Amiri et al., 2014 - Google Patents
Low-power MRAM for nonvolatile electronics: Electric field control and spin-orbit torquesAmiri et al., 2014
- Document ID
- 8329931386107419823
- Author
- Amiri P
- Wang K
- Publication year
- Publication venue
- 2014 IEEE 6th International Memory Workshop (IMW)
External Links
Snippet
We review recent results and discuss challenges and prospects of nonvolatile magnetic random access memory (MRAM). In particular, we will focus on recent developments in magnetoelectric memory (MeRAM), where electric field control is used to replace existing …
- 230000005684 electric field 0 title abstract description 5
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00 - G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00 - G11C25/00 using resistance random access memory [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0069—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L43/00—Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
- H01L43/02—Details
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L43/00—Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
- H01L43/08—Magnetic-field-controlled resistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift register stack stores, push-down stores
- G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift register stack stores, push-down stores using magnetic elements
- G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift register stack stores, push-down stores using magnetic elements using thin films in plane structure
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/22—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including components using galvano-magnetic effects, e.g. Hall effects; using similar magnetic field effects
- H01L27/222—Magnetic non-volatile memory structures, e.g. MRAM
- H01L27/226—Magnetic non-volatile memory structures, e.g. MRAM comprising multi-terminal components, e.g. transistors
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L43/00—Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
- H01L43/12—Processes or apparatus peculiar to the manufacture or treatment of these devices or of parts thereof
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
- G11C14/0054—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Amiri et al. | Electric-field-controlled magnetoelectric RAM: Progress, challenges, and scaling | |
Prejbeanu et al. | Thermally assisted MRAMs: ultimate scalability and logic functionalities | |
Huai | Spin-transfer torque MRAM (STT-MRAM): Challenges and prospects | |
CN103069564B (en) | Magnetoresistive element and magnetic random-access memory | |
US7800942B2 (en) | Method and system for providing a magnetic element and magnetic memory being unidirectional writing enabled | |
US8514615B2 (en) | Structures and methods for a field-reset spin-torque MRAM | |
US7532505B1 (en) | Method and system for using a pulsed field to assist spin transfer induced switching of magnetic memory elements | |
US8228715B2 (en) | Structures and methods for a field-reset spin-torque MRAM | |
US10460786B2 (en) | Systems and methods for reducing write error rate in magnetoelectric random access memory through pulse sharpening and reverse pulse schemes | |
Dorrance et al. | Diode-MTJ crossbar memory cell using voltage-induced unipolar switching for high-density MRAM | |
JP5062538B2 (en) | Magnetic memory element, driving method thereof, and nonvolatile memory device | |
US9070456B2 (en) | High density magnetic random access memory | |
Peng et al. | Magnetic tunnel junctions for spintronics: principles and applications | |
CN105633111A (en) | Electrical field assisted writing magnetic tunnel junction unit and writing method thereof | |
Worledge | Spin-transfer-torque MRAM: The next revolution in memory | |
De Araujo et al. | Multilevel thermally assisted magnetoresistive random-access memory based on exchange-biased vortex configurations | |
US9455012B2 (en) | Magnetic device with spin polarisation | |
Sbiaa et al. | Multi-level domain wall memory in constricted magnetic nanowires | |
Verma et al. | Spintronics-based devices to circuits: Perspectives and challenges | |
Andrawis et al. | Design and comparative analysis of spintronic memories based on current and voltage driven switching | |
Lee et al. | Source line sensing in magneto-electric random-access memory to reduce read disturbance and improve sensing margin | |
JP4438806B2 (en) | memory | |
Amiri et al. | Low-power MRAM for nonvolatile electronics: Electric field control and spin-orbit torques | |
Sverdlov et al. | Reliable sub-nanosecond switching of a perpendicular SOT-MRAM cell without external magnetic field | |
Bandiera et al. | Thermally assisted MRAM |