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Mehregany et al., 1999 - Google Patents

SiC MEMS: opportunities and challenges for applications in harsh environments

Mehregany et al., 1999

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Document ID
4046835269576603295
Author
Mehregany M
Zorman C
Publication year
Publication venue
Thin solid films

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Many measurement and control applications requiring MEMS technology are in the presence of harsh environments, eg high temperatures, intense shock/vibrations, erosive flows, and corrosive media. Unlike Si, SiC as a semiconductor material is exceptionally well …
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