[go: up one dir, main page]

Bennett, 1997 - Google Patents

Packaging and interconnection of a black-lit CCD sensor device

Bennett, 1997

View PDF
Document ID
940996979254014846
Author
Bennett J
Publication year

External Links

Snippet

This paper describes the engineering and development of a process to electrically and mechanically bond a large area, backlit charge-coupled device (CCD) sensor to a metallized substrate, using a materials system compatible with a high vacuum tube …
Continue reading at dspace.mit.edu (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/095Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
    • H01L2924/097Glass-ceramics, e.g. devitrified glass
    • H01L2924/09701Low temperature co-fired ceramic [LTCC]
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/102Material of the semiconductor or solid state bodies
    • H01L2924/1025Semiconducting materials
    • H01L2924/10251Elemental semiconductors, i.e. Group IV
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L23/00Details of semiconductor or other solid state devices

Similar Documents

Publication Publication Date Title
Wolffenbuttel et al. Low-temperature silicon wafer-to-wafer bonding using gold at eutectic temperature
Niklaus et al. Adhesive wafer bonding
Wolffenbuttel Low-temperature intermediate Au-Si wafer bonding; eutectic or silicide bond
US5783867A (en) Repairable flip-chip undercoating assembly and method and material for same
US6490144B1 (en) Support for supporting a substrate in a process chamber
KR100735933B1 (en) Thermally Conductive Adhesive Bonding Part and Manufacturing Method of The Adhesive Bonding Part
Tan et al. Low temperature wafer-level bonding for hermetic packaging of 3D microsystems
US7019956B2 (en) Electrostatic chuck having bonded structure and method of manufacturing the same
US5693574A (en) Process for the laminar joining of silicon semiconductor slices
Dragoi et al. Wafer-level plasma activated bonding: new technology for MEMS fabrication
Lee et al. Wafer bonding by low-temperature soldering
Dragoi et al. Adhesive wafer bonding for MEMS applications
US7405466B2 (en) Method of fabricating microelectromechanical system structures
Narayan et al. Thin film transfer process for low cost MCM's
JP2005504953A (en) Bond structure using reaction borosilicate mixture
Jaffe Encapsulation of integrated circuits containing beam leaded devices with a silicone RTV dispersion
Bennett Packaging and interconnection of a black-lit CCD sensor device
JP2001085505A (en) Susceptor and manufacture thereof
Schjølberg-Henriksen et al. Anodic bonding of glass to aluminium
Knechtel Glass frit wafer bonding
GB2305672A (en) An electrically isolating support for electronic components
Narayan et al. Thin film transfer process for low cost MCM-D fabrication
Fan et al. Effect of bonding temperature on hermetic seal and mechanical support of wafer-level Cu-to-Cu thermo-compression bonding for 3D integration
Selbmann et al. Parylene as a novel packaging material for adhesive bonding, flexible electronics and wafer level packaging
Soroush et al. Mechanical Design and Reliability of Gold-Tin Eutectic Bonding for Silicon-Based Thermal Management Devices