Allevi et al., 2019 - Google Patents
Detecting quantum features in the real worldAllevi et al., 2019
- Document ID
- 5800058455625504043
- Author
- Allevi A
- Chesi G
- Nardo L
- Bondani M
- Publication year
- Publication venue
- Quantum Information and Measurement
External Links
Snippet
Detecting quantum features in the real world Page 1 T5A.23.pdf Quantum Information and
Measurement (QIM) V: Quantum Technologies © OSA 2019 Detecting quantum features in the
real world Alessia Allevi Department of Science and High Technology, University of Insubria …
- 230000005540 biological transmission 0 abstract description 4
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infra-red, visible or ultra-violet radiation
- H01L31/102—Devices sensitive to infra-red, visible or ultra-violet radiation characterised by only one potential barrier or surface barrier
- H01L31/107—Devices sensitive to infra-red, visible or ultra-violet radiation characterised by only one potential barrier or surface barrier the potential barrier working in avalanche mode, e.g. avalanche photodiode
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infra-red, visible or ultra-violet radiation
- H01L31/111—Devices sensitive to infra-red, visible or ultra-violet radiation characterised by at least three potential barriers, e.g. photothyristor
- H01L31/1113—Devices sensitive to infra-red, visible or ultra-violet radiation characterised by at least three potential barriers, e.g. photothyristor the device being a photothyristor
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Lydersen et al. | Superlinear threshold detectors in quantum cryptography | |
US9029774B2 (en) | Single photon detector in the near infrared using an InGaAs/InP avalanche photodiode operated with a bipolar rectangular gating signal | |
Miller et al. | Demonstration of a low-noise near-infrared photon counter with multiphoton discrimination | |
KR101564954B1 (en) | Method and Apparatus for Generating Random Number Using Light Source and Single Photon Detector | |
Jiang et al. | Intrinsic imperfection of self-differencing single-photon detectors harms the security of high-speed quantum cryptography systems | |
Thomas et al. | Efficient photon number detection with silicon avalanche photodiodes | |
Koehler-Sidki et al. | Best-practice criteria for practical security of self-differencing avalanche photodiode detectors in quantum key distribution | |
Calandri et al. | Charge persistence in InGaAs/InP single-photon avalanche diodes | |
Petticrew et al. | Avalanche breakdown timing statistics for silicon single photon avalanche diodes | |
Mahmoudi et al. | Statistical study of intrinsic parasitics in an SPAD-based integrated fiber optical receiver | |
Mahmoudi et al. | Modeling and analysis of BER performance in a SPAD-based integrated fiber optical receiver | |
Acheva et al. | Automated verification of countermeasure against detector-control attack in quantum key distribution | |
Ramirez et al. | Detection efficiencies and generalized breakdown probabilities for nanosecond-gated near infrared single-photon avalanche photodiodes | |
Pljonkin et al. | Features of detection of a single-photon pulse at synchronisation in quantum key distribution systems | |
Du et al. | Implementation of large angle low error non-line-of-sight ultraviolet communication system | |
Allevi et al. | Detecting quantum features in the real world | |
KR101672509B1 (en) | Single photon detection device and photodetector using by the single photon detection device | |
Mu et al. | Evaluation and experimental comparisons of different photodetector receivers for visible light communication systems under typical scenarios | |
IT202100013571A1 (en) | Quantum key distribution receiver and method for detecting a cryptographic key | |
Acerbi et al. | Dark count rate dependence on bias voltage during gate-OFF in InGaAs/InP single-photon avalanche diodes | |
Bogdanov et al. | Influence of QKD apparatus parameters on the backflash attack | |
Qiao et al. | Avalanche noise in Al 0.52 In 0.48 P diodes | |
Marini et al. | Deterministic filtering of breakdown flashing at telecom wavelengths | |
Koehler-Sidki et al. | Intrinsic mitigation of the after-gate attack in quantum key distribution through fast-gated delayed detection | |
Wang et al. | Performance analysis and experimental verification of SPAD receivers without photon counting for optical wireless communications |