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Johansson et al., 2019 - Google Patents

Concurrency defect localization in embedded systems using static code analysis: An evaluation

Johansson et al., 2019

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Document ID
3509519355671462513
Author
Johansson B
Papadopoulos A
Nolte T
Publication year
Publication venue
2019 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)

External Links

Snippet

Defects with low manifestation probability, such as concurrency defects, are difficult to find during testing. When such a defect manifests into an error, the low likelihood can make it time-consuming to reproduce the error and find the root cause. Static Code Analysis (SCA) …
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Classifications

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    • G06F11/3676—Test management for coverage analysis
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