Sonoda et al., 1994 - Google Patents
Measurement of low-frequency ultrasonic waves by Fraunhofer diffractionSonoda et al., 1994
- Document ID
- 4250800104773674279
- Author
- Sonoda Y
- Akazaki M
- Publication year
- Publication venue
- Japanese journal of applied physics
External Links
Snippet
The application of the Fraunhofer diffraction method, which has been developed as a new means to identify long-wavelength plasma waves or fluctuations appearing in plasma nuclear fusion research machines, to the measurement of low-frequency ultrasonic waves …
- 238000005259 measurement 0 title abstract description 21
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N2021/653—Coherent methods [CARS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US3978713A (en) | Laser generation of ultrasonic waves for nondestructive testing | |
Sonoda et al. | Measurement of low-frequency ultrasonic waves by Fraunhofer diffraction | |
US6844552B2 (en) | Terahertz transceivers and methods for emission and detection of terahertz pulses using such transceivers | |
Karabutov et al. | Time-resolved laser optoacoustic tomography of inhomogeneous media | |
KR910004225B1 (en) | Method and device for nondestructive evaluation | |
US4503708A (en) | Reflection acoustic microscope for precision differential phase imaging | |
JP2001500975A (en) | Improved method and apparatus for measuring material properties using a transient grating spectrometer | |
WO1999061867A1 (en) | An apparatus and method for measuring a property of a structure comprising at least one layer | |
JP2005147813A (en) | Material nondestructive inspection method and apparatus by laser ultrasonic wave | |
Feurer et al. | Direct visualization of the Gouy phase by focusing phonon polaritons | |
Culshaw et al. | Non-contact measurement of the mechanical properties of materials using an all-optical technique | |
Nissim et al. | Free-surface velocity measurements of opaque materials in laser-driven shock-wave experiments using photonic Doppler velocimetry | |
Dürr et al. | High resolution acoustic probe | |
Berthelot et al. | Directional laser generation and detection of ultrasound with arrays of optical fibers | |
Kamizuma et al. | Development of fast-scanning laser probe system based on knife-edge method for diagnosis of RF surface acoustic wave devices | |
Smith et al. | Confocal surface acoustic wave microscopy | |
US4571081A (en) | Light scattering apparatus and method | |
Vella et al. | High‐resolution spectroscopy for optical probing of continuously generated surface acoustic waves | |
Weisen | The phase-contrast technique as an imaging diagnostic for plasma density fluctuations | |
RU2359265C1 (en) | Ultrasonic introscopy device | |
JP2002257793A (en) | Lasor ultrasonic inspection device | |
US20030184760A1 (en) | Optical device | |
RU2061250C1 (en) | Acoustic-optical device for detection of frequency of radio signal | |
Sakoda et al. | Transmission and detection of light diffraction signal by low-frequency ultrasonic wave | |
KR100733539B1 (en) | Ultrasonic Measurement Apparatus and Method of High Temperature Measurement Object Using Laser |