Karar et al., 2017 - Google Patents
Design and fabrication of multilayer dichroic beam splitterKarar et al., 2017
View PDF- Document ID
- 8703189447232883071
- Author
- Karar V
- Sharma A
- Publication year
- Publication venue
- Advanced Materials Proceedings
External Links
Snippet
Beam splitters are primarily used for applications like avionic displays, optical storage, fluorescence applications, optical interferometry, semiconductor instrumentation where some of the information needs to be reflected as well as transmitted. They operate on the …
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
- G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
- G02B5/3041—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid comprising multiple thin layers, e.g. multilayer stacks
- G02B5/305—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid comprising multiple thin layers, e.g. multilayer stacks including organic materials, e.g. polymeric layers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3083—Birefringent or phase retarding elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/285—Interference filters comprising deposited thin solid films
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
- G02B5/0816—Multilayer mirrors, i.e. having two or more reflecting layers
- G02B5/0825—Multilayer mirrors, i.e. having two or more reflecting layers the reflecting layers comprising dielectric materials only
-
- G—PHYSICS
- G02—OPTICS
- G02F—DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colour
- G01J3/12—Generating the spectrum; Monochromators
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B27/00—Other optical systems; Other optical apparatus
- G02B27/28—Other optical systems; Other optical apparatus for polarising
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B6/00—Light guides
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Heavens | Optical properties of thin films | |
| Gu et al. | Optimal broadband Mueller matrix ellipsometer using multi-waveplates with flexibly oriented axes | |
| Samoylov et al. | Achromatic and super-achromatic zero-order waveplates | |
| CN107991728B (en) | Wide-band and wide-field angle compensator | |
| CN103162831B (en) | Broadband polarization spectrometer and optical measurement system | |
| WO2023071215A1 (en) | Thin film refractive index test apparatus and method | |
| Gu et al. | Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer | |
| Boulbry et al. | Improved method for calibrating a Stokes polarimeter | |
| Johs et al. | Recent developments in spectroscopic ellipsometry for in-situ applications | |
| Karar et al. | Design and fabrication of multilayer dichroic beam splitter | |
| Negara et al. | Simplified Stokes polarimeter based on division-of-amplitude | |
| EP1590306B1 (en) | Method of producing transparent titanium oxide coatings having a rutile structure | |
| Zhang et al. | Characterization of beam splitters in the calibration of a six-channel Stokes polarimeter | |
| EP2899514B1 (en) | Terahertz-wave detection element, production method therefor, joined body, and observation device | |
| Favaro et al. | Reduction of mechanical losses in ion-beam sputtered tantalum oxide thin films via partial crystallization | |
| CN111351576B (en) | Confocal optical path system, confocal polarization measurement method and its application | |
| Yang et al. | Design and fabrication of ultra-high precision thin-film polarizing beam splitter | |
| Pace et al. | CVD diamond optics for ultraviolet | |
| Liu et al. | Ion beam sputtering mixture films with tailored refractive indices | |
| George et al. | An improved wire grid polarizer for thermal infrared applications | |
| Masetti et al. | Optical characterization of low-absorbing thin films in the visible and infrared spectrum | |
| Azzam | Ellipsometry of single-layer antireflection coatings on transparent substrates | |
| US20050280895A1 (en) | Multi-layer thin-film broadband beam splitter with matched group delay dispersion | |
| Daugherty et al. | Low polarization microscope objectives | |
| Zhang et al. | Review of Monochromatic Ellipsometry: Emerging Technologies and Up-to-Date Applications |