[go: up one dir, main page]

Zhu et al., 2017 - Google Patents

Determination of propagation constant of terahertz dielectric ridge waveguide using noncontact measurement approach

Zhu et al., 2017

Document ID
682591638016710861
Author
Zhu H
Xue Q
Publication year
Publication venue
IEEE Transactions on Instrumentation and Measurement

External Links

Snippet

This paper presents a detailed uncertainty analysis and tolerance analysis of the noncontact measurement approach proposed here for determining the propagation constant of the dielectric ridge waveguide (DRW), operating in 750-1000-GHz range. Two diagonal horns …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/12—Coupling devices having more than two ports
    • H01P5/16—Conjugate devices, i.e. devices having at least one port decoupled from one other port
    • H01P5/18—Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of aerials; Antenna testing in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/02—Coupling devices of the waveguide type with invariable factor of coupling
    • H01P5/022—Transitions between lines of the same kind and shape, but with different dimensions

Similar Documents

Publication Publication Date Title
Zhu et al. Complex permittivity measurement of dielectric substrate in sub-THz range
Friedsam et al. A broadband free-space dielectric properties measurement system at millimeter wavelengths
Reck et al. Measurement of silicon micromachined waveguide components at 500–750 GHz
Wang et al. Broadband printed-circuit-board characterization using multimode substrate-integrated-waveguide resonator
Kazemipour et al. Design and calibration of a compact quasi-optical system for material characterization in millimeter/submillimeter wave domain
Wang et al. Characterization of dielectric materials at WR-15 band (50–75 GHz) using VNA-based technique
Caglayan et al. Non-contact probes for on-wafer characterization of sub-millimeter-wave devices and integrated circuits
Gagnon et al. Material characterization using a quasi-optical measurement system
Tsai et al. A V-band on-wafer near-field antenna measurement system using an IC probe station
Wu et al. Convenient waveguide technique for determining permittivity and permeability of materials
Zhu et al. A 750–1000 GHz $ H $-plane dielectric horn based on silicon technology
Li et al. Repeatability and mismatch of waveguide flanges in the 500–750 GHz band
Zhu et al. Low-cost narrowed dielectric microstrip line—A three-layer dielectric waveguide using PCB technology for millimeter-wave applications
Zeier et al. Establishing traceability for the measurement of scattering parameters in coaxial line systems
Zhu et al. Determination of propagation constant of terahertz dielectric ridge waveguide using noncontact measurement approach
Viratikul et al. 220–325-GHz horn-type adapter for terahertz microstructured fiber measurements
CN103605033B (en) X-wave band autenna across frequency range electromagnetic property measurement mechanism and measuring method
Ridler et al. Establishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths
Gagnon et al. Low-cost free-space measurement of dielectric constant at Ka band
Moallem et al. A Non-Contact Submillimeter-Wave $ S $-Parameters Measurement Technique for Multiport Micromachined Devices
Khanal et al. Measurement of dielectric properties at 75-325 GHz using a vector network analyzer and full wave simulator
US11333682B2 (en) Silicon probe for millimeter-wave and terahertz measurement and characterization
Ridler et al. The Trace Is on Measurements: Developing Traceability for S? Parameter Measurements at Millimeter and Submillimeter Wavelengths
Kang Free-space unknown thru measurement using planar offset short for material characterization
Zhu et al. Silicon probe measurement and characterization in sub-THz range