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Wu et al., 2019 - Google Patents

Optimization of deposition processing of VN thin films using design of experiment and single-variable (nitrogen flow rate) methods

Wu et al., 2019

Document ID
6967142732562387330
Author
Wu C
Huang J
Yu G
Publication year
Publication venue
Materials Chemistry and Physics

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The purpose of this study was to find the optimum deposition conditions for vanadium nitride (VN) thin film using Taguchi design of experiment (DOE) method, and the attained parameters were further refined by conducting single-variable experiments, where the effect …
Continue reading at www.sciencedirect.com (other versions)

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    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
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    • C23C14/16Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon
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