[go: up one dir, main page]

Zhou et al., 2019 - Google Patents

Visualizing the melting processes in ultrashort intense laser triggered gold mesh with high energy electron radiography

Zhou et al., 2019

View HTML
Document ID
3316203254331822089
Author
Zhou Z
Fang Y
Chen H
Wu Y
Du Y
Zhang Z
Zhao Y
Li M
Tang C
Huang W
Publication year
Publication venue
Matter and Radiation at Extremes

External Links

Snippet

High-energy electron radiography (HEER) is a promising diagnostic tool for high-energy- density physics, as an alternative to tools such as X/γ-ray shadowgraphy and high-energy proton radiography. Impressive progress has been made in the development and …
Continue reading at pubs.aip.org (HTML) (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
    • H01J37/243—Beam current control or regulation circuits
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/261—Details
    • H01J37/265—Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06—Sources
    • H01J2237/08—Ion sources
    • H01J2237/0802—Field ionization sources
    • H01J2237/0807—Gas field ion sources [GFIS]
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anti-cathode is movable relative to the surface thereof
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes

Similar Documents

Publication Publication Date Title
Du et al. Generation of first hard X-ray pulse at Tsinghua Thomson Scattering X-ray Source
Law et al. Direct measurement of kilo-tesla level magnetic field generated with laser-driven capacitor-coil target by proton deflectometry
Musumeci et al. High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector
Fu et al. High quality single shot ultrafast MeV electron diffraction from a photocathode radio-frequency gun
Xu et al. Ultrashort megaelectronvolt positron beam generation based on laser-accelerated electrons
McGuffey et al. Focussing protons from a kilojoule laser for intense beam heating using proximal target structures
Hidding et al. Novel method for characterizing relativistic electron beams in a harsh laser-plasma environment
Merrill et al. Magnifying lens for 800 MeV proton radiography
Li et al. Note: Single-shot continuously time-resolved MeV ultrafast electron diffraction
Chen et al. Magnetic collimation of relativistic positrons and electrons from high intensity laser–matter interactions
Wang et al. Recent diagnostic developments at the 100 kJ-level laser facility in China
Cheng et al. Warm dense matter research at HIAF
JPWO2011093285A1 (en) Ultrafast electron beam diffractometer
Zhou et al. Visualizing the melting processes in ultrashort intense laser triggered gold mesh with high energy electron radiography
Scoby et al. Single-shot 35 fs temporal resolution electron shadowgraphy
Nishiuchi et al. Efficient production of a collimated MeV proton beam from a polyimide target driven by an intense femtosecond laser pulse
Tokita et al. Single-shot ultrafast electron diffraction with a laser-accelerated sub-MeV electron pulse
Kashiwagi et al. Observation of high-intensity X-rays in inverse Compton scattering experiment
Torrisi et al. Aluminium plasma production at high laser intensity
Zhou et al. Demonstration of single-shot high-quality cascaded high-energy-electron radiography using compact imaging lenses based on permanent-magnet quadrupoles
Dong et al. Micro-spot gamma-ray generation based on laser wakefield acceleration
Torrisi et al. Equivalent ion temperature in Ta plasma produced by high energy laser ablation
Ohira et al. X-ray backlight measurement of preformed plasma by kJ-class petawatt LFEX laser
Mirzaie et al. Enhanced electron yield from laser-driven wakefield acceleration in high-Z gas jets
Kulevoy et al. ITEP MEVVA ion beam for reactor material investigation