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Civera et al., 2001 - Google Patents

FPGA-based fault injection techniques for fast evaluation of fault tolerance in VLSI circuits

Civera et al., 2001

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Document ID
7799826678707432190
Author
Civera P
Macchiarulo L
Rebaudengo M
Sonza Reorda M
Violante M
Publication year
Publication venue
International Conference on Field Programmable Logic and Applications

External Links

Snippet

Designers of safety-critical VLSI systems are asking for effective tools for evaluating and validating their designs. Fault Injection is commonly adopted for this task, and its effectiveness is therefore a key factor. In this paper we propose to exploit FPGAs to speed …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

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    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequence by preliminary fault modelling, e.g. analysis, simulation
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    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318583—Design for test
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    • G06F17/50—Computer-aided design
    • G06F17/5045—Circuit design
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