Davis et al., 1974 - Google Patents
Sulfur surface layers on tungsten investigated by field ion mass spectroscopyDavis et al., 1974
- Document ID
- 8919601092752179399
- Author
- Davis P
- Bechtold E
- Block J
- Publication year
- Publication venue
- Surface Science
External Links
Snippet
A beam of molecular sulfur S2 is produced from solid Ag2S in an electrochemical source and directed unto a tungsten field emitter. Field ions are analyzed by a quadrupole mass filter. The field ionization and field desorption of sulfur is investigated between 150 and 500° …
- 229910052717 sulfur 0 title abstract description 85
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Redhead | Interaction of slow electrons with chemisorbed oxygen | |
| Chertihin et al. | On the spectrum and structure of the isolated O 4− anion in solid argon | |
| Neynaber et al. | Scattering of low-energy electrons by atomic hydrogen | |
| US6825477B2 (en) | Method and apparatus to produce gas phase analyte ions | |
| Taylor et al. | Surface alteration of graphite, graphite monofluoride and teflon by interaction with Ar+ and Xe+ beams | |
| Davis et al. | Sulfur surface layers on tungsten investigated by field ion mass spectroscopy | |
| Prell et al. | Comparison of atomization mechanisms for group IIA elements in electrothermal atomic absorption spectrometry | |
| Fogel | Ion—ion emission—A new tool for mass-spectrometric investigations of processes on the surface and in the bulk of solids | |
| Le Coat et al. | Medium enhanced, electron stimulated desorption of CF3− from condensed CF3I | |
| Sack et al. | Adsorption and angle-resolved electron-stimulated desorption of CCl4 on Ru (0001) | |
| Sosulin et al. | Mechanism of the radiation-induced transformations of fluoroform in solid noble gas matrixes | |
| Gandrud et al. | Investigation of the Hollow Cathode Discharge as an Atomic Absorption Medium | |
| Burtt et al. | The X-ray decomposition of nitrous oxide | |
| Wang et al. | Hydrogen ion-molecule isotopomer collisions: Charge transfer and rearrangement | |
| Bradley et al. | Secondary Positive Ion‐Emission from Platinum | |
| McCracken | Desorption of adsorbed and condensed gases on metals by deuterons | |
| Vacher et al. | A determination of the stabilities of negative ion clusters in SO2 and SO2-O2 mixtures | |
| Wucher et al. | On the internal energy of sputtered clusters | |
| Kovacs et al. | Electronic excitation in metals through hyperthermal atoms | |
| Zollweg et al. | Continuum radiation from the mercury arc | |
| Glazunov et al. | Effect of low/high hydrogen recycling operation on palladium sputtering under steady state plasma impact | |
| van Zwol et al. | Effects of Ar+ angle of incidence on the etching of Si with Cl2 and low‐energy Ar+ ions | |
| Misaizu et al. | Formation of negative ions from pyridine clusters in collision with high-Rydberg rare-gas atoms and slow electrons | |
| Klar et al. | Exoelectron emission from magnesium surfaces | |
| Callahan et al. | High-pressure fast-atom bombardment mass spectrometry: Collisional stabilization and reactions of alkali halide cluster ions |