Shi et al., 2002 - Google Patents
Exchange bias in Fe x Zn 1− x F 2/Co bilayersShi et al., 2002
- Document ID
- 6688477082661421251
- Author
- Shi H
- Lederman D
- Fullerton E
- Publication year
- Publication venue
- Journal of applied physics
External Links
Snippet
The exchange bias (HE) was measured in Fe x Zn 1− x F 2/Co bilayers grown on MgO (100) with and without a 1.0 nm layer of pure FeF 2 at the interface between the Fe x Zn 1− x F 2 and the Co layers. For x= 0.83 samples with an additional 1.0 nm FeF 2 interface layer HE …
- 239000010410 layer 0 abstract description 58
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/18—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being compounds
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