Roughani et al., 1989 - Google Patents
Raman scattering by epitaxial GaAs on a Si substrateRoughani et al., 1989
- Document ID
- 415168328717393475
- Author
- Roughani B
- Kallergi M
- Aubel J
- Sundaram S
- Publication year
- Publication venue
- Journal of applied physics
External Links
Snippet
The strain distribution and the lattice disorder of GaAs on a Si substrate were studied by Raman scattering technique as a function of distance from the GaAs/Si interface. Epitaxial layers of GaAs grown by the laser‐assisted metalorganic chemical vapor deposition …
- 229910001218 Gallium arsenide 0 title abstract description 64
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02546—Arsenides
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Amano et al. | Stress and defect control in GaN using low temperature interlayers | |
Tripathy et al. | Micro-Raman investigation of strain in GaN and Al x Ga 1− x N/GaN heterostructures grown on Si (111) | |
Kozawa et al. | Thermal stress in GaN epitaxial layers grown on sapphire substrates | |
Nootz et al. | Correlations between spatially resolved Raman shifts and dislocation density in GaN films | |
Demangeot et al. | Phonon deformation potentials in hexagonal GaN | |
Dietrich et al. | Measurement of stress and relaxation in Si1− x Ge x layers by Raman line shift and x‐ray diffraction | |
Melnik et al. | Physical properties of bulk GaN crystals grown by HVPE | |
KR20060129956A (en) | Damage evaluation method of a compound semiconductor member, a manufacturing method of a compound semiconductor member, a gallium nitride compound semiconductor member, and a gallium nitride compound semiconductor film | |
Freitas Jr et al. | Structural and optical properties of thick freestanding GaN templates | |
Tang et al. | Dispersion properties of aluminum nitride as measured by an optical waveguide technique | |
Özden et al. | Spectroscopic and microscopic investigation of MBE-grown CdTe (211) B epitaxial thin films on GaAs (211) B substrates | |
Roughani et al. | Raman scattering by epitaxial GaAs on a Si substrate | |
Lange et al. | Dielectric response of strained and relaxed Si 1− x− y Ge x C y alloys grown by molecular beam epitaxy on Si (001) | |
Nishioka et al. | Raman microprobe analysis of stress in Ge and GaAs/Ge on SiO2‐coated Si substrates | |
Talwar et al. | Spectroscopic phonon and extended x-ray absorption fine structure measurements on 3C-SiC/Si (001) epifilms | |
Bilgili et al. | Investigation of structural, optical and morphological properties of InGaN/GaN structure | |
US20030049916A1 (en) | Development of an intermediate-temperature buffer layer for the growth of high-quality GaxInyAlzN epitaxial layers by molecular beam epitaxy | |
Coquillat et al. | Observations of band structure and reduced group velocity in epitaxial GaN–sapphire 2D photonic crystals | |
Valcheva et al. | Elimination of nonuniformities in thick GaN films using metalorganic chemical vapor deposited GaN templates | |
Flynn et al. | Effects of phosphoric acid on the surface morphology and reflectance of AlN grown by MBE under Al-rich conditions | |
Drews et al. | Monitoring heteroepitaxial growth of ZnSe on GaAs by Raman spectroscopy | |
Gennari et al. | Raman scattering of strained GaAs layers grown by MOVPE on InP (111) A and B | |
JP3653622B2 (en) | Method for evaluating compound semiconductor epitaxial wafer including GaAs-AlGaAs superlattice structure layer | |
Novikova et al. | Surface polariton spectroscopy of AlN films grown by ammonia MBE on (0001) Al2O3 substrate | |
Wu et al. | X-ray absorption and Raman study of GaN films grown on different substrates by different techniques |