[go: up one dir, main page]

Nguyen et al., 2019 - Google Patents

Calibration tools for scanning thermal microscopy probes used in temperature measurement mode

Nguyen et al., 2019

View PDF
Document ID
8013663355939585797
Author
Nguyen T
Thiery L
Euphrasie S
Lemaire E
Khan S
Briand D
Aigouy L
Gomes S
Vairac P
Publication year
Publication venue
Journal of Heat Transfer

External Links

Snippet

We demonstrate the functionality of a new active thermal microchip dedicated to the temperature calibration of scanning thermal microscopy (SThM) probes. The silicon micromachined device consists in a suspended thin dielectric membrane in which a heating …
Continue reading at hal.science (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/18Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K17/00Measuring quantity of heat
    • G01K17/06Measuring quantity of heat conveyed by flowing mediums, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device
    • G01K17/08Measuring quantity of heat conveyed by flowing mediums, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device based upon measurement of temperature difference or of a temperature
    • G01K17/20Measuring quantity of heat conveyed by flowing mediums, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device based upon measurement of temperature difference or of a temperature across a radiating surface, combined with ascertainment of the heat transmission coefficient
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/20Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/005Investigating or analyzing materials by the use of thermal means by investigating specific heat
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry

Similar Documents

Publication Publication Date Title
Zhang et al. A review on principles and applications of scanning thermal microscopy (SThM)
Liu et al. Thermal conductivity measurements of ultra-thin single crystal silicon layers
Shi et al. Measuring thermal and thermoelectric properties of one-dimensional nanostructures using a microfabricated device
Dames Measuring the thermal conductivity of thin films: 3 omega and related electrothermal methods
Shi et al. Thermal transport mechanisms at nanoscale point contacts
Cai et al. Design and test of carbon nanotube biwick structure for high-heat-flux phase change heat transfer
Sultan et al. Thermal conductivity of micromachined low-stress silicon-nitride beams from 77 to 325 K
Mackey et al. Uncertainty analysis for common Seebeck and electrical resistivity measurement systems
Völklein et al. Measuring methods for the investigation of in‐plane and cross‐plane thermal conductivity of thin films
Borca-Tasciuc Scanning probe methods for thermal and thermoelectric property measurements
Lee et al. Thermal conduction from microcantilever heaters in partial vacuum
Thompson Pettes et al. A reexamination of phonon transport through a nanoscale point contact in vacuum
Kim et al. Quantification of thermal and contact resistances of scanning thermal probes
Park et al. Experimental investigation on the heat transfer between a heated microcantilever and a substrate
Zhang et al. Quantitative temperature distribution measurements by non-contact scanning thermal microscopy using Wollaston probes under ambient conditions
Gurrum et al. Size effect on the thermal conductivity of thin metallic films investigated by scanning Joule expansion microscopy
Aubain et al. In-plane thermal conductivity determination through thermoreflectance analysis and measurements
Guen et al. Scanning thermal microscopy on samples of varying effective thermal conductivities and identical flat surfaces
Park et al. Design of micro-temperature sensor array with thin film thermocouples
Guen et al. Impact of roughness on heat conduction involving nanocontacts
Bontempi et al. Quantitative thermal microscopy using thermoelectric probe in passive mode
Thiery et al. Thermal contact calibration between a thermocouple probe and a microhotplate
Nguyen et al. Calibration tools for scanning thermal microscopy probes used in temperature measurement mode
Pernot et al. Frequency domain analysis of 3ω-scanning thermal microscope probe—Application to tip/surface thermal interface measurements in vacuum environment
Huang et al. Temperature and strain effects in micro-Raman thermometry for measuring in-plane thermal conductivity of thin films