[go: up one dir, main page]

Bingham et al., 2010 - Google Patents

A statistical analysis of the variation in measured crystal orientations obtained through electron backscatter diffraction

Bingham et al., 2010

View PDF
Document ID
37671179767225674
Author
Bingham M
Lograsso B
Laabs F
Publication year
Publication venue
Ultramicroscopy

External Links

Snippet

Electron backscatter diffraction (EBSD) techniques are used to determine the crystallography of individual metal grains. This paper examines the variability in the orientation of measurements obtained by EBSD. Although precision and statistics of …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/207—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
    • G01N23/2252—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables

Similar Documents

Publication Publication Date Title
Clabbers et al. Electron diffraction data processing with DIALS
Otwinowski et al. Denzo and scalepack
Jailin et al. In situ μ CT-scan mechanical tests: fast 4D mechanical identification
Martinez et al. Quantitative STEM normalisation: The importance of the electron flux
EP3974807A1 (en) Information processing apparatus, learning device, information processing system, information processing method, program, and non-transitory storage medium
US9754360B2 (en) Determination of spatial distribution of charged particle beams
Kotula et al. Focused ion beam and scanning electron microscopy for 3D materials characterization
Hu et al. High-precision star-formation efficiency measurements in nearby clouds
Kim et al. Fast acquisition protocol for X-ray scattering tensor tomography
Alania et al. Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure
Shi et al. Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns
Bingham et al. A statistical analysis of the variation in measured crystal orientations obtained through electron backscatter diffraction
Su et al. Dual U-Net based feature map algorithm for automatic projection alignment of synchrotron nano-CT
Rodek et al. A stochastic algorithm for reconstruction of grain maps of moderately deformed specimens based on X-ray diffraction
Butterfield et al. Quantitative three‐dimensional ice roughness from scanning electron microscopy
Diederichs Simulation of X-ray frames from macromolecular crystals using a ray-tracing approach
Xie et al. Texture analysis in cubic phase polycrystals by single exposure synchrotron X-ray diffraction
Poulsen et al. Multigrain crystallography and three-dimensional grain mapping
Probst et al. Focal spot characterization of an industrial X-ray CT scanner
Zhang et al. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions
De Backer et al. Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt
Bingham et al. Bayes one-sample and one-way random effects analyses for 3-D orientations with application to materials science
Chen et al. Box replication effects in weak lensing light-cone construction
Alania et al. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?
Davis et al. High-contrast x-ray microtomography in dental research