting angles consisting of a material from the crystal group 32, e.g. langasite, langatate, langanite
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezo-electric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezo-electric or electrostrictive material having a single resonator
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Ratajski | Force-frequency coefficient of singly rotated vibrating quartz crystals | |
Ohno | Free vibration of a rectangular parallelepiped crystal and its application to determination of elastic constants of orthorhombic crystals | |
Ohno | Rectangular parallellepiped resonance method for piezoelectric crystals and elastic constants of alpha-quartz | |
US4039969A (en) | Quartz thermometer | |
Gagnepain et al. | Nonlinear effects in piezoelectric quartz crystals | |
CA1102928A (en) | Simultaneously resonated multi-mode crystal force transducer | |
CA2061282C (en) | Acoustic vibrator with variable sensitivity to external acceleration | |
Fang et al. | Rotation sensitivity of waves propagating in a rotating piezoelectric plate | |
Besson et al. | BVA resonators and oscillators: a review. Relation with space requirements and quartz material characterization | |
Lee et al. | The influence of support-configuration on the acceleration sensitivity of quartz resonator plates | |
Yang et al. | Thickness vibrations of rotating piezoelectric plates | |
Shimizu et al. | Dielectric, elastic and piezoelectric constants of lanthanum calcium oxoborate single crystals with monoclinic structure of point group m | |
US2423061A (en) | Piezoelectric device and method of manufacture | |
Ballato et al. | Electronic desensitization of resonators to accelerations | |
Ishizaki et al. | Two-dimensional analysis using one-dimensional FEM for straight-crested waves in arbitrary anisotropic crystal plates and axisymmetric piezoelectric vibrations in ceramic disks | |
Goka et al. | Effect of stepped bi-mesa structures on spurious vibrations of AT-cut quartz plates | |
Zhu et al. | Thickness-twist and face-shear waves in piezoelectric plates of monoclinic crystals | |
Kosinski et al. | Stress-induced frequency shifts in langasite thickness-mode resonators | |
Yang | Frequency shifts in a piezoelectric body due to small amounts of additional mass on its surface | |
US2178146A (en) | Piezoelectric element | |
Kosinski et al. | A finite plate technique for the determination of piezoelectric material constants | |
Kosinski et al. | Stress-induced frequency shifts in langasite thickness-mode resonators | |
Zhang | Optimal cuts to extract the third-order piezoelectric constants and electrostictive constants of langasite single crystals through the electroelastic effect | |
Kosinski et al. | An analysis of the normal acceleration sensitivity of rotated Y-cut quartz surface transverse wave resonators simply supported along rectangular edges | |
Camou et al. | Interface acoustic waves properties in some common crystal cuts |