[go: up one dir, main page]

Su, 2011 - Google Patents

Color retrieval for fringe projection techniques

Su, 2011

Document ID
557135494132194003
Author
Su W
Publication year
Publication venue
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

External Links

Snippet

Fringe projection techniques are powerful tools to find the 3D profile of an object. However, color on the inspected object might be damaged due to the fringe projection. In this paper, we investigate three approaches to recover the color distribution. This makes it possible to …
Continue reading at www.spiedigitallibrary.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/2441—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/02—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/30—Measuring arrangements characterised by the use of optical means for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/08—Measuring arrangements characterised by the use of optical means for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Instruments as specified in the subgroups and characterised by the use of optical measuring means
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20048—Transform domain processing
    • G06T2207/20056—Discrete and fast Fourier transform, [DFT, FFT]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

Similar Documents

Publication Publication Date Title
US10911672B2 (en) Highly efficient three-dimensional image acquisition method based on multi-mode composite encoding and epipolar constraint
Zhang et al. In situ surface topography of laser powder bed fusion using fringe projection
EP3012576B1 (en) Method for measuring a contour of an object
CN111238403A (en) Three-dimensional reconstruction method and device based on light field sub-aperture stripe image
US20200219273A1 (en) Surface roughness measurement
Niu et al. Two-step phase retrieval algorithm based on the quotient of inner products of phase-shifting interferograms
Le et al. Reconstruction of accurate 3-D surfaces with sharp edges using digital structured light projection and multi-dimensional image fusion
Xiaoling et al. Calibration of a fringe projection profilometry system using virtual phase calibrating modelplanes
CN104180778A (en) Structured light method for small angle measurement
Blanchard et al. Removal of phase artifacts from high-contrast texture for 3D fringe projection system
Granero-Montagud et al. Deterioration estimation of paintings by means of combined 3D and hyperspectral data analysis
Goesele et al. Accuracy of 3D range scanners by measurement of the slanted edge modulation transfer function
Guo et al. Absolute phase technique for the Fourier transform method
Spagnolo et al. Fringe projection profilometry for recovering 2.5 D shape of ancient coins
Su Color retrieval for fringe projection techniques
Li et al. Fast phase-based stereo matching method for 3D shape measurement
Vargas et al. Background intensity removal in structured light three-dimensional reconstruction
Zhang et al. Analysis of 3-D surface waviness on standard artifacts by retroreflective metrology
Wang et al. High-speed 3D shape measurement from noisy fringe images using deep learning
Ochoa et al. Improvement on fringe projection profilometry
Na et al. Three-dimensional measurements by using deflectometry and the double Hilbert transform
Wang et al. Multi-frequency heterodyne phase shift technology in 3-D measurement
Özbay et al. Inspection of the accuracy of fringe projection profilometry by using hybrid methods
Su et al. A real-time, full-field, and low-cost velocity sensing approach for linear motion using fringe projection techniques
Lu et al. Phase analysis for three-dimensional surface reconstruction of apples using structured-illumination reflectance imaging