Knaapila et al., 2003 - Google Patents
X-ray diffraction studies of multiple orientation in poly (9, 9-bis (2-ethylhexyl) fluorene-2, 7-diyl) thin filmsKnaapila et al., 2003
View PDF- Document ID
- 9293944878263714441
- Author
- Knaapila M
- Lyons B
- Kisko K
- Foreman J
- Vainio U
- Mihaylova M
- Seeck O
- Pålsson L
- Serimaa R
- Torkkeli M
- Monkman A
- Publication year
- Publication venue
- The Journal of Physical Chemistry B
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Snippet
The structural investigation of poly (9, 9-bis (2-ethylhexyl) fluorene-2, 7-diyl)(PF2/6) in aligned thin films is presented. Formation of a thickness dependent triaxial texturing is identified in thermotropically aligned films. X-ray reflectivity measurements reveal good …
- -1 poly (9, 9-bis (2-ethylhexyl) fluorene-2, 7-diyl) 0 title abstract description 72
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L51/00—Solid state devices using organic materials as the active part, or using a combination of organic materials with other materials as the active part; Processes or apparatus specially adapted for the manufacture or treatment of such devices, or of parts thereof
- H01L51/0032—Selection of organic semiconducting materials, e.g. organic light sensitive or organic light emitting materials
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