[go: up one dir, main page]

Hung et al., 1989 - Google Patents

Characterization of GaAs monolithic circuits by optical techniques

Hung et al., 1989

Document ID
8129350899839729982
Author
Hung H
Lee T
Polak-Dingels P
Chauchard E
Webb K
Lee C
Huang H
Publication year
Publication venue
Optical Technology for Microwave Applications IV

External Links

Snippet

Optical techniques for broadband microwave signal generation and detection have been developed to characterize monolithic microwave integrated circuits (MMICs). Emphasis is on the enhancement of measurement accuracy and the identification of limitations. De …
Continue reading at www.spiedigitallibrary.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of aerials; Antenna testing in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00

Similar Documents

Publication Publication Date Title
US5142224A (en) Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals
Weingarten et al. Picosecond optical sampling of GaAs integrated circuits
van Raay et al. A new on-wafer large-signal waveform measurement system with 40 GHz harmonic bandwidth
US6049219A (en) Signal probing of microwave integrated circuit internal nodes
Frankel et al. Ultrahigh-bandwidth vector network analyzer based on external electro-optic sampling
WO1988006737A1 (en) Electro-optic measurement (network analysis) system
Hung et al. Millimeter-wave monolithic integrated circuit characterization by a picosecond optoelectronic technique
Cooper et al. Picosecond optoelectronic measurement of the high-frequency scattering parameters of a GaAs FET
Whitaker et al. External electro-optic integrated circuit probing
Nagel et al. Optical second-harmonic probe for ultra-high frequency on-chip interconnects with benzocyclobutene
Hung et al. Characterization of GaAs monolithic circuits by optical techniques
Frankel Optoelectronic techniques for ultrafast device network analysis to 700 GHz
US10591530B1 (en) Coplanar load pull test fixture for wave measurements
Huang et al. On-wafer testing of MMIC with monolithically integrated photoconductive switches
Yu et al. Full two-port on-wafer vector network analysis to 120 GHz using active probes
Webb et al. A time-domain network analyzer which uses optoelectronic techniques
Heymann et al. Multiharmonic generators for relative phase calibration of nonlinear network analyzers
Weingarten et al. GaAs integrated circuit measurements using electrooptic sampling
Khalid et al. Oscillation detection technique by using vector network analyzer
Lee et al. Optical techniques for on-wafer measurements of MMICs
Whitaker et al. External electro-optic probing of millimeter-wave integrated circuits
Mertin et al. Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements
Weingarten et al. Picosecond sampling of GaAs integrated circuits
CA2020733C (en) Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter-wave signals
Weingarten et al. Microwave measurements of GaAs integrated circuits using electrooptic sampling