[go: up one dir, main page]

Prak et al., 1991 - Google Patents

Q-factor and frequency shift of resonating silicon diaphragms in air

Prak et al., 1991

View PDF
Document ID
9320974217077322073
Author
Prak A
Blom F
Elwenspoek M
Lammerink T
Publication year
Publication venue
Sensors and Actuators A: Physical

External Links

Snippet

The dependence of the relative frequency shift and theQ-factor of the first two modes of vibration of square silicon diaphragms on the diaphragm geometry and the air pressure is investigated. The experimental results are compared with the theory, which is based on …
Continue reading at research.utwente.nl (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02Analysing fluids
    • G01N29/036Analysing fluids by measuring frequency or resonance of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02Analysing fluids
    • G01N29/022Fluid sensors based on micro-sensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/12Analysing solids by measuring frequency or resonance of acoustic waves

Similar Documents

Publication Publication Date Title
Blom et al. Dependence of the quality factor of micromachined silicon beam resonators on pressure and geometry
Kilic et al. External fibre Fabry–Perot acoustic sensor based on a photonic-crystal mirror
Li et al. Simple, high‐resolution interferometer for the measurement of frequency‐dependent complex piezoelectric responses in ferroelectric ceramics
JP5028410B2 (en) High sensitivity fiber compatible photoacoustic sensor
Prak et al. Q-factor and frequency shift of resonating silicon diaphragms in air
Liu et al. A loss mechanism study of a very high Q silicon micromechanical oscillator
Le Foulgoc et al. Highly decoupled single-crystal silicon resonators: An approach for the intrinsic quality factor
Zhang et al. Measurement of Young's modulus and internal stress in silicon microresonators using a resonant frequency technique
Wang et al. Thermal treatments and gas adsorption influences on nanomechanics of ultra-thin siliconresonators for ultimate sensing
Vigevani et al. Microleverage DETF aluminum nitride resonating accelerometer
Park et al. Optimum design of circular CMUT membranes for high quality factor in air
Badi et al. Capacitive micromachined ultrasonic Lamb wave transducers using rectangular membranes
WO2004104567A1 (en) Quartz crystal microbalance humidity sensor
Choi et al. Anelasticity and damping of thin aluminum films on silicon substrates
Lange et al. CMOS chemical microsensors based on resonant cantilever beams
Kim et al. In situ measurement of mechanical properties of polyimide films using micromachined resonant string structures
Rittenmyer et al. Direct measurement of the temperature‐dependent piezoelectric coefficients of composite materials by laser Doppler vibrometry
JP7620853B2 (en) RESONANCE SENSOR USING MEMS RESONATOR AND DETECTION METHOD OF THE RESONANCE SENSOR
Valbin et al. Piezoelectric aluminum nitride thin films for ultrasonic transducers
Toda Elastic properties of piezoelectric PVF2
Schmid et al. Quality factor improvement of silicon nitride micro string resonators
Kazinczi et al. Environment-induced failure modes of thin film resonators
Hodges et al. Characterization of Mass-Loaded Silicon Nitride On-Chip Resonators for Traceable Sensing of Low Amplitude Acceleration
WO2001061312A1 (en) Method of determining viscosity
Todorović et al. Photoacoustic elastic bending method: Study of the silicon membranes